BIAS LAYER AND SHIELD BIASING DESIGN

20170069341 ยท 2017-03-09

    Inventors

    Cpc classification

    International classification

    Abstract

    A read head is longitudinally biased unidirectionally by laterally abutting soft magnetic layers or multilayers. The soft magnetic layers are themselves magnetically stabilized by layers of antiferromagnetic material that are exchange coupled to them. The same layers of antiferromagnetic materials can be used to stabilize a unidirectional anisotropy of an overhead shield by means of exchange coupling. By including the antiferromagnetic material layer within the patterned biasing structure itself, an additional layer of antiferromagnetic material that normally covers the entire sensor structure is eliminated. The elimination of an entire layer is also advantageous for reducing the inter-sensor spacing in a TDMR (two dimensional magnetic recording) configuration where two sensor are vertically stacked on top of each other.

    Claims

    1-9. (canceled)

    10. A TDMR (two dimensional magnetic recording) read head having longitudinally biased freelayers with unidirectional anisotropy in a longitudinal direction, comprising: a top sensor top shield; a patterned top sensor placed beneath and contiguous with said top sensor top shield, wherein said patterned top sensor includes a freelayer having a unidirectional magnetic anisotropy aligned in a horizontal direction; a top sensor bottom shield; a non-magnetic spacer layer; a bottom sensor top shield; a patterned bottom sensor placed beneath and contiguous with said bottom sensor top shield, wherein said patterned bottom sensor includes a freelayer having a unidirectional magnetic anisotropy aligned in a horizontal direction; a bottom sensor bottom shield; wherein said top and bottom sensors are identical in pattern and structure and symmetrically positioned; and an oppositely disposed pair of soft magnetic biasing layers or a multilayer of soft magnetic biasing layers that symmetrically abut patterned lateral sides of each said identically patterned sensor thereby stably biasing each said freelayer therein and producing said unidirectional magnetic anisotropy in each said freelayer therein; and a pair of symmetrically formed antiferromagnetic layers exchange coupled to said soft magnetic biasing layers or said multilayer of soft magnetic biasing layers in each said sensor, thereby stabilizing said biasing of each said freelayer therein; and wherein said top sensor top shield is also biased in the same direction as said freelayer in said top sensor and wherein said bottom sensor top shield is also biased in the same direction as said freelayer in said bottom sensor and wherein both said top shield of said top sensor and said top shield of said bottom sensor are exchange coupled to said pair of antiferromagnetic layers of their respective sensors and are also provided with a stabilized unidirectional magnetic anisotropy thereby.

    11. The read head of claim 10 wherein each of said pair of symmetrically formed antiferromagnetic layers is formed on top of said soft magnetic biasing layers or said multilayer formation of soft magnetic biasing layers.

    12-13. (canceled)

    14. The read head of claim 10 wherein each of said pair of symmetrically formed antiferromagnetic layers formed on the top of said soft magnetic biasing layers or on the top of said multilayered formation of soft biasing layers is exchange coupled to said top shield of said top sensor or to said top shield of said bottom sensor and thereby provides a unidirectional magnetic anisotropy to each of said top shields as well as said biasing layers.

    15. The read head of claim 13 wherein, in said bottom sensor, each of said pair of symmetrically formed antiferromagnetic layers is exchange coupled to each of a pair of soft magnetic biasing layers formed beneath said antiferromagnetic layers and is also exchange coupled to a top shield formed above said antiferromagnetic layers, thereby providing a unidirectional magnetic anisotropy to said top shield layer as well as to said pair of soft magnetic biasing layers.

    16. The read head of claim 10 wherein said soft magnetic biasing layer is a multilayer of soft magnetic layers and wherein adjacent pairs of soft magnetic layers in said multilayer may be antiferromagnetically exchange coupled by means of an intermediate antiferromagnetically coupling layer but wherein said exchange coupled soft magnetic layers are formed with different thicknesses so that a net magnetic moment is produced for purposes of biasing said freelayer.

    17. The read head of claim 16 wherein either or both individual layers of antiferromagnetically coupled adjacent pairs of soft magnetic layers may be exchange coupled to an antiferromagnetic layer.

    18. The read head of claim 10 wherein said soft magnetic biasing layers may be formed of the soft magnetic alloys NiFe, CoFe, FeCo, Fe or their combinations.

    19. The read head of claim 16 wherein said layer of antiferromagnetically coupling material is a layer of Ru and wherein said antiferromagnetic coupling is a negative exchange coupling.

    20. The read head of claim 10 wherein said exchange coupling produces said unidirectional anisotropy as a result of an annealing process carried out at a temperature of between 200-250 deg. C., for a period of approximately 2 hours in a saturating magnetic field.

    21. The read head of claim 10 wherein said symmetrically formed layers are intrinsically antiferromagnetic material comprising IrMn, with a thickness between approximately 50 and 200 Angstroms.

    22. (canceled)

    23. The read head of claim 11 wherein said symmetrically formed layers are intrinsically antiferromagnetic material comprising IrMn, with a thickness between approximately 50 and 200 Angstroms.

    Description

    BRIEF DESCRIPTION OF THE DRAWINGS

    [0012] FIG. 1 is a schematic representation of an ABS view of a prior art biased and stabilized sensor.

    [0013] FIG. 2 is a schematic representation of an ABS view of an alternate prior art biased and stabilized sensor differing from FIG. 1 in that the biasing structure is a layered configuration.

    [0014] FIG. 3 is a schematic representation of a biased and stabilized sensor that satisfies the object of this disclosure.

    [0015] FIG. 4 is a schematic representation of a TDMR (two dimensional magnetic recording) sensor showing how the present structure, when vertically stacked, leads to a smaller separation between top and bottom sensors.

    DETAILED DESCRIPTION

    [0016] Referring again to schematic FIG. 3, there is shown a stabilizing unidirectional magnetic anisotropy provided by insertion of layer 90, adjacent to and on top of the soft magnetic bias layer 61, which are typically layers of NiFe or CoFe formed to a thickness between approximately 40 and 125 Angstroms. Layer 90 is here a patterned AFM layer, formed into a pair of layers, longitudinally disposed and symmetrically placed on each side of the sensor, 20, over the biasing layers 61. Layer 90 is formed to a thickness of between approximately 50 and 200 Angstroms of intrinsically antiferromagnetic material, such as a layer of IrMn.

    [0017] Subsequent to an annealing process, such as a 2 hour anneal at between 200-250 deg. C. in a saturating field, each of this pair of antiferromagnetic layers 90 will exchange couple to the soft magnetic biasing layers, 61, below it to promote and stabilize unidirectional magnetic anisotropy in those layers. It should be noted that the biasing layers 61 require a large net moment in order to bias the sensor. For this reason, forming the biasing layers as synthetic antiferromagnetic structures (i.e., coupling them with opposite moments across a layer of Ru as in FIG. 2) is not preferred, although two soft layers with different thicknesses can be coupled to provide a net moment.

    [0018] In addition to stabilizing the biasing layers, the pair of patterned antiferromagnetic films, 90, will be exchange coupled to the top shield, 50, thereby providing the shield with a stable unidirectional magnetic anisotropy as well. Thus, layer 90 serves two functions; it stabilizes both the pair of bias layers, 61, and also the top shield 50. It can be used in place of the antiferromagnetic film C, 30, in prior art FIG. 2 thus completely eliminating that film, and in TDMR structures thus reducing the top sensor to bottom sensor vertical spacing. It is a further aspect of the process that the antiferromagnetic films can also be sandwiched between pairs of soft magnetic biasing layers if the biasing configuration, 61, is formed as a multilayered structure rather than a single layer.

    [0019] Referring finally to FIG. 4, there is shown schematically a two dimensional magnetic recording (TDMR) vertically stacked double sensor structure (top sensor 20, bottom sensor 25), having a reduced sensor-to-sensor spacing (shown by the double arrow between sensor freelayers 10 and 15) because an extra exchange coupling AFM layer, that would typically be formed on top of the top shield 50 of the bottom sensor 25, has been eliminated. This eliminated layer of AFM material is shown as layer 30 (or C) in FIG. 2. In FIG. 4, the effect of this layer is replaced by the laterally disposed symmetric pair, 90, which does double-duty of stabilizing both the soft bias layers 61 and the bottom sensor top shield 50.

    [0020] As FIG. 4 illustrates, the separation between the bottom sensor and the top sensor is now a result only of the combined thicknesses of the bottom sensor top shield, 50, a non-magnetic spacer layer, 55, and the top sensor bottom shield 45. A blanket covering antiferromagnetic layer (layer 30 of FIG. 2) that would have been used to cover the top surface of the bottom sensor top shield 50 to stabilize its unidirectional anisotropy has been completely eliminated. Note that we also show the presence of the AFM stabilizing layers, 80, in the top sensor, 20, but they do not contribute to the reduced inter-sensor distance although they will stabilize the top shield, 40, of the top sensor.

    [0021] As is understood by a person skilled in the art, the present description is illustrative of the present disclosure rather than limiting of the present disclosure. Revisions and modifications may be made to methods, materials, structures and dimensions employed in forming and providing a single or multiple sensor read head with longitudinally disposed patterned antiferromagnetic stabilized biasing layers, while still forming and providing such a structure and its method of formation in accord with the spirit and scope of the present disclosure as defined by the appended claims.