Electrostatically controlled magnetic logic device

Abstract

A magnetic logic cell includes a first electrode portion, a magnetic portion arranged on the first electrode, the magnetic portion including an anti-ferromagnetic material or a ferrimagnetic material, a dielectric portion arranged on the magnetic portion, and a second electrode portion arranged on the dielectric portion.

Claims

1. A method for fabricating a logic cell, the method comprising: depositing and patterning a layer of conductive material on a substrate to define a first electrode; depositing a first layer of anti-ferromagnetic material or ferrimagnetic material directly on the electrode; depositing a dielectric material layer over the first layer of anti-ferromagnetic material or ferrimagnetic material; patterning the first layer of anti-ferromagnetic material or ferrimagnetic material and the dielectric material layer to define a magnetic portion and a dielectric portion of the cell; and forming a second electrode portion in contact with the dielectric material layer; wherein the first layer of anti-ferromagnetic material or ferrimagnetic material includes a first sublayer formed of rare earth ions and a second sublayer of formed of transition metal ions directly contacting the first sublayer, wherein the first and second layers are antiferromagnetically coupled so that moments of the first and second sublayers point towards opposite directions and have equal and opposite moments.

2. The method of claim 1, wherein the ferrimagnetic material includes Tb.sub.1-xFe.sub.x, Gd.sub.1-xFe.sub.x, Dy.sub.1-xFe.sub.x, Tb.sub.1-x-yFe.sub.xCo.sub.y Gd.sub.1-x-yFe.sub.xCo.sub.y, or Dy.sub.1-x-yFe.sub.xCo.sub.y.

3. The method of claim 1, wherein the conductive material includes a metallic material.

Description

BRIEF DESCRIPTION OF THE SEVERAL VIEWS OF THE DRAWINGS

(1) The subject matter which is regarded as the invention is particularly pointed out and distinctly claimed in the claims at the conclusion of the specification. The forgoing and other features, and advantages of the invention are apparent from the following detailed description taken in conjunction with the accompanying drawings in which:

(2) FIG. 1 illustrates a side view of a prior art example of an electrostatically controlled logic cell (cell) in a first state.

(3) FIG. 2 illustrates a side view of the prior art example of the cell of FIG. 1 in a second state.

(4) FIG. 3 illustrates an exemplary embodiment of a logic cell in a first state.

(5) FIG. 4 illustrates the exemplary embodiment of the logic cell of FIG. 3 in a second state.

(6) FIG. 5 illustrates another exemplary embodiment of the ferrimagnetic portion.

(7) FIG. 6 illustrates another exemplary embodiment of the ferrimagnetic portion.

(8) FIG. 7 illustrates another exemplary embodiment of the ferrimagnetic portion.

(9) FIG. 8 illustrates another exemplary embodiment of the ferrimagnetic portion.

DETAILED DESCRIPTION

(10) Computational schemes based on the switching of magnetic moment (spintronics) used in magnetic logic cells may be controlled using lower voltages than the voltages used in complementary metal oxide semiconductor (CMOS) based memory/logic devices. The voltage control of some devices may be less than one volt, which facilitates the use of higher clock speeds in processors. The use of devices based on ferromagnetic materials provides a low voltage control solution, however previous ferromagnetic devices have exhibited a relatively slow state switching speed (e.g., 0.5 nanoseconds). The low switching speeds are undesirable. The exemplary embodiments described below provide a device having a relatively fast switching speed with out-of-plane to in-plane reversal as fast or potentially faster than 10 ps. The exemplary embodiments include logic cells that include layers of antiferromagnets and ferrimagnets that affect a low-energy and fast voltage induced control using anisotropy control and magnetization switching.

(11) FIG. 3 illustrates an exemplary embodiment of a logic cell (cell) 300 in a first state. The cell 300 includes a first conductive electrode portion 302 that is connected to ground. A ferrimagnetic (or antiferromagnetic) portion 304 is arranged in contact with the first conductive electrode portion 302. A non-conductive dielectric portion 306 is arranged on the ferrimagnetic (or antiferromagnetic) portion 304. The dielectric portion 306 may include any suitable dielectric material such as, for example, MgO, HfO.sub.2, Al.sub.2O.sub.3, TiO.sub.2 more generally all High-k dielectrics (such as ZrO2, La2O3, TiO2, SrTiO.sub.3, BaSrTiO.sub.3, PbLaTiO.sub.3). A second conductive electrode portion 308 is arranged on the dielectric portion 306. The cell 300 may be arranged on a substrate (not shown) and may be arranged in an array with any number of cells 300.

(12) The first and second conductive electrode portions 302 and 308 may include any suitable conductive material such as, for example, Al, Au, Ag, Pt, Pd, Ti, Ta, Ru or Cu and so on. The ferrimagnetic (or antiferromagnetic) portion 304 is illustrated with arrows that indicate the direction of the magnetic moment of the atoms that are arranged in the ferrimagnetic (or antiferromagnetic) portion 304. In the illustrated embodiment, a first voltage V1 is applied to the second conductive electrode portion 308 such that the magnetic orientation of the ferrimagnetic (or antiferromagnetic) portion 304 is shown in plane however, the orientation of the spins are in opposing directions. In this regard, the sum of the vectors representing the orientation of the magnetic moments is approximately zero or close to zero. The ferrimagnetic (or antiferromagnetic) portion 304 may include, for example, an alloy material such as, for example Tb.sub.1-xFe.sub.x, Gd.sub.1-xFe.sub.x, Dy.sub.1-xFe.sub.x, Tb.sub.1-x-yFe.sub.xCo.sub.y Gd.sub.1-x-yFe.sub.xCo.sub.y, Dy.sub.1-x-yFe.sub.xCo.sub.y more generally materials containing rare earth metals and magnetic transition metals elements, in which the magnetic sublattice of rare earth ions and the one formed by the Transition metal ions are antiferromagnetically coupled so that the moment of the two sublattices are pointing towards opposite directions. Moment compensation is reached when the two sublattices have equal but opposite moments.

(13) FIG. 4 illustrates the cell 300 in a second state where a second voltage V2 is applied to the second conductive electrode 308. The application of the V2 voltage results in a change in state of the ferrimagnetic (or antiferromagnetic) portion 304 such that the orientation of the spins of the atoms is out of plane however, the directions of the magnetic moments of the atoms are in opposing directions. The cell 300 may be fabricated by, depositing a layer of conductive metallic material such as, for example, Al, Au, Ag, Pt, Pd, Ti, Ta, Ru or Cu on a substrate. Portions of the layer of conductive metallic material may be removed by, for example, a lithographic patterning and etching process. A layer of ferrimagnetic material such as, for example Tb.sub.1-xFe.sub.x, Gd.sub.1-xFe.sub.x, Dy.sub.1-xFe.sub.x, Tb.sub.1-x-yFe.sub.xCo.sub.y Gd.sub.1-x-yFe.sub.xCo.sub.y, Dy.sub.1-x-yFe.sub.xCo.sub.y. The layers can be fabricated by using, for example, a magnetron sputtering technique by either deposition directly from a single phase sputtering source such as Tb.sub.1-xFe.sub.x or cosputtering using two or more sources namely one for the rare earth metal such as for instance Tb and one or two for the transition metal such as Fe. A dielectric layer is disposed on the layer of ferrimagnetic material, which may include any suitable dielectric material such as, for example, MgO, HfO.sub.2, Al.sub.2O.sub.3, TiO.sub.2 more gernerally all High-k dielectrics (such as ZrO2, La2O3, TiO2, SrTiO.sub.3, BaSrTiO.sub.3, PbLaTiO.sub.3). A second layer of conductive metallic material is disposed on the dielectric layer. A suitable lithographic etching process may be performed to pattern the cell 300 as illustrated in FIG. 3.

(14) FIG. 5 illustrates an alternate exemplary embodiment of the ferrimagnetic (or antiferromagnetic) portion 304 in the first state as shown in FIG. 3. It shall be understood that portion 304 may also be considered an artificial ferrimagnet as it may be composed of ferromagnetic layers each at least several atoms thick In this regard, the ferrimagnetic (or antiferromagnetic) portion 304 is formed from layers 502 and 504 of alternating materials having thicknesses of the order of 2-20 , for example Tb 20 /Fe 20 . The layer 502 includes a ferromagnetic material such as, for example, Tb, Dy, or Gd, Nd, Sm more generally all of the rare earth metals. The layer 504 disposed on the layer 502 includes a ferromagnetic material such as, for example, Fe, Co, Ni, Co.sub.xFe.sub.1-x, Co.sub.1-x-yFe.sub.xB.sub.y. The respective magnetic properties of the layers 502 and 504 and the relative [antiferromagnetic] arrangement of the layers 502 and 504 results in a ferrimagnetic (or antiferromagnetic) portion 304 that has a magnetic moment that is substantially neutral or substantially close to zero (e.g., 0-20 electro magnetic units (EMU) per cubic centimeter; i.e., at or close to the magnetization compensation point). Though the layer 504 is shown in contact with the dielectric portion 306 in the illustrated embodiment, in an alternate embodiment, a layer 502 may be in contact with the dielectric portion 306. In some embodiments, an ultra thin metal layer may be inserted or dusted in the interface between the dielectric portion 306 and the ferrimagnetic (or antiferromagnetic) portion 304. (e.g, with a thickness of the order of a monolayer or 2-3 ) in order to enhance the contribution to the surface magnetic anisotropy of layer 304, for instance metallic layer such as Pt or Pd or Bi or more generally metals with a high atomic number hence with a high spin orbit coupling.

(15) FIG. 6 illustrates the ferrimagnetic (or antiferromagnetic) portion 304 as described in FIG. 5 when the cell 300 in the second state. In this regard, the layers 502 and 504 have atoms with magnetic moments that are perpendicular to the plane of the film, however the magnetic moments are orientated in opposing directions.

(16) FIG. 7 illustrates an alternate exemplary embodiment of the ferrimagnetic (or antiferromagnetic) portion 304 in the first state as shown in FIG. 3. In this regard, the ferrimagnetic (or antiferromagnetic) portion 304 is formed from layers 502 and 504 as described above in FIG. 5, however the layer 504 that includes a ferromagnetic material such as a transition metal, like Fe, Co, or Ni, is disposed on the second electrode portion 302 (of FIG. 3), and the layer 502 that includes a second ferromagnetic material such as for instance a rare earth ferromagnet, like Tb or Gd, is disposed on the layer 504, the thicknesses are chosen so that 502 and 504 are coupled antiferromagnetically. Any number of alternating pairs of layers 504 and 502 may be included in the ferrimagnetic (or antiferromagnetic) portion 304.

(17) FIG. 8 illustrates the ferrimagnetic (or antiferromagnetic) portion 304 as described in FIG. 7 when the cell 300 in the second state. In this regard, the layers 502 and 504 have atoms with magnetic moments that are out of plane, however the magnetic moments are orientated in opposing directions.

(18) The combination of the transition metal and the rare earth in the ferrimagnetic (or antiferromagnetic) portion 304 result in a small (zero or near zero) moment. Thus, at a given applied voltage, the ferrimagnetic (or antiferromagnetic) portion 304 undergoes a higher effective field (electric and magnetic) as compared to devices having ferromagnets. Each sublattice is subjected to the exchange field (orientated in an opposing direction to an adjacent sublattice) of the adjacent sublattice. The additional field appears to increase the damping rate and provides for faster magnetization dynamics. The effect provides very fast reversal of the magnetization of the MRAM device 300 with voltage-induced anisotropy modulation at the interface 301 of the dielectric portion 306 and the ferrimagnetic (or antiferromagnetic) portion 304.

(19) The application of the voltage to the top electrode 108 induces an electric field across the dielectric in region 106 and results in a change in the carrier concentration of the interfacial region 101 thereby changing the contribution of this region to the overall magnetic anisotropy of the magnetic film 104. This results in a rotation of the magnetic moments on each atomic site of the region 104. The anisotropy axis defines the energetically favorable direction for the magnetic moments of a given material when no magnetic field is applied to portion 304 and interfacial anisotropies form region 301. (This includes the contribution from the bulk and the surface/interface, or portion 301, of the given material with the dielectric portion 306, the magnetic moment direction is the sum or total contributions of both bulk anisotropies from portion 304 and surface anisotropies from portion 301, the latter interfacial contribution may be modulated with the electric field, hence the magnetic moment of portion 304 and 301 can be rotated when the surface anisotropy represents more than 50% of the total anisotropy (bulk+interface) which is the case only of very thin magnetic layers of less than 20 ).

(20) The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. As used herein, the singular forms a, an and the are intended to include the plural forms as well, unless the context clearly indicates otherwise. It will be further understood that the terms comprises and/or comprising, when used in this specification, specify the presence of stated features, integers, steps, operations, elements, and/or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, element components, and/or groups thereof.

(21) The corresponding structures, materials, acts, and equivalents of all means or step plus function elements in the claims below are intended to include any structure, material, or act for performing the function in combination with other claimed elements as specifically claimed. The description of the present invention has been presented for purposes of illustration and description, but is not intended to be exhaustive or limited to the invention in the form disclosed. Many modifications and variations will be apparent to those of ordinary skill in the art without departing from the scope and spirit of the invention. The embodiment was chosen and described in order to best explain the principles of the invention and the practical application, and to enable others of ordinary skill in the art to understand the invention for various embodiments with various modifications as are suited to the particular use contemplated.

(22) The flow diagrams depicted herein are just one example. There may be many variations to this diagram or the steps (or operations) described therein without departing from the spirit of the invention. For instance, the steps may be performed in a differing order or steps may be added, deleted or modified. All of these variations are considered a part of the claimed invention.

(23) While the preferred embodiment to the invention had been described, it will be understood that those skilled in the art, both now and in the future, may make various improvements and enhancements which fall within the scope of the claims which follow. These claims should be construed to maintain the proper protection for the invention first described.