ELECTRONIC COMPONENT-USE PACKAGE AND PIEZOELECTRIC DEVICE

Abstract

An electronic component-use package includes a base that holds an electronic component element, and terminal electrodes formed on a bottom surface of the base. The terminal electrodes have chamfered parts facing corner parts of the base bottom surface and having angles of chamfer ranging in 10 degrees to a reference line. The reference line is a perpendicular line to a straight line that connects the corner parts of the base bottom surface to a central part on one side of the terminal electrode in proximity to a center point of the base bottom surface, the reference line L8 passing through the chamfered parts.

Claims

1. An electronic component-use package, comprising at least a base that holds an electronic component element, the electronic component-use package further comprising a terminal electrode disposed on a bottom surface of the base, the terminal electrode being electrically connected to a circuit board externally provided, wherein the terminal electrode has a chamfered part facing a corner part of the bottom surface of the base and having an angle of chamfer ranging in 10 degrees to a reference line, and the reference line is a perpendicular line to a straight line that connects the corner parts of the bottom surface of the base to a central part on one side of the terminal electrode in proximity to a center point of the bottom surface of the base, the reference line passing through the chamfered part of the terminal electrode.

2. The electronic component-use package as claimed in claim 1, wherein a bump including a metal film is integrally formed on the terminal electrode, and the bump has a chamfered part facing the corner part of the bottom surface of the base, the chamfered part of the bump has an angle of chamfer ranging in 10 degrees to a reference line for bump, and the reference line for bump is a perpendicular line to a straight line that connects the corner part of the bottom surface of the base to the central part on the one side of the terminal electrode in proximity to the center point of the bottom surface of the base, the reference line passing through the chamfered part of the bump.

3. The electronic component-use package as claimed in claim 2, wherein the chamfered parts of the terminal electrode and of the bump both have a planar shape and have equal angles of chamfer.

4. The electronic component-use package as claimed in claim 1, wherein the angle of chamfer ranges in 5 degrees.

5. The electronic component-use package as claimed in claim 1, wherein the terminal electrode has the chamfered parts facing corner parts at both ends on one side of the bottom surface of the base, a castellation vertically extending is formed on a side surface of the base corresponding to the one side of the bottom surface of the base, the castellation has a side surface electrode formed in continuity with the terminal electrode, and the castellation has an opening width small enough to fall between points of intersection at which extension lines respectively along directions of chamfer of the chamfered parts of the terminal electrode intersect with the one side of the bottom surface of the base.

6. The electronic component-use package as claimed in claim 2, wherein the terminal electrode has the chamfered parts facing corner parts at both ends on one side of the bottom surface of the base, a castellation vertically extending is formed on a side surface of the base corresponding to the one side of the bottom surface of the base, the castellation has a side surface electrode formed in continuity with the terminal electrode, and the castellation has an opening width small enough to fall between points of intersection at which extension lines respectively along directions of chamfer of the chamfered parts of the terminal electrode intersect with the one side of the bottom surface of the base.

7. The electronic component-use package as claimed in claim 3, wherein the terminal electrode has the chamfered parts facing corner parts at both ends on one side of the bottom surface of the base, a castellation vertically extending is formed on a side surface of the base corresponding to the one side of the bottom surface of the base, the castellation has a side surface electrode formed in continuity with the terminal electrode, and the castellation has an opening width small enough to fall between points of intersection at which extension lines respectively along directions of chamfer of the chamfered parts of the terminal electrode intersect with the one side of the bottom surface of the base.

8. The electronic component-use package as claimed in claim 5, wherein the bottom surface of the base has a rectangular shape in plan view and a pair of opposing sides including the one side, a pair of the terminal electrodes is formed along the pair of opposing sides of the bottom surface of the base, and the castellations vertically extending are formed on both side surfaces of the base corresponding to the pair of opposing sides of the bottom surface of the base.

9. The electronic component-use package as claimed in claim 5, further comprising a lid for hermetical seal of an upper opening of the base, wherein the base has a multilayered structure including a plurality of layers vertically stacked on each other, and the castellation has a smaller opening size in at least an uppermost one of the plurality of layers of the base than in the other ones of the plurality of layers.

10. A piezoelectric device, comprising: the electronic component-use package as claimed in claim 1; and a piezoelectric vibration piece as the electronic component element.

11. A piezoelectric device, comprising: the electronic component-use package as claimed in claim 2; and a piezoelectric vibration piece as the electronic component element.

12. A piezoelectric device, comprising: the electronic component-use package as claimed in claim 3; and a piezoelectric vibration piece as the electronic component element.

13. A piezoelectric device, comprising: the electronic component-use package as claimed in claim 4; and a piezoelectric vibration piece as the electronic component element.

14. A piezoelectric device, comprising: the electronic component-use package as claimed in claim 5; and a piezoelectric vibration piece as the electronic component element.

15. A piezoelectric device, comprising: the electronic component-use package as claimed in claim 6; and a piezoelectric vibration piece as the electronic component element.

16. A piezoelectric device, comprising: the electronic component-use package as claimed in claim 7; and a piezoelectric vibration piece as the electronic component element.

17. A piezoelectric device, comprising: the electronic component-use package as claimed in claim 8; and a piezoelectric vibration piece as the electronic component element.

Description

BRIEF DESCRIPTION OF THE DRAWINGS

[0029] FIG. 1 is a sectional view of a crystal vibrator by way of example of a piezoelectric device according to an embodiment of the invention.

[0030] FIG. 2 is a bottom surface view of the crystal vibrator illustrated in FIG. 1.

[0031] FIG. 3 is a perspective view of the crystal vibrator illustrated in FIG. 1 from its bottom-surface side.

[0032] FIG. 4 is a drawing illustrated to describe, as per stress distribution, directions in which solder cracks progress and spread.

[0033] FIG. 5 is a bottom surface view illustrated to describe an angle of chamfer of a chamfered part.

[0034] FIG. 6 are drawings of different angles of chamfer evaluated in a simulation test.

[0035] FIG. 7 is a perspective overall view of a simulation model.

[0036] FIG. 8 is a perspective view of a fourth part of the simulation model used in the simulation test.

[0037] FIG. 9 is a contour drawing of a maximum principal strain in a solder-applied part

[0038] FIG. 10 is a contour drawing of a principal strain along an X-coordinate direction.

[0039] FIG. 11 is a contour drawing of a principal strain along a Y-coordinate direction.

[0040] FIG. 12 is a graphical illustration of changes per angle of chamfer in the principal strain along the X-coordinate direction.

[0041] FIG. 13 is a graphical illustration of changes per angle of chamfer in the principal strain along the Y-coordinate direction.

[0042] FIG. 14 is a graphical illustration of average values, taken per angle of chamfer , of principal stains in vicinity of points A and B.

[0043] FIG. 15 is a graphical illustration plotted with greater average values of the principal strain averages in vicinity of the points A and B of FIG. 14.

[0044] FIG. 16 are drawings of other chamfered parts evaluated in the simulation test.

[0045] FIG. 17 is a bottom surface view of a base illustrated to describe the opening width of a castellation.

[0046] FIG. 18 are drawings of castellations that differ in opening width evaluated in the simulation test.

[0047] FIG. 19 are contour drawings of maximum principal strains in solder-applied parts of the castellations of FIG. 18 that differ in opening width.

[0048] FIG. 20 are contour drawings of principal strains along the X-coordinate direction of the solder-applied parts in the castellations of FIG. 18 that differ in opening width.

[0049] FIG. 21 is a graphical illustration of changes in principal strains between the points A and B of FIG. 20.

[0050] FIG. 22 is a perspective view of a crystal vibrator according to another embodiment of the invention from its bottom-surface side.

DETAILED DESCRIPTION OF THE INVENTION

[0051] Hereinafter, embodiments of the invention are described in detail referring to the accompanying drawings. In an embodiment described below, a crystal vibrator is described by way of example of a piezoelectric device of surface mounting type.

[0052] FIG. 1 is a sectional view of a crystal vibrator according to an embodiment of the invention. FIG. 2 is a bottom surface view of the crystal vibrator illustrated in FIG. 1. FIG. 3 is a perspective view of the crystal vibrator from its bottom-surface side.

[0053] As illustrated in FIG. 1, a crystal vibrator 1 according to this embodiment has, as an exemplified electronic component element, a crystal vibration piece 2 including AT-cut crystals, and a package 3 that holds and hermetically seals the crystal vibration piece 2. The package 3 includes a base 4 and a lid 5. The base 4 has a recessed portion with an opening on its upper side, in which the crystal vibration piece 2 is placed and held. The lid 5 is for hermetical seal of the crystal vibration piece 2 held in the base 4. An internal space 20 is hermetically sealed by joining the lid 5 to the opening of the base 4 with a sealing material 6. In this internal space 20, the crystal vibration piece 2 is electromechanically bonded with, for example, an electro conductive adhesive 7 to an electrode pad (not illustrated in the drawings) of the base 4.

[0054] The base 4 is made from a ceramic material, for example, alumina. As illustrated in FIG. 1, the base 4 has a box-like shape formed by a bottom portion 4a and a bank portion 4b extending upward along the outer periphery of the bottom portion 4a. The base 4 is formed in an upper-opening recessed shape by stacking ceramic layers and sintering them together.

[0055] At four corner parts on the outer periphery of the base 4 substantially rectangular in plan view, castellations 8 to 11 dented inward are formed as illustrated in FIGS. 2 and 3, and they are extending from the upper surface to the bottom surface of the base 4. On a side surface of the base 4 between the castellations 8 and 11 and a side surface of the base 4 between the castellations 9 and 11, castellations 12 and 13 dented inward are formed, and they are vertically extending. The castellations 12 and 13 are formed at central parts on opposing short sides of the base 4 substantially rectangular in plan view.

[0056] As illustrated in FIG. 3, side surface electrodes 14 and 15 (side surface electrode 15 is not illustrated in the drawing) are formed at lower parts of the vertically extending castellations 12 and 13, i.e., at parts of these castellations closer to the bottom surface of the base 4.

[0057] The side surface electrodes 14 and 15 are electrically connected to a pair of terminal electrodes 16 and 17 formed on the bottom surface of the base 4. These terminal electrodes 16 and 17 are connected, with an electro conductive jointing material such as solder, to a circuit board externally provided. A state of connection then may be determinable by checking whether the solder has climbed up on the castellations 12 and 13 where the side surface electrodes 14 and 15 are formed.

[0058] The terminal electrodes 16 and 17 on the bottom surface of the base 4 are two symmetrical terminals facing each other along the opposing short sides. The terminal electrode 16 has two opposing chamfered parts 16.sub.1 and 16.sub.2 facing two corner parts on both sides of one of the short sides. The terminal electrode 17 has two opposing chamfered parts 17.sub.1 and 17.sub.2 facing two corner parts on both sides of the other short side. The chamfered parts 16.sub.1 and 16.sub.2, and 17.sub.1 and 17.sub.2 have inclined planar faces formed by chamfering the corner parts of the terminal electrodes 16 and 17.

[0059] The terminal electrodes 16 and 17 are rectangular in plan view in any parts thereof but where the castellations continuous to the side surface electrodes 14 and 15 and the chamfered parts 16.sub.1 and 16.sub.2, and 17.sub.1 and 17.sub.2 are formed. The rectangular terminal electrodes 16 and 17 are formed with their short sides facing the long sides of the rectangular bottom surface of the base 4, and their long sides facing the short sides of the bottom surface.

[0060] On the terminal electrodes 16 and 17, bumps 16B and 17B are formed substantially alike but slightly smaller in area in plan view than the terminal electrodes 16 and 17. The bumps 16B and 17B, as with the terminal electrodes 16 and 17, have chamfered parts 16.sub.1B and 16.sub.2B, 17.sub.1B and 17.sub.2B facing the four corner parts of the rectangular bottom surface of the base 4. The chamfered parts 16.sub.1B and 16.sub.2B, 17.sub.1B and 17.sub.2B of the bumps 16B and 17B have inclined planar faces formed by chamfering similarly to the chamfered parts 16.sub.1 and 16.sub.2, 17.sub.1 and 17.sub.2 of the terminal electrodes 16 and 17.

[0061] The bumps 16B and 17B are formed to be integral with the terminal electrodes 16 and 17 by stacking metalized (with tungsten or molybdenum) layers substantially equally shaped on upper parts of the terminal electrodes 16 and 17 metalized with the same metal.

[0062] The terminal electrodes 16 and 17 and the bumps 16B and 17B are both structurally characterized in that these metalized materials are sintered to be integral with the base 4, the metallized upper parts are plated with nickel, and the nickel-plated upper parts are further overlaid with gold.

[0063] The terminal electrodes 16 and 17 are electrically connected to the electrode pad (not illustrated in the drawings) in the internal space 20 of the base 4 illustrated in FIG. 1 through the side surface electrodes 14 and 15 formed on the castellations 12 and 13.

[0064] Extraction electrodes (not illustrated in the drawings) of the crystal vibration piece 2 are connected to the electrode pad with, for example, the electro conductive adhesive 7, and the crystal vibration piece 2 is thereby held in the base 4. On front and back surfaces of the crystal vibration piece 2 are formed the extraction electrodes and a pair of driving electrodes also not illustrated in the drawings.

[0065] The lid 5 for hermetical seal of the base 4 is made from a ceramic material such as alumina in the form of a plate. The lid 5 is sealably bonded to the base 4 with the sealing material 6 such as glass. The lid 5, though rectangular in plan view similarly to the base 4, is shaped slightly smaller than the base 4.

[0066] The crystal vibration piece 2 is placed and held in the internal space 20 of the base 4 thus structured and sealed therein by the lid 5. Then, the crystal vibration piece 2 is further hermetically sealed by, for example, fusion bonding using a heating furnace. As a result, a piezoelectric device using the electronic component-use package is obtained.

[0067] The crystal vibrator, a final product, is then joined, with an electro conductive material such as solder, to an upper part of the electrode pattern on the circuit board made from a glass epoxy material.

[0068] This embodiment provides for a scheme described below to deter the solder crack progression with an aim to improve installation and bonding reliabilities between the electronic component-use package and the circuit board.

[0069] In case of any difference between coefficients of thermal expansion of the electronic component-use package and the circuit board, generating stress acting upon the solder used as an electro conductive material that joins the package to the circuit board, the solder is likely to start to crack in maximum stress-bearing sections S max in vicinity of outer-peripheral corner parts of the bottom surface of the base 4 as illustrated in FIG. 4. The heavy stress may continuously affect cracks generated in the solder, causing the cracks to progress and spread toward minimum stress-bearing sections S min at the center of the bottom surface of the base 4. In the end, the cracks may be spread all over the terminal electrodes 16 and 17, finally destroying the fusion bond between the package and the circuit board.

[0070] The inventors of this invention earnestly worked on a solution for determent of the crack progression. Focusing on the chamfered parts 16.sub.1 and 16.sub.2, and 17.sub.1 and 17.sub.2 of the terminal electrodes 16 and 17 facing the corner parts of the base 4, they finally found it effective to define a certain range of angles for their angles of chamfer. In this embodiment, the chamfered parts 16.sub.1B and 16.sub.2B, 17.sub.1B and 17.sub.2B are formed on the bumps 16B and 17B as well as the terminal electrodes 16 and 17, which are all alike in shape in plan view.

[0071] In search of chamfered parts shaped effectively for solder crack control, the inventors of this invention carried out a solder crack simulation test directed to the finite element method-based structural analyses. They verified, through the simulation test, solder strain differences between the terminal electrodes 16 and 17 on the back-surface side that are associated with their different shapes to find out desirable shapes of the chamfered parts.

[0072] FIG. 5 is a bottom surface view of the base 4 illustrated to describe the solder crack simulation test. Referring to this drawing, a description is given below to the chamfered part 16.sub.1B of the bump 16B of the terminal electrode 16.

[0073] The solder crack simulation test included changes in the angle of chamfer of the chamfered part 16.sub.1B of the solder bump 16. The next paragraph defines the angle of chamfer of the chamfered part 16.sub.1B.

[0074] First, a reference line L2 for bump is defined. The reference line L2 for bumps refers to a perpendicular line to a straight line L1 connecting a center O1 on an inner end of the terminal electrode 16 to a peak point V1 at a corner part of the bottom surface of the base 4 and passing through the chamfered part 16.sub.1B of the bump 16B. The center O1 on an inner end of the terminal electrode 16 specifically refers to a center point on one of long opposing sides of the terminal electrode 16 substantially rectangular in plan view that is closer to a center O of the bottom surface of the base 4.

[0075] An angle made by the reference line L2 for bump and a straight line L3 along the planar face of the chamfered part 16.sub.1B of the bump 16B is defined as the angle of chamfer of the chamfered part 16.sub.1B of the bump 16B.

[0076] FIG. 5 is a drawing that explicitly illustrates the angle of chamfer . The angle of chamfer of the chamfered part 16.sub.1B of the bump 16B illustrated in this drawing is =0 degree, meaning that the straight line L3 along the planar face of the chamfered part is coincident with the reference line L2 for bump. In this drawing, however, the straight line L3 is inclined on purpose relative to the planar face of the chamfered part, so that the angle of chamfer is distinctly seeable.

[0077] The solder crack simulation test, as well as changing the angle of chamfer of the chamfered part 16.sub.1B of the bump 16B, changed the angle of chamfer of the chamfered part 16.sub.1 of the terminal electrode 16. A reference line L8 refers to a perpendicular line to the straight line L1 connecting the center O1 on the inner end of the terminal electrode 16 to the peak point V1 at the corner part of the bottom surface of the base 4 and passing through the chamfered part 16.sub.1 of the terminal electrode 16. The angle of chamfer of the chamfered part 16.sub.1 of the terminal electrode 16 is defined as an angle made by the reference line L8 and a straight line along the planar face of the chamfered part 16.sub.1 of the terminal electrode 16.

[0078] The reference line L8 that defines the angle of chamfer of the chamfered part 16.sub.1 of the terminal electrode 16 and the reference line L2 that defines the angle of chamfer of the chamfered part 16.sub.1B of the bump 16B are both perpendicular lines to the straight line L1 connecting the center O1 on the inner end of the terminal electrode 16 to the peak point V1 at the corner part of the bottom surface of the base 4 and passing through the chamfered part 16.sub.1 of the bump 16. Further, these reference lines L2 and L8 are perpendicular lines in parallel with each other and passing through the chamfered part 16.sub.1 of the terminal electrode 16 and the chamfered part 16.sub.1B of the bump 16B. The reference lines L2 and L8 are lines passing through points of intersection at which the straight line L1 intersects with the planar faces of the chamfered parts 16.sub.1 and 16.sub.1B.

[0079] According to this embodiment, the chamfered part 16.sub.1 of the terminal electrode 16 and the chamfered part 16.sub.1B of the bump 16B1 have their angles of chamfer be changed so that the planar faces of these chamfered parts are in parallel with each other, as illustrated in FIG. 5. The chamfered part 16.sub.1 of the terminal electrode 16 and the chamfered part 16.sub.1, of the bump 16B, therefore, have equal angles of chamfer .

[0080] In this solder crack simulation test, the angles of chamfer of the chamfered part 16.sub.1 of the terminal electrode 16 and the chamfered part 16.sub.1B of the bump 16B were each changed by 5 degrees clockwise and counterclockwise, up to 15 degrees in both directions, as illustrated in FIGS. 6 (a) to (f).

[0081] FIG. 7 is a drawing of the whole structure of a model used in the simulation test. This simulation model has a structure in which an electronic component-use package including the ceramic base 4 and the ceramic lid 5 joined to the base 4 is mounted on and joined to a glass epoxy substrate 19 with a solder 18.

[0082] In this simulation model, its structural elements were respectively sized as below; bottom surface of the base 4 was sized 3.2 mm2.5 mm, terminal electrodes 16 and 17 were sized 1.2 mm2.3 mm, and glass epoxy substrate 19 was sized 6.0 mm5.0 mm1.6 mm.

[0083] The finite element method-based structural calculations used one-fourth part of the whole simulation model of FIG. 7, the one-fourth part of which is a symmetrical part including one corner part as illustrated in this drawing with a broken line. In the example illustrated in FIG. 7, the one corner part is a corner part of FIG. 2 with the castellation 11 formed thereon.

[0084] A load in this simulation was +100 C., which was uniformly applied to the whole model, and conditions at +125 C. were calculated on the basis of +25 C. being a reference load. Specifically, in this crack simulation, linear analyses was carried out with room temperature (25 C.) at which stress starts (stress-free temperature) and the application of thermal loads up to 125 C.

[0085] Table 1 shows physical values of the materials of the structural elements illustrated in FIG. 8 illustrating an enlarged view of the simulation model, specifically, terminal electrode 16: tungsten (W), base 4 and lid 5: ceramics, sealing material 6: flint glass, electro conductive material: solder 18, and glass epoxy substrate 19: FR-4.

TABLE-US-00001 TABLE 1 Coefficient Young's Poisson's of linear modulus (GPa) ratio expansion W 407 0.17 4.5 Ceramics 316 0.24 7.2 Flint 80.1 0.27 8.5 Glass Solder 38.5 0.38 21.7 FR-4 27 0.15 14

[0086] The result of this simulation is hereinafter described.

[0087] Any cracks in the solder are greatly affected by strain variations imposed on the solder. Therefore, the inventors placed their focus on the maximum principal strain of the solder. The maximum principal strain is a value calculated by coordinate rotating computation of six components of the stress tensor that are maximized in dilation direction.

[0088] FIG. 9 is a contour drawing of the maximum principal strain in a solder-applied part. FIG. 9 illustrates the solder-applied part alone of the simulation model illustrated in FIGS. 7 and 8. This solder-applied part includes partial shapes 16 and 16B corresponding to each of the terminal electrode 16 and the bump 16B, and further includes a fillet 12 extending upward corresponding to the castellation 2.

[0089] This drawing shows a heavy principal strain generated in a peripheral part 16.sub.2 corresponding to the chamfered part 16.sub.2 of the terminal electrode 16.

[0090] The principal strains at different angles of chamfer mentioned earlier were evaluated, which is described below.

[0091] As illustrated in FIG. 10, a point A at a corner part of the solder in its short-side direction was defined as a reference X coordinate 0, and the principal strain along an X-coordinate direction coincident with the short-side direction of the terminal electrode 16 was calculated for each of the angles of chamfer at a plurality of points including the point A and points on both sides of the point A, as illustrated with a line L4.

[0092] As illustrated in FIG. 11, a point B at the corner part of the solder in its long-side direction was similarly defined as a reference Y coordinate 0, and the principal strain along a Y-coordinate direction coincident with the long-side direction of the terminal electrode 16 was calculated for each of the angles of chamfer at a plurality of points including the point B and points on both sides of the point B, as illustrated with a line L5.

[0093] FIG. 12 shows principal strain changes along the X-coordinate direction at different angles of chamfer ; =0 degree (reference), +10 degrees, +15 degrees, 10 degrees, and 15 degrees. Referring to FIG. 12, the lateral axis (X coordinate) shows positions along the line L4, where the point A of FIG. 10 is the reference X coordinate 0, while the vertical axis shows the principal strains along the X-coordinate direction.

[0094] FIG. 13 shows principal strain changes along the Y-coordinate direction at different angles of chamfer ; =0 degree (reference), +10 degrees, +15 degrees, 10 degrees, and 15 degrees. Referring to FIG. 13, the lateral axis (Y coordinate) shows positions along the line L5, where the point B of FIG. 11 is the reference Y coordinate 0, while the vertical axis shows the principal strains along the Y-coordinate direction.

[0095] As illustrated in FIG. 12, the principal strains along the X-coordinate direction are relatively greater near the point A, reference X coordinate. As illustrated in FIG. 13, the principal strains along the Y-coordinate direction are relatively greater near the point B, reference Y coordinate.

[0096] Average values, taken per the angle of chamfer , of the principal strains along the X-coordinate direction and the Y-coordinate direction in the range of 0.05 to +0.05 near the reference points A and B were respectively calculated.

[0097] FIG. 14 shows averages value of the principal strains along the X-coordinate direction near the point A at the corner part and average values of the principal strains along the Y-coordinate direction near the point B at the corner part at different angles of chamfer ; =15 degrees, 1.0 degrees, 5 degrees, 0 degree, 5 degrees, 10 degrees, and 15 degrees.

[0098] Among the average values of the principal strains along the X-coordinate direction near the corner point A and of the principal strains along the Y-coordinate direction near the corner points B at the different angles of chamfer of FIG. 14, the values with greater strains were extracted and plotted in FIG. 15.

[0099] It is known from FIG. 15 that the principal strain average values are smaller at angles of chamfer more approximate to =0 degree. In order to reduce the principal strains for crack control, the angle of chamfer may preferably range in 0.10 degrees, and more preferably range in 5 degrees.

[0100] FIGS. 16 (a) and (b) illustrate other optional shapes, apart from the planar shape described so far, of the chamfered parts of the terminal electrodes 16 and 17 and the bumps 16B and 17B respectively facing the corner parts of the base 4. FIG. 16 (a) is a drawing of chamfered parts 16.sub.1-R and 16.sub.1B-R rounded so as to bulge outward (outer-round shape), and FIG. 16 (b) is a drawing of chamfered parts 16.sub.1-R and 16.sub.1B-R dented inward (inner-round shape). A simulation test was carried out on these optionally-shaped chamfered parts, which demonstrated greater principal strains in both of these chamfered parts in contrast to the planar chamfered parts.

[0101] As for the terminal electrodes 16 and 17 formed on the bottom surface of the base 4 and the bumps 16B and 17B formed further thereon, this embodiment regulates the angles of chamfer of their chamfered parts 16.sub.1 to 16.sub.4, 17.sub.1 to 17.sub.4, and 16.sub.1B to 16.sub.4B to range in 10 degrees, or preferably to range in 5 degrees. A possible scenario with the electro conductive material that joins the terminal electrodes 16 and 17 to the circuit board, such as solder, is that cracks originate in any of the maximum stress-bearing sections at the outer peripheral corner parts on the base bottom surface progress and then spread toward the minimum stress-bearing sections at the center on the base bottom surface. The chamfered parts 16.sub.1 to 16.sub.4, 17.sub.1 to 17.sub.4, and 16.sub.1B to 16.sub.4B, however, may serve to effectively disperse the stress that would otherwise be spread and may also serve to deflect the crack progressing direction. These advantageous effects may successfully deter the crack progression.

[0102] So far were described the angles of chamfer of the chamfered parts 16.sub.1, 16.sub.2, 17.sub.1, 17.sub.2, 16.sub.1B, 16.sub.2B, 17.sub.1B, and 17.sub.2B of the terminal electrodes 16 and 17 and the bumps 16B and 17B. This embodiment further regulates opening sizes of the castellations 12 and 13 formed on the side surfaces of the base 4 as hereinafter described, thereby further effectively suppressing the occurrence of solder cracks.

[0103] FIG. 17 is a bottom surface view of the base 4 illustrated to describe sizes of the castellations 12 and 13 formed on both side surfaces of the base 4. While the size of the castellation 12 alone is described below, the same goes for the other castellation 13.

[0104] In this embodiment, referring to the drawing, C1 and C2 refer to points of intersection at which extension lines L6 and L7 respectively intersect with a short side of the bottom surface of the base 4. The extension lines L6 and L7 are extending along the directions of chamfer of the opposing chamfered parts 16.sub.1 and 16.sub.2 of the terminal electrode 16 facing the corner parts at both ends of the short side. An opening width W of the castellation 12 formed substantially at the center of the short side, i.e., an opening width W of the castellation 12 on the side surface of the base 4 is small enough to fall between the points of intersection C1 and C2. The extension lines L6 and L7 are straight lines along the planar faces of the chamfered parts 16.sub.1 and 16.sub.2.

[0105] By arranging the opening width of the castellation 12 to be small enough to fall between the points of intersection at which the extension lines L5 and L46 along the planar faces of the chamfered parts 16.sub.1 and 16.sub.2 of the terminal electrode 16 intersect with the short side, the solder cracks may be more effectively suppressed. This advantageous effect is described below.

[0106] As illustrated in FIGS. 18 (a) to (c), the inventors of this invention carried out a solder crack simulation test on simulation models in which three castellations 12a to 12c respectively have opening widths W1, W2, and W3 that differ from the opening width W of the castellation 12. The angles of chamfer of the chamfered parts 16.sub.1 and 16.sub.2, 16.sub.1B and 16.sub.2B were set to the reference 0 degree. Comparing these opening widths, the opening width W1 is the smallest width (small), the opening width W2 is an intermediate width between W1 and W3 (mid-sized), and the opening width W3 is the greatest width (large).

[0107] As for castellations 12a and 12b illustrated in FIGS. 18 (a) and (b), their opening widths W1 and W2 are small enough to fall between the points of intersection C1 and C2. As for a castellation 12c illustrated in FIG. 18 (c), its opening width W3 is too large to fall between the points of intersection C1 and C2.

[0108] FIG. 19 show simulation results of the castellations 12a to 12c respectively with the opening widths W1, W2, and W3. FIGS. 19 (a) to (c) are contour drawings of maximum principal strains in solder-applied parts of the simulation models having three different castellations 12a to 12c illustrated in FIGS. 18 (a) to (c).

[0109] As illustrated in a circled area of FIG. 19 (c), the castellation 12c having a large opening width, in turn, reduces the chamfered part of the terminal electrode 16 formed at the angle of chamfer . As a result, adequate dispersion of the stress fails, producing a greater principal strain.

[0110] FIG. 20 are a contour drawing of solder principal strains along the Y-coordinate directions coincident with the long-side direction of the terminal electrode 16, wherein a point A refers to a corner part in the short-side direction (X-coordinate direction) of the terminal electrode 16, and a point B refers to a corner part in the long-side direction (Y-coordinate direction) of the terminal electrode 10.

[0111] FIG. 21 is a graphical illustration plotted with values of the principal strains between the points A and B.

[0112] Referring to FIG. 21, in contrast to the castellations 12a and 12b with the opening widths W1 and W2 small enough to fall between the points A and B, a significant increase of the principal strain, from an A-B mid point toward the point B, is observed in the castellation 12c with the greater opening width W3 than the interval between the points of intersection C1 and C2.

[0113] In this embodiment, the castellations 12 and 13 on the both side surfaces of the base 4 are formed so as to have their opening widths W fall between the points of intersection at which the extension lines along the directions of chamfer of the chamfered parts 16.sub.1 and 16.sub.2, 17.sub.1 and 17.sub.2 of the terminal electrodes 16 and 17 intersect with the short sides of the bottom surface of the base 4. Then, the castellations 12 and 13 may be favorably formed without compromising determent of the crack progression effected by the chamfered parts 16.sub.1 and 16.sub.2, 17.sub.1 and 17.sub.2 of the terminal electrodes 16 and 17. Further advantageously, adverse effects may be avoidable for the chamfered parts 16.sub.1B and 16.sub.2B, 17.sub.1B and 17.sub.2B of the bumps 16B and 17B that deter the crack progression in collaboration with the chamfered parts 16.sub.1 and 16.sub.2, 17.sub.1 and 17.sub.2 of the terminal electrodes 16 and 17.

[0114] The side surface electrodes 14 and 15 are formed in continuity with the terminal electrodes 16 and 17 on the castellations 12 and 13 on the side surfaces of the base 4 with opening widths small enough to fall between the points of intersection. When the terminal electrodes 16 and 17 are joined to the circuit board with an electro conductive jointing material such as solder, the solder partly climbs up on the side surface electrodes 14 and 15 of the castellations 12 and 13, forming fillets. This may increase the bonding strength, facilitating optical tests performed on the fillet shapes.

[0115] In this embodiment, the openings of the castellations 12 and 13 formed on the side surfaces of the base 4 are sized equally in upper and lower directions. In other embodiments of this invention, the openings of the castellations 12 and 13 may be sized differently in upper and lower directions.

[0116] FIG. 22 (a) is a perspective view of the base bottom surface illustrated with the castellations 12 and 13 having openings smaller in their upper parts than lower parts. FIG. 22 (b) is an enlarged view of the castellation 12 and its vicinity. Though the castellation 12 alone is illustrated in FIG. 22, the same goes for the other castellation 13.

[0117] As illustrated in FIG. 22 (b), the castellation 12 has an opening with an upper part 12.sub.2 smaller than a lower part 12.sub.1 having the side electrode 14 formed thereon.

[0118] In the illustrated examples, the opening upper part 12.sub.2 of the castellation 12 is smaller in both width and depth than the lower part 12.sub.1. Instead, the opening upper part 12.sub.2 may be smaller in width or depth than the lower part 12.sub.1.

[0119] The base 4 includes a plurality of multilayered ceramic layers. The smaller opening upper part 12.sub.2 of the castellation 12 includes at least an uppermost one of the plurality of layers, while the lower part 12.sub.1 includes the rest of the layers.

[0120] As illustrated in FIG. 1, the lid 5 is joined to the upper part of the base 4 to hermetically seal the base 4. In this embodiment, the castellations 12 and 13 formed on the side surfaces of the base 4 have openings smaller in size in their upper parts. This may increase a sealable area, affording an improved sealing performance.

[0121] On the other hand, the lower parts of the castellations 12 and 13 formed on the side surfaces of the base 4, where the side surface electrodes 14 and 15 are formed, are greater in opening size. Then, the solder, used as an electro conductive material, may successfully effect reliable and firm electrical connection.

[0122] In the embodiments described so far, the angles of chamfer of the chamfered parts 16.sub.1 to 16.sub.4, and 17.sub.1 to 17.sub.4 of the terminal electrodes 16 and 17 and the angles of chamfer of the chamfered parts 16.sub.1B and 16.sub.2B, 17.sub.1B and 17.sub.2B of the bumps 16B and 17B are all equal angles. However, some or all of the angles of chamfer of these chamfered parts may be arranged to differ.

[0123] The bumps 16B and 17B on the terminal electrodes 16 and 17 may or may not be formed.

[0124] In the embodiments described so far, the invention was applied to a crystal vibrator. This invention is not necessarily limited to crystal vibrators but may be applicable to other electronic components of surface mounting type such as crystal filters and crystal oscillators.

[0125] The package 3 described in the embodiments is equipped with the lid 5. This invention, however, includes lid-free packages.