Heavily doped semiconductor nanoparticles
09543385 ยท 2017-01-10
Assignee
- Yissum Research Development Company Of The Hebrew University Of Jerusalem Ltd. (Jerusalem, IL)
- Ramot at Tel-Aviv University Ltd. (Tel Aviv, IL)
Inventors
- Guy Cohen (Tel Aviv, IL)
- Oded Millo (Jerusalem, IL)
- David Mocatta (Gadera, IL)
- Eran Rabani (Har Adar, IL)
- Uri Banin (Mevasseret Zion, IL)
Cpc classification
C09K11/88
CHEMISTRY; METALLURGY
C09K11/61
CHEMISTRY; METALLURGY
B82Y10/00
PERFORMING OPERATIONS; TRANSPORTING
H01L21/22
ELECTRICITY
International classification
H01L29/06
ELECTRICITY
C09K11/88
CHEMISTRY; METALLURGY
C09K11/61
CHEMISTRY; METALLURGY
H01L21/02
ELECTRICITY
B01J13/00
PERFORMING OPERATIONS; TRANSPORTING
B82Y10/00
PERFORMING OPERATIONS; TRANSPORTING
H01L29/36
ELECTRICITY
Abstract
Herein, provided are heavily doped colloidal semiconductor nanocrystals and a process for introducing an impurity to semiconductor nanoparticles, providing control of band gap, Fermi energy and presence of charge carriers. The method is demonstrated using InAs colloidal nanocrystals, which are initially undoped, and are metal-doped (Cu, Ag, Au) by adding a metal salt solution.
Claims
1. A nanoparticle comprising a semiconductor material, the semiconductor material being doped with at least two atoms of a dopant material, wherein the at least two atoms of the dopant material are heterovalent to atoms of the semiconductor material, said at least two atoms of the dopant material being dispersed within the semiconductor material, and the nanoparticle is free of dopant islands within the nanoparticle and free of dopant islands on the surface of the nanoparticle.
2. A nanoparticle according to claim 1, wherein said at least two atoms of the dopant material alter the density of states of the semiconductor material.
3. The nanoparticle according to claim 1, wherein the nanoparticle consists of the semiconductor material doped with at least two atoms of the dopant material.
4. The nanoparticle according to claim 1, wherein an average length or diameter of the nanoparticle is in the range of 1 nm to 500 nm.
5. The nanoparticle according to claim 1, wherein the semiconductor material is selected from the group of elements consisting of Group I-VII, Group II-VI, Group III-V, Group IV-VI, Group III-VI, and Group IV semiconductors and combinations thereof.
6. The nanoparticle according to claim 5, wherein the semiconductor material is a Group I-VII material being selected from the group consisting of CuCl, CuBr, CuI, AgCl, AgBr, and AgI, or the semiconductor material is a Group II-VI material selected from the group consisting of CdSe, CdS, CdTe, ZnSe, ZnS, ZnTe, HgS, HgSe, HgTe, CdZnSe, ZnO and any combination thereof, or the semiconductor is a Group III-V material being selected from the group consisting of InAs, InP, InN, GaN, InSb, InAsP, InGaAs, GaAs, GaP, GaSb, AlP, AlN, AlAs, AlSb, CdSeTe, ZnCdSe and any combination thereof, or the semiconductor material is a Group IV-VI material being selected from the group consisting of PbSe, PbTe, PbS, PbSnTe, Tl.sub.2SnTe.sub.5 and any combination thereof, or the semiconductor material comprises an element of Group IV being selected from the group consisting of Si and Ge.
7. The nanoparticle according to claim 5, wherein the semiconductor material is selected from CdSe, CdS, CdTe, ZnSe, ZnS, ZnTe, HgS, HgSe, HgTe, CdZnSe, InAs, InP, InN, GaN, InSb, InAsP, InGaAs, GaAs, GaP, GaSb, AlP, AlN, AlAs, AlSb, CdSeTe, ZnCdSe, PbSe, PbTe, PbS, PbSnTe, Tl.sub.2SnTe.sub.5, RuS.sub.2, RuO.sub.2, MoS.sub.2, MoO.sub.3, RhS.sub.2, RuO.sub.4, WS.sub.2, WO.sub.2, Cu.sub.2S, Cu.sub.2Se, Cu.sub.2Te, CuInS.sub.2, CuInSe.sub.2, CuInTe.sub.2 and any combination thereof.
8. The nanoparticle according to claim 7, wherein the semiconductor material is selected from InAs, InP, InN, GaN, InSb, InAsP, InGaAs, GaAs, GaP, GaSb, AlP, AlN, AlAs, AlSb, CdSeTe, ZnCdSe and any combination thereof.
9. The nanoparticle according to claim 8, wherein the semiconductor material is selected from InAs, GaAs, GaP, GaSb, InP, InSb, AlAs, AlP, AlSb and InGaAs.
10. The nanoparticle according to claim 9, wherein the semiconductor material is InAs.
11. The nanoparticle according to claim 1, wherein the dopant material is selected from the group consisting of materials which atoms differ from atoms composing the semiconductor material by one or more valance electron(s).
12. The nanoparticle according to claim 11, wherein the dopant material is selected amongst metals and non-metal materials, said dopant being Li or Mg or Na or K or Rb or Cs or Be or Ca or Sr or Ba or Sc or Ti or V or Cr or Fe or Ni or Cu or Zn or Y or La or Zr or Nb or Tc or Ru or Mo or Rh or W or Au or Pt or Pd or Ag or Co or Cd or Hf or Ta or Re or Os or Ir or Hg or B or Al or Ga or In or Tl or C or Si or Ge or Sn or Pb or P or As or Sb or Bi or O or S or Se or Te or Po or F or Cl or Br or I or At, or any combination thereof.
13. The nanoparticle according to claim 12, wherein the dopant is selected from Ag and Cu.
14. The nanoparticle according to claim 1, wherein the nanoparticle material is InAs and said dopant is selected from Ag and Cu.
15. The nanoparticle according to claim 1, wherein the number of dopant atoms dispersed in the nanoparticle ranges from 110.sup.18 atoms per cm.sup.3 to 110.sup.23 atoms per cm.sup.3.
16. The nanoparticle according to claim 1, wherein the number of dopant atoms per nanoparticle is between 2 to 500.
17. The nanoparticle according to claim 1, wherein the nanoparticle is a n-doped material having negative charge carriers, or a p-doped material having positive charge carriers.
18. A device comprising a nanoparticle according to claim 1, wherein the nanoparticle is incorporated into a layer and/or a region of the device.
19. The device according to claim 18, wherein the device is a bipolar transistor in a form selected from n-p-n, p-n-p and n-i-p type transistor.
20. The device according to claim 18, wherein the device is selected from a diode; a transistor; an electronic circuit component; an integrated circuit; a detector; a switch; an amplifier; a transducer; a laser; a tag; a biological tag; a photoconductor; a photodiode; a photovoltaic cell; a light emitting diode (LED); a light sensor; a display; and a large area display array.
21. A method for manufacturing a doped semiconductor nanoparticle, said method comprising providing an undoped nanoparticle comprising a semiconductor material, and contacting said undoped nanoparticle with at least one doping material under conditions permitting dispersion of at least two atoms of said doping material within said semiconductor material to form a doped semiconductor nanoparticle that is doped with at least two atoms of a dopant material, wherein said at least two atoms of the dopant material are heterovalent to atoms of said semiconductor material, and the doped semiconductor nanoparticle is free of dopant islands within the doped semiconductor nanoparticle and free of dopant islands on the surface of the doped semiconductor nanoparticle.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
(1) In order to understand the invention and to see how it may be carried out in practice, embodiments will now be described, by way of non-limiting example only, with reference to the accompanying drawings, in which:
(2)
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(8)
DETAILED DESCRIPTION OF EMBODIMENTS
(9) The invention provides a family of novel doped nanoparticles and a process for their preparation, which permits doping semiconductor nanocrystals with doping atoms, and a specific embodiment relates to metal dopants. By changing the dopant type and concentration, exquisite control of the electronic properties, including the band gap and Fermi energy is achieved. The role of strong quantum confinement leading to localization of impurity levels, as well as disorder effects leading to band-tailing in small nanocrystals, have been studied experimentally and theoretically. The successful controlled doping provides n- and p-doped semiconductor nanocrystals which greatly enhance the potential application of such materials in solar cells, thin-film transistors, and optoelectronic devices.
(10) The addition of even a single impurity atom to a semiconductor nanocrystal with a diameter of 4 nm, and which contains about 1,000 atoms, leads to a nominal doping level of 710.sup.19 atoms per cm.sup.3. In a bulk semiconductor this is already within an exceedingly highly-doped limit, where metallic (degenerate) behavior is expected. Doping at this level in bulk semiconductors leads to the several effects summarized in
(11) A dramatically different situation arises for electronic impurity doping of nanocrystals due to the discrete nature of the quantum confined states (
(12) To dope InAs nanocrystals with different impurity atoms, the inventors of the present invention have modified a reaction used for gold growth onto semiconductor nanoparticles [17], demonstrating phase separation between InAs and impurity metal regions (domains). As
(13) Further support for the dispersion of impurities is provided by X-ray diffraction (data not shown), where no fingerprints of metal domains were detected while the InAs crystal structure was generally maintained. Some broadening of the peaks was observed, ascribed to a small degree of structural disorder. X-ray photoelectron spectroscopy (XPS) measurements of these samples were also performed indicating the presence of dopant atoms (Ag, Au or Cu) in the respective samples (data not shown). This suggests successful addition of these atoms to the InAs QDs. Indeed, extrapolating the diffusion parameter values to room temperature gives a diffusion length scale for Au in InAs of 10.sup.4 nm/24 h, far greater than the QD diameter, and large values are also extrapolated for Ag and Cu in InAs at room temperature.
(14)
(15) The effect of varying amounts of impurities on the first absorption peak and on the emission is shown in
(16) The amount of impurities in the QDs was estimated by the analytical method of inductively coupled plasma-atomic emission spectroscopy (ICP-AES,
(17) A first possible source of optical spectral shifts in such quantum confined particles may be related to size changes upon doping, but this was excluded by detailed sizing analysis (data not shown). An alternative source of the spectral shifts can be associated with electronic doping by the impurities. In
(18) Several changes were seen upon doping the QDs. Starting with the case of Au, the gap was similar to the undoped NC, consistent with the optical measurements. However, the features in the scanning tunneling spectroscopy (STS) spectra were washed out, suggesting that indeed Au entered the nanocrystal, perturbing the pristine level structure. More significant changes were seen for both the Cu and Ag cases, presented in the upper panel. Significant band-tailing into the gap and emergence of in-gap states in regions covering nearly 40% of the gap region were observed. In particular, in the Cu case, a shoulder on a tail-state structure was seen at bias values just below the 1S.sub.e conduction band doublet (which is remarkably preserved). Additionally, the doublet was superimposed on a notable rising background that increased to the region of the 1P.sub.e peaks that are not well resolved. For the Ag-doped QDs, there was a significant broadening and merging of features on the positive bias side, and on the negative bias side a background signal develops.
(19) A clear result of doping in bulk semiconductors was the shift of the Fermi level, which for n-type doping was close to the conduction band, and conversely, shifts to a lower energy close to the valence band, for p-type impurities. Remarkably, such shifts were clearly identified in the STS of the Cu and Ag doped QDs measured by the positions of the band edges relative to zero bias. While the zero bias position for the undoped case, as well as the Au doped case, was nearly centered in between the valence band and conduction band onsets, in the Cu-case the onset of the conduction band states nearly merges with the zero bias position. Considering that this relative shift corresponds to a relative measure of the Fermi level of the nanoparticle, this shift is clearly indicating n-type doping in this case. In contrast, for the Ag case, the zero bias was much closer to the onset of the valence band states. Therefore the Fermi level is now close to the valence band signifying p-type doping in this case.
(20) Chemical considerations for the doping of InAs with the different metal atom impurities can help to understand these observations. Cu can have a formal oxidation state of either Cu.sup.2+/1+. Moreover, its ionic radius is the smallest of the three impurities and therefore may be accommodated in interstitial sites within the InAs lattice. In such a case, one can expect that the Cu will partly donate its valence electrons to the QD (quantum dot) leading to n-type doping, consistent with the shift in the Fermi energy observed by STS. The incorporation of multiple impurities is expected to lead to the development of closely spaced impurity states, akin to the impurity band formed in the bulk. This band forms asymmetrically due to the disordered arrangement of the impurities in the QD, surpassing the energy of the 1S.sub.e NC state. The observed rising background in the STS curve signifies the presence of such an impurity band. This is a direct indication of the substantial modification of the DOS induced by the impurities in small QDs, corresponding to very highly doped behavior in the bulk. Revisiting the observed blue shift in the absorption, this is in line with the filling of the conduction and asymmetric impurity-band levels in heavily n-type doped QD, leading to a Moss-Burstein blue-shift in the absorption spectrum and minor shifts in the emission (
(21) Ag has a large radius, and is considered to be a substitutional impurity in III-V semiconductors. The replacement of an In atom, which possesses three valence electrons, with a Ag atom, which has only one valence electron, leads to an electron deficiency in the bonding orbitals causing p-type doping. This is reflected in the shift of the Fermi level, as seen in the STS data (
EXPERIMENTAL
Materials
(22) In(III)Cl.sub.3 (99.999+%), tris(trimethylsilyl) arsenide (TMS3As), trioctylphosphine (TOP, 90%; purified by vacuum distillation and kept in the glovebox), AuCl.sub.3 (99%), AgCl (99+%), AgNO.sub.3 (99+%), CuCl.sub.2 (99.999%), dodecylamine (DDA, 98%), didodecyldimethylammonium bromide (DDAB, 98%), toluene (99.8% anhydrous), methanol (99.8% anhydrous) were purchased from Sigma Aldrich except for (TMS.sub.3As) which was synthesized as detailed in the literature [17].
(23) Methods
(24) InAs Nanocrystal Synthesis
(25) The synthesis of InAs nanocrystals (NCs) was carried out under an inert atmosphere using standard Schlenck techniques.
(26) In a typical synthesis a mixture of indium and arsenic precursors were prepared by adding 0.3 g (1 mmol) of (TMS.sub.3As) to 1.7 g of a 1.4M InCl.sub.3 TOP solution (2 mmol in total). 1 ml of this solution was injected into a three neck-flask containing 2 ml of TOP at 300 C. under vigorous stirring. The temperature was then reduced to 260 C. and further precursor solution was added in order to achieve particle growth. The growth was monitored by taking the absorption spectra of aliquots extracted from the reaction solution. Upon reaching the desired size, the reaction mixture was allowed to cool to room temperature and was transferred into a glovebox. Anhydrous toluene was added to the reaction solution, and the nanocrystals were precipitated by adding anhydrous methanol. The size distribution of the nanocrystals in a typical reaction was on the order of 10%. This was improved using size selective precipitation with toluene and methanol as the solvent and anti-solvent, respectively.
(27) Metal-Atom Doping
(28) In a typical reaction a metal solution was prepared by dissolving 10 mg of the metal salt (CuCl.sub.2, AgNO.sub.3, AgCl or AuCl.sub.3), 80 mg DDAB and 120 mg of DDA in 10 ml of toluene. The Cu and Ag solutions prepared in this manner are respectively blue, colorless and yellow. The metal solution was then added drop-wise to a stirred 2 ml toluene solution of InAs NCs. After 15 minutes the absorption and emission of the solutions were measured. The Cu and Au samples were precipitated with methanol whilst the Ag sample was precipitated with acetone. The entire metal treatment procedure was carried out under inert conditions. The ratio of metal atoms to NCs in solution was estimated from the literature values of InAs NC absorption cross-sections.