Telecentric, wide-field fluorescence scanning systems and methods

Abstract

Wide-field fluorescence imaging systems and methods. A bi-telecentric optical imaging system comprising imaging optics arranged and positioned such that a first telecentric space is created or exists between a sample platform and an entry aperture stop wherein Principal or chief rays from a plurality of field points on the sample platform are parallel to each other when passing through a first filter; and such that a second telecentric space is created or exists between a light detector and an exit aperture stop wherein the Principal or chief rays from the plurality of field points are parallel to each other when passing through a second filter. In this manner, light collected from different points in the field of view pass through the first filter at the same angles and also through the second filter at the same angles to thereby reduce or eliminate angular spectral shifting effects.

Claims

1. A fluorescence imaging system, comprising: a source subsystem having: a sample platform holding a fluorescent material; a light source that illuminates the fluorescent material with excitation light in an absorption band of the fluorescent material; and a first filter that passes wavelengths of light other than the excitation light, the first filter being positioned in a first light path between the sample platform and an entry aperture stop of a bi-telecentric optical imaging system; a detector subsystem for detecting light from the fluorescent material, comprising; a light detector having an array of sensing locations; and a second filter that passes wavelengths of light in an emission band of the fluorescent material, the second filter being positioned in a second light path between the light detector and an exit aperture stop of the bi-telecentric optical imaging system; and the bi-telecentric optical imaging system comprising imaging optics arranged and positioned such that a first telecentric space exists in the first light path between the sample platform and the entry aperture stop wherein Principal rays from a plurality of field points on the sample platform are parallel to each other when passing through the first filter; and such that a second telecentric space exists in the second light path between the light detector and the exit aperture stop wherein the Principal rays from the plurality of field points are parallel to each other when passing through the second filter, wherein contiguous field points on the sample platform are simultaneously imaged onto contiguous sensing locations on the light detector.

2. The imaging system of claim 1, wherein the bi-telecentric optical imaging system comprises an Offner relay mirror system arrangement comprising a first mirror element having a spherical mirror surface and a second mirror element having a spherical mirror surface, wherein the entry aperture stop and the exit aperture stop each comprise a portion of the first mirror element.

3. The imaging system of claim 2, wherein the first mirror element presents a convex-shaped mirror surface, and wherein the second mirror element presents a concave-shaped mirror surface.

4. The imaging system of claim 1, wherein the bi-telecentric optical imaging system comprises a bi-telecentric lens arrangement, wherein the entry aperture stop includes a first refractive lens element and wherein the exit aperture stop includes a second refractive lens element.

5. The imaging system of claim 1, wherein the light source emits a beam of uniform illumination having a line-shaped profile when impinging on the fluorescent material.

6. The imaging system of claim 1, wherein the light source comprises a diode laser.

7. The imaging system of claim 1, wherein the light detector comprises a CCD array detector.

8. The imaging system of claim 7, wherein the contiguous field points on the sample platform are simultaneously imaged onto contiguous sensing locations on the CCD array detector.

9. A method of imaging a fluorescent material that absorbs light in an absorption band of wavelengths and that emits fluorescent light in an emission band of wavelengths, the method comprising: a) illuminating a first portion of a fluorescent material on a sample platform with an illumination beam having excitation light in the absorption band; and b) detecting emissions from the first portion of fluorescent material using a detector system including a light detector having an array of sensing locations, a bi-telecentric optical imaging system, a first filter that passes wavelengths of light other than the excitation light, the first filter being positioned in a first light path between the sample platform and an entry aperture stop of the bi-telecentric optical imaging system, and a second filter that passes wavelengths of light in the emission band, the second filter being positioned in a second light path between the light detector and an exit aperture stop of the bi-telecentric optical imaging system, wherein the bi-telecentric optical imaging system includes imaging optics arranged and positioned such that a first telecentric space exists in the first light path between the sample platform and the entry aperture stop wherein Principal rays from a plurality of field points on the sample platform are parallel to each other when passing through the first filter; and such that a second telecentric space exists in the second light path between the light detector and the exit aperture stop wherein the Principal rays from the plurality of field points are parallel to each other when passing through the second filter, and wherein contiguous field points on the sample platform are simultaneously imaged onto contiguous sensing locations on the detector to form a first detector image.

10. The method of claim 9, further including moving one or both of the sample platform and the illumination beam in a direction substantially parallel with a surface defined by the sample platform so as to illuminate a second portion of the fluorescent material, and repeating the step of detecting to form a second detector image.

11. The method of claim 10, further including combining the first and second detector images.

12. The method of claim 9, further including repeatedly moving one or both of the sample platform and the illumination beam in a direction substantially parallel with a surface defined by the sample platform so as to illuminate a multiple portions of the fluorescent material, and repeating the step of detecting to form multiple second detector images, and combining the first detector images and the multiple second detector images.

13. The method of claim 9, wherein illuminating includes shaping an output of a laser beam so that the beam has a line-shaped profile where it impinges on the sample platform.

14. The method of claim 9, wherein the bi-telecentric optical imaging system comprises an Offner relay mirror system arrangement including a first mirror element having a spherical mirror surface and a second mirror element having a spherical mirror surface, wherein the entry aperture stop and the exit aperture stop each comprise a portion of the first mirror element.

15. The method of claim 9, wherein the bi-telecentric optical imaging system comprises a bi-telecentric lens arrangement, wherein the entry aperture stop includes a first refractive lens element and wherein the exit aperture stop includes a second refractive lens element.

16. The method of claim 9, wherein the light detector comprises a CCD array detector.

Description

BRIEF DESCRIPTION OF THE DRAWINGS

(1) FIG. 1 shows a typical absorption and emission spectra for LI-COR's IRDye 800cw.

(2) FIG. 2 shows a telecentric space created between the imaging optics and the detector array so that light collected from different points on the target goes through the emission filter with the same angular range.

(3) FIG. 3a depicts area imaging, which includes imaging a whole area at a time.

(4) FIG. 3b depicts line imaging, where one line is imaged at a time.

(5) FIGS. 4a and 4b show a front view and side view, respectively, of a fluorescence imaging system according to one embodiment.

(6) FIGS. 5a and 5b show the front view and side view, respectively, of a fluorescence imaging system according to another embodiment.

(7) FIGS. 6a and 6b show an example of a laser line generator 301 that can be used with the embodiment shown in 5a and 5b

(8) FIG. 7 shows the line generator optical elements of FIGS. 6a and 6b combined with the bi-telecentric, line imaging optical elements of FIGS. 5a and 5b together in one system according to an embodiment.

(9) FIGS. 8a and 8b show a front view and side view, respectively, of a fluorescence imaging system according to another embodiment.

(10) FIGS. 9a and 9b show a front view and side view, respectively, of a fluorescence imaging system according to another embodiment.

DETAILED DESCRIPTION

(11) To image in fluorescence, a target (e.g., containing fluorescent material) is illuminated by an optical signal having a first spectral content (excitation light) where a portion of such a signal is absorbed by at least part of the target and re-emitted as optical signal of a second spectral content (emission light). The emission light is then detected by a detection system as a measure of the amount present of that target at that location. Imaging a fluorescently labeled area, therefore, requires excitation light delivered to the target area, an imaging system that collects light from the target area and projects it onto an optical detector (e.g., detector array), and a means to separate the emitted fluorescence light from the portion of excitation light that makes its way through the imaging system. The latter, typically, includes one or more interference filters.

(12) Wide-Field imaging, as considered herein, includes collecting light from a contiguous area and projecting it onto a detector array, such as a CCD or other detector having an array of sensing locations or pixels, at the same time in a way that preserves the relative locations of each point within the contiguous area. This is different from collecting light from one point at a time and sequentially scanning to a different point in order to cover a larger area, i.e. point scan imaging. It is also different from collecting light from a large area and condensing the total amount of light onto a detector and reading it as total signal. The latter is common for many measurement techniques that do not require specific location information.

(13) One skilled in the art will understand that other types of useful sensors or detectors and arrays of sensors, such as CCD and CMOS sensors can be used. Other useful sensors might include photodiodes, avalanche photodiodes, silicon photomultiplier devices, an array of photomultiplier tubes, a focal plane array, etc.

(14) Two types of wide-field imaging include area imaging and line scanning FIG. 3a depicts area imaging, which includes imaging a whole area 102a at a time, the size of which depends on various design factors that include the desired resolution, available components (detectors, imaging lenses, etc. . . . ), cost, sensitivity, and speed. Target areas that are larger than can be imaged in one shot are covered by successively imaging different sub-areas and stitching them together through software. Various technologies exist in this class each optimized for a particular application and/or focusing on a particular benefit. In this depiction, fluorescently labeled target area is on top of sample platform or medium 101 (e.g., a slide) and can cover the whole x-y surface area on the platform or a portion of it. The wide-field imaging system 103 images the sub-area 102a onto the array detector 104. If imaging an area larger than 102a is needed then platform 101 and/or the imaging system are translated along the x- and/or y-direction and additional sub-area images are taken.

(15) FIG. 3b depicts line-scanning, where one line is imaged at a time. The length of line 102b is also dictated by similar design factors as is the case for area imaging. Here, a wide-field imaging system 103 images line 102b in a contiguous manner such that every point along that line is imaged at the same time. The array detector 104 can include one or multiple linear arrays, depending on the specific measurements desired. To cover an area here, typically sample platform 101 and/or the imaging system are translated along the x-axis and then stepped along the y-axis to take another pass.

(16) In both area imaging and line imaging applications, scanning can be achieved by moving the illumination light across the target area while the detection system and the target remain fixed, for example, using a scanning mirror or similar element that sequentially aims the illumination beam at different target locations over time and the detection system is accordingly aimed at these locations. As another example, scanning can be achieved by moving the sample platform relative to a fixed illumination beam and a fixed detection system, or by moving both the illumination and detection systems while holding the sample platform fixed.

(17) Telecentric imaging refers to the case where the chief rays from all the points being images are parallel to each other. A design can be telecentric in the object space where the Principal or chief rays are parallel to each other in the space between the 1.sup.st element of the imaging optics and the sample. On the other hand, a design that's telecentric in the image space has its Principal or chief rays between the last element of the imaging optics and the detector array parallel to each other. Referring to FIG. 2 again, each point xa, xb along the length of sample 10 generates a cone of light 11a, 11b surrounding a center ray 17a, 17b, called chief ray. This cone of light passes through aperture 16, where chief ray 17a, 17b passes through its center, and is then focused by the imaging lens 12. Because all the chief rays coming from sample 10 pass through the center of aperture 16, which in turn is located at the front focal length of lens 12, these chief rays would be collimated on the other side (detector side) of the lens 12 (creating telecentric space 18). In this manner, all the cones of light will have the same parallel direction, i.e. their chief rays are parallel to each other in telecentric space 18. Accordingly, each of cones of light 11a, 11b and from every point in between will undergo the same filtering effect by filter 15 so that for equal amount of light incident on filter 15 there is equal amount of light exiting it. Another benefit of telecentricity is that when the distance in a telecentric space changes, for example between lens 12 and detector 13 in FIG. 2, then the distance between the chief rays at the detector 13 remains unchanged. This is not the case for non-telecentric side between aperture 16 and sample 10. If the front distance between aperture 16 and sample 10 changes, both the focus changes but also the distances between where chief rays 17a, 17b, and every one in between hit sample 10 change as well which makes scaling on that side sensitive to focus errors.

(18) FIGS. 4a and 4b show a front view and side view, respectively, of a fluorescence imaging system 210 according to one embodiment. Fluorescence imaging system 210 as depicted includes an Offner relay mirror system having a primary mirror element 203a and a secondary mirror element 203b that together create a bi-telecentric 1:1 imaging system that approaches perfect imaging. Mirror elements 203a and 203b each present a generally spherical mirror surface, at least where light interacts with each element. This design leverages the symmetry present in this mirror system to create both object-space and image-space telecentric areas, enabling placement of both a rejection filter 207 and an emission filter 206 as depicted without sacrificing any light collection capability or imaging performance. For example, as shown, rejection filter 207 is positioned in the object-space telecentric area and the emission filter 206 is placed in the image-space telecentric area. In this manner all filtering is done with chief rays parallel to each other and distances between chief rays is unchanged when adjusting focus. The magnification of this imaging technique, and therefore location accuracy, is quite insensitive to focus errors and therefore image-to-image or pass-to-pass registration is very robust. The aperture stop defines the size of the cone of light collected by or admitted to the optical system. As shown in FIG. 4a, mirror element 203b acts as both the entry aperture stop and the exit aperture stop. That is, the object-space telecentric area is created or exists in the light path between the sample platform 200 and the portion of mirror element 203b defining the entry aperture stop, and the image-space telecentric area is created or exists in the light path between the detector 205 and the portion of mirror element 203b defining the exit aperture stop. The aperture stop is also where the chief rays pass through its center, i.e., cross the optical axis (for mirrors, light changes direction after it hits a mirror); mirror element 203b is where chief rays hit in the center (optical axis of that mirror).

(19) In certain aspects, rejection filter 207 includes one or more filter elements that reject (or filter out) excitation light wavelengths, while allowing other light wavelengths as desired to pass. Similarly, emission filter 206 includes one or more filter elements that allow emission band wavelengths to pass, while rejecting other wavelengths as desired. Examples of useful filters include notch filters to block most of the excitation light and band-pass filters to further block any residual excitation light leaking through the notch filter.

(20) Referring to FIG. 4a, a light source 201 generates an excitation light beam 202, preferably nearly collimated, that illuminates a portion of the sample area 200. Light source 201 may include a laser source (e.g., diode laser or other laser source), an LED, a broadband lamp, etc, and appropriate optional optical elements to shape the light beam as desired. The excitation light beam 202 may be configured to illuminate an area on the sample for area imaging applications as depicted, or it may be configured to illuminate a line on the sample for line scanning applications. From every point on the sample area 200 being imaged, there is a cone of light 208 that includes a chief ray at its center that passes through rejection filter 207 in a telecentric way, the chief ray is refocused by Offner mirror elements 203a and 203b to the image side where the chief ray passes through emission filter 206 also in a telecentric way before it reaches detector array 205, also perpendicularly to it, in a telecentric way. Optional folding mirror 204 is used to redirect the path for ease of packaging. FIG. 4b shows that imaging is telecentric in the y-z plane as well. With this imaging system, a strip area can be imaged in fluorescence under fully telecentric filtering conditions. Larger sample areas are covered by scanning the sample platform or the imaging system to other different areas and stitching all images together to produce a uniform, contiguous image of the desired total area.

(21) FIGS. 5a and 5b show the front view and side view, respectively, of a fluorescence imaging system 310 according to another embodiment. Fluorescence imaging system 310 includes a laser line scanning version of the all-telecentric Offner-based fluorescence relay system. Referring to FIG. 5a, a light source 301, such as a laser line source, generates excitation light and emits a focused line-shaped beam and projects it onto sample 300. The laser line is preferably shaped to focus on a line perpendicular to the plane of incidence, wherein the illuminating line is substantially uniform along its length and narrow in the other direction, for example diffraction limited. The fluorescence signal generated by this excitation line produces a cone of light from every point along that line with a chief ray at its center which passes through filter 307 in a telecentric way, re-imaged to the other side by the Offner relay mirrors 303a and 303b, passes through the emission filter 306, also in a telecentric way, and impinges upon the detector array 305 also in a telecentric way. FIG. 5b shows a y-z plane view which shows that the telecentric space in this embodiment is along the line being imaged which is along the y-axis. The width of the line in the x-direction is small, defined by the required scan step resolution. For example, for 5 m scan resolution, the width of the line is about 5 to about 20 m wide. The length of the line is matched to the length of the detector array or slightly longer (e.g., typically on the order of about 1 mm to about 10 mm).

(22) The laser line scanning embodiment presents a number of additional advantages. For example, in US 2012/0257087, which is hereby incorporated by reference in its entirety, a laser differential scan method is provided that reduces optical background from scattering type media such as tissue or membrane as well as the optical components in the imaging path. This type of improvement can also be integrated in the present embodiments to further enhance the sensitivity of the system. This is done through the use of a detector array where two line images are simultaneously acquired for every laser illumination position, one at the laser illumination location and another in neighboring regions where the main excitation beam does not reach. The latter is read as a line image of the background and is subtracted from the fluorescence line image. The resulting difference contains fluorescence signal and minimal background signal.

(23) Additional benefits of laser line scanning includes the availability of one direction (e.g., x-z plane) to tilt signals reflected by the filters away from the imaging path to further reduce background without negatively affecting the imaging performance along the line (e.g., y-z plane). In FIG. 5a, rejection filter 307 is shown as being tilted (e.g., tilt angle can be about 4 to about 8 degrees or more) so that most of its reflection falls away from the measurement area at sample 300. Also, emission filter 306 is similarly tilted in the x-z plane so that its reflection does not go back through the Offner imaging relay and reach sample 300.

(24) Yet another benefit of the Offner relay system is its reflective nature and therefore it is achromatic which makes it ready for combining more than one color without the need for any color related adjustments or corrections.

(25) An example of the components that can be used in the embodiment represented by FIGS. 5a and 5b include:

(26) 303a Front surface concave mirror with radius of curvature R=80 mm

(27) 303b Front surface convex mirror with radius of curvature R=40 mm

(28) 304 Front surface flat mirror

(29) 305 CCD detector

(30) 306 Emission Band-Pass filter, example 510 nm to 550 nm.

(31) 307 Rejection filter, example 500 nm Long-Pass.

(32) FIGS. 6a and 6b show an example of a laser line generator 301 that can be used with the embodiment shown in 5a and 5b . Laser line generator 301 includes a laser diode based system that generates a uniform laser line 302 and focuses it onto the sample plane 300. A laser diode 400 is collimated by a collimating lens 401, and passes through an excitation filter 402. The collimated, filtered output from filter 402, which typically is in the form of a Gaussian beam, enters next into a Line Generator lens 403 and then cylindrical lens 404 and cylindrical lens 405 to produce a collimated, uniform line which has a nearly flat-top (uniform) profile along the line length and Gaussian in the other direction. This collimated line is then focused in the Gaussian-beam plane onto the sample plane 300. Example of the components that can be used in the embodiment represented by FIGS. 6a and 6b are:

(33) 400 Laser diode, example Nichia's 488 nm laser diode.

(34) 401 Aspheric lens

(35) 402 Band-Pass filter centered at laser diode wavelength

(36) 403 Powell lens

(37) 404 Cylindrical lens, example F=12.5 mm

(38) 405 Cylindrical lens, example F=15 mm

(39) FIG. 7 shows the line generator optical elements of FIGS. 6a and 6b combined with the bi-telecentric, line imaging optical elements of FIGS. 5a and 5b together in one system. Additional mirror elements 406 and 407 are included to redirect beam 302 as depicted.

(40) FIGS. 8a and 8b show a front view and side view, respectively, of a fluorescence imaging system 510 according to an embodiment. Fluorescence imaging system 510 as depicted includes a bi-telecentric lens-based optical imaging system 503 having a first refractive lens element 503a and a second refractive lens element 503b. Lens element 503a includes an entry aperture stop wherein a telecentric space is created between target platform 300 and lens element 503a . Similarly, lens element 503b includes an exit aperture stop wherein a telecentric space is created between lens element 503b and detector 305. Both aperture stops can be the same or similar. A rejection filter 307 is positioned in the object-space telecentric area and the emission filter 306 is placed in the image-space telecentric area. In this manner all filtering is done with chief rays parallel to each other and distances between chief rays is unchanged when adjusting focus. Similar to FIG. 5a, light source 301, such as a laser line source, generates excitation light and emits a focused line-shaped beam and projects it onto sample 300.

(41) It should be understood that the first refractive lens element and the second refractive lens element can each include more than one lens element. It should also be understood that the first aperture stop and the second aperture stop can each be in air, or located before all the lenses within the first and second refractive lens elements, respectively, or somewhere in the middle of the first and second refractive lens elements, respectively, or after all the lenses within the first and second refractive lens elements, respectively. For example, a lens element within a refractive lens element may include an aperture stop.

(42) FIGS. 9a and 9b show a front view and side view, respectively, of a fluorescence imaging system 510 according to an embodiment. The configuration shown in FIG. 9 is similar to that shown in FIG. 8, with the addition of a dichroic filter element 504 positioned to reflect excitation light beam 302 towards the sample 300. Fluorescence light emitted at sample 300 passes through dichroic filter element 504 to reach bi-telecentric imaging system 503. Dichroic filter element 504 is also in a telecentric space and therefore its spectral filtering affects all points within a contiguous area or line the same way. It should be appreciated that the configurations shown in FIGS. 8 and 9 are applicable for area imaging and line imaging applications.

(43) All patents, patent applications and other references mentioned herein are herby incorporated by reference in their entireties.

(44) While the foregoing invention has been described in some detail for purposes of clarity and understanding, it will be clear to one skilled in the art from a reading of this disclosure that various changes in form and detail can be made without departing from the true scope of the invention. For example, all the techniques and apparatus described above can be used in various combinations. All publications, patents, patent applications, and/or other documents cited in this application are incorporated by reference in their entirety for all purposes to the same extent as if each individual publication, patent, patent application, and/or other document were individually indicated to be incorporated by reference for all purposes.