Wavelength-selectable coating thickness measurement apparatus

Abstract

Provided is an apparatus that measures a thickness of a coating by selecting a wavelength of a laser based on a color of the coating using a contactless method using a photoacoustic effect and an interferometer, the apparatus including a pulsed laser source to irradiate a pulsed laser beam toward the coating, a continuous wave (CW) laser source to irradiate a CW laser beam toward the coating, a detector to detect an optical interference signal corresponding to the CW laser beam, and a signal processor to process the optical interference signal to calculate a thickness of the coating.

Claims

1. A coating thickness measurement apparatus comprising: a pulsed laser source to irradiate a pulsed laser beam toward a coating; a continuous wave (CW) laser source to irradiate a CW laser beam toward the coating; a detector to detect an optical interference signal corresponding to the CW laser beam; and a signal processor to process the optical interference signal to calculate a thickness of the coating; wherein a wavelength of the pulsed laser source is selectable based on an absorptivity of the wavelength of the pulsed laser source with respect to a color of the coating, and a wavelength of the CW laser source is selectable based on a reflectivity of the wavelength of the CW laser source with respect to the color of the coating.

2. The apparatus of claim 1, wherein the optical interference signal is changed due to an effect of a surface of the coating displaced by the pulsed laser beam.

3. The apparatus of claim 1, wherein the detector detects the optical interference signal in a vicinity of a surface of the coating.

4. The apparatus of claim 1, further comprising: an output unit to display the calculated thickness of the coating.

5. The apparatus of claim 1, further comprising: a laser controller to control the wavelength of the pulsed laser source and the wavelength of the CW laser source to be selectively switched based on color information of the coating input by a user.

6. The apparatus of claim 5, wherein the laser controller controls the wavelength of the pulsed laser source based on an absorptivity of the color information of the coating, and controls the wavelength of the CW laser source based on a reflectivity of the color information of the coating.

7. The apparatus of claim 1, wherein the pulsed laser source and the CW laser source further comprise a laser array, respectively, comprising at least two lasers to irradiate the pulsed laser beam and the CW laser beam having at least two wavelengths toward the coating.

8. The apparatus of claim 1, wherein the coating thickness measurement apparatus operates in a contactless manner.

9. The apparatus of claim 1, wherein the pulsed laser source and the CW laser source are configured to be a single sensor head unit, and the sensor head unit is replaceable.

10. The apparatus of claim 1, wherein the pulsed laser source comprises a plurality of pulsed lasers each having a wavelength different from others of the plurality of pulsed lasers, and the CW laser source comprises a plurality of CW lasers each having a wavelength different from others of the plurality of CW lasers, the wavelength of each of the plurality of pulsed lasers and the wavelength of each of the plurality of CW lasers being independently selectable based on at least one input corresponding to at least one of a plurality of main colors.

Description

BRIEF DESCRIPTION OF THE DRAWINGS

(1) These and/or other aspects, features, and advantages of the invention will become apparent and more readily appreciated from the following description of example embodiments, taken in conjunction with the accompanying drawings of which:

(2) FIGS. 1A through 1D are graphs illustrating reflection spectrums, transmission spectrums, and absorption spectrums of colors of a coating, respectively, according to an embodiment of the present invention;

(3) FIG. 2 is a block diagram illustrating a wavelength-selectable coating thickness measurement apparatus according to an embodiment of the present invention;

(4) FIG. 3 is a block diagram illustrating an example of a wavelength-selectable coating thickness measurement apparatus according to an embodiment of the present invention; and

(5) FIG. 4 is a diagram illustrating a laser selection unit and an interferometer according to an embodiment of the present invention.

DETAILED DESCRIPTION

(6) Reference will now be made in detail to example embodiments of the present invention, examples of which are illustrated in the accompanying drawings, wherein like reference numerals refer to the like elements throughout. Example embodiments are described below to explain the present invention by referring to the figures.

(7) Example embodiments of the present invention relate to a coating thickness measurement apparatus that may select a wavelength of a laser, which will be described in detail with reference to the accompanying drawings.

(8) FIGS. 1A through 1D illustrate reflection (R) spectrums, transmission (T) spectrums, and absorption (A) spectrums of main colors of a coating, for example, white, black, red, and blue, respectively, according to an embodiment of the present invention. The A and R spectrums may be used to select a wavelength of a pulsed laser and a CW laser, respectively. Referring to FIGS. 1A through 1D, a wavelength band having a relatively high absorptivity and a relatively high reflectivity may be changed based on a color of the coating.

(9) FIG. 2 is a block diagram illustrating a wavelength-selectable coating thickness measurement apparatus according to an embodiment of the present invention.

(10) Referring to FIG. 2, the wavelength-selectable coating thickness measurement apparatus may include an optical unit 100 and signal processing unit 110.

(11) The optical unit 100 may include a photoacoustic effect producer 120 and an interferometer 130. The photoacoustic effect producer 120 may produce a photoacoustic effect by generating an ultrasonic wave using a pulsed laser (not shown). The interferometer 130 may measure an optical interference signal changed when the generated ultrasonic wave is propagated into a coating and reaches a surface of the coating.

(12) The signal processing unit 110 may include a data acquisition unit 112 and a signal processor 113. The data acquisition unit 112 may acquire the optical interference signal measured by the interferometer 130. The signal processor 113 may process the acquired optical interference signal and convert the optical interference signal into a thickness.

(13) FIG. 3 is a block diagram illustrating an example of a wavelength-selectable coating thickness measurement apparatus 200 according to an embodiment of the present invention.

(14) FIG. 3 illustrates an example of the wavelength-selectable coating thickness measurement apparatus of FIG. 2.

(15) Referring to FIG. 3, the wavelength-selectable coating thickness measurement apparatus 200 may include a signal processing unit 210 to receive data acquired through an interferometer 230 and process the acquired data, a photoacoustic effect producer 220 to produce a photoacoustic effect, for example, to generate an ultrasonic wave using a pulsed laser, and the interferometer 230 to measure an optical interference signal changed when the ultrasonic wave is propagated into a coating and reaches a surface of the coating.

(16) In detail, the photoacoustic effect producer 220 may receive a signal selected by a user from an input unit 211. The selected signal may correspond to a selection of a color of the coating. A laser selection unit 221 may select lasers having suitable wavelengths based on the color of the coating. The laser selection unit 221 may control a pulsed laser array unit 222 and a CW laser array unit 231 to select lasers of wavelengths suitable for the color of the coating. A selected pulsed laser may be irradiated toward the coating through a measurement head unit 223. A selected CW laser may pass through a circulator 232 to be irradiated toward the coating through the measurement head unit 223. Waves reflected by the coating may be received through the measurement head unit 223. The received waves may pass through the circulator 232, and be detected by a detector 223. Detected signals may be transferred to a data acquisition unit 212. A signal processor 213 may convert a signal received from the data acquisition unit 212 into a thickness. The signal received from the data acquisition unit 212 may correspond to an optical interference signal generated when the CW laser reflected after irradiation toward the coating is changed due to an effect of an ultrasonic wave generated by the pulsed laser.

(17) FIG. 4 is a diagram illustrating the photoacoustic effect producer 220 and the interferometer 230 of FIG. 3.

(18) Referring to FIG. 4, a pulsed laser and a CW laser having different wavelengths may be selected and operated based on a color of a coating. A pulsed laser array unit 322 and a CW laser array unit 331 may include pulsed lasers .sub.1, .sub.2, .sub.3, and .sub.4, and CW lasers .sub.a, .sub.b, .sub.c, and .sub.d, respectively. The pulsed lasers .sub.1, .sub.2, .sub.3, and .sub.4 and the CW lasers .sub.a, .sub.b, .sub.c, and .sub.d may have different wavelengths. The pulsed lasers may have wavelength bands with relatively excellent absorptivities with respect to four main colors of a coating to be measured. The CW lasers may have the wavelength bands with relatively excellent reflectivities with respect to the four main colors of the coating to be measured.

(19) When a color of the coating, for example, a wavelength of a laser, is selected by a coating thickness measurement apparatus (for example, when a first button of an input unit 311 is selected), a pulsed laser may be switched to a pulsed laser beam (for example, .sub.1) having a wavelength with a most excellent absorptivity with respect to the selected color of the coating, and a CW laser may be switched to a CW laser beam (for example, .sub.a) having a wavelength with a most excellent reflectivity with respect to the selected color of the coating. As described above, a pulsed laser and a CW laser having at least one wavelength may be selectively output through the pulsed laser array unit 322 and the CW laser array unit 331. A laser selection unit 321 may enable a single-wavelength pulsed laser and a single-wavelength CW laser to be output based on a user input provided through the input unit 311, and switch to and operate a pulsed laser and a CW laser suitable for the color of the coating to be measured using switches 321a and 321b. The CW laser reflected after irradiation toward the coating may be detected by a detector 333, and detected signals may be transferred to a data acquisition unit (not shown).

(20) In another example, by replacing a sensor head unit including a single pulsed laser and a single CW laser based on the color of the coating, wavelengths of the pulsed laser and the CW laser may be selectively changed based on the color of the coating.

(21) According to example embodiments of the present invention, a coating thickness measurement apparatus may support a contactless manner using light. The coating thickness measurement apparatus may include pulsed lasers and CW lasers having different wavelengths, and select a pulsed laser and a CW laser having a wavelength that may produce a photoacoustic effect and that may generate an interference signal based on a color of a coating, respectively. Thus, thicknesses of coatings in various colors may be precisely measured using a single coating thickness measurement apparatus.

(22) A number of example embodiments have been described above. Nevertheless, it should be understood that various modifications may be made. For example, suitable results may be achieved if the described techniques are performed in a different order and/or if components in a described system, architecture, device, or circuit are combined in a different manner and/or replaced or supplemented by other components or their equivalents. Accordingly, other implementations are within the scope of the following claims.