PARTICLE BEAM SYSTEM

Abstract

A particle beam system includes: a multi-beam particle source configured to generate a multiplicity of particle beams; an imaging optical unit configured to image an object plane in particle-optical fashion into an image plane and direct the multiplicity of particle beams on the image plane; and a field generating arrangement configured to generate electric and/or magnetic deflection fields of adjustable strength in regions close to the object plane. The particle beams are deflected in operation by the deflection fields through deflection angles that depend on the strength of the deflection fields.

Claims

1-21. (canceled)

22. A multi-charged particle beam irradiation apparatus comprising: a forming mechanism configured to form multiple charged particle beams; a multipole deflector array configured to individually deflect each beam of the multiple charged particle beams so that a center axis trajectory of the each beam of the multiple charged particle beams does not converge in a region of a same plane orthogonal to a direction of a central axis of a trajectory of the multiple charged particle beams; and an electron optical system configured to irradiate a substrate with the multiple charged particle beams while maintaining a state where the multiple charged particle beams are not converged.

23. The apparatus according to claim 22, wherein the multipole deflector array is configured to individually deflect the each beam of the multiple charged particle beams so that a peripheral beam, located on a peripheral side off a center, in the multiple charged particle beams irradiates the substrate without passing through the central axis of the trajectory of the multiple charged particle beams.

24. The apparatus according to claim 22, wherein the multipole deflector array is arranged at an intermediate image plane position of the multiple charged particle beams.

25. The apparatus according to claim 22, wherein the electron optical system comprises at least one of an electromagnetic lens, a deflector and an aperture.

26. A multi-charged particle beam inspection apparatus comprising: a forming mechanism configured to form multiple charged particle beams; a multipole deflector array configured to individually deflect each beam of the multiple charged particle beams so that a center axis trajectory of the each beam of the multiple charged particle beams does not converge in a region of a same plane orthogonal to a direction of a central axis of a trajectory of the multiple charged particle beams; an electron optical system configured to irradiate a substrate with the multiple charged particle beams while maintaining a state where the multiple charged particle beams are not converged; and a multi-detector configured to detect multiple secondary electron beams emitted from the substrate due to irradiation with the multiple charged particle beams, wherein electron intensities detected by the detector elements provide information concerning the object at the location at which a corresponding primary beam impinges on the object.

27. The apparatus according to claim 26, wherein the multipole deflector array is configured to individually deflect the each beam of the multiple charged particle beams so that a peripheral beam, located on a peripheral side off a center, in the multiple charged particle beams irradiates the substrate without passing through the central axis of the trajectory of the multiple charged particle beams.

28. The apparatus according to claim 26, wherein the multipole deflector array is arranged at an intermediate image plane position of the multiple charged particle beams.

29. The apparatus according to claim 26, wherein the electron optical system comprises at least one of an electromagnetic lens, a deflector and an aperture.

30. A particle beam system, comprising: a multi-beam particle source configured to generate a first multiplicity of particle beams; a first imaging optical unit configured to: i) particle-optically image a first object plane into an image plane; and ii) direct the first multiplicity of particle beams onto the image plane; and a first field generating arrangement configured to generate electric and/or magnetic deflection fields of adjustable strength in regions near the first object plane, wherein, during operation of the particle beam system, the first multiplicity of particle beams are deflected by the deflection fields of the first field generating arrangement by deflection angles dependent on the strength of the deflection fields, and wherein, during operation of the particle beam system, the deflection angles have an effect of enlarging a cross-section of the first multiplicity of particle beams in a crossover plane in which the cross-section is otherwise minimal.

31. The particle beam system of claim 30, wherein the enlarging of the cross-section of the first multiplicity of particle beams in the crossover plane by the deflection angles reduces the mutual repulsion of the particles from one another on account of Coulomb repulsion, which in turn enables smaller beam foci for the particle beams in the image plane.

32. The particle beam system of claim 31, wherein the first field generating arrangement is configured to generate the deflection angles to be oriented in a circumferential direction around an optical axis of the first imaging optical unit to cause the enlarging of the cross-section of the first multiplicity of particle beams in the crossover plane.

33. The particle beam system of claim 31, wherein the deflections angles cause the particles beam to run spiral paths around an optical axis passing through the center of the first field generating arrangement before being incident on the image plane.

34. The particle beam apparatus of claim 33, wherein the first imaging optical unit comprises an objective lens with a magnetic field extending to the image plane, and wherein wherein the deflection angles cause the spiral paths to be orthogonally incident on the image plane in the presence of the magnetic field from the objective lens.

35. The particle beam apparatus of claim 34, wherein the first field generating arrangement is configured to generate the deflection angles to be oriented in a circumferential direction around an optical axis of the first imaging optical unit to cause the enlarging of the cross-section of the first multiplicity of particle beams in the crossover plane.

36. The particle beam apparatus of claim 35, wherein the first field generating arrangement comprises a deflector array comprising a pair of electrodes positioned to deflect each particle beam and wherein each such pair of electrodes is oriented in a circumferential direction with respect to a center of the first field generating arrangement.

37. The particle beam apparatus of claim 31, wherein the first field generating arrangement is arranged at an intermediate image plane of the first imaging optical unit.

38. The particle beam apparatus of claim 31, further comprising: a detector array configured to detect multiple secondary electron beams emitted from a substrate on the image plane in response to irradiation with the multiple charged particle beams, wherein electron intensities detected by the detector elements provide information concerning the object at the location at which a corresponding primary beam impinges on the object.

Description

BRIEF DESCRIPTION OF THE FIGURES

[0057] The above-described features and aspects will become clearer from the following description of embodiments. However, embodiments of the disclosure need not include all of the described features, and any features which may be included need not show all of the described advantages.

[0058] In the figures:

[0059] FIG. 1 shows a schematic illustration of a particle beam system;

[0060] FIG. 2 shows a schematic illustration of a detail of the particle beam system from FIG. 1;

[0061] FIG. 3 shows a schematic illustration of a plan view of a deflector array which is usable in the particle beam system from FIG. 1;

[0062] FIG. 4 shows an illustration for elucidating an orientation of a deflection of a particle beam, the deflection being produced by a field generating arrangement of the particle beam system from FIG. 1;

[0063] FIG. 5 shows a schematic illustration of a plan view of a further deflector array which is usable in the particle beam system from FIG. 1;

[0064] FIG. 6 shows a schematic illustration of a cross-sectional view of the deflector array illustrated in FIG. 5 along a line V-V in FIG. 5;

[0065] FIG. 7 shows a schematic illustration of a cross-sectional view of a detail of a multi-beam particle source which is usable in the particle beam system from FIG. 1;

[0066] FIG. 8 shows a schematic illustration of a cross-sectional view of a detail of a further multi-beam particle source which is usable in the particle beam system from FIG. 1.

[0067] FIG. 9 shows a schematic illustration of a cross-sectional view of a detail of a further multi-beam particle source which is usable in the particle beam system from FIG. 1.

[0068] FIG. 10 shows a schematic illustration of a cross-sectional view of a detail of a further multi-beam particle source which is usable in the particle beam system from FIG. 1.

DETAILED DESCRIPTION OF EMBODIMENTS

[0069] In the following description of embodiments, components which are similar in terms of their structure and function are largely provided with the same or similar references.

[0070] A particle beam system in accordance with one embodiment is illustrated schematically in FIG. 1. The particle beam system 1 includes an illumination system 3 configured to direct a multiplicity of particle beams 5 onto a plane 7 in which an object 9 is arranged. Each of the particle beams 5 illuminates an incidence location on the object 9, wherein the particle beams 5 are incident on the object 9 alongside one another and at a distance from one another, such that a field of incidence locations is illuminated there. The particle beams 5 can be electron beams, for example, which generate secondary electrons and backscattered electrons at the object 9. An imaging optical unit 11 of a detection system is configured to collect the electrons generated at the incidence locations and to direct them onto a detector array 13. Here electrons emanating from each of the incidence locations are used to shape in each case a separate particle beam 15. The particle beams 15 are directed onto the detector array 13. The detector array 13 includes an array of detector elements, wherein one or more detector elements are provided for detecting a respective one of the particle beams 15. For this purpose, the detector elements are arranged in an array corresponding to the arrangement of the incidence locations at the object 9. The imaging optical unit 11 is configured with respect to the surface of the object 9 and the detector array 13 such that the surface of the object 9 is arranged in an object plane 17 of the imaging provided by the imaging optical unit 11 and the detector elements of the detector array 13 are arranged in an image plane 19 of the imaging. The imaging optical unit 35 of the illumination system 3 and the imaging optical unit 11 of the detector system are arranged such that the image plane 7 of the imaging optical unit 35 and the object plane of the imaging optical unit 11 coincide and the surface of the object can be arranged there. The plane 7 is thus the image plane of the illumination system 3, the object plane 17 of the imaging optical unit 11 and the sample plane in which the surface of an object to be examined is arranged.

[0071] The illumination system 3 includes a multi-beam particle source 21 having a particle emitter 22 for generating a particle beam 23, which is collimated by one or more condenser lenses 25 and impinges on a multi-aperture plate arrangement 27. The multi-aperture plate arrangement 27 includes at least one multi-aperture plate having a multiplicity of openings. The particles of the particle beam 23 which pass through the openings in the multi-aperture plate form the particle beams 5. The multi-aperture plate arrangement 27 is furthermore configured to focus the individual particle beams 5, such that foci 31 of the particle beams 5 are formed in a region around a surface 29. In this case, the surface 29 can have a curved shape. Further lenses 33 that influence the beam path can be provided between the multi-aperture plate arrangement 27 and the surface 29.

[0072] The illumination system 3 furthermore includes an imaging optical unit 35 configured to image the surface 29 into the plane 7, such that the surface 29 and the plane 7 are planes that are conjugate with respect to one another in the sense of an optical imaging. The imaging optical unit 35 includes an objective lens 37, which is the lens of the imaging optical unit 35 which is arranged the closest to the plane 7. Furthermore, the imaging optical unit 35 can include further lenses 39.

[0073] The illumination system 3 directs the particle beams 5 onto the plane 7 in such a way that there the particle beams are incident on the plane 7 as far as possible orthogonally, i.e. at an angle of incidence of 90. However, deviations from this relation arise on account of the properties of the lenses 37 and 39, such that the particle beams are incident on the plane 7 at angles of incidence that are different from 90. For example, these directions are not identical for all of the particle beams 5, but rather can be dependent on the position of the respective particle beam 5 within the field of particle beams. The deviation of the angle of incidence from 90 may be caused by telecentricity errors of the imaging optical unit 35, for example. Furthermore, the objective lens 37 can provide its focusing effect via a magnetic field reaching as far as the surface of the object 9. The trajectories of the particle beams directly at the surface of the object then have the shape of spirals. In order at least partly to compensate for such deviations from telecentricity, a deflector array 41 is arranged near the surface 29 which is imaged into the plane 7.

[0074] A plan view of one embodiment of the deflector array 41 is illustrated schematically in FIG. 3. The deflector array 41 includes a multi-aperture plate 43 having a multiplicity of openings 45 arranged in an array 46 in such a way that one of the particle beams 5 passes centrally through each of the openings 45. At each opening 45, a pair of electrodes 47 situated opposite one another is arranged on both sides of the midpoint of the opening 45. Each electrode 47 is connected to a controller 49 configured to apply mutually different electrical potentials to the electrodes 47 of each pair of electrodes. The potential difference between the electrodes 47 of a pair of electrodes 47 generates an electric field between the electrodes 47, the electric field deflecting the particle beam 5 passing through the pair of electrodes 47 by an angle dependent on the potential difference.

[0075] The pairs of electrodes 47 are oriented with respect to the particle beams 5 passing through the latter in such a way that a connecting line 51 between centres of the two electrodes 47 of the pair is arranged in a circumferential direction with respect to a centre 53 of the array 46 of the openings 45 through which the particle beams 5 pass. As a result, it is possible to deflect the particle beams 5 such that, after passing through the deflector array 41, they run on spiral paths around a centre 53 of the field of particle beams 5. The inclination of these spiral paths can be set here such that the effect of a magnetic field extending from the objective lens 37 as far as the surface of the object 9 is compensated for, with the result that the particle beams 5 are incident on the plane 7 substantially orthogonally.

[0076] In the case of the deflector array 41 illustrated in FIG. 3, each individual deflector has a pair of electrodes 47 situated opposite one another and arranged offset in a circumferential direction with respect to the centre 53. It is thereby possible to deflect the particle beams in directions which are oriented in a circumferential direction with respect to the centre. It is also possible however for two or more pairs of electrodes situated opposite one another to be arranged in a distributed manner in a circumferential direction around the opening in order also to be able to set the orientations in which the particle beam passing through the plurality of pairs of electrodes is deflected.

[0077] FIG. 4 is an illustration for elucidating the orientation of a deflection of a particle beam, the deflection being produced by a field generating device 41.

[0078] A plane 201 in FIG. 4 represents the plane in which the effects of the deflection fields of the field generating arrangement 41 can be localized. The particle beam 5 enters the field generating arrangement 41 from above and emerges from the field generating device 41 at the bottom in FIG. 4. The trajectory of the particle beam 5 runs rectilinearly before entering the field generating arrangement 41 and after emerging from the field generating arrangement 41 and on a curved path within the field generating arrangement 41. Extensions 203 and 204 of the rectilinear parts of the trajectory intersect at a point 205 and form and angle with one another. The angle is the deflection angle by which the particle beam 5 is deflected by the deflection fields of the field generating arrangement 41. The rectilinear extensions 203 and 204 form legs of the deflection angle , and the point 205 is the vertex of the deflection angle. The legs 203 and 204 lie in a plane 207. The plane 207 is oriented orthogonally to the plane 201 in which the effects of the deflection fields of the field generating arrangement 41 can be localized. The vertex 205 of the deflection angle is at a distance r from the centre 53 of the field generating arrangement 41. It is advantageous if an optical axis 209 of the imaging optical unit 35 passes through the centre 53 of the field generating arrangement 41. With respect to the centre 53 or the optical axis 209 of the imaging optical unit 35, the plane 207 has an orientation in such a way that a straight line 211 oriented orthogonally to the plane 207 and passing through the vertex 205 of the deflection angle is at a distance d from the optical axis which is less than 0.99 times or 0.95 times or 0.90 times the distance r between the vertex 205 and the optical axis 209 or the centre 53. This means that the particle beam 5 is deflected by the deflection angle , which is also oriented in a circumferential direction with respect to the optical axis 209.

[0079] FIG. 4 likewise shows the object plane 29, which is imaged into the image plane by the imaging optical unit 35. The plane 201 in which the deflecting effect on the particle beam 5 can be localized is at a distance 1 from the object plane 29 which is small in comparison with the distance along the optical axis 209 of the object plane 29 from the image plane 7. For example, the distance 1 is less than 0.1 times the distance between the object plane 29 and the image plane 7 along the optical axis 209.

[0080] A further embodiment of a deflector array 41 is explained below with reference to FIGS. 5 and 6. In this case, FIG. 5 shows a plan view of the deflector array 41 and FIG. 6 shows a cross section through the deflector array 41 along a line V-V in FIG. 5.

[0081] The deflector array 41 includes a first multi-aperture plate 56 having a multiplicity of openings 45, and a second multi-aperture plate 57 having a multiplicity of openings 45, through which the particle beams 5 pass. The two multi-aperture plates 56 and 57 are arranged one behind the other in the beam path, such that each particle beam 5 passes firstly through an opening 45 in the first multi-aperture plate 56 and then through an opening 45 in the second multi-aperture plate 57. The openings 45 and 45 in the two multi-aperture plates 56 and 57 can each have an identical diameter. However, this need not be the case.

[0082] The two multi-aperture plates 56 and 57 are arranged relative to one another such that a centre of the opening 45 in the first multi-aperture plate 56, through which opening a given particle beam passes, is offset laterally relatively to a centre of the opening 45 in the second multi-aperture plate 57, through which opening the particle beam passes, as viewed in the beam direction. This is illustrated in FIG. 5 by the fact that the openings 45 in the first multi-aperture plate 56 are entirely visible and are illustrated as solid lines, while the openings 45 in the second multi-aperture plate 57 are partly concealed and, in so far as they are visible, are illustrated by solid lines and, in so far as they are concealed, are illustrated by interrupted lines.

[0083] A controller 59 is configured to apply mutually different electrical potentials to the first multi-aperture plate 56 and to the second multi-aperture plate 57. Electrostatic fields are thereby generated between the multi-aperture plates 56 and 57, the electrostatic fields deflecting the particle beams 5. The deflection angle can be set via the potential difference between the multi-aperture plates 56 and 57 that is determined by the controller 59.

[0084] The deflector array includes a centre 53, around which the second multi-aperture plate 57 is rotated relative to the first multi-aperture plate, as is illustrated by an arrow 61 in FIG. 5. This rotation produces a lateral offset in a circumferential direction around the centre 53 between the openings 45 and 45, through which the particle beam 5 passes successively, wherein the lateral offset increases in a circumferential direction with increasing distance between the respective openings 45 and 45 and the centre 53.

[0085] By virtue of the arrangement of the deflector array 41 near the surface 29 which is imaged into the plane 7 at the surface of the object 9, it is thus possible to influence the angles of incidence of the particle beams 5 on the plane 7. For example, the angles of incidence can be set in such a way that they are approximately 90 for all of the particle beams.

[0086] The particle beam system 1 illustrated in FIG. 1 includes the illumination system 3 in order to generate the particle beams 5 and to direct them into the plane 7 in which the surface of the object 9 is arranged. Furthermore, the particle beam system 1 includes the imaging optical unit 11 in order to direct the electrons generated at the surface of the object 9 as particle beams 15 onto the detector array 13. For this purpose, the beam paths of the particle beams 5 and of the particle beams 15 are separated from one another by a beam switch 65. Between the beam switch 65 and the plane 7, the particle beams 5 and 15 traverse a common beam path, while their beam paths run separately from one another in the region above the beam switch 65 in FIG. 1. The beam switch 65 is provided by a substantially homogeneous magnetic field. The reference sign 67 in FIG. 1 denotes a region in which a homogeneous magnetic field is provided, through which the particle beams 5 pass and which is provided to compensate for imaging aberrations produced by the magnetic field of the beam switch 65 in the imaging of the surface 29 onto the plane 7.

[0087] The imaging optical unit 11 includes the objective lens 37 and a plurality of lenses 69, which are illustrated schematically in FIG. 1 and in greater detail in FIG. 2. The imaging optical unit 11 images the plane 17 onto the plane 19 in which the detector elements of the detector array 13 are arranged in such a way that three intermediate images 71, 72 and 73 arise one behind another along the beam path of the particle beams 15. Furthermore, there is a crossover of the particle beams 15 in a plane 75 arranged in the beam path between the intermediate images 72 and 73. There is arranged in the plane 75 an aperture plate 77 having a cutout 79, which serves to filter out particles of the particle beams 15 which would otherwise impinge on a detector element of the detector array 13 which is different from the detector element(s) assigned to that location in the plane 7 from which the particle started.

[0088] As explained above the quality of this filtering is reduced if the particle beams 15 start from the plane 7 non-orthogonally, i.e. at angles which are different from 90. This occurs in practice for example if the objective lens 37 generates a focusing magnetic field which reaches as far as the plane 7.

[0089] In order to compensate for this, a deflector array 81 is arranged in the region of the intermediate image 72, the deflector array including an array of deflectors, wherein one of the particle beams 15 passes through each of the deflectors. The deflectors deflect the particle beams passing through them in such a way that the latter pass through the smallest possible region in the plane 75, and the opening 79 can be chosen to be small enough to achieve a good filtering with a high throughput.

[0090] The deflector array 81 can have a construction as explained above for the deflector array 41 with reference to FIGS. 3 to 5.

[0091] FIG. 7 is a schematic illustration in cross section of one embodiment of a multi-aperture plate arrangement 27 for generating particle beams 5 in FIG. 1. The multi-aperture plate arrangement 27 includes a multi-aperture plate 101 having a multiplicity of openings 103, through which the particle beams 5 pass. In this case, the multi-aperture plate 101 can be the first multi-aperture plate in the beam path downstream of the particle source 21, such that the multi-aperture plate 101 also absorbs those particles of the particle beam 23 generated by the particle source 21 which do not contribute to the particle beams 5. However, it is also possible for a further multi-aperture plate to be arranged upstream of the multi-aperture plate 101, the further multi-aperture plate providing this function, such that the multi-aperture plate 101 absorbs substantially no particles generated by the particle source 21. A single-aperture plate 105 is arranged at a distance L1 from the multi-aperture plate 101. The single-aperture plate 105 has an opening 107, through which all of the particle beams 5 pass.

[0092] A further single-aperture plate 109 is arranged at a distance L2 from the multi-aperture plate 101 and has an opening 111, through which likewise all of the particle beams 5 pass. The opening 111 has a diameter D2. A further single-aperture plate 113 is arranged at a distance L3 from the multi-aperture plate 101 and has an opening 115, through which likewise all of the particle beams 5 pass. The opening 115 has a diameter D3. The controller 117 is configured to apply different electrical potentials to the multi-aperture plate 101 and the single-aperture plates 105, 109 and 113. In this case, the single-aperture plate 113 can also be connected to a beam pipe, which can be at earth potential, for example.

[0093] As a result of the different electrical potentials applied to the multi-aperture plate 101 and the single-aperture plates 105, 109 and 113, inhomogeneous electric fields are generated between these plates, as is illustrated by field lines 119 in FIG. 7.

[0094] The electric field extending to the multi-aperture plate 101 has the effect that the openings 103 in the multi-aperture plate 101 act as lenses on the particle beams 5 passing through the openings 103. This lens effect is represented by ellipses 121 in FIG. 7. On account of the inhomogeneity of the electric field, the central opening 103 in the array of openings 103 in the multi-aperture plate 101 provides the strongest lens effect, while this lens effect decreases with increasing distance from the centre. This has the effect that the beam foci 31 (cf. FIG. 1) do not lie in a plane but rather in a convexly curved plane from the viewpoint of the particle source. The shape and the magnitude of the curvature of this plane are determined by the strength and the inhomogeneity of the electric field at the multi-aperture plate 101. The inhomogeneity in turn is substantially determined by the diameter D1 of the opening 107 in the single-aperture plate 105 and by the distance L1 between the multi-aperture plate 101 and the single-aperture plate 105. These variables D1 and L1 are chosen such that the resultant shape of the curvature of the surface 29 in which the beam foci 31 are arranged can compensate for a field curvature of the imaging optical unit 35, such that the foci of the particle beams 5 at the surface of the object 7 substantially all arise very near to the plane 7. Furthermore, the magnitude of the curvature of the plane 29 is determined by the potential difference between the multi-aperture plate 101 and the single-aperture plate 105.

[0095] The distance L2 between the single-aperture plate 109 and the multi-aperture plate 101 is significantly greater than the distance L1 between the single-aperture plate 105 and the multi-aperture plate 101. For example, the distance L2 is more than two times (e.g., more than five times, more than ten times) greater than the distance L1. The diameter D2 of the opening 111 in the single-aperture plate 109 is furthermore significantly larger than the diameter D1 of the opening 107 in the single-aperture plate 105. By way of example, the diameter D2 is more than 1.5 times (e.g., more than three times) larger than the diameter D1. The distance L3 between the single-aperture plate 113 and the multi-aperture plate 101 is likewise significantly greater than the distance L1 between the single-aperture plate 105 and the multi-aperture plate 101. The distance L3 is furthermore greater than the distance L2. The diameter D3 of the opening 115 of the single-aperture plate 113 is likewise significantly larger than the diameter D1 of the opening 107 in the single-aperture plate 105. The diameter D3 can be approximately equal to the diameter D2.

[0096] The inhomogeneous electric field formed in the beam path downstream of the single-aperture plate 105 provides the effect of a lens on the totality of the particle beams 5, as is illustrated by an ellipse 123 in FIG. 7. The effect of the lens changes the divergence and/or convergence of the particle beams 5 relative to one another. The strength of the effect of this lens 123 can be set by changing the voltages between the single-aperture plates 105, 109 and 113. A change in the strength of this lens 123 results in a change in the distance between the beam foci 31 on the surface 29.

[0097] With the aid of the multi-aperture plate arrangement 27, it is thus possible firstly to compensate for the field curvature of the imaging optical unit 35 and secondly to set the distance between the beam foci 31 in the plane 29. In this case, the controller 117 can have a first signal input 125, via which a desired magnitude of the compensation of the field curvature can be input to the controller 117, and the controller 117 can have a second signal input 127, via which a desired distance between the beam foci 31 in the surface 29 or a desired distance between the incidence locations of the particle beams in the plane 7 can be input to the controller 117. On account of the described configuration of the multi-aperture plate arrangement 27, the effects of the lenses 121 are adjustable in a manner largely decoupled from the effect of the lens 123. In the event of a change in the signal applied to the first signal input 125, the controller 117 can then change the voltage between the multi-aperture plate 101 and the single-aperture plate 105 in order to set the curvature of the surface 29. In the event of a change in the control signal applied to the second signal input 127, the controller 117 can then substantially change the electrical potential applied to the single-aperture plate 109 in order to change the distance between the incidence locations of the particle beams on the surface of the object 9.

[0098] Parameters of the multi-aperture plate arrangement 27 in FIG. 7 in accordance with one exemplary embodiment are indicated below: [0099] Kinetic energy of the particle beams 5 before passing through the multi-aperture plate 101:30 keV; [0100] distance between the openings 103:100 m; [0101] Diameter of the openings 103:30 m; [0102] Focal length of the lenses 121:100 mm to 300 mm; [0103] D1: 4 mm; [0104] D2: 16 mm; [0105] D3: 6.5 mm; [0106] L1: 0.2 mm; [0107] L2: 7.3 mm; [0108] L3: 65 mm, [0109] U1: 0; [0110] U2 500 V; [0111] U3: 17.5 kV; [0112] U4: 0; and [0113] Distance between the foci in the plane 29:200 m to 300 m.

[0114] FIG. 8 is a schematic illustration in cross section of a further embodiment of a multi-aperture plate arrangement 27 for generating the particle beams 5 in FIG. 1. The multi-aperture plate arrangement 27 in FIG. 8 has a similar construction to that in FIG. 7. For example, a single-aperture plate 105 having an opening 107 having a diameter D1 is arranged at a distance L1 from a multi-aperture plate 101. Likewise, a single-aperture plate 113 having an opening 115 having a diameter D3 is arranged at a distance L3 from the multi-aperture plate 101. However, instead of the one single-aperture plate 109 in FIG. 7, provision is made of three single-aperture plates 109.sub.1, 109.sub.2 and 109.sub.3 having openings 111.sub.1, 111.sub.2 and, 111.sub.3 respectively having diameter D2, which are arranged at distances L2.sub.1, L2.sub.2 and L2.sub.3, respectively, from the multi-aperture plate 101.

[0115] Once again L1 is significantly less than L2.sub.1 and L3, and D1 is significantly less than D2 and D3. The differences between L2.sub.2 and L2.sub.1 and between L2.sub.3 and L2.sub.2 can be for example somewhat smaller than L2.sub.1.

[0116] FIG. 9 is a schematic illustration in cross section of a further embodiment of a multi-beam particle source 21. The multi-beam particle source 21 includes a multiplicity of particle emitters 131 arranged in a plane 135. A multi-aperture plate 137 is arranged at a distance from the plane 135. The multi-aperture plate 137 is at positive potential relative to the particle emitters 131 in order to extract electrons from the particle emitters 131. the electrons are accelerated from the particle emitters 131 towards the multi-aperture plate 137 and pass through the latter through openings 139 in the multi-aperture plate 137 in order to shape the multiplicity of particle beams 5. The particle emitters 131 are arranged within a field generating arrangement 41. The field generating arrangement 41 is formed by a coil 141, through which current flows in order to generate a magnetic field whose field lines 143 permeate the plane 135 substantially orthogonally. In the region of the particle emitters 131, the magnetic field is a substantially homogeneous magnetic field.

[0117] The particle beams 5 start at the particle emitters 131 substantially parallel to the field lines 143 of the magnetic field and are not yet deflected here by the magnetic field. However, the particle beams 5 then traverse a region of the magnetic field in which the field lines 143 diverge. There the particle beams 5 experience a deflection by deflection angles oriented in a circumferential direction around an optical axis 209 of the imaging optical unit 35.

[0118] The plane 135 in which the particle emitters 131 are arranged is imaged into the image plane 7 by the imaging optical unit 35. The excitation of the coil 141 then makes it possible to set the angles at which the particle beams 5 are incident on the image plane. For example, it is thus possible to set the telecentricity of the incidence of the particle beams 5 in a circumferential direction around the optical axis 209 and to compensate for a telecentricity error produced by the magnetic field of the objective lens 37 at the object 17.

[0119] FIG. 10 is a schematic illustration of a further embodiment of a particle beam system 1 including an illumination system 3 having a multi-beam particle source 21. The multi-beam particle source 21 includes a particle emitter 22 for generating a particle beam 23, which passes through a condenser lens 25 and then impinges on a multi-aperture plate 151 having openings, through which particles of the particle beam 23 pass in order to form the multiplicity of particle beams 5 downstream of the multi-aperture plate 151. A further multi-aperture plate 101 is arranged in the beam path downstream of the multi-aperture plate 151 and has openings, through which the particle beams 5 likewise pass. One or more single-aperture plates 153 are arranged in the beam path downstream of the further multi-aperture plate 101.

[0120] As explained above in association with FIGS. 7 and 8, the openings of the further multi-aperture plate 101 act like lenses on the particle beams 5 passing through the latter, the lenses likewise being illustrated as ellipses 121 in FIG. 10, in order to focus the particle beams in a curved plane 155 at locations 31, the plane also being the object plane 29, which is imaged by an imaging optical unit 35 onto an image plane 7, in which an object 17 can be arranged.

[0121] A controller 117 is provided in order to set the potentials of the further multi-aperture plate 101 and of the single-aperture plates 153 and an excitation of the condenser lens 25. The controller 117, like the controllers of the embodiments explained with reference to FIGS. 7 and 8, includes a signal input 125 at which a desired magnitude of the compensation of the field curvature can be input to the controller 117. In a manner similar to that in the embodiments explained above with reference to FIGS. 7 and 8, the controller 117 is configured, in the event of changes in the signal applied to the signal input 125, to change the potentials of the further multi-aperture plate 101 and of the single-aperture plates 153 in order to set the refractive powers of the lenses 121 with respect to the change in the curvature of the plane 29.

[0122] The controller 117 furthermore includes a signal input 127 via which a desired distance between the beam foci 31 in the plane 7 can be input to the controller 117.

[0123] Depending on the signal input via the signal input 127, the controller 117 changes the excitation of the condenser lens 25. With the change in the excitation of the condenser lens 25 there is a change in the divergence with which the particle beam 23 is incident on the multi-aperture plate 151. There is thus also a change in the divergence of the bundle of particle beams 5 in the beam path downstream of the multi-aperture plate 151. This in turn leads to a change in the regions within the cross sections of the openings in the further multi-aperture plate 101 in which the particle beams 5 pass through the openings. For example, the particle beams 5 do not pass through the openings centrally, but rather at a distance from the centres of the openings. As a result of the change in the excitation of the condenser lens 25, the distances from the centres of the openings in the further multi-aperture plate 101 at which the particle beams 5 pass through the openings are thus changed. If a particle beam does not pass through an opening of the further multi-aperture plate 101 centrally, then the lens effect of the lens 121 on the beam results not only in a focusing but also in a deflection, such that the particle beam 5 does not pass through the lens 121 rectilinearly, but rather is also deflected by the latter. The deflection of the beam 5 by the lens 121 results in a change in the location 31 in the plane 29 at which the beam is focused. Consequently, it is possible to change the distances between the beam foci 31 in the plane 29 by changing the excitation of the condenser lens 25. Since the plane 29 is imaged onto the plane 7, the distance between the beam foci in the image plane 7 also changes as a result.

[0124] The disclosure has been described above using preferred embodiments. Nevertheless, the disclosure, which is defined by the scope of the patent claims, is not restricted by the described embodiments and covers the scope given by the patent claims and equivalents thereof.