Detection method and device for low carrier mobility of insulating material

Abstract

A detection method and device for low carrier mobility of an insulating material, relating to a technical field of electrical property testing of insulating polymer materials, includes following steps: fixing a sample; applying a triangular wave voltage to both ends of the sample; irradiating the sample by an X-ray to generate carriers inside the sample, in which, the carriers is driven to move under an action of the triangular wave voltage, and an irradiation process of the X-ray coincides with a rising phase of the triangular wave voltage; acquiring a current signal of the sample under the action of the triangular wave voltage; and calculating a carrier mobility based on the current signal. The detection method and device for low carrier mobility of the insulating material achieves accurate detection of behaviors of the carriers inside the insulating material by combining X-ray excitation with voltage signal analysis.

Claims

1. A detection method for carrier mobility of an insulating material, comprising: fixing a sample; applying a triangular wave voltage to both ends of the sample; irradiating the sample by using an X-ray to generate carriers inside the sample, and driving the carriers to move under an action of the triangular wave voltage; wherein an irradiation process of the X-ray coincides with a rising phase of the triangular wave voltage; acquiring a current signal of the sample under the action of the triangular wave voltage; and calculating a carrier mobility based on the current signal; wherein a calculation equation of the carrier mobility is expressed as follows: $=\frac{I}{neE}$ where, I represents a measured current, n represents a carrier concentration, e represents an elementary charge, and E represents an electric field strength; an amplitude of the triangular wave voltage is determined according to a rated breakdown voltage of the sample; and the amplitude of the triangular wave voltage is 70% of the rated breakdown voltage of the sample.

2. The detection method for carrier mobility of the insulating material as claimed in claim 1, wherein the X-ray is generated by an X-ray tube; and an operating voltage of the X-ray tube is greater than or equal to 80 kilovolts (kV).

3. The detection method for carrier mobility of the insulating material as claimed in claim 1, wherein a thickness of the sample is less than or equal to 500 micrometers (m).

4. The detection method for carrier mobility of the insulating material as claimed in claim 1, wherein a time of the irradiating by the X-ray on the sample is 0.5 seconds(s).

5. The detection method for carrier mobility of the insulating material as claimed in claim 1, wherein the calculating a carrier mobility based on the current signal comprises: calculating the carrier mobility by a filtering and denoising process based on the current signal.

6. A detection device for carrier mobility of an insulating material, comprising: a sample fixture, wherein the sample fixture is configured to fix a sample; a voltage generation component, wherein the voltage generation component is configured to be connected to the sample to apply a triangular wave voltage to both ends of the sample; an X-ray excitation component, wherein the X-ray excitation component is configured to generate an X-ray to irradiate the sample; the X-ray is configured to, under an irradiation of the X-ray, drive the sample to generate carriers inside the sample; the triangular wave voltage is configured to drive the carriers to move; and an irradiation process of the X-ray coincides with a rising phase of the triangular wave voltage; a signal acquisition component, connected to the sample, wherein the signal acquisition component is configured to acquire a current signal generated by movement of the carriers inside the sample; and a data process component, connected to the signal acquisition component, wherein the data process component is configured to calculate a carrier mobility based on the current signal, wherein a calculation equation of the carrier mobility is expressed as follows: $=\frac{I}{neE}$ where, I represents a measured current, n represents a carrier concentration, e represents an elementary charge, and E represents an electric field strength; an amplitude of the triangular wave voltage applied to the both ends of the sample by the voltage generation component is determined according to a rated breakdown voltage of the sample; and the amplitude of the triangular wave voltage is 70% of the rated breakdown voltage of the sample.

7. The detection device for carrier mobility of the insulating material as claimed in claim 6, wherein the X-ray excitation component is configured to be an X-ray tube, and an operating voltage of the X-ray tube is greater than or equal to 80 kV.

Description

BRIEF DESCRIPTION OF DRAWINGS

(1) FIG. 1 illustrates a flowchart of a detection method for low carrier mobility of an insulating material according to an embodiment of the disclosure.

(2) FIG. 2 illustrates a schematic working principle diagram of the detection method for low carrier mobility of the insulating material according to the embodiment of the disclosure.

(3) FIG. 3 illustrates a schematic diagram of a sample fixture according to the embodiment of the disclosure.

(4) FIG. 4 illustrates an application timing chart of a triangular wave voltage applied to an X-ray according to the embodiment of the disclosure.

(5) FIG. 5 illustrates a schematic structural diagram of a detection device for low carrier mobility of the insulating material according to the embodiment of the disclosure.

(6) FIG. 6 illustrates a schematic circuit diagram of a voltage generation component according to the embodiment of the disclosure.

(7) FIG. 7 illustrates a schematic circuit diagram of a signal acquisition component according to the embodiment of the disclosure.

(8) Description of reference numerals: 301: fixture plate; 302: fixture slot; 303: clamping piece; 304: wiring port; 305: sample; 501: sample fixture; 502: voltage generation component; 503: X-ray excitation component; 504: signal acquisition component; 505: data process component.

DETAILED DESCRIPTION OF EMBODIMENTS

(9) Implementation of the disclosure will be described through specific embodiments. Those skilled in the art can easily understand other advantages and effects of the disclosure from content disclosed in the specification. The disclosure can be implemented or applied through other different specific embodiments. All details in the specification can be modified or variated in various ways based on different viewpoints and applications without departing from a spirit of the application. It should be noted that, in case of no conflict, the following embodiments and features in the embodiments can be combined with each other.

(10) Specific implementation of the disclosure will be further described below in detail with reference to attached drawings and embodiments.

(11) FIG. 1 illustrates a flow chart of a detection method for low carrier mobility of an insulating material according to an embodiment of the disclosure. FIG. 2 illustrates a schematic working principle diagram of the detection method for low carrier mobility of the insulating material according to the embodiment of the disclosure. The disclosure provides the detection method for low carrier mobility of the insulating material, by combining X-ray excitation with voltage signal analysis to achieve accurate detection of behaviors of carriers inside the insulating material. As illustrated in FIG. 1 and FIG. 2, the detection method for low carrier mobility of the insulating material includes following steps.

(12) S100, a sample is fixed.

(13) In the embodiment, a sample fixture is configured to fix the sample to ensure good contact between electrodes and a surface of the sample, therefore ensuring accuracy of measurement. The sample is made of the insulating material, and a specific structure of the sample fixture is determined according to a structural shape of the sample.

(14) In an embodiment, FIG. 3 illustrates a schematic diagram of the sample fixture according to the embodiment of the disclosure. As illustrated in FIG. 3, the sample fixture includes a fixture plate 301. A fixture slot 302 is defined on the fixture plate 301. A clamping piece 303 is disposed on the fixture plate 301 corresponding to the fixture slot 302, and the clamping piece 303 can be configured to be a screw. The screw is movably disposed on the fixture plate 301 through a screw hole defined on the fixture plate 301. Multiple wiring ports 304 are disposed on the fixture plate 301 corresponding to the fixture slot 302. The clamping piece 303 is configured to fix the sample 305 in the fixture slot 302. The multiple wiring ports 304 are configured to route out wires connected to the sample 305. In an embodiment, when the sample 305 needs to be connected to a voltage generation component (as illustrated in FIG. 6 for circuit principle) and a signal acquisition component (as illustrated in FIG. 7 for circuit principle) respectively through wires, the multiple wiring ports 304 can route out the wires to correspondingly connect the sample 305 to the voltage generation component and the signal acquisition component. Since both ends of the fixture slot 302 are not closed and a triangular wave voltage is applied to both ends of the sample 305, wires connected the sample 305 to the voltage generation component can directly pass through the both ends of the fixture slot 302.

(15) S200, the triangular wave voltage is applied to the both ends of the sample.

(16) In the embodiment, the voltage generation component is configured to apply the triangular wave voltage to the both ends of the sample by a way of connecting the sample with wire. Appropriate frequency and amplitude of the triangular wave voltage can be chosen to optimize measurement conditions. In an embodiment, the voltage generation component includes a voltage source and a signal generation system, and the signal generation system is configured to control the voltage source to generate a triangular wave signal with a set frequency and amplitude. In an embodiment, a frequency of the triangular wave voltage is set to 0.5 Hertz (Hz). An amplitude of the triangular wave voltage is determined according to a rated breakdown voltage of the sample, specifically, the amplitude of the triangular wave voltage is 70% of the rated breakdown voltage of the sample. For example, when a rated breakdown voltage of a sample with a thickness of 500 micrometers (m) is 10 kilovolts (kV), correspondingly, an amplitude of an applied triangular wave voltage is 7 kV.

(17) S300, the sample is irradiated by using an X-ray to generate carriers therein, the carriers are driven by an action of the triangular wave voltage to move.

(18) In the embodiment, FIG. 4 illustrates an application timing chart of a triangular wave voltage applied to an X-ray according to the embodiment of the disclosure. As illustrated in FIG. 4, an irradiation process of the X-ray coincides with a rising phase of the triangular wave voltage, and an irradiation time of the X-ray on the sample is 0.5 seconds(s). The X-ray is generated by an X-ray tube; and an operating voltage of the X-ray tube is greater than or equal to 80 kV to ensure excitation efficiency.

(19) S400, a current signal of the sample under the action of the triangular wave voltage is acquired.

(20) In the embodiment, the signal acquisition component is configured to acquire the current signal of the sample under the action of the triangular wave voltage. The signal acquisition component can be configured to be a current sensor. When the signal generation component is used to apply the triangular wave voltage to the sample, the current sensor can be disposed in a circuit connecting the signal generation component to the sample. The current sensor can further adopt a separate measuring circuit to achieve an acquisition of the current signal. The content here is merely an example and does not constitute a limitation to the disclosure.

(21) S500, a carrier mobility is calculated based on the current signal.

(22) In the embodiment, the carrier mobility is calculated by a filtering and denoising process based on the current signal.

(23) A calculation equation of the carrier mobility u is expressed as follows:

(24) $=\frac{I}{neE}$ where, I represents a measured current, n represents a carrier concentration (a property of the insulating material itself, which can be obtained by looking up tables or through theoretical calculations), e represents an elementary charge, and E represents an electric field strength.

(25) In summary, the disclosure achieves a high accurate measurement of the carrier mobility of the insulating material, and has a wide application value and prospect.

(26) Feasibility and advancement of the disclosure will be further illustrated below with reference to specific experiments.

(27) Based on aforementioned methods, a cross-linked polyethylene material sample and a polypropylene material sample with known carrier mobility values are selected for multiple test experiments. Size parameters of the cross-linked polyethylene material sample and the polypropylene material sample are the same, with a thickness of 200 m, a length of 10 centimeters (cm), and a width of 10 cm. In each of the multiple test experiments, core parameters are set differently. The core parameters include an excitation voltage of the X-ray, an excitation time, the amplitude of the triangular wave voltage and the frequency of the triangular wave voltage. The current signal in each of the multiple test experiments is recorded, and the carrier mobility is calculated based on the current signal. Test results for the cross-linked polyethylene material sample and the polypropylene material sample are shown in table 1 and table 2.

(28) TABLE-US-00001 TABLE 1 Test results for the cross-linked polyethylene material sample amplitude of frequency current experiment excitation triangular of triangular signal/ carrier serial voltage of excitation wave voltage/ wave ampere mobility/ number X-ray/kV time/s volt (V) voltage/Hz (A) V .Math. s 1 80 1 600 0.5 2.1 10.sup.9 1.31 10.sup.7 2 80 0.5 800 1 2.06 10.sup.9 1.29 10.sup.7 3 120 1 600 0.5 2.03 10.sup.9 1.27 10.sup.7 4 120 0.5 800 1 2 10.sup.9 1.25 10.sup.7 5 200 1 600 0.5 2 10.sup.9 1.25 10.sup.7 6 200 0.5 800 1 2.02 10.sup.9 1.26 10.sup.7

(29) TABLE-US-00002 TABLE 2 Test results for the polypropylene material sample amplitude of frequency of experiment excitation triangular triangular carrier serial voltage of excitation wave voltage/ wave current mobility/ number X-ray /kV time/s V voltage/Hz signal/(A) V .Math. s 1 80 1 600 0.5 3.5 10.sup.10 2.19 10.sup.8 2 80 0.5 800 1 3.6 10.sup.10 2.25 10.sup.8 3 120 1 600 0.5 3.55 10.sup.10 2.22 10.sup.8 4 120 0.5 800 1 3.62 10.sup.10 2.26 10.sup.8 5 160 1 600 0.5 3.48 10.sup.10 2.18 10.sup.8 6 160 0.5 800 1 3.7 10.sup.10 2.31 10.sup.8 7 200 1 600 0.5 3.6 10.sup.10 2.25 10.sup.8 8 200 0.5 800 1 3.82 10.sup.9 2.39 10.sup.8

(30) As shown in table land table 2, after the multiple test experiments, calculated values of the carrier mobility of the cross-linked polyethylene material sample and the polypropylene material sample differ little from the known carrier mobility values, proving effectiveness and accuracy of the disclosure.

(31) FIG. 5 illustrates a schematic structural diagram of a detection device for low carrier mobility of the insulating material according to the embodiment of the disclosure. The disclosure further provides the detection device for low carrier mobility of the insulating material, as illustrated in FIG. 5. The detection device for low carrier mobility of the insulating material includes: the sample fixture 501, the voltage generation component 502, an X-ray excitation component 503, the signal acquisition component 504, and a data process component 505.

(32) The sample fixture 501 is configured to fix the sample.

(33) The voltage generation component 502 is configured to be connected to the sample to apply the triangular wave voltage to the both ends of the sample.

(34) The X-ray excitation component 503 is configured to generate the X-ray to irradiate the sample; in which the X-ray is configured to, under the irradiation of the X-ray, drive the sample to generate the carriers inside the sample; the triangular wave voltage is configured to drive the carriers to move; and the irradiation process of the X-ray coincides with the rising phase of the triangular wave voltage.

(35) The signal acquisition component 504, connected to the sample, is configured to acquire the current signal generated by the movement of the carriers inside the sample.

(36) The data process component 505, connected to the signal acquisition component 504, is configured to calculate the carrier mobility based on the current signal.

(37) In an embodiment, the amplitude of the triangular wave voltage applied to the both ends of the sample by the voltage generation component 502 is determined according to the rated breakdown voltage of the sample.

(38) In an embodiment, the X-ray excitation component 503 is configured to be the X-ray tube, and an operating voltage of the X-ray tube is greater than or equal to 80 kV.

(39) Embodiments described above are merely used to illustrate the disclosure, and are not to limit the disclosure. Those skilled in the art can make modification and variation to the embodiments without departing from the spirit and scope of the disclosure. Therefore, all equivalent technical solutions fall with a scope of protection of the disclosure, and the scope of protection of the disclosure is defined by the claims.