IC socket for semiconductor
11624774 · 2023-04-11
Assignee
Inventors
Cpc classification
G01R1/0466
PHYSICS
H01R33/76
ELECTRICITY
G01R31/2863
PHYSICS
H01L23/32
ELECTRICITY
International classification
H01L23/32
ELECTRICITY
Abstract
Provided is an IC socket for a semiconductor capable of preventing adhesion of dust to a photodetection surface provided on an opposite side of a contact surface of an image sensor with no contact with the photodetection surface. The IC socket for a semiconductor includes: a seat (12) that has an attachment surface (12a) to which an image sensor (60) is attached; a base (10) that has a placement surface (10b) on which the seat (12) is placed and a secured surface (10a) located on an opposite side of the placement surface (10b) and secured to an inspection substrate; and a lid member (18) that does not come into contact with the image sensor (60) and that covers a back surface region (80) on a side of a back surface (64) of the image sensor (60) when the image sensor (60) is attached to the seat (12).
Claims
1. An IC socket for a semiconductor comprising: a seat that has an attachment surface to which an image sensor is attached; a base that has a placement surface on which the seat is placed and a secured surface located on an opposite side of the placement surface and to be secured to an inspection substrate; a lid member that does not come into contact with the image sensor and that covers a back surface region located on a side of a back surface of the image sensor when the image sensor is attached to the seat; and a cover that is attached so as to slide relative to the base in a perpendicularly intersecting direction that perpendicularly intersects the attachment surface, wherein the lid member follows the sliding of the cover to cover and release the back surface region.
2. The IC socket for a semiconductor according to claim 1, further comprising: a support shaft that attaches the lid member to the cover such that the lid member is able to turn; and a releasing mechanism that follows a motion of sliding the cover in a pressing direction directed from a side of the placement surface to a side of the secured surface to cause the lid member to turn around the support shaft so as to release the back surface region.
3. The IC socket for a semiconductor according to claim 1, further comprising a releasing mechanism that includes a push rod that is secured to the base, is provided to stand in the perpendicularly intersecting direction, and abuts on the lid member to press the lid member in an opening direction.
4. The IC socket for a semiconductor according to claim 1, wherein the lid member has a notch portion at an edge of a distal end located on an opposite side of the support shaft and edges of side surfaces connected to both ends of the edge of the distal end, and the cover has an abutting portion that has a shape corresponding to the notched portion and touch the notch portion when the lid member is in a closed state.
5. The IC socket for a semiconductor according to claim 1, wherein the lid member has a first lid member and a second lid member, and the first lid member and the second lid member are disposed to face each other in a same plane.
6. The IC socket for a semiconductor according to claim 1, wherein the lid member has a first lid member and a second lid member, and wherein the first lid member has a notch portion at an edge of a distal end located on an opposite side of the support shaft, and the second lid member has, at a distal end, an abutting portion that has a shape corresponding to the notched portion and touch the notch portion when the lid member is in a closed state.
7. The IC socket for a semiconductor according to claim 1, further comprising: a tubular guide rib that is provided to stand in a pulling direction directed from the secured surface to the placement surface and that surrounds the attachment surface, wherein when the lid member is in a closed state, the lid member abuts on an end portion of the guide rib on a side of the pulling direction.
8. The IC socket for a semiconductor according to claim 1, further comprising: a biasing mechanism that biases the lid member such that the lid member is brought into a closed state.
Description
BRIEF DESCRIPTION OF DRAWINGS
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DESCRIPTION OF EMBODIMENTS
(13) Hereinafter, an IC socket for a semiconductor according to the present disclosure will be described with reference to drawings.
First Embodiment
(14) Hereinafter, an embodiment of the present disclosure will be described using the drawings.
(15) First, an overview of an IC socket for a semiconductor 1A according to the present embodiment (hereinafter, simply referred to as a “socket 1A”) will be described.
(16) The socket 1A is an IC socket for a semiconductor of a so-called open-top type.
(17) The lid member 18 has a substantially square shape and is brought into a closed state illustrated in
(18) Next, the socket 1A will be described in detail.
(19)
(20) The base 10 has a placement surface 10b on the opposite side (the upper side in
(21) The image sensor 60 has a thin plate shape, and the lower surface thereof, which is illustrated in the drawing, serves as a contact surface 62. The image sensor 60 is placed on the attachment surface 12a with the contact surface 62 and the attachment surface 12a of the seat 12 brought into surface contact with each other. A plurality of solder balls are formed on the contact surface 62. The plurality of solder balls are pinched with tweezer-type contacts provided on the attachment surface 12a, which are not illustrated, and are electrically connected thereto.
(22) Also, the image sensor 60 is attached and secured to the attachment surface 12a by the solder balls formed in the image sensor 60 being pinched with the contacts provided on the attachment surface 12a. The contacts are electrically connected to the aforementioned terminals 10c. In this manner, the inspection substrate and the image sensor 60 are electrically connected to each other, and a burn-in test can thus be carried out. On the other side, the upper surface of the image sensor 60, which is illustrated in the drawing, serves as a sensor surface. A photodetection surface that has a photodetection element is provided on the sensor surface.
(23) Note that the image sensor 60 may be of a land grid array (LGA) type in which a plane electrode pads aligned in a grid shape are formed, instead of a ball grid array (BGA) type in which solder balls are formed as described above.
(24) A cover 16 that can slide in a perpendicularly intersecting direction (the up-down direction in
(25) As illustrated in
(26) When the lid member 18 is in the closed state, and the image sensor 60 is attached (the state in
(27) The lid member 18 is biased by the biasing mechanism 26 to constantly turn in a direction (a direction in which the closed state is achieved) in which the back surface region 80 is covered. As the biasing mechanism 26, a torsion spring as illustrated in
(28) As illustrated in
(29) The notch portion 22 is notched in a plate thickness direction from the side of the bottom surface 19 of the lid member 18 along the peripheral edges of the three sides described above. Also, the vertical section of the notch portion 22 is a rectangular shape. Note that the shape of the notch portion 22 is not limited to the shape, may be any shape notched from the side of the bottom surface 19 of the lid member 18, and may be, for example, an arc shape, a step shape, or a shape as a combination thereof.
(30) Also, as illustrated in
(31) The guide rib 14 has such a tubular shape that surrounds the attachment surface 12a. The guide rib 14 is provided to stand in a pulling direction (the direction from the lower side to the upper side illustrated in the drawing) directed from the secured surface 10a to the placement surface 10b.
(32) As illustrated in
(33) Next, the releasing mechanism that causes the lid member 18 to turn from the closed state to the opened state will be described.
(34) The releasing mechanism includes push rods 28 with rod shapes that have proximal ends at the base 10 as illustrated in
(35) The push rods 28 are configured such that distal ends thereof (the upper ends illustrated in the drawing; the ends on the opposite side of the distal ends) abut on the bottom surface 19 of the lid member 18. The distal end sides of the push rods 28 are formed as R portions 29 rounded into quarter-arc shapes. Further, upper ends of the R portions 29 serve as R upper ends 30. When the lid member 18 is in the closed state (the state in
(36) The push rods 28 have the following actions. In other words, when the cover 16 is caused to slide in the pressing direction (the direction directed from the upper side to the lower side illustrated in
(37) Note that the push rod 28 and the lid member 18 smoothly slide by forming the R portions 29 at the push rods 28.
(38) Also, it is possible to curb the length by which the push rods 28 are provided to stand, by locating the positions at which the push rods 28 are provided to stand, that is, the positions of the R upper ends 30 to be close to the side of the support shaft 20. In other words, it is possible to curb the height of the entire socket 1A.
(39) However, if the positions of the R upper ends 30 are located to be excessively close to the side of the support shaft 20, the distance between the push rods 28 as a point where force works and the support shaft 20 becomes short, and large force is thus needed to turn the lid member 18. In other words, force needed to slide the cover 16 in the pressing direction increases. Therefore, the positions and the lengths of the push rods 28 are not limited to the form illustrated in the drawing, and it is preferable that the positions and the lengths thereof be appropriately designed in accordance with the specification of the socket 1A.
(40) The seat 12 also slides as described above by causing the cover 16 to slide in the pressing direction. The sliding of the seat 12 is performed by a mechanism, which is not illustrated, and the tweezer-type contacts provided on the attachment surface 12a, which are not illustrated, are opened or closed along with the sliding. Specifically, the tweezer-type contacts are brought into the opened state when the cover 16 is caused to slide in the pressing direction.
(41) Also, the tweezer-type contacts are brought into the closed state when the cover 16 is caused to slide in the pulling direction. In other words, the tweezer-type contacts are brought into the opened state when the lid member 18 releases the back surface region 80, and at the same time, the image sensor 60 can be attached to the attachment surface 12a.
(42) Also, the tweezer-type contacts are brought into the closed state when the lid member 18 covers the back surface region 80, and at the same time, the contacts pinch the plurality of solder balls formed on the contact surface 62 of the image sensor 60, thereby securing the image sensor 60 to the attachment surface 12a.
(43) Further, hook-shaped latches 31 are opened and closed with the sliding of the cover 16 as illustrated in
(44) The latches 31 are connected to the base 10 via springs 32. The latches 31 are biased by the springs 32 such that the hook-shaped distal ends thereof come into contact with the upper surface 64 of the image sensor 60 attached to the seat 12 when the lid member 18 is in the closed state (the state in
(45) The present embodiment has the following advantages.
(46) It is possible to cover the back surface region 80 located on the side of the upper surface 64 of the image sensor 60 in a non-contact manner when the image sensor 60 is attached to the attachment surface 12a of the seat 12. In this manner, it is possible to prevent adhesion of dust to the photodetection surface provided on the upper surface 64 located on the opposite side of the contact surface 62 of the image sensor 60 with no contact with the photodetection surface.
(47) Also, it is possible to easily open and close the lid member 18 by following the sliding of the cover 16 by employing a simple structure of the push rods 28. In other words, it is possible to easily cover and release the back surface region 80 of the image sensor 60 when the image sensor 60 is attached to the seat 12.
(48) Also, the abutting portion 24 that abuts on the notch portion 22 of the lid member 18 in the closed state when the lid member 18 covers the back surface region 80 is formed in the cover 16. In this manner, the abutting portion 24 serves as a stopper of the lid member 18, and it is thus possible to maintain the closed state of the lid member 18. Also, since the abutting portion 24 has the shape corresponding to the notch portion 22, and overlapping portions are provided, it is possible to prevent entrance of dust into the back surface region 80 from the gap between the lid member 18 and the cover 16.
(49) Also, in a case in which the end portion of the guide rib 14 on the side of the pulling direction is designed to abut on the bottom surface 19 of the lid member 18 when the lid member 18 is in the closed state, the guide rib 14 serves as a stopper of the lid member 18, and it is thus possible to maintain the closed state of the lid member 18. Also, since the attachment surface 12a is surrounded by the guide rib 14, and the lid member 18 covers the back surface region 80 and abuts on the end portion of the guide rib 14, it is possible to more reliably prevent entrance of dust into the back surface region 80.
Second Embodiment
(50) Next, a second embodiment of the present disclosure will be described using drawings.
(51) A socket 1B according to the present embodiment is different from the first embodiment in the shape of the lid member 18, and the other points are similar to those in the first embodiment. Therefore, only points that are different from those in the first embodiment will be described, and description of the other points will be omitted by using the same reference signs.
(52) A lid member 18 has a first lid member 18a and a second lid member 18b as illustrated in
(53) In a case of
(54) The first lid member 18a and the second lid member 18b are opened and closed in a double-door form as illustrated in
(55) A notch portion 22 is formed at an edge of a distal end of the first lid member 18a located on the opposite side of the support shaft 20a as illustrated in
(56) The distance between an R upper end 30a of an R portion 29a provided at the push rod 28a and the support shaft 20a in a direction in which the support shaft 20a and the support shaft 20b are connected is set to be shorter than the distance between an R upper end 30b of an R portion 29b provided at the push rod 28b and the support shaft 20b.
(57) In this manner, it is possible to reduce the turning angle of the second lid member 18b as compared with the turning angle of the first lid member 18a when the cover 16 is caused to slide as illustrated in
(58) The present embodiment has the following advantages.
(59) It is possible to cover the back surface region 80 located on the side of the upper surface 64 of the image sensor 60 in a non-contact manner when the image sensor 60 is attached to the attachment surface 12a of the seat 12, with the lid member 18 that has the first lid member 18a and the second lid member 18b. It is thus possible to prevent adhesion of dust to the photodetection surface provided on the upper surface 64 located on the opposite side of the contact surface 62 of the image sensor 60 with no contact with the photodetection surface.
(60) Also, it is possible to easily open and close the lid member 18 through the sliding of the cover 16 by employing a simple structure of the push rods 28. In other words, it is possible to easily cover and release the back surface region 80 of the image sensor 60 when the image sensor 60 is attached to the seat 12.
(61) Also, in a case in which the end portion of the guide rib 14 on the side of the pulling direction is designed to abut on the bottom surface 19 of the lid member 18 when the lid member 18 is in the closed state, the guide rib 14 serves as a stopper of the lid member 18, and it is thus possible to maintain the closed state of the lid member 18. In addition, the attachment surface 12a is surrounded by the guide rib 14, the lid member 18 covers the back surface region 80 and abuts on the end portion of the guide rib 14, and it is thus possible to more reliably prevent entrance of dust into the back surface region 80.
(62) Also, since the lid member 18 has the first lid member 18a and the second lid member 18b, it is possible to curb the height of the entire socket 1B when the first lid member 18a and the second lid member 18b are opened as compared with a case in which a single lid member is provided, for example.
(63) Also, since the abutting portion 24 with the shape corresponding to the notch portion 22 formed in the first lid member 18a is formed in the second lid member 18b, it is possible to prevent entrance of dust into the back surface region 80 from the gap between the first lid member 18a and the second lid member 18b.
(64) Note that although no biasing mechanism 26 such as a torsion spring is illustrated in
REFERENCE SIGNS LIST
(65) 1 (1A, 1B) IC socket for semiconductor (socket)
(66) 10 Base
(67) 10a Secured surface
(68) 10b Placement surface
(69) 10c Terminal
(70) 12 Seat
(71) 12a Attachment surface
(72) 14 Guide rib
(73) 16 Cover
(74) 18 Lid member
(75) 18a First lid member
(76) 18b Second lid member
(77) 19 Bottom surface
(78) 20, 20a, 20b Support shaft
(79) 22 Notch portion
(80) 24 Abutting portion
(81) 26 Biasing mechanism
(82) 28, 28a, 28b Push rod (releasing mechanism)
(83) 29, 29a, 29b R portion
(84) 30, 30a, 30b R upper end
(85) 31 Latch
(86) 32 Spring
(87) 60 Image sensor
(88) 62 Contact surface
(89) 64 Back surface
(90) 80 Back surface region