Method of preparing a sample for physical analysis

Abstract

A method of preparing a sample for physical analysis is disclosed, which is characterized by forming a low-temperature atomic layer deposition (ALD) metal nitride film or a low-temperature atomic layer deposition (ALD) metal oxynitride film by plasma-less enhanced atomic layer deposition (PLALD) at a temperature below 40° C. on a specimen to generate a sample for physical analysis to prevent the surface of sample for physical analysis from being damaged during physical analysis.

Claims

1. A method of preparing a sample for physical analysis, comprising the steps of: providing a specimen; and forming a low-temperature atomic layer deposition (ALD) film on the specimen to generate a sample for physical analysis; wherein the low-temperature atomic layer deposition (ALD) film is formed by plasma-less enhanced atomic layer deposition (PLALD) at a temperature below 40° C.; wherein the low-temperature atomic layer deposition (ALD) film is a metal nitride film or a metal oxynitride film.

2. The method of preparing a sample for physical analysis as claimed in claim 1, wherein the metal nitride film is an aluminum nitride (ALN) film, a molybdenum nitride (MoN) film, a titanium nitride film (TiN) or a tantalum nitride (TaN) film.

3. The method of preparing a sample for physical analysis as claimed in claim 2, further comprising a step of slimming treatment for the low-temperature atomic layer deposition (ALD) film formed on the sample for physical analysis.

4. The method of preparing a sample for physical analysis as claimed in claim 3, wherein the step of slimming treatment is proceed by a focus ion beam (FIB) system.

5. The method of preparing a sample for physical analysis as claimed in claim 1, wherein the metal oxynitride film is a tantalum oxynitride (TaON) film.

6. The method of preparing a sample for physical analysis as claimed in claim 5, further comprising a step of slimming treatment for the low-temperature atomic layer deposition (ALD) film formed on the sample for physical analysis.

7. The method of preparing a sample for physical analysis as claimed in claim 6, wherein the step of slimming treatment is proceed by a focus ion beam (FIB) system.

8. The method of preparing a sample for physical analysis as claimed in claim 1, further comprising a step of slimming treatment for the low-temperature atomic layer deposition (ALD) film formed on the sample for physical analysis.

9. The method of preparing a sample for physical analysis as claimed in claim 8, wherein the step of slimming treatment is proceed by a focus ion beam (FIB) system.

Description

BRIEF DESCRIPTION OF THE DRAWINGS

(1) FIGS. 1A-1B are cross-sectional views illustrating steps of a method of preparing a sample 1000 for physical analysis according to Embodiment 1 of this present invention.

(2) FIGS. 2A-2C are cross-sectional views illustrating steps of a method of preparing a sample 2000 for physical analysis according to Embodiment 2 of this present invention.

DETAILED DESCRIPTION OF THE INVENTION

(3) The detailed description provided below in connection with the appended drawings is intended as a description of the present examples and is not intended to represent the only forms in which the present example may be constructed or utilized. The description sets forth the functions of the example and the sequence of steps for constructing and operating the example. However, the same or equivalent functions and sequences may be accomplished by different examples.

(4) In the following description, numerous specific details are described in detail in order to enable the reader to fully understand the following examples. However, embodiments of the present invention may be practiced in case no such specific details. In other cases, in order to simplify the drawings the structure of the apparatus known only schematically depicted in figures.

EMBODIMENT

Embodiment 1

(5) Please refer to FIGS. 1A-1B, which are cross-sectional views illustrating steps of a method of preparing a sample 1000 for physical analysis according to Embodiment 1 of this present invention.

(6) First, as shown in FIG. 1A, a specimen 10 was provided, wherein the specimen 10 comprises a substrate 100 with a top surface 100A having a plurality of structures 110 formed thereon, and a bottom surface 100B opposite to the top surface 100A.

(7) Next, as shown in FIG. 1B, a low-temperature atomic layer deposition (ALD) film 150 with a thickness for example but not limited to 5 Ř600 Šwas formed on the top surface 100A of the sample 10 and overlay the structures 110 on the top surface 100A to generate a sample 1000 for physical analysis. The sample 1000 for physical analysis can be used for subsequent physical analysis by an electron microscope, for example but not limited to a scanning electron microscope (SEM), a transmission electron microscope (TEM) or a focused ion beam microscope (FIB).

(8) The low-temperature atomic layer deposition (ALD) film 150 was formed by plasma-less enhanced atomic layer deposition (PLALD) at a temperature below 40° C. The low-temperature atomic layer deposition (ALD) film 150 can be for example but not limited to a metal oxide film, a metal nitride film or a metal oxynitride film.

(9) The above-mentioned metal oxide film is for example but not limited to a titanium dioxide (TiO.sub.2) film, an aluminum oxide (Al.sub.2O.sub.3) film, a hafnium dioxide (HfO.sub.2) film, an indium tin oxide (ITO) film or an indium gallium zinc oxide (IGZO) film.

(10) The above-mentioned metal nitride film is for example but not limited to an aluminum nitride (ALN) film, a molybdenum nitride (MoN) film, a titanium nitride film (TiN) or a tantalum nitride (TaN) film.

(11) The above-mentioned metal oxynitride film is for example but not limited to a tantalum oxynitride (TaON) film.

Embodiment 2

(12) Please refer to FIGS. 2A-2C, which are cross-sectional views illustrating steps of a method of preparing a sample 2000 for physical analysis according to Embodiment 2 of this present invention.

(13) First, as shown in FIG. 2A, a sample 20 was provided, wherein the specimen 20 comprises a substrate 200 with a top surface 200A having a plurality of structures 210 formed thereon, and a bottom surface 200B opposite to the top surface 200A.

(14) Next, as shown in FIG. 2B, a low-temperature atomic layer deposition (ALD) film 250 with a thickness for example but not limited to 5 Ř600 Å was formed on the top surface 200A of the specimen 20 and overlay the structures 210 on the top surface 200A. The low-temperature atomic layer deposition (ALD) film 250 was formed by plasma-less enhanced atomic layer deposition (PLALD) at a temperature below 40° C. The low-temperature atomic layer deposition (ALD) film 250 can be for example but not limited to a metal oxide film, a metal nitride film or a metal oxynitride film.

(15) Next, as shown in FIG. 2C, the low-temperature atomic layer deposition (ALD) film 250 was slimmed by a focus ion beam system (FIB) to form a slimmed low-temperature atomic layer deposition (ALD) film 250′ formed on the top surface 200A of the sample 20 and overlay the structures 210 on the top surface 200A to generate a sample 2000 for physical analysis. The sample 2000 for physical analysis can be used for subsequent physical analysis by an electron microscope, for example but not limited to a scanning electron microscope (SEM), a transmission electron microscope (TEM) or a focused ion beam microscope (FIB).

(16) The above-mentioned metal oxide film is for example but not limited to a titanium dioxide (TiO.sub.2) film, an aluminum oxide (Al.sub.2O.sub.3) film, a hafnium dioxide (HfO.sub.2) film, an indium tin oxide (ITO) film or an indium gallium zinc oxide (IGZO) film.

(17) The above-mentioned metal nitride film is for example but not limited to an aluminum nitride (ALN) film, a molybdenum nitride (MoN) film, a titanium nitride film (TiN) or a tantalum nitride (TaN) film.

(18) The above-mentioned metal oxynitride film is for example but not limited to a tantalum oxynitride (TaON) film.

(19) To sum up, the method of preparing a sample for physical analysis according to this invention can improve the disadvantages suffered by the conventional method of preparing a sample for physical analysis by forming a low-temperature atomic layer deposition (ALD) film on the sample, thereby the surfaces of biological samples or samples with relatively soft materials will not be damaged and favorable for subsequent precise defect analysis.

(20) Although particular embodiments have been shown and described, it should be understood that the above discussion is not intended to limit the present invention to these embodiments. Persons skilled in the art will understand that various changes and modifications may be made without departing from the scope of the present invention as literally and equivalently covered by the following claims.