Abstract
An optoelectronic device is provided, the optoelectronic device including a radiation source that is configured to emit electromagnetic radiation, a sensor that is configured to detect electromagnetic radiation, a carrier on which the radiation source and the sensor are arranged, and a deflection element, wherein the sensor is arranged between the deflection element and the carrier, the radiation source has a main plane of extension that extends parallel to a main plane of extension of the sensor, and the deflection element has at least one deflection surface that encloses an angle of more than 0 with the main plane of extension of the sensor. Furthermore, a method for operating an optoelectronic device is provided.
Claims
1. An optoelectronic device comprising: a radiation source that is configured to emit electromagnetic radiation, a sensor that is configured to detect electromagnetic radiation, a carrier on which the radiation source and the sensor are arranged, and a deflection element, wherein the sensor is arranged between the deflection element and the carrier, the radiation source has a main plane of extension that extends parallel to a main plane of extension of the sensor, the deflection element has at least one deflection surface that encloses an angle of more than 0 with the main plane of extension of the sensor, the deflection element is arranged within a housing comprising an opening, the opening is connected with a channel arranged within the housing, wherein the channel has a main extension direction that runs parallel to the main plane of extension of the sensor, and the opening and the channel are provided such that only electromagnetic radiation that is emitted by the radiation source and that has a main propagation direction which encloses an angle of less than 20 with the main plane of extension of the radiation source can pass the opening and the channel towards the deflection element.
2. The optoelectronic device according to claim 1, wherein the deflection element is configured to change the main propagation direction of electromagnetic radiation impinging on the deflection element by 90.
3. The optoelectronic device according to claim 1, wherein the deflection surface of the deflection element encloses an angle of at least 30 and at most 60 with the main plane of extension of the sensor.
4. The optoelectronic device according to claim 1, wherein the deflection surface of the deflection element has a reflection coefficient of at least 0.5 for electromagnetic radiation emitted by the radiation source.
5. The optoelectronic device according to claim 1, wherein the deflection element comprises a mirror.
6. The optoelectronic device according to claim 1, wherein the sensor has a radiation-sensitive region with a main plane of extension that extends parallel to the main plane of extension of the radiation source.
7. (canceled)
8. (canceled)
9. The optoelectronic device according to claim 1, wherein the sensor is arranged within the housing.
10. The optoelectronic device according to claim 1, wherein at least one surface of the housing has a reflection coefficient of at least 0.5.
11. The optoelectronic device according to claim 1, wherein the optoelectronic device comprises at least one further radiation source.
12. The optoelectronic device according to claim 11, wherein the optoelectronic device comprises at least one further deflection element, wherein the further deflection element is arranged closer to the further radiation source than the deflection element.
13. The optoelectronic device according to claim 1, wherein the radiation source is configured to emit electromagnetic radiation of wavelengths within a range of wavelengths, wherein the range has an extension of 100 nm at most.
14. A method for operating the optoelectronic device of claim 1, the method comprising: emitting electromagnetic radiation by the radiation source of the optoelectronic device, deflecting, by the deflecting element, electromagnetic radiation emitted by the radiation source towards the sensor of the optoelectronic device, and detecting deflected electromagnetic radiation by the sensor, wherein electromagnetic radiation that is emitted by the radiation source and that has a main propagation direction which encloses an angle of less than 20 with the main plane of extension of the radiation source is deflected towards the sensor.
15. (canceled)
16. An optoelectronic device comprising: a radiation source that is configured to emit electromagnetic radiation, a sensor that is configured to detect electromagnetic radiation, a carrier on which the radiation source and the sensor are arranged, and a deflection element, wherein the sensor is arranged between the deflection element and the carrier, the radiation source has a main plane of extension that extends parallel to a main plane of extension of the sensor, and the deflection element has at least one deflection surface that encloses an angle of more than 0 with the main plane of extension of the sensor.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
[0039] FIG. 1 shows an exemplary embodiment of the optoelectronic device and an exemplary embodiment of the method for operating an optoelectronic device is described with FIG. 1.
[0040] FIGS. 2 and 3 show a part of an exemplary embodiment of the optoelectronic device.
[0041] FIG. 4 shows an exemplary embodiment of the sensor.
[0042] FIG. 5 shows an exemplary embodiment of the housing.
[0043] FIG. 6 shows a top view on an exemplary embodiment of the sensor.
[0044] FIG. 7 shows a part of an exemplary embodiment of the optoelectronic device.
[0045] FIGS. 8, 9 and 10 show further exemplary embodiments of the optoelectronic device.
[0046] FIGS. 11, 12 and 13 show cross sections through further exemplary embodiments of the optoelectronic device.
DETAILED DESCRIPTION
[0047] FIG. 1 shows an exemplary embodiment of the optoelectronic device 20. The optoelectronic device 20 comprises a radiation source 21 that is configured to emit electromagnetic radiation. The radiation source 21 is arranged on a carrier 23. The radiation source 21 can emit electromagnetic radiation in two different directions. In FIG. 1, as an example rays of electromagnetic radiation are depicted that propagate mainly in one direction. The radiation source 21 can be configured to emit electromagnetic radiation of wavelengths within a range of wavelengths, wherein the range has an extension of 100 nm at most.
[0048] The optoelectronic device 20 further comprises a sensor 22 that is configured to detect electromagnetic radiation. Also the sensor 22 is arranged on the carrier 23. In FIG. 1 the sensor 22 is not visible as it is arranged within a housing 27. The housing 27 is arranged on the carrier 23. Within the housing 27 a deflection element 24 is arranged. The deflection element 24 is arranged in such a way that the sensor 22 is arranged between the deflection element 24 and the carrier 23.
[0049] The radiation source 21 has a main plane of extension that extends parallel to a main plane of extension of the sensor 22, and the deflection element 24 has at least one deflection surface 25 that encloses an angle of more than 0 with the main plane of extension of the sensor 22. These features are not visible in FIG. 1 and are shown in other figures.
[0050] According to an exemplary embodiment of the method for operating optoelectronic device 20, the radiation source 21 emits electromagnetic radiation and a part of the emitted electromagnetic radiation is deflected towards the sensor 22. The sensor 22 then detects deflected electromagnetic radiation.
[0051] Electromagnetic radiation emitted by the radiation source 21 can reach an opening 28 of the housing 27. The electromagnetic radiation can enter the housing 27 through the opening 28. The electromagnetic radiation that enters the housing 27 through the opening 28 can reach the sensor 22 by being deflected by the deflection element 24.
[0052] Electromagnetic radiation that is emitted by the radiation source 21 and that has a main propagation direction which encloses an angle of less than 20 with the main plane of extension of the radiation source 21 is deflected towards the sensor 22. This is visible in FIG. 1 where only rays of electromagnetic radiation that enclose a small angle with the main plane of extension of the carrier 23 reach the opening 28. The amount of electromagnetic radiation emitted by the radiation source 21 and passing the opening 28 can be adapted by changing the extension of the opening 28 in a vertical direction z that extends perpendicular to the main plane of extension of the carrier 23. The larger the extension of the opening 28 in the vertical direction z is, the larger is the range of angles of main propagation directions of electromagnetic radiation that can pass the opening 28.
[0053] FIG. 2 shows a part of an exemplary embodiment of the optoelectronic device 20. A cross-section through the sensor 22 with the deflection element 24 is shown. The housing 27 is not shown in FIG. 2. A plurality of rays of electromagnetic radiation emitted by the radiation source 21 propagate from the left side of the figure towards the deflection element 24. At the deflection surface 25 the main propagation direction of the electromagnetic radiation is changed by 90. This means, the deflection element 24 is configured to change the main propagation direction of electromagnetic radiation impinging on the deflection element 24 by 90. Thus, the electromagnetic radiation is deflected towards the sensor 22.
[0054] For this purpose, the deflection surface 25 of the deflection element 24 encloses an angle of at least 30 and at most 60 with the main plane of extension of the sensor 22. Furthermore, the deflection surface 25 of the deflection element 24 can have a reflection coefficient of at least 0.5 for electromagnetic radiation emitted by the radiation source 21. It is also possible that the deflection element 24 comprises a mirror.
[0055] The sensor 22 has a radiation-sensitive region 26 with a main plane of extension that extends parallel to the main plane of extension of the radiation source 21. Thus, in FIG. 2 the main propagation direction of electromagnetic radiation reaching the sensor 22 and the main plane of extension of the radiation-sensitive region 26 enclose an angle of 90.
[0056] FIG. 3 shows the same part of the optoelectronic device 20 as FIG. 2, but seen from a different angle. No cross-section through the sensor 22 is shown but a view on the sensor 22 with the deflection element 24.
[0057] FIG. 4 shows an exemplary embodiment of the sensor 22. The sensor 22 comprises a package 35 within which the radiation-sensitive region 26 is arranged.
[0058] FIG. 5 shows an exemplary embodiment of the housing 27. The housing 27 is seen from a bottom side 32 of the housing 27. When mounted on the carrier 23, the bottom side 32 of the housing 27 faces the carrier 23. The opening 28 is connected with a channel 29 arranged within the housing 27, wherein the channel 29 has a main extension direction that runs parallel to the main plane of extension of the sensor 22. Adjacent to the channel 29 the deflection element 24 is arranged. The main plane of extension of the deflection element 24 is inclined with respect to the sidewalls of the channel 29. Adjacent to the deflection element 24 the housing 27 comprises a cavity 33 in which the sensor 22 is arranged once the housing 27 with the sensor 22 is mounted on the carrier 23. In FIG. 5 the cavity 33 is shown without the sensor 22. At least one surface of the housing 27 can have a reflection coefficient of at least 0.5, for example the surface adjacent to the opening 28.
[0059] FIG. 6 shows an exemplary embodiment of the sensor 22. The sensor 22 comprises three different radiation-sensitive regions 26. The three radiation-sensitive regions 26 can be sensitive to different wavelength ranges, respectively. The deflection surface 25 can be designed in such a way that electromagnetic radiation of a wavelength range is directed towards the respective radiation-sensitive region 26 that is sensitive to this wavelength range.
[0060] FIG. 7 shows a cross-section through a part of another exemplary embodiment of the optoelectronic device 20. A cross-section through the sensor 22 and a part of the housing 27 with the deflection element 24 is shown. The deflection element 24 comprises a free form mirror 34.
[0061] FIG. 8 shows another exemplary embodiment of the optoelectronic device 20. The optoelectronic device 20 comprises the radiation source 21 and a plurality of further radiation sources 30. The radiation source 21 and the plurality of further radiation sources 30 are arranged along a line. The housing 27 with the deflection element 24 is also arranged along the line. The radiation source 21 and the further radiation sources 30 are arranged at the same side of the housing 27. Electromagnetic radiation emitted by the radiation source 21 and by all further radiation sources 30 under angles of 20 at most with respect to the main plane of extension of the carrier 23 can reach the opening 28 and can thus be detected by the sensor 22. Thus, it is possible to monitor not only the emission of the radiation source 21 but also the emission of the further radiation sources 30 with the sensor 22.
[0062] FIG. 9 shows a cross-section through another exemplary embodiment of the optoelectronic device 20. The optoelectronic device 20 comprises the radiation source 21 and at least one further radiation source 30. The radiation source 21 and the further radiation source 30 are arranged at different sides of the housing 27. The optoelectronic device 20 comprises the deflection element 24 and at least one further deflection element 31. The deflection element 24 faces the radiation source 21 and the further deflection element 31 faces the further radiation source 30. Both the deflection element 24 and the further deflection element 31 are arranged within the housing 27. The further deflection element 31 is arranged closer to the further radiation source 30 than the deflection element 24. Thus, it is possible that electromagnetic radiation emitted by the radiation source 21 is deflected by the deflection element 24 towards the sensor 22. It is also possible that electromagnetic radiation emitted by the further radiation source 30 is deflected by the further deflection element 31 towards the sensor 22. Thus, the sensor 22 can be employed to monitor electromagnetic radiation emitted by the radiation source 21 and electromagnetic radiation emitted by the further radiation source 30.
[0063] FIG. 10 shows a top view on another exemplary embodiment of the optoelectronic device 20. The optoelectronic device 20 shown in FIG. 9 can have the set up shown in FIG. 10. One radiation source 21 and seven further radiation sources 30 are arranged around the housing 27. The radiation source 21 and the further radiation sources 30 are arranged along the edges of a square. The housing 27 with the sensor 22 is arranged in the center of the square. Within the housing 27 one further deflection element 31 for each further radiation source 30 is arranged. This means, within the housing 27 the deflection element 24 and seven further deflection elements 31 are arranged. The further deflection elements 31 are arranged as shown in FIG. 9. The housing 27 can comprise eight channels 29 in total. Each channel 29 faces one of the radiation sources 21, 30. It is also possible that more further radiation sources 30 are arranged around the square formed by the further radiation sources 30 and the radiation source 21. It is possible that further radiation sources 30 extend along lines around the housing 27. The sensor 22 can be configured to determine from which radiation source 21 out of the radiation source 21 and the further radiation sources 30 detected electromagnetic radiation is coming.
[0064] FIG. 11 shows a cross-section through another exemplary embodiment of the optoelectronic device 20. One radiation source 21 and one further radiation source 30 are arranged adjacent to each other on the carrier 23. As an example some rays of electromagnetic radiation emitted by the radiation source 21 are depicted in FIG. 11. These rays of electromagnetic radiation are emitted towards the housing 27 where they can enter the housing 27 through the opening 28. At the deflection element 24 the electromagnetic radiation is deflected towards the sensor 22.
[0065] FIG. 12 shows a cross-section through another exemplary embodiment of the optoelectronic device 20. One radiation source 21 and several further radiation sources 30 are arranged along a line on the carrier 23. The housing 27 with the sensor 22 is also arranged along the line. This enables, that the sensor 22 detects electromagnetic radiation emitted by the radiation source 21 and the further radiation sources 30.
[0066] FIG. 13 shows the same exemplary embodiment of the optoelectronic device 20 as FIG. 12. Furthermore, as an example some rays of electromagnetic radiation emitted by the radiation source 21 and the further radiation sources 30 are depicted. These rays propagate towards the housing 27 and can enter the housing 27 through the opening 28. At the deflection element 24 the electromagnetic radiation is deflected towards the sensor 22. Thus, with the sensor 22 electromagnetic radiation emitted by the radiation source 21 and by the further radiation sources 30 can be detected.
[0067] It will be appreciated that the disclosure is not limited to the disclosed embodiments and to what has been particularly shown and described hereinabove. Rather, features recited in separate dependent claims or in the description may advantageously be combined. Furthermore, the scope of the disclosure includes those variations and modifications, which will be apparent to those skilled in the art. The term comprising, insofar it was used in the claims or in the description, does not exclude other elements or steps of a corresponding feature or procedure. In case that the terms a or an were used in conjunction with features, they do not exclude a plurality of such features. Moreover, any reference signs in the claims should not be construed as limiting the scope.
