Method for determining sagging of melt of a tube extruded in an extrusion device
12515391 ยท 2026-01-06
Assignee
Inventors
Cpc classification
B29C48/92
PERFORMING OPERATIONS; TRANSPORTING
B29C2948/92171
PERFORMING OPERATIONS; TRANSPORTING
B29C48/09
PERFORMING OPERATIONS; TRANSPORTING
B29C2948/92666
PERFORMING OPERATIONS; TRANSPORTING
International classification
B29C48/92
PERFORMING OPERATIONS; TRANSPORTING
B29C48/09
PERFORMING OPERATIONS; TRANSPORTING
B29C48/88
PERFORMING OPERATIONS; TRANSPORTING
Abstract
A method for determining sagging of melt of a tube extruded in an extrusion device includes structuring a measuring device to rotate about the tube. The measuring device is configured to measure a wall thickness of the tube over a circumference of the tube and determine a wall-thickness profile over the circumference of the tube from the measured wall thicknesses. The wall-thickness profile includes a frequency and an amplitude. The method further includes determining a sagging of the melt from at least one of (i) the frequency and (ii) the amplitude of the wall-thickness profile.
Claims
1. A method for determining sagging of melt of a tube extruded in an extrusion process, comprising: measuring a wall thickness of the tube over a circumference of the tube; determining a wall-thickness profile over the circumference of the tube from the measured wall thicknesses, wherein the wall-thickness profile includes a frequency; comparing the wall-thickness profile with a reference wall-thickness profile; determining the sagging of the melt from a change in the frequency between the reference wall-thickness profile and the determined wall-thickness profile; and applying a change to at least one control parameter of the extrusion process based on the determined sagging of the melt to control the sagging of the melt.
2. The method according to claim 1, wherein the reference wall-thickness profile comprises a periodic reference wall-thickness profile.
3. The method according to claim 1, wherein the reference wall-thickness profile comprises a measured reference wall-thickness profile directly at an outlet of an extrusion device used in the extrusion process.
4. The method according to claim 1, further comprising generating a deviation profile from the comparison between the wall-thickness profile and the reference wall-thickness profile.
5. The method according to claim 4, further comprising: measuring the wall thickness of the tube over the circumference of the tube at a position downstream of a first cooling section; and cooling the tube emerging from an extrusion device via the first cooling section.
6. The method according to claim 5, further comprising identifying the at least one control parameter of at least one of (i) the extrusion device and (ii) the first cooling section based on the determined sagging of the melt.
7. The method according to claim 6, further comprising changing the at least one control parameter based on the deviation profile.
8. The method according to claim 6, further comprising changing the at least one control parameter by means of a phase-locked loop.
9. The method according to claim 6, wherein the at least one control parameter is at least one of: (i) an output capacity of the extrusion device; (ii) a melt temperature in the extrusion device; (iii) a temperature; and (iv) a position of setting elements of the extrusion device determining a geometry of the tube at an outlet of the extrusion device.
10. The method according to claim 1, further comprising predicting further sagging of the melt before the tube completely solidifies from the determined sagging of the melt.
11. The method according to claim 1, wherein the measuring the wall thickness of the tube over the circumference of the tube comprises: emitting terahertz radiation towards the tube and over the circumference of the tube; detecting the terahertz radiation reflected by the tube; generating measuring signals corresponding to the detected terahertz radiation; and determining the wall thickness over the circumference of the tube based on a propagation time of the measuring signals.
12. The method according to claim 11, wherein the terahertz radiation comprises modulated continuous wave terahertz radiation.
13. The method according to claim 11, wherein: at least one transmitter is configured to emit the terahertz radiation; and at least one detector is configured to detect the terahertz radiation emitted and reflected by the tube, wherein the at least one transmitter is configured to be rotated about a longitudinal axis of the tube during the emission and detection of the terahertz radiation.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
(1) An exemplary embodiment of the invention is explained below in greater detail with reference to figures.
(2)
(3)
(4)
(5)
(6) The same reference numbers refer to the same objects in the figures unless indicated otherwise.
DETAILED DESCRIPTION OF THE INVENTION
(7) A tube 10, in the present case a plastic tube 10, is depicted in
(8) The structure and the function of the measuring device 24 are to be explained in greater detail with reference to
(9) In this case, the measuring device 24 is rotated about the longitudinal axis of the tube during the measurement, for example, of the wall thickness 40, wherein the wall thickness is measured continuously or at discrete distances over the complete circumference of the tube 10 and a wall-thickness profile over the circumference of the tube is produced from this.
(10) The tube 10 is depicted in a cross-section in
(11) This effect is depicted in
(12) The middle diagram in
(13) In the lowermost diagram in
(14) It is also possible, for example, to predict, for example by comparing with a wall-thickness profile produced in the completely solidified state of a corresponding tube 10, further sagging of the melt to be expected before the tube 10 completely solidifies using the wall-thickness profile 54 produced at the measurement location of the measuring device 24, at which the tube 10 regularly still has flowable components.
LIST OF REFERENCE SIGNS
(15) 10 Tube 12 Wall 14 Hollow space 16 Outer surface 18 Inner wall 20 Extrusion device 22, 26 Cooling section 24 Measuring device 28 Cutting-to-length apparatus 30 Transceiver 32 Terahertz radiation 34 Reflector 36 Line 38 Evaluation apparatus 40,42 Wall thickness 46,46 Rays 48 Regions 50 Reference wall-thickness profile 51 Setting elements 52 Boundary surfaces 54 Wall-thickness profile 56 Deviation profile