ION IMPLANTER, CONTROL SYSTEM, AND TECHNIQUES FOR TUNING ION IMPLANTER
20260018378 ยท 2026-01-15
Assignee
Inventors
- Wai Ming TAM (Georgetown, MA, US)
- William Herron Park, JR. (Marblehead, MA, US)
- Peter F. Kurunczi (Cambridge, MA, US)
- Maximilian SCHNEIDER (Boston, MA, US)
- Frank Sinclair (Hartland, ME, US)
- Scott E. Peitzsch (Tewksbury, MA, US)
- Benjamin Alexandrovich (Brookline, MA, US)
Cpc classification
H01J2237/24585
ELECTRICITY
International classification
H01J37/304
ELECTRICITY
H01J37/147
ELECTRICITY
Abstract
A method to operate an ion implanter. The method may include conducting an ion beam into an acceleration stage of a linear accelerator in the ion implanter, where the ion beam is a bunched ion beam. The method may also include applying an RF signal to the acceleration stage while the ion beam passes through the acceleration stage, the RF signal comprising a determined frequency and a determined amplitude, and performing a phase scan using the RF signal. The phase scan may include varying a phase of the RF signal at the acceleration stage over a plurality of phase values; and recording a plurality of arrival times at a monitor, situated downstream of the acceleration stage, the plurality of arrival times corresponding to the plurality of phase values, respectively.
Claims
1. A method to operate an ion implanter, comprising: conducting an ion beam into an acceleration stage of a linear accelerator in the ion implanter, the ion beam comprising a bunched ion beam; applying an RF signal to the acceleration stage while the ion beam passes through the acceleration stage, the RF signal comprising a determined frequency and a determined amplitude; and performing a phase scan using the RF signal, the phase scan comprising: varying a phase of the RF signal at the acceleration stage over a plurality of phase values; and recording a plurality of arrival times at a monitor, situated downstream of the acceleration stage, the plurality of arrival times corresponding to the plurality of phase values, respectively.
2. The method of claim 1, further comprising generating an energy profile for the acceleration stage, based upon the phase scan, the energy profile corresponding to an ion energy, determined at the monitor, as a function of phase of the RF signal, as applied to the acceleration stage.
3. The method of claim 2, further comprising determining a zero synchronous phase for the acceleration stage, based upon the energy profile, wherein the zero synchronous phase corresponds to a phase where a maximum energy is imparted into the ion beam by the acceleration stage.
4. The method of claim 1, wherein the monitor comprising a pair of monitors, wherein an ion energy of the ion beam is determined by a time-of-flight between a first monitor of the pair of monitors and a second monitor of the pair of monitors.
5. The method of claim 3, further comprising: setting the phase of the RF signal so as to impart a targeted acceleration into the bunched ion beam, based upon the zero synchronous phase.
6. The method of claim 5, wherein the conducting the ion beam, the applying the RF signal, the performing the phase scan, the determining a zero synchronous phase and the setting the phase of the RF signal comprise tuning an acceleration stage, the method further comprising tuning at least one additional acceleration stage of the linear accelerator, to complete a tuning of the linear accelerator.
7. The method of claim 6, wherein the tuning the linear accelerator comprises: tuning a first acceleration stage, the first acceleration stage being a most upstream acceleration stage of the linear accelerator, wherein all other acceleration stages of the linear accelerator are set to OFF.
8. The method of claim 7, wherein the tuning the linear accelerator further comprises: tuning an additional acceleration stage, wherein the first acceleration stage and any other acceleration stage, upstream to the at least one additional acceleration stage are set to ON, and wherein all other acceleration stages of the linear accelerator stage are set to OFF.
9. The method of claim 1, wherein the monitor is disposed within the linear accelerator.
10. The method of claim 1, wherein the monitor is disposed upstream to at least one acceleration stage of the linear accelerator.
11. An ion implanter, comprising: an ion source to generate an ion beam; a linear accelerator, comprising a plurality of acceleration stages to accelerate the ion beam, wherein a given acceleration stage is driven by an RF signal, comprising a determined frequency and a determined amplitude; and a controller, coupled to the linear accelerator, the controller comprising: a processor; and a memory unit coupled to the processor, including a tuning routine, the tuning routine operative on the processor to control the ion implanter to: apply the RF signal to the given acceleration stage while the ion beam passes through the acceleration stage; and perform a phase scan using the RF signal, the phase scan comprising: varying a phase of the RF signal at the given acceleration stage over a plurality of phase values; and recording a plurality of arrival times at a monitor, situated downstream of the given acceleration stage, the plurality of arrival times corresponding to the plurality of phase values, respectively.
12. The ion implanter of claim 11, wherein the tuning routine operative on the processor to: generate an energy profile for the given acceleration stage, based upon the phase scan, the energy profile corresponding to an ion energy, determined at the monitor, as a function of the phase of the RF signal, as applied to the given acceleration stage.
13. The ion implanter of claim 12, wherein the tuning routine operative on the processor to: determine a zero synchronous phase for the given acceleration stage, based upon the energy profile, wherein the zero synchronous phase corresponds to a phase where a maximum energy imparted is into the ion beam by the given acceleration stage.
14. The ion implanter of claim 13 the tuning routine operative on the processor to control the ion implanter to: set the phase of the RF signal so as to impart a targeted acceleration into the ion beam, based upon the zero synchronous phase.
15. The ion implanter of claim 14, wherein the applying the RF signal, the performing the phase scan, the determining the zero synchronous phase, and the setting the phase of the RF signal comprise performing an acceleration stage tune, the tuning routine operative on the processor to control the ion implanter to: perform the acceleration stage tune on at least one additional acceleration stage of the linear accelerator.
16. A controller for an ion implanter, comprising: a processor; and a memory unit coupled to the processor, including a tuning routine, the tuning routine operative on the processor to control the ion implanter for: applying an RF signal to an acceleration stage of a linear accelerator of the ion implanter while an ion beam passes through the acceleration stage, performing a phase scan using the RF signal; generating an energy profile for the acceleration stage, based upon the phase scan; determining a zero synchronous phase based upon the energy profile; and setting an RF phase of the RF signal so as to impart a targeted acceleration into the ion beam, based upon the zero synchronous phase.
17. The controller of claim 16, the tuning routine operative on the processor to control the ion implanter to: perform the phase scan by: varying a phase of the RF signal at the acceleration stage over a plurality of phase values; and recording a plurality of arrival times at a monitor, situated downstream of the acceleration stage, the plurality of arrival times corresponding to the plurality of phase values, respectively.
18. The controller of claim 16, wherein the zero synchronous phase corresponds to a phase where a maximum energy is imparted into the ion beam by the acceleration stage.
19. The controller of claim 16, wherein the applying the RF signal, the performing the phase scan, the determining the zero synchronous phase, and the setting the phase of the RF signal comprise performing an acceleration stage tune, the tuning routine operative on the processor to control the ion implanter to: perform the acceleration stage tune on at least one additional acceleration stage of the linear accelerator.
20. The controller of claim 19, the tuning routine operative on the processor to control the ion implanter to: perform the acceleration stage tune by: setting the at least one additional acceleration stage and any other acceleration stage, upstream to the at least one additional acceleration stage to ON, and set all other acceleration stages of the linear accelerator to OFF.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
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[0020] The drawings are not necessarily to scale. The drawings are merely representations, not intended to portray specific parameters of the disclosure. The drawings are intended to depict exemplary embodiments of the disclosure, and therefore are not be considered as limiting in scope. In the drawings, like numbering represents like elements.
DETAILED DESCRIPTION
[0021] An apparatus, system and method in accordance with the present disclosure will now be described more fully hereinafter with reference to the accompanying drawings, where embodiments of the system and method are shown. The system and method may be embodied in many different forms and are not be construed as being limited to the embodiments set forth herein. Instead, these embodiments are provided so this disclosure will be thorough and complete, and will fully convey the scope of the system and method to those skilled in the art.
[0022] Terms such as top, bottom, upper, lower, vertical, horizontal, lateral, and longitudinal may be used herein to describe the relative placement and orientation of these components and their constituent parts, with respect to the geometry and orientation of a component of a semiconductor manufacturing device as appearing in the figures. The terminology may include the words specifically mentioned, derivatives thereof, and words of similar import.
[0023] As used herein, an element or operation recited in the singular and proceeded with the word a or an are understood as potentially including plural elements or operations as well. Furthermore, references to one embodiment of the present disclosure are not intended to be interpreted as precluding the existence of additional embodiments also incorporating the recited features.
[0024] Provided herein are approaches for improved operation of high energy ion implantation systems and components, based upon a beamline architecture, and in particular, ion implanters based upon linear accelerators. For brevity, an ion implantation system may also be referred to herein as an ion implanter. Various embodiments provide novel resonator structures for RF linear accelerators (LINACs).
[0025]
[0026] The ion implanter 100 may include an analyzer 104, functioning to analyze the ion beam 106 as in known apparatus, by changing the trajectory of the ion beam 106, as shown. The ion implanter 100 may also include a buncher 124, which component may form an upstream part of an RF linear accelerator, shown as LINAC 118. The buncher 124 may be arranged as in known apparatus to output the initially-continuous ion beam, meaning ion beam 106A, as a bunched ion beam 106B. The LINAC 118 may include various acceleration stages to accelerate the bunched ion beam 106B by application of an RF signal at the different stages. The LINAC may output the bunched ion beam 106B as a high energy ion beam 106C. The ion implanter 100 may include various additional components, such as a scanner 108, to scan the high energy ion beam 106C, such as in a transverse direction to a direction of propagation of the high energy ion beam 106C. The ion implanter may further include components such as a corrector 110 and end station 112, as known in the art.
[0027] To impart a target final energy to the high energy ion beam 106C, the LINAC 118 may include a series of RF assemblies, where a given RF assembly is arranged to deliver a given RF signal to a given acceleration stage of the LINAC 118. These RF assemblies are shown as assembly 122A, assembly 122B, assembly 122C, assembly 122D, assembly 122E, and assembly 122N. The RF signal generated by a given assembly serves to generate an accelerating RF electric field between electrodes that are contained in a given acceleration stage, as detailed with respect to
[0028] In the example of
[0029] To illustrate how energy is coupled into a bunched ion beam using the assemblies (122A-122N),
[0030] Referring again to
[0031] Turning to
[0032] As the bunched ion beam 142 traverses the monitor assembly 130A, the bunched ion beam 142 will be detected as a series of ion bunches that are detected at different instances in time by the first beam monitor 132A and the second beam monitor 132B. In operation, the tuning system 128A may adjust the operating parameters that are applied to the stage AX by the RF assembly 122X, in particular, the phase of an RF signal that drives the stage AX. As explained with respect to
[0033] Turning to
[0034] In accordance with embodiments of the disclosure the tuning system 128 may measure the energy of a bunched ion beam as a function of RF phase applied to a given acceleration stage, and may accordingly adjust RF phase for the given acceleration stage. As used herein, the term synchronous ion may refer to an ion located at the centroid of an ion bunch. The term Synchronous phase may refer the phase difference between the RF voltage on an accelerating electrode(s) of a resonator driving a given stage and the arrival of the synchronous ion at the accelerating gap(s) between the electrodes. The term Zero synchronous phase may refer to the synchronous phase such that the synchronous ion experiences the largest acceleration from the gap, and thus where a maximum energy is imparted into the ion bunch.
[0035] To explain further, the operation of the tuning systems of
[0036] At a given instance when the ion bunch of the bunched ion beam 142 enters an acceleration gap, such as gap G1, the ion bunch will experience an electric field between the powered drift tube 156 and the first grounded drift tube 152, for example, where the electric field is proportional to the amplitude of the RF voltage applied to the powered drift tube 156 at the given instance. In the example shown in
[0037]
[0038] The maximum energy imparted into a ion bunch, Max E may occur when s=0, which condition corresponds to a zero synchronous phase for synchronous ions of the ion bunch. Note that with respect to any given RF signal that is applied to a given acceleration stage for a given ion species, this phase where Max E may occur may not be known a priori. In
[0039] Note that various considerations may call for the phase applied to the bunched ion beam to be displaced from the phase of Max E. Based upon the curve of
[0040] Turning to
[0041] As shown in
[0042] In one embodiment, the RF phase of an RF (voltage) signal applied to the given acceleration stage may be varied in a series of steps in a so-called phase scan, while the amplitude (and frequency) of the RF signal is kept constant, and the curves 202 and curve 204 are recorded. As depicted previously with respect to
[0043] Turning to
[0044] According to various embodiments of the disclosure, the above procedure may be employed across the entirety of acceleration stages of a LINAC in order to tune the acceleration stages by setting suitable phase values for RF signals that drive the different acceleration stages. In one example, the procedure may be first employed at a most upstream acceleration stage (e.g., A1), and then performed successively at downstream stages, A2, A3, etc., so as to tune each acceleration stage of a LINAC to a targeted RF phase that yields a targeted output energy. Note that the phase angle need not be set to produce a maximum output energy at any given stage, as discussed above. The energy profiles may be mapped for the different stages so that the suitable phase angle is applied for each give acceleration stage of a LINAC, in order to achieve a targeted final ion beam property, including a final ion energy after exiting the LINAC.
[0045] Table I below provides a summary of procedures to be applied in one embodiment for tuning a LINAC. In the example of Table I, four acceleration stages are depicted. The procedures shown in table I are equally applicable to LINACs including fewer stages or more stages. In the embodiment of Table I, a phase scan for each acceleration stage is performed in sequence, starting from the most upstream acceleration stage (A1) to the most downstream acceleration stage (A4). The phase scan is based upon measurement of output energy of a bunched ion beam as a function of applied RF phase for a given acceleration stage. The top row of Table I list the various stages of the LINAC, as well as the beam monitors. In the lower four rows, the status of the various acceleration stages is listed for a series of four phase scan procedures that are individually applied to the different stages. In the example shown, a buncher is ON in all measurements, meaning that a bunched ion beam is provided to each acceleration stage where a phase scan is performed. The bunched ion beam will be provided to the acceleration stages at a suitable ion energy, where each acceleration stage will then increase the ion energy in steps.
TABLE-US-00001 TABLE I Buncher A1 A2 A3 A4 BM1 & BM2 Map for A1 On Phase scan Off Off Off Time of flight Map for A2 On On Phase scan Off Off Time of flight Map for A3 On On On Phase scan Off Time of flight Map for A4 On On On On Phase scan Time of flight
[0046] In the first procedure, the acceleration stage A2, acceleration stage A3, and acceleration stage A4 are set to OFF, meaning that no power is delivered to the respective drift tubes in said acceleration stages. A phase scan is performed for acceleration stage A1, generally as described above with respect to
[0047] In a second procedure, the acceleration stage A3 and acceleration stage A4 are set to OFF, while the buncher and acceleration stage A1 are set to ON. A phase scan is performed for acceleration stage A2, similarly to the phase scan for acceleration stage A1. Since acceleration stage A3 and acceleration stage A4 are set to OFF, the ion energy measured as a function of phase angle at BM1 and BM2 represents the output energy for the bunched ion beam after being accelerated through both acceleration stage A1 and acceleration stage A2. Again, the phase scan may be used to determine a zero synchronous phase for the acceleration stage A2, given the accelerated bunched ion beam that is received from acceleration stage A1.
[0048] In a third procedure, the acceleration stage A4 is set to OFF, while the buncher and acceleration stage A1 and acceleration stage A2 are set to ON. A phase scan is performed for acceleration stage A3, similarly to the phase scan for acceleration stage A1 and A2. Since acceleration stage acceleration stage A4 is set to OFF, the ion energy measured as a function of phase angle at BM1 and BM2 represents the output energy for the bunched ion beam after being accelerated through acceleration stages A1, A2, and A3. Again, the phase scan may be used to determine a zero synchronous phase for the acceleration stage A3, given the accelerated bunched ion beam that is received from acceleration stage A2.
[0049] In a fourth procedure, the buncher, acceleration stage A1, acceleration stage A2, and acceleration stage A3 are set to ON. A phase scan is performed for acceleration stage A4, similarly to the phase scan for acceleration stage A1, A2, and A3. The ion energy measured as a function of phase angle at BM1 and BM2 represents the output energy for the bunched ion beam after being accelerated through all four acceleration stages A1, A2, and A3, and A4. Again, the phase scan may be used to determine a zero synchronous phase for the acceleration stage A4, given the accelerated bunched ion beam that is received from acceleration stage A3.
[0050] As such, in the approach as outlined in Table I, a given phase scan performed for any given stage of a LINAC is predicated upon the fact that phase scans have been performed on all upstream stages to the given stage, and the targeted maximum applied voltages and phases have been set and applied to those upstream stages at the time of the given phase scan.
[0051] In various embodiments, the tuning of a LINAC as outlined, for example, at Table I, may be performed periodically during the operation of an ion implanter. As an example, when an implantation recipe is to be changed, such as changing ion species, ion energy, ion dose, etc., the various stages of the LINAC may be tuned as outlined in Table I, so the phase relationship between a bunched ion beam and the RF signal generated at the resonators of the LINAC may be more accurately determined. In other examples, the tuning of the LINAC may be performed according to an interval based upon a number of wafer starts, such as every 1000 wafers, and so forth.
[0052] Note that while the beam monitor assembly 130 is depicted as being disposed downstream to the LINAC 118, in other embodiments a beam monitor assembly, formed of one or more monitors, may be disposed within the LINAC 118. For example, a monitor assembly may be disposed between A4 and A5, or between A3 and A2. In addition, multiple monitor assemblies may be located within the LINAC 118 in other embodiments.
[0053]
[0054] At block 704, a given acceleration stage to be tuned may be set to ON, meaning that an RF voltage signal is sent to the drift tube electrode of the given acceleration stage, at a determined frequency and a determined amplitude. Any other acceleration stages of the linear accelerator that are upstream to the given acceleration stage are also set to ON.
[0055] At block 706, any acceleration stages of the linear accelerator that are disposed downstream to the given acceleration stage to be tuned, are set to OFF.
[0056] At block 708, a phase scan is applied to the given acceleration stage, meaning that the phase of the RF voltage signal as applied to the given acceleration stage is varied, while the output energy of a bunched ion beam that is output from the given acceleration stage is measured as a function of the phase. In one non-limiting embodiment, the output energy may be measured using a plurality of monitors that perform a time-of-flight measurement on the bunched ion beam.
[0057] At block 710, a decision is made as to whether additional acceleration stages are to be tuned. If so, the flow returns to block 704. If not, the process ends.
[0058] Referring again to
[0059] The memory unit 54 may comprise an article of manufacture. In one embodiment, the memory unit 54 may comprise any non-transitory computer readable medium or machine readable medium, such as an optical, magnetic or semiconductor storage. The storage medium may store various types of computer executable instructions to implement one or more of logic flows described herein. Examples of a computer readable or machine-readable storage medium may include any tangible media capable of storing electronic data, including volatile memory or non-volatile memory, removable or non-removable memory, erasable or non-erasable memory, writeable or re-writeable memory, and so forth. Examples of computer executable instructions may include any suitable type of code, such as source code, compiled code, interpreted code, executable code, static code, dynamic code, object-oriented code, visual code, and the like. The embodiments are not limited in this context.
[0060] In view of the above, the present disclosure provides at least the following advantages. For one advantage, tuning time for a multi-stage linear accelerator may be substantially reduced, and recipe generation can be facilitated. As another advantage, the phase offset between adjacent stages need not be determined. In particular, a master clock referencing for phase control of the RF signals applied to the different acceleration stages is rendered unnecessary using the tuning approach of the present embodiments.
[0061] While certain embodiments of the disclosure have been described herein, the disclosure is not limited thereto, as the disclosure is as broad in scope as the art will allow and the specification may be read likewise. Therefore, the above description is not to be construed as limiting. Those skilled in the art will envision other modifications within the scope and spirit of the claims appended hereto.