Partially Filling a Component Carrier Opening in a Controlled Manner
20230105997 · 2023-04-06
Inventors
- Thomas WULZ (Leoben, AT)
- Daniel SCHLICK (St. Marein-Feistritz, AT)
- Sebastian LACKNER (Kammern i. L., AT)
- Dominik WILDING (Knittelfeld, AT)
Cpc classification
H05K2203/0207
ELECTRICITY
H05K3/0094
ELECTRICITY
H05K1/185
ELECTRICITY
H05K1/115
ELECTRICITY
H05K3/429
ELECTRICITY
H05K2201/0187
ELECTRICITY
International classification
Abstract
A component carrier includes a layer stack with at least one electrically insulating layer structure and/or at least one electrically conductive layer structure, at least one opening in the layer stack, a first curable dielectric element arranged at least partially on the opening, and a second curable dielectric element arranged adjacent to the first curable dielectric element, so that there is an interface region in between. A part of the first curable dielectric element extends partially into the opening.
Claims
1. A component carrier, comprising: a layer stack with at least one electrically insulating layer structure and/or at least one electrically conductive layer structure; at least one opening in the layer stack; a first curable dielectric element arranged at least partially on the opening; and a second curable dielectric element arranged adjacent to the first curable dielectric element, so that there is an interface region in between; wherein a part of the first curable dielectric element extends partially into the opening.
2. The component carrier according to claim 1, wherein the cure state of the first curable dielectric element is more cured than the cure state of the second curable dielectric element during component carrier manufacturing, and wherein this difference in the cure state is determinable at the interface region as an interface pattern.
3. The component carrier according to claim 2, wherein the interface pattern comprises at least one of the group which consists of at least one cut fiber, in particular a cut glass fiber, an alignment shift, a smearing, a colour shift, a tapering.
4. The component carrier according to claim 1, wherein the part of the first curable dielectric element extends into the opening to a specific filling height, in particular wherein the filling height corresponds to 5% or more of the opening volume, and/or wherein the filling height corresponds to 50% or less of the opening volume.
5. The component carrier according to claim 1, wherein the part of the first curable dielectric element that extends into the opening comprises a shaped main surface, in particular a hemisphere-like shape, more in particular a concave or convex shape.
6. The component carrier according to claim 1, wherein the part of the first curable dielectric element that extends into the opening essentially comprises no glass-fibers, in particular, wherein a glass fiber of the first curable dielectric element forms a wave-like structure at the opening main surface.
7. The component carrier according to claim 1, wherein the opening comprises at least one of the group which consists of a blind hole, a through hole, a cavity, a trench, a recess between traces.
8. The component carrier according to claim 1, wherein sidewalls of the opening are at least partially covered by an electrically conductive material.
9. The component carrier according to claim 1, wherein a diameter of the opening exposed at a layer stack main surface, in particular an opening main surface, is larger than a diameter of the opening which is not exposed at the layer stack main surface, in particular wherein the diameter at the opening main surface is a backdrill-opening.
10. The component carrier according to claim 1, wherein the opening is a fluid-filled, in particular gas-filled, more in particular air filled, cavity embedded in the layer stack.
11. A component carrier arrangement, comprising: a component carrier having a layer stack with at least one electrically insulating layer structure and/or at least one electrically conductive layer structure; at least one opening in the layer stack; a first curable dielectric element arranged at least partially on the opening; and a second curable dielectric element arranged adjacent to the first curable dielectric element, so that there is an interface region in between; wherein a part of the first curable dielectric element extends partially into the opening; and a further component carrier or a further component comprising a protruding element; wherein the further component carrier or the further component is stacked on the component carrier; and wherein the protruding element is at least partially inserted into the opening in order to connect the component carrier with the further component carrier or the further component.
12. A method of manufacturing a component carrier, the method comprising: providing a layer stack with at least one electrically insulating layer structure and/or at least one electrically conductive layer structure; forming at least one opening in the layer stack; arranging a first curable dielectric element with a first cure state at least partially on the opening; and arranging a second curable dielectric element with a second cure state adjacent to the first curable dielectric element, thereby forming an interface region in between; wherein the first cure state is more cured than the second cure state.
13. The method according to claim 12, further comprising: extending a part of the first curable dielectric element into the opening.
14. The method according to claim 13, wherein extending comprises: flowing material of the first curable dielectric element into the opening in a controlled manner, in particular with respect to at least one of the group which consists of filling depth, amount of flow material, speed of flow material, shape of the flow material.
15. The method according to claim 12, further comprising: arranging the second curable dielectric element to provide a cut-out region on the opening; and arranging the first curable dielectric element in the cut-out region.
16. The method according to claim 12, further comprising: predefining a cure state criterion, in particular including at least one of viscosity and filling height; and tuning the first curable dielectric element so that the first cure state fulfills the cure state criterion.
17. The method according to claim 12, further comprising: laminating a further electrically insulating layer structure and/or a further electrically conductive layer structure on the first curable dielectric element, in particular wherein the first cure state and the second cure state are different after lamination or wherein the first cure state and the second cure state are the same after lamination.
18. The method according to claim 12, further comprising: back-drilling the opening at an opening main surface that is exposed to a layer stack main surface.
19. The method according to claim 12, further comprising: interconnecting a further component carrier or a further component at the opening.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
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DETAILED DESCRIPTION OF ILLUSTRATED EMBODIMENTS
[0089] The illustrations in the drawings are schematically presented. In different drawings, similar or identical elements are provided with the same reference signs.
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[0091] A first curable dielectric element 120, being in this example a pre-cured prepreg (a glass fiber enforced epoxy resin, e.g., FR4) that is formed as a sheet, is arranged on top of the openings 110. A part 121 of the first curable dielectric element 120 extends partially into the openings 110. This extension is down to a predetermined filling depth. The first curable dielectric element 120 is in a first cure state (for example with a cross-linking state of 30%), wherein the cure state has been pre-determined (and fulfills a predetermined cure state criterion) in order to achieve a controlled flow of curable dielectric material 121 into the openings 110.
[0092] In this example, the through holes 110 serve for establishing a press-fit connection to a further component carrier. A protruding element of the further component carrier (not shown) will be pressed into the component carrier openings 110 (in this view from below) up to a specific height. However, during a further lamination step on top of the component carrier 100, layer stack 101, the through holes 110 would be completely filled with insulating material (e.g., resin). Conventional plugin pastes are generally not reliable enough and would fill the through holes 110 too little or too much. However, with the described first curable dielectric element 120, which has a predetermined cure state and hence a controllable flow viscosity, enables a reliable and robust partial filling of the through holes 110.
[0093] The component carrier 100 further comprises two second curable (essentially not pre-cured) dielectric elements 130 that are arranged adjacent (side-by-side) with the first curable dielectric element 120, so that there are two respective interface regions 150 in between. The cure state of the first curable dielectric element 120 is more cured than the cure state of the second dielectric element 130, i.e., being more viscos and/or more cross-linked. Besides the difference in the cure state, the first curable dielectric element 120 and the second curable dielectric elements 130 comprise the same material, e.g., a prepreg. The difference in the cure state is also determinable at the interface region 150 as an interface pattern. The second dielectric element 130 is not arranged on top of the openings 110.
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[0095] As illustrated in
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[0099] In a further step, a further electrically insulating layer structure 140 is laminated on top of the first curable dielectric element 120 and the second curable dielectric elements 130. The openings 110 are not completely filled by the lamination step due to the first curable dielectric element 120 that partially fills the openings 110 to a specific predetermined depth.
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[0102] The electric component 160 is not covered by the first curable dielectric elements 120. On the curable dielectric elements 120, 130, there is arranged an upper electrically insulating layer structure 102 with respective conductive layer structures 104. Depending on the desired functionality, the first cure state can be chosen such that a part of the first curable dielectric elements 120 extends into the cavity 110 and partially fills it. Hereby, the embedded component 160 can be partially encapsulated, for example the region between the cavity sidewalls and the component sidewalls can be filled in a controlled manner. In another example, the first cure state is already very hard and there will be essentially no flow into the cavity 110.
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[0111] It should be noted that the term “comprising” does not exclude other elements or steps and the article “a” or “an” does not exclude a plurality. Also, elements described in association with different embodiments may be combined.
[0112] Implementation of the invention is not limited to the preferred embodiments shown in the figures and described above. Instead, a multiplicity of variants are possible which variants use the solutions shown and the principle according to the invention even in the case of fundamentally different embodiments.
REFERENCE SIGNS
[0113] 100 Component carrier
101 Layer stack
102 Electrically insulating layer structure
104 Electrically conductive layer structure
110 Opening, through hole, cavity
111 Electrically conductive material
112 Opening main surface
113 Backdrill-opening
[0114] 120 First curable dielectric element
121 Extending part of first curable dielectric element
122 Extending part shaped main surface
123 Glass fiber
130 Second curable dielectric element
132 Cut-out region
140 Further electrically insulating layer structure
150 Interface region
155 Interface pattern
160 Electronic component
200 Component carrier arrangement
210 Protruding element
250 Further component carrier, further component