SELECTIVE PLANE ILLUMINATION MICROSCOPY INSTRUMENTS

Abstract

Disclosed is an optical arrangement providing selective plane illumination, including an inverted illumination objective mounted below a sample support in use providing a line or plane of light at the sample support, and at least one image collection objective mounted above the support, said inverted illumination objective having an illumination objective optic axis, and said image collection objective having an image collection objective optical axis, wherein illumination light is arranged to propagate toward the illumination objective lateral offset to the illumination objective optical axis such that the illumination light leaving the illumination objective propagates toward the sample support at an oblique angle relative to the illumination objective optical axis, and wherein the image objective optical axis has an angle α which is obtuse to the illumination objective optical axis and generally perpendicular to light propagating at the sample support.

Claims

1. An optical arrangement providing selective plane illumination, including an inverted illumination objective mounted below a sample support in use providing a line or plane of light at the sample support, and at least one image collection objective mounted above the support, said inverted illumination objective having an illumination objective optical axis, and said image collection objective having an image collection objective optical axis, wherein illumination light is arranged to propagate toward the illumination objective laterally offset to the illumination objective optical axis such that the illumination light leaving the illumination objective propagates toward the sample support at an oblique angle relative to the illumination objective optical axis, and wherein the image objective optical axis has an angle α which is obtuse to the illumination objective optical axis and generally perpendicular to light propagating at the sample support.

2. An optical arrangement as claimed in claim 1, wherein the angle α is between 100 and 170 degrees, preferably between 125 and 145 degrees and more preferably about 135 degrees.

3. An optical arrangement as claimed in claim 1, wherein said at least one image collection objective comprises first and second image collection objectives each mounted on opposing sides of said illumination objective axis and wherein, said illumination light is arranged to propagate on alternate opposing sides of said illumination object axis along respective first and second paths, to provide image light to the first or the second image collection objective alternately.

4. An optical arrangement as claimed in claim 1, wherein said illumination light is coherent light, for example laser light, and the optical arrangement further includes optical manipulators to provide the illumination light either focused to line of light or in the form of a plane or sheet of collimated light.

5. A method of illuminating a sample to provide SPIM, the method comprising the steps of: a) providing an optical arrangement as claimed in claim 1; b) causing coherent light to propagate in a direction of illumination; c) capturing one or more images collected by the first and second image collection objectives; d) formulating a structured image from the images captured by both image collection objectives.

6. A SPIM instrument including an optical arrangement as claimed in any one of claim 1.

7. A SPIM instrument as claimed in claim 6, adaptable to perform also any one or more of SIM, TIRF and PK microscopy techniques.

8. A SPIM microscopy instrument as claimed in claim 6, wherein there is a space between the illumination objective and the sample support, and said space is bridged by a liquid.

9. A SPIM microscopy instrument as claimed in claim 6, wherein the sample support is moveable perpendicular to the illumination objective optical axis, preferably in a continuous motion.

10. A SPIM microscopy instrument including a illumination objective having an illumination object optical axis, and including a sample support moveable relative to said axis in a direction perpendicular to the illumination objective optical axis, and preferably in a continuous motion.

Description

BRIEF DESCRIPTION OF THE DRAWINGS

[0012] The invention can be put into effect in numerous ways, illustrative embodiments of which are described below with reference to the drawings, wherein:

[0013] FIG. 1a shows a schematic representation of an optical arrangement for SPIM;

[0014] FIG. 1b shows a microscopy instrument employing the optical arrangement of FIG. 1a;

[0015] FIG. 2 shows a first light beam path model for the optical arrangement shown in FIG. 1a;

[0016] FIG. 3 shows a second light beam path model for the optical arrangement shown in FIG. 1a; and

[0017] FIG. 4 shows a schematic representation employing a moving sample support.

DETAILED DESCRIPTION OF THE INVENTION

[0018] The invention, together with its objects and the advantages thereof, may be understood better by reference to the following description taken in conjunction with the accompanying drawings, in which like reference numerals identify like elements in the Figures.

[0019] Referring to FIG. 1a, an optical arrangement 100 is shown schematically in cross section, and a SPIM instrument 10 is shown in FIG. 1b incorporating the optical arrangement of FIG. 1a. A SPIM illumination objective lens 110 is illustrated which provides a line, or a plane/sheet of light (herein referred to as a line), the line extending in a direction perpendicular to, and into, the paper. The illumination objective lens 110, is positioned below a sample support 120, in an inverted configuration, so as to be compatible with the typical configuration of high-resolution and super-resolution fluorescence microscopes. The illumination objective lens 110 has an illumination objective optical axis 111. Two separate image collection objective lenses 130 and 140 are positioned above the sample support 120, each having an image collection objective optical axis 131 and 141 respectively. The angle α between the illumination objective optical axis and each of the image collection objective optical axes 131 and 141 is about 135 degrees. Thus the optical axes 131 and 141 of the image collection objectives are at +135 degrees and −135 degrees with respect to the optical axis 111 of the inverted illumination objective lens.

[0020] In use, coherent laser light beams 132 and 142 in the form of lines of light are alternately directed toward the illumination objective lens 110. Each beam is parallel but laterally offset to the optical axis 111 by a distance x, such that each beam is refracted at the objective lens 110 to propagate obliquely with respect to the optical axis 111 at a sample holding area 122 of the sample support 120.

[0021] A sample S can be illuminated by the oblique phase of the beams 132 and 142 at the sample area 122. The lines of illumination are used to selectively illuminate sections through the sample and diffuse image light is collected by the respective image collection objectives 130 and 140 mounted to be generally perpendicular to the direction of propagation of the lines of light of the beams 132 and 142, such that the lines of light stay generally at the focal plane of the image collection objectives.

[0022] The purpose of the dual image collection objectives 130 and 140 is to provide isotropic high-resolution imaging throughout the volume of a three dimensional sample. A structured image can be formulated from a series of images from both left and right illuminations.

[0023] The optical arrangement described above provides a thin line of illumination that propagates upwards through the inverted objective lens 110, but at a slight lateral offset x with respect to the lens' optical axis 111 such that the beam exiting the lens is precisely diverted to the angle of the focal plane of the image collection objectives 130 or 140. That is, orthogonal to the optic axis 131 and 141 of the image collection objectives. In this manner, only the thin section of the sample that is in focus with respect to the imaging lens is excited by the illumination beam 132 or 142. In order to provide illumination for both of the image collection objective lenses 130 and 140, the aforementioned lateral offset x of the illumination beams would be alternated between two discrete lateral offset positions lying on equal and opposite sides of the optical axis 111 of the inverted illumination objective lens 110. Switching of the beam between the two discrete lateral offset positions can be accomplished by a variety of light manipulators such as opto-mechanical switching mechanisms, including but not limited to a galvo-mirror, a piezo-mirror, or a flipper mirror. Likewise, scanning of the beam across the entire field of view of the sample plane can be accomplished by a variety of opto-mechanical scanning mechanisms, including but not limited to a galvo-mirror, a piezo-mirror, or a rotating polyhedral mirror. Switching between illumination modes (SPIM, SIM, TIRF, PK, etc., . . . ) can be accomplished by utilizing multiple reflections off of a galvo-mirror with an associated beam detour path for each supported mode, for example as previously described in W02013074033A1, the contents of which are incorporated herein by reference.

[0024] FIGS. 2 and 3 show beam path models for the two illumination beam paths 132 and 142, and in particular illustrate that the image collection objectives collect light propagating from the sample area 122 generally perpendicular to the illumination path.

[0025] FIG. 4 shows the optical arrangement in more detail and illustrates more clearly a second aspect of the invention. In this embodiment the sample support 120 is moveable in the X plane defined by the optical axes of the 3 objective lenses 110, 130 and 140. This movement provides a method for sectioning through a three-dimensional sample volume without the requirement for scanning the illumination beam across multiple adjacent image planes. The technique involves movement of the sample support 120, which is preferably by means of a linear slideway, or two orthogonally opposed slideways and an electric motor drive or drives. Scanning is done horizontally by moving the sample. Ideally, the scanning would be continuous rather than in discrete steps in order to minimize vibration of the sample media which would be sensitive to discrete lateral perturbations. This approach has three distinct advantages. First it reduces the number of scanning control mechanisms for the illumination beam. Second, it eliminates the need to provide opto-mechanical depth control of the image collection objectives while scanning. These first two advantages greatly simplify the opto-mechanical system design while also improving system stability and alignability. The third advantage is a functional one, in which the proposed horizontal scanning of the sample allows for an unlimited field of view along one lateral axis to accommodate elongated specimens, such as caenorhabditis elegans. To make this SPIM optical arrangement compatible with other known high resolution microscopy techniques, the space between the sample support 120 and the illumination objective 110 is bridged by fluid, in this case immersion oil 124.

[0026] Although two embodiments have been described and illustrated, it will be apparent to the skilled addressee that additions, omissions and modifications are possible to those embodiments without departing from the scope of the invention claimed. For example, the angle α between the optical axes 111 and 131, or the axes 111 and 141 could in principle be anywhere in the range between about 100 degrees and about 170 degrees, however 135 degrees supports the greatest light gathering capacity and is thus considered optimal and 125 to 145 degrees is satisfactory.