FORCE SENSOR WITH NOISE SHIELDING LAYER

Abstract

A force sensor having a noise shielding layer is disclosed. For a first embodiment, a top noise shielding layer is configured on a top surface of a force sensor to screen noise signals which are caused by human body's touch or approaching from top of the force sensor. For a second embodiment, a bottom noise shielding layer is configured on a bottom surface of the force sensor to screen noise signals which are caused by human body's touch or approaching from bottom of the force sensor.

Claims

1. A force sensor, comprises: a top substrate and a bottom substrate; a top electrode, configured on a bottom side of the top substrate; a bottom electrode, configured on a top side of the bottom substrate; and a first noise shielding layer, electrically coupled to ground, defining a first area for a user's press; configured on one of a top surface of the top substrate and a bottom surface of the bottom substrate.

2. A force sensor as claimed in claim 1, further comprises: a second noise shielding layer, electrically coupled to ground, defining a second area for a user's press; configured on the other one of the top surface of the top substrate and the bottom surface of the bottom substrate.

3. A force sensor as claimed in claim 1, further comprises: an intermediate layer, configured between the top electrode and the bottom electrode; wherein the intermediate layer is selected from a group consisting of an air space, piezo-capacitive material, compressive-restorable dielectric material, piezo-electric material, piezo-resistive material, and compressible-restorable semiconductor polymer.

4. A force sensor as claimed in claim 1, wherein the top substrate and the bottom substrate are formed from a single substrate.

5. A force sensor as claimed in claim 2, wherein the second noise shielding layer and the first noise shielding layer are electrically connected.

6. A force sensor, comprises: a top substrate and a bottom substrate; a pair of coplanar electrodes, configured on a top surface of the bottom substrate; and a first noise shielding layer, electrically coupled to ground, defining a first area for a user's press; configured on one of a top surface of the top substrate and a bottom surface of the bottom substrate.

7. A force sensor as claimed in claim 6, further comprises: a second noise shielding layer, electrically coupled to ground, defining a second area for a user's press; configured on the other one of the top surface of the top substrate and the bottom surface of the bottom substrate.

8. A force sensor as claimed in claim 6, further comprises: an intermediate layer, configured between the auxiliary metal and the pair of coplanar electrodes; wherein the intermediate layer is selected from a group consisting of piezo-capacitive material, compressive-restorable dielectric material, piezo-electric material, piezo-resistive material, and compressible-restorable semiconductor polymer.

9. A force sensor as claimed in claim 6, wherein the top substrate and the bottom substrate are formed from a single substrate.

10. A force sensor as claimed in claim 7, wherein the second noise shielding layer and the first noise shielding layer are electrically connected.

11. A force sensor as claimed in claim 6, further comprises: an auxiliary metal, configured on a bottom surface of the top substrate.

12. A force sensor, comprises: a top substrate and a bottom substrate; a top electrode, configured on a top side of the top substrate, defining a first area for a user's press; electrically couple to ground, and a bottom electrode, configured on a top side of the bottom substrate; wherein the top electrode functions as a first shielding layer and functions also as a counter electrode with respect to the bottom electrode.

13. A force sensor as claimed in claim 11, further comprises: one of an air space and an intermediate layer, configured between the top substrate and the bottom electrode.

14. A force sensor as claimed in claim 12, wherein a second noise shielding layer, defining a second area for a user's press; configured on a bottom surface of the bottom substrate.

15. A force sensor as claimed in claim 11, wherein the top substrate and the bottom substrate are formed from a single substrate.

16. A force sensor as claimed in claim 13, wherein the second noise shielding layer and the first noise shielding layer are electrically connected.

17. A force sensor as claimed in claim 12, wherein the intermediate layer is selected from a group consisting of an air space, piezo-capacitive material, compressive-restorable dielectric material, piezo-electric material, piezo-resistive material, and compressible-restorable semiconductor polymer.

Description

BRIEF DESCRIPTION OF THE DRAWINGS

[0012] FIG. 1 shows a prior art.

[0013] FIG. 2 shows an operation with the prior art.

[0014] FIG. 3 shows an equivalent circuit for the prior art.

[0015] FIG. 4 shows an equivalent circuit when pressed for a prior art force sensor.

[0016] FIG. 5A shows an actual test picture for the prior art.

[0017] FIG. 5B shows an actual test picture for the present invention.

[0018] FIG. 6 shows a first embodiment according to the present invention.

[0019] FIG. 7 shows an operation with the first embodiment according to the present invention.

[0020] FIG. 8 shows a second embodiment according to the present invention.

[0021] FIG. 9 shows a third embodiment according to the present invention.

[0022] FIG. 10 shows a fourth embodiment according to the present invention.

[0023] FIGS. 11A-11C show force sensors categorized by electrodes configuration applied with noise shielding layer according to the present invention.

[0024] FIG. 12A shows a fifth embodiment according to the present invention.

[0025] FIG. 12B shows a modified embodiment to FIG. 12A according to the present invention.

DETAILED DESCRIPTION OF THE INVENTION

[0026] FIG. 5A shows an actual test picture for the prior art.

[0027] FIG. 5A shows a test picture for a multi-touch force sensor according to the prior art which does not have any shielding layer. FIG. 5A shows a plurality of noise signals generated in an area 115 besides normal signals for the palm when a user's palm touches the multi-touch force sensor.

[0028] A material for the shielding layer is an electrical conductive material such as metal, conductive polymer, or ito (Indium Tin Oxide). The shielding layer can be formed with network or grid to save the conductive material.

[0029] FIG. 5B shows an actual test picture for the present invention.

[0030] FIG. 5B shows a test picture for a multi-touch force sensor according to the present invention which has a noise shielding layer 21 (FIG. 6) configured on top. FIG. 5B shows no significant noise signals generated in an area 115 besides normal signals for the palm when the user's palm touches the force sensor.

[0031] FIG. 6 shows a first embodiment according to the present invention.

[0032] FIG. 6 shows a force sensor according to the present invention which has a noise shielding layer 21 configured on a top side of a force sensor. FIG. 6 shows a force sensor has a noise shielding layer 21. A top substrate 11 is configured on a bottom side of the top noise shielding layer 21; a top electrode 111 is configured on a bottom side of the top substrate 11; a bottom substrate 12 is configured on a bottom side of a bottom electrode 121; and a pair of force sensitive layers 112, 122 are configured between the top electrode 111 and the bottom electrode 121.

[0033] For a modified force sensor (not shown), single layer of force sensitive layer can be adopted and configured between the top electrode 111 and the bottom electrode 121.

[0034] The force sensitive layer can be used for the present invention is made of a material selected from a group consisting of piezo-electric material, dielectric material, semi-conductive material, piezo-resistive material and piezo-capacitive material.

[0035] FIG. 7 shows an operation with the first embodiment according to the present invention.

[0036] FIG. 7 shows an operation for the first embodiment of FIG. 6. Referring to FIG. 7, an induced capacitor 11C is created when a finger of a user touches the force sensor. Since the noise shielding layer 21 is electrically coupled to system ground, therefore the induced capacitance 11C gives no significant influence to the force sensor. No noise signals shall be generated when the user's finger touches the force sensor.

[0037] FIG. 8 shows a second embodiment according to the present invention.

[0038] FIG. 8 shows a second embodiment according to the present invention. In addition to the top noise shielding layer 21 configured on top, a bottom noise shielding layer 22 is configured on a bottom side of the bottom substrate 12. Both the top noise shielding layer 21 and the bottom noise shielding layer 22 are electrically coupled to ground. For the bottom of the force sensor, noise signals can be eliminated under conditions where electrical conductive material may be configured on a bottom side of the force sensor.

[0039] FIG. 9 shows a third embodiment according to the present invention.

[0040] FIG. 9 shows a modification version from the second embodiment according to the present invention. Where the top substrate 11 and the bottom substrate 12 are integrated into a single substrate 13 (11+12). In other words, the top substrate 11 and the bottom substrate 12 are made as partial elements of a single flexible circuit substrate 13.

[0041] FIG. 10 shows a fourth embodiment according to the present invention.

[0042] FIG. 10 shows a modification version from the third embodiment according to present invention. Where the bottom noise shielding layer 22 and the top noise shielding layer 21 are integrated into a single shielding layer. In other words, the bottom noise shielding layer 22 and the top noise shielding layer 21 are made as partial elements of a single flexible circuit substrate 13. After assembly, the integrated bottom noise shielding layer 22 and the top noise shielding layer 21 is electrically coupled to system ground.

[0043] FIGS. 11A˜11C show force sensors categorized by electrodes configuration applied with noise shielding layer according to the present invention.

[0044] FIG. 11A shows a force sensor has a top electrode 31A and a bottom electrode 31B. The top electrode 31A is configured on a bottom surface of a top substrate 32A. The bottom electrode 31B is configured on a top surface of a bottom substrate 32B. A top noise shielding layer 33A is configured on a top surface of the top substrate 32A. A bottom noise shielding layer 33B is optionally configured on a bottom surface of the bottom substrate 32B. An intermediate layer 35 can be inserted between the top electrode 31A and the bottom electrode 31B.

[0045] A material for the intermediate layer 35 is selected from a group consisting of an air space, piezo-capacitive material, and compressive-restorable dielectric material, so that the force sensor functions as a variable capacitor with AC power. Alternatively, a material for the intermediate layer 35 is selected from a group consisting of piezo-electric material, piezo-resistive material, compressible-restorable semiconductor polymer, so that that the force sensor functions as a variable resistor with DC power.

[0046] FIG. 11B shows a force sensor has a coplanar electrodes 41A, 41B. The coplanar electrodes 41A, 41B are configured on a top surface of a bottom substrate 42B. A top noise shielding layer 43A is configured on a top surface of a top substrate 42A. A bottom noise shielding layer 43B is optionally configured on a bottom surface of the bottom substrate 42B. An intermedia layer 45 is inserted between the top substrate 42A and the bottom substrate 42B.

[0047] A material for the intermedia layer 45 is selected from a group consisting of piezo-capacitive material, and compressive-restorable dielectric material, so that the force sensor functions as a variable capacitor with AC power.

[0048] Alternatively, a material for the intermedia layer 45 is selected from a group consisting of piezo-electric material, piezo-resistive material, compressible-restorable semiconductor polymer, so that the force sensor functions as a variable resistor with DC power.

[0049] FIG. 11C shows a force sensor has a coplanar electrodes 51A, 51B, and an auxiliary metal 512. The coplanar electrodes 51A, 51B are configured on a top surface of a bottom substrate 52B. The auxiliary metal 512 is configured on a bottom surface of the top substrate 52A. A top noise shielding layer 53A is configured on a top surface of a top substrate 52A. A bottom noise shielding layer 53B is optionally configured on a bottom surface of the bottom substrate 52B. An intermediate layer 55 can be inserted between the auxiliary metal 512 and the bottom substrate 42B.

[0050] The auxiliary metal 512 is an independent metal layer to enhance an even distribution for electric field, and without connecting to any electrode.

[0051] A material for the intermediate layer 55 is selected from a group consisting of an air space, piezo-capacitive material, and compressive-restorable dielectric material. So that the force sensor functions as a variable capacitor with AC power.

[0052] Alternatively, a material for the intermediate layer 55 is selected from a group consisting of piezo-electric material, piezo-resistive material, compressible-restorable semiconductor polymer. So that the force sensor functions as a variable resistor with DC power.

[0053] Table 1 shows Electrode Configuration v Intermediate Layer choices for the force sensor of FIGS. 11A˜11C.

TABLE-US-00001 TABLE 1 Electrode configuration v Intermediate layer choices. Electrode Intermediate Force sensor Configuration Layer Choices equivalent to Power Top, bottom electrodes Air space; variable AC (FIG. 11A) piezo-capacitive material; capacitor dielectric material; Piezo-electric material; variable DC Piezo-resistive material; resistor Semiconductor polymer; Coplanar electrodes piezo-capacitive material; variable AC (FIG. 11B) dielectric material; capacitor Piezo-electric material; variable DC Piezo-resistive material; resistor Semiconductor polymer; Coplanar electrodes Air space; variable AC plus piezo-capacitive material; capacitor Enhancing metal layer dielectric material; (FIG. 11C) Piezo-electric material; variable DC Piezo-resistive material; resistor Semiconductor polymer;

[0054] FIG. 12A shows a fifth embodiment according to the present invention.

[0055] FIG. 12A shows that a variable capacitor force sensor is formed by a configuration where a top electrode 61 is prepared. A top substrate 62A is configured on a bottom surface of the top electrode 61A. A piezo capacitive material 62P is configured on a bottom of the top substrate 62A. A bottom electrode 61B is configured on a bottom of the piezo capacitive material 62P. A bottom substrate 62B is configured on a bottom surface of the bottom electrode 61B.

[0056] The top electrode 61A is electrically coupled to ground, so that the top electrode 61A functions as a shielding layer and, in the meanwhile, functions as a counter electrode with respect to the bottom electrode 61B. i.e. the top electrode 61A and the bottom electrode 61B forms a variable capacitor force sensor. Capacitance exists between the top electrode 61A and the bottom electrode 61B as shown in heavy arrow in the FIGS. 12A-12B.

[0057] The variable resistor force sensor of FIG. 13A can be pressed from top side, as shown by the finger on top, with noise shielding protection.

[0058] An air space or a compressible-restorable material can be used to replace the piezo capacitive material 62P.

[0059] FIG. 12B shows a modified embodiment to FIG. 12A according to the present invention.

[0060] FIG. 13B shows a bottom shielding layer 63, electrically coupled to ground, is optionally configured on a bottom surface of the bottom substrate 62B so that the variable resistor force sensor of FIG. 13B can be pressed from either top side or bottom side, as shown by the fingers on top and bottom, with noise shielding protection.

[0061] While several embodiments have been described by way of examples, it will be apparent to those skilled in the art that various modifications may be configured without departs from the spirit of the present invention. Such modifications are all within the scope of the present invention, as defined by the appended claims.

TABLE-US-00002 Numerical system top substrate 11 top electrode 111 force sensitive layers 112, 122 Area 115 induced capacitor 11C bottom substrate 12 substrate 13 (11 + 12) noise shielding layer 21 noise shielding layer 22 electrode 31A, 31B substrate 32A, 32B noise shielding layer 33A, 33B intermediate layer 35, 45, 55 electrode 41A, 41B substrate 42A, 42B noise shielding layer 43A, 43B electrode 51A, 51B substrate 52A, 52B noise shielding layer 53A, 53B top electrode 61A (top shielding layer 61A) bottom electrode 61B top substrate 62A bottom substrate 62B piezo capacitive material 62P bottom shielding layer 63