COMPLEMENTARY METAL-OXIDE-SEMICONDUCTOR (CMOS) MULTI-WELL APPARATUS FOR ELECTRICAL CELL ASSESSMENT

Abstract

Disclosed herein are semiconductor devices to provide a CMOS-compatible, wafer-scale, multi-well platform that can be used for biomedical or other applications, and methods to operate the same. In some embodiments, circuitry is provided underneath a multiple-well array to electrically interface with electrodes in the wells. To interface with electrodes in a large array, circuitry may be fabricated on a single silicon (Si) wafer having a dimension that is at least the same or larger than that of the multiple-well array. According to one aspect of the present disclosure, standard CMOS fabrication process such as those known to be used in a standard semiconductor foundry may be used without expensive customization for complex fabrication procedures. This may help the production cost to be lowered in some cases.

Claims

1-40. (canceled)

41. An apparatus for electrical assessment of a biological specimen, comprising: a plate having a multiple-well array for disposing thereon the biological specimen, each well of the multiple-well array having a plurality of electrodes disposed therein; and a multiwell integrated circuit having a first surface facing a first side wells of the multiple-well array of the plate and having a second surface facing opposite the wells of the multiple-well array, comprising: an array of reticle areas, each reticle area having a plurality of complementary metal oxide semiconductor (CMOS) circuitry of a same design, wherein each reticle area comprises: at least one well circuit containing a plurality of peripheral circuits in electrical communication with the plurality of electrodes in a well of the multiple-well array using a plurality of addressable switches located underneath each electrode in a pixel; and a reference electrode bias to connect to any set of the plurality of electrodes to act as a reference electrode using an addressable switch located underneath each electrode in a pixel; wherein the multiple-well array comprises at least 24 wells; and wherein the multiple-well array includes at least 24 reticle areas to accommodate a standard number of wells in the multiple-well array.

42. (canceled)

43. The apparatus of claim 41, further comprising a lid coupled to a second side of the plate opposite a first side of the plate.

44. (canceled)

45. The apparatus of claim 43, wherein the lid comprises a plurality of photodetectors, each photodetector facing a corresponding well of the multiple-well array.

46. The apparatus of claim 41, further comprising a first substrate and a second substrate, wherein the second substrate has a plurality of conductive structures disposed at a first surface of the second substrate facing a mounting surface of the first substrate, each conductive structure electrically connected to a corresponding pad of a plurality of pads on the mounting surface of the first substrate.

47. The apparatus of claim 46, wherein the second substrate and the first substrate are coupled via a magnetic force.

48. The apparatus of claim 41, further comprising an enclosure that surrounds the multiwell integrated circuit and the plate on at least five sides.

49. (canceled)

50. The apparatus of claim 49, wherein the plurality of electrodes within a well are configured to be in electrical communication with an interior of a single cell disposed in the well.

51. The apparatus of claim 41, wherein the multiwell integrated circuit is configured to route a signal of a first type from a first side of the reticle area towards a second side of the reticle area along a first direction, and to route a signal of a second type from a third side of the reticle area towards a fourth side of the reticle area along a second direction different from the first direction; and wherein the signal of a first type is a digital signal and the signal of a second type is an analog signal.

52. The apparatus of claim 51, wherein the reticle area is a first reticle area, and wherein a routing circuit in the first reticle area is configured to receive the signal of the first type from a second reticle area that is adjacent the first reticle area along the first direction, and the routing circuit in the first reticle area is further configured to receive the signal of the second type from a third reticle area that is adjacent the first reticle area along the second direction.

53. The apparatus of claim 41, wherein each peripheral circuit comprising a stimulation circuit and a recording circuit, and wherein the plurality of addressable switches is configured to selectively couple a subset of peripheral circuits to a subset of the plurality of electrodes.

54. The apparatus of claim 41, wherein each well has an opening that is open towards the multiwell integrated circuit, and wherein the plurality of electrodes comprise an array of conductors disposed on an insulative surface of the multiwell integrated circuit.

55. The apparatus of claim 41, further comprising an interposer, wherein the second surface facing opposite the wells of the multiple-well array faces the interposer.

56. The apparatus of claim 55, wherein the multiple-well array has a well-to-well distance between 4.5 mm and 9 mm.

57. The apparatus of claim 56, wherein the reticles are centered at a pitch of 18 mm or 9 mm.

58. The apparatus of claim 55, wherein the interposer is a printed circuit board (PCB).

59. The apparatus of claim 41, wherein at least two reticle areas of the array of reticle areas are in electrical communication with each other.

60. The apparatus of claim 59, further comprising a plurality of cross-reticle connections configured to place the at least two reticle areas in electrical communication.

61. The apparatus of claim 60, wherein the at least two reticle areas are disposed on a first surface of the multiwell integrated circuit, the apparatus further comprising a redistribution layer (RDL) on the first surface, wherein at least a portion of the plurality of cross-reticle connections comprise conductors disposed in the RDL layer.

62. The apparatus of claim 52, wherein the routing circuit comprises one or more shift registers configured to route the signal of the first type.

62. The apparatus of claim 52, wherein the routing circuit comprises at least one digital bus, and at least one analog bus.

63. The apparatus of claim 41, wherein the plurality of electrodes comprises at least 1000 electrodes.

64. The apparatus of claim 63, wherein the plurality of electrodes comprises at least 4000 electrodes.

65. The apparatus of claim 41, wherein the at least one well circuit comprises a stimulation circuit which in turn includes a current injector.

66. The apparatus of claim 41, wherein each peripheral circuit of the plurality of peripheral circuits comprises a stimulation circuit and a recording circuit; and wherein the apparatus further comprises one or more switches configured to selectively couple a subset of the plurality of peripheral circuits within the well circuit with one or more optoelectronic components.

67. The apparatus of claim 66, wherein the one or more optoelectronic components comprise a light-emitting diode, a photodetector, or a combination thereof.

68. The apparatus of claim 41, wherein the array of reticle areas is arranged in rows along the first direction and in columns along the second direction, wherein adjacent reticle areas in each row are connected by an array of cross-reticle connections arranged along the second direction, and wherein adjacent reticle areas in each column are connected by an array of cross-reticle connections arranged along the first direction.

69. A method of operating an apparatus to assess a biochemical sensor, the method comprising: electrically communicating, using the at least one well circuit, with a well of the multiple-well array; and routing, with the routing circuit, a digital signal of a first type from a first side of the reticle area towards a second side of the reticle area along a first direction, and an analog signal of a second type from a third side of the reticle area towards a fourth side of the reticle area along a second direction different from the first direction; wherein the apparatus comprises: a plate having a multiple-well array for disposing thereon the biological specimen, each well of the multiple-well array having a plurality of electrodes disposed therein; a multiwell integrated circuit having a first surface facing wells of the multiple-well array of the plate and having a second surface facing opposite the wells of the multiple-well array; a semiconductor device comprising a multiwell integrated circuit; and at least two reticle areas disposed within the multiwell integrated circuit, each reticle area having a plurality of complementary metal oxide semiconductor (CMOS) circuitry of a same design, wherein each reticle area comprises at least one well circuit and a routing circuit, the semiconductor device further comprising an interposer; wherein the multiple-well array comprises at least 24 wells; and wherein the multiple-well array includes at least 24 reticle areas to accommodate a standard number of wells in the multiple-well array.

Description

BRIEF DESCRIPTION OF THE DRAWINGS

[0010] Various aspects and embodiments will be described with reference to the following figures. It should be appreciated that the figures are not necessarily drawn to scale. Items appearing in multiple figures are indicated by the same reference number in all the figures in which they appear. In the drawings:

[0011] FIG. 1 is a high level block diagram illustrating an exemplary CMOS-Multiwell Platform, in accordance with some embodiments;

[0012] FIG. 2A is a high level schematic diagram illustrating an exemplary CMOS-Multiwell Platform, in accordance with some embodiments;

[0013] FIG. 2B is a top view schematic diagram of an exemplary semiconductor device that can be used in a CMOS-Multiwell Platform, in accordance with some embodiments; FIG. 2C is an magnified view of a portion of FIG. 2B;

[0014] FIG. 3 is a schematic block diagram illustrating an exemplary apparatus for electrical assessment of a biological specimen, in accordance with some embodiments;

[0015] FIG. 4 is a cross-section view schematic diagram of an exemplary apparatus, in accordance with some embodiments;

[0016] FIG. 5 is a cross-section view schematic diagram of an exemplary apparatus that could interface with an external data acquisition system, in accordance with some embodiments;

[0017] FIG. 6 is a plan-view schematic diagram of an exemplary environment chamber, in accordance with some embodiments;

[0018] FIG. 7 is a top view schematic diagram illustrating an exemplary wafer, in accordance with some embodiments;

[0019] FIG. 8 is a top view schematic diagram illustrating an example circuit design within a reticle area, in accordance with some embodiments;

[0020] FIG. 9 is a schematic block diagram illustrating an exemplary well circuit inside a reticle area 920, in accordance with some embodiments;

[0021] FIGS. 10A and 10B are top view and bottom view schematic diagrams, respectively, of an example design of an environment chamber lid with reference electrodes, in accordance with some embodiments;

[0022] FIGS. 11A, 11B and 11C illustrate several exemplary applications of the apparatus as disclosed herein.

DETAILED DESCRIPTION

[0023] The present disclosure is directed to a semiconductor device to provide a CMOS-compatible, wafer-scale, multi-well platform that can be used for biomedical or other applications, and methods to operate the same. In some applications, circuitry is provided underneath a multiple-well array to electrically interface with electrodes in the wells. The platform may sometimes be referred to as a CMOS-Multiwell Platform. The inventors have recognized and appreciated that to interface with electrodes in a large array, circuitry may be fabricated on a single silicon (Si) wafer having a dimension that is at least the same or larger than that of the multiple-well array. According to one aspect of the present disclosure, standard CMOS fabrication processes such as those known to be used in a standard semiconductor foundry may be used, e.g., without expensive customization for complex fabrication procedures, and thus the production cost can be lowered in some cases. The CMOS-Multiwell Platform according to some aspects of this disclosure can be used in applications including electrophysiology studies and general cell assessment using electrical methods, and/or in a high throughput format (e.g. 24-, 96-, and 384-well plate formats).

[0024] In some embodiments, the Si wafer is part of a semiconductor device, and has an array of reticle areas, with some or all of the reticle areas having a plurality of circuitry of a same design. The inventors have recognized and appreciated that during manufacturing, reticle areas of a wafer may reuse the same lithographical mask design repeated across the wafer in some cases, thus reducing the cost of tooling and increasing the wafer manufacturing throughput.

[0025] According to an aspect, digital and analog circuitry within a reticle area may be arranged to correspond to one or more wells when the multiple-well array is coupled on top of the wafer. Some embodiments can therefore provide a wafer-scale integration of electrical interface with a multiple-well array by using a manufacturing method that does not dice the wafer and/or is compatible with standard using standard CMOS-compatible techniques to reduce manufacturing cost.

[0026] Further, according to some aspects, because the reticle areas are spaced apart from each other in accordance with the pitch of the multiple-well array, cross-reticle connections can be provided in the semiconductor device to route power and data signals between reticle areas. The cross-reticle connections may be made using conductors that are disposed in a different plane than the reticle areas, such as in a redistribution layer (RDL) disposed above or below the wafer.

[0027] To route the large amount of data signals across the wafer, some or all of the reticle areas of the wafer may comprise well circuits configured to route digital signals along a first direction (X-direction) across a routing area of the reticle area, and to route analog signals along a second direction (Y-direction) across the routing area of the reticle area, e.g., such that digital and analog signals are cascaded from one reticle to the next until an edge of the wafer. Some or all of the reticle areas may also comprise reconfigurable peripheral circuits. Some or all of the peripheral circuits may include a stimulation circuit, a recording circuit, or a combination of one or more of stimulation circuits and recording circuits. The semiconductor device may comprise addressable switches that can selectively couple a subset of peripheral circuits within a well circuit to a selected subset of electrodes disposed within a well above the well circuit. Optionally and in addition to the electrodes, the switches may couple the peripheral circuits to one or more optoelectronic components. Optoelectronic components may be photodetectors or light-emitting diodes, and in some embodiments may be provided in a 1:1 relationship to the number of electrode arrays, such that the functionality for each well above a reticle area can be individually and independently programmed to allow a range of different assessments to be performed within the multiple-well array. The aspects and embodiments describes above, as well as additional aspects and embodiments, are described further below. These aspects and/or embodiments may be used individually, all together, or in any combination of two or more, as the present disclosure is not limited in this respect.

[0028] FIG. 1 is a high level block diagram illustrating an exemplary CMOS-Multiwell Platform, in accordance with some embodiments. FIG. 1 shows a semiconductor device 50 that includes a wafer 51. At least two reticle areas 52 are disposed within wafer 51, where some or all the reticle areas have a plurality of circuitry of a same design. Circuitry within each reticle areas 52 includes at least one well circuit 53 and a routing circuit 54. The routing circuit 54 routes a signal of a first type 55 from a first side 61 of the reticle area 52 towards a second side 62 of the reticle area 52 along a first direction y, and routes a signal of a second type 56 from a third side of the reticle area 63 towards a fourth side of the reticle area 64 along a second direction x. Semiconductor device 50 is configured to be used with a biochemical sensor that comprises a multiple-well array. For example, semiconductor device 50 may be coupled to a multiple-well array 1 along the z-direction, such that well circuit 53 in respective reticle area 52 is in electrical communication with a respective well 2 in the multiple-well array 1.

[0029] In FIG. 2A, a 96-well plate 10 is provided as part of a biosensor for assessment of biological specimens such as single cells disposed within the arrays of wells 12. The well 12 may have an array of electrodes 14 disposed in the well, for example at a bottom surface of a well 12, to serve as probes that can interface extracellularly or intracellularly with a specimen in the well. The 96-well plate 10 is attached to a semiconductor device 100 that includes a substrate 110 and an interposer 102. In some embodiments, substrate 110 comprises an integrated circuit (IC), and is bonded to an interposer printed circuit board (PCB) via wire-bonding or flip-chip solder bump connection. Circuitry within substrate 110 is situated below each well 12 and are in electrical communication with electrodes 14 disposed in the wells 12. It should be appreciated that plate 10 is shown as a 96-well array for illustration purposes only, and other aspects of the present disclosure are not so limited, and can be applicable, for example, to 24-well, 384-well, or other suitable multiple-well array formats known in the field.

[0030] FIG. 2A is a high level schematic diagram illustrating an exemplary CMOS-Multiwell Platform, in accordance with some embodiments. In FIG. 2A, a 96-well plate 10 is provided as part of a biosensor for assessment of biological specimens such as single cells disposed within the arrays of wells 12. The well 12 may have an array of electrodes 14 disposed in the well, for example at a bottom surface of a well 12, to serve as probes that can interface extracellularly or intracellularly with a specimen in the well. The 96-well plate 10 is attached to a semiconductor device 100 that includes a substrate 110 and an interposer 102. In some embodiments, substrate 110 comprises an integrated circuit (IC), and is bonded to an interposer printed circuit board (PCB) via wire-bonding. Circuitry within substrate 110 is situated below each well 12 and are in electrical communication with electrodes 14 disposed in the wells 12. It should be appreciated that plate 10 is shown as a 96-well array for illustration purposes only, and other aspects of the present disclosure are not so limited, and can be applicable, for example, to 24-well, 384-well, or other suitable multiple-well array formats known in the field.

[0031] The number of electrodes in electrode array 14 may be at least 1000, at least 4000, or in some embodiments at least 1 million, as aspects of the present disclosure is not so limited. It should be appreciated that while the electrode array 14 are shown disposed within wells 12 of plate 10, it is not necessary for electrode array 14 to be provided as part of the multiple-well plate, or as a separate component from the semiconductor device 100. In some embodiments, electrode array 14 may be disposed within semiconductor device 100, for example as conductors exposed from an insulative surface of substrate 110 that faces plate 10. In some embodiments, electrode array 14 may be patterned on a surface of substrate 110 as part of the semiconductor fabrication process to form semiconductor device 100, and may be metal pads that comprise Au or Pt, or alloys thereof. In such embodiments, substrate 110 may additionally comprise conductors that interconnect vertically the exposed electrode array 14 to circuitry within substrate 110.

[0032] FIG. 2B is a top view schematic diagram of an exemplary semiconductor device 200 that can be used in a CMOS-Multiwell Platform, in accordance with some embodiments. In FIG. 2B, there are 8×12=96 reticle areas 220 in the substrate 210, and the substrate 210 may be referred to as a multiwell IC. Substrate 210 may be a Si wafer, and each reticle area may be of an identical design that is fabricated by stepping the reticle of a standard lithography process along the X- and Y-directions without the need to dice the wafer. Each reticle area may comprise multiple layers, including an active layer that comprises silicon components, as well as one or more layers comprising conductors and dielectric materials as connections and interconnections. Each reticle area may contain one or more identical well circuits 230, as shown in the magnified view image in FIG. 2C.

[0033] In the embodiment shown in FIG. 2B, each reticle area 220 may be a CMOS chip and all 96 chips are connected through cross-reticle connections that can be fabricated using standard semiconductor processing techniques.

[0034] FIG. 3 is a schematic block diagram illustrating an exemplary apparatus 1000 for electrical assessment of a biological specimen, in accordance with some embodiments. The apparatus 1000 may be an example of a CMOS-Multiwell Platform, and includes a plate 30 having a multiple-well array. The plate 30 may be a standard 24-, 96- or 384-well plate in some non-limiting examples. The plate 30 is attached mechanically to a wafer 310, which may be a multiwell IC. Wafer 310 may be a silicon wafer that comprise a plurality of reticle areas 320. Reticle areas 320 may be arranged in an array on a surface of wafer 310, and may be un-diced silicon dies. Adjacent reticle areas are in electrical communications with each other, for example via cross-reticle connections. Each reticle area may have an identical circuit design. In some embodiments, each reticle area may have N identical well circuits 330. In the example shown in FIG. 2B, one well circuit is provided to electrically interface with electrodes in one well of the plate 30. For example, when there are 24 reticle areas, N may be 1 for 24-well format, 4 for 96-well format and 16 for 384-well format. However, it should be appreciated that the design of the reticles and well circuits is not limited to providing a one-to-one correspondence with the wells, and more or less than one well circuit may be provided to a well. In some embodiments, the well circuits may be reconfigured, for example by using a plurality of switches, to couple to different wells.

[0035] Still referring to FIG. 3, wafer 310 is attached to an interposer 302 both mechanically, and electrically. Any suitable bonding method known in the field of semiconductor packaging may be used to couple wafer 310 with interposer 302, such as but not limited to flip-chip bonding or wire-bonding. Apparatus 1000 may additionally and optionally include components for carrying out electrical assessment of a biological specimen disposed in the wells of plate 30. Such components may include a data acquisition system in communication with contact pads on interposer 302, one or more computers having processors that can execute programs stored in one or more storage medium to implement a method of carrying out testing using the wafer 310. Furthermore, in some embodiments, robotics may be used in connection with plate 30 to provide automatic sample handling and placement.

[0036] FIG. 4 is a cross-section view schematic diagram of an exemplary apparatus, in accordance with some embodiments. In FIG. 4, a first surface or top surface 422 of the multiwell IC 420 is facing the wells 42 in the plate 40, while a second or bottom surface 424 of the multiwell IC is facing opposite the wells, and faces the interposer. A plurality of reticle areas (not shown) are disposed in the top surface of the multiwell IC. Multiwell IC 420 is coupled to interposer 402 at a wafer attach surface 406. The interposer 402 may comprise a cavity 404 as shown in FIG. 4, which in some examples may have a cavity height that is similar to the thickness of the wafer that forms multiwell IC 420. Wafer attach surface 406 may be disposed at the bottom surface of cavity 404, and the multiwell IC 420 is positioned inside the cavity 404 and wire-bonded to the interposer 402. The input/output (I/O) of the multiwell IC 420 may be wire-bonded and routed to the contact pads 408 disposed on a mounting surface 409 at the bottom of the interposer 402. It should be appreciated that connection between the interposer and multiwell IC is not limited to wire-bonding as shown in the example in FIG. 4, and in some embodiments may be done via flip-chip bonding, or other techniques. Pads 408 may alternatively be implemented as gold fingers, cables, or connectors (e.g. USB) instead of contact pads. For example, a PCB with center opening and having pads aligned with the pads of a multiwell IC can be used for flip-chip bonding, where a solder bump will connect the interposer pads with the array of pads in the multiwell IC directly without wire-bonding.

[0037] As shown in FIG. 4, wells 42 are open bottom wells that are attached onto the multiwell IC 420 and the interposer 402, such that the interior of wells 42 may be fluidically connected to the top surface 422 of multiwell IC 420, although aspects of the present disclosure are not limited to open bottom wells.

[0038] FIG. 5 is a cross-section view schematic diagram of an exemplary apparatus that could interface with an external data acquisition system, in accordance with some embodiments. In FIG. 5, components that are similar to those of FIG. 4 are denoted with the same reference numbers. In FIG. 5, an environment chamber or incubator 506 with key slot feature is used to guide the well-plate 40 to align with an array of spring-loaded contacts 504 on a second substrate 502 with matching pattern to the contact pads 408 on the interposer 402. The enclosed chamber 506 provides an isolated environment for the experiment wells 42 with gas control. In some embodiments, second substrate 502 may provide mechanical support and environmental sealing for chamber 506. Furthermore, second substrate 502 may provide electrical interconnections between the multiwell IC 420 within chamber 506 to an external data acquisition system outside of chamber 506. Second substrate 502 may be physically secured to interposer 402 by a suitable clamping technique. In some embodiments, second substrate 502 is coupled to interposer 402 via a magnetic force, for example using a pair of magnets disposed on the mounting surface 409 of interposer 402 and a top surface of second substrate 502, which provides a pulling/snapping force to ensure sufficient contact between the pads 408 and spring-loaded contacts 504.

[0039] FIG. 6 is a plan-view schematic diagram of an exemplary environment chamber 606, in accordance with some embodiments. FIG. 6, shows that environment chamber 606 comprises a lid 608 that can snap on to a housing 610 to create an enclosure that has two openings towards the bottom, with opening 602 open to a well-plate, and opening 604 for providing gas control to the environment chamber 606.

[0040] FIG. 7 is a top view schematic diagram illustrating an exemplary wafer 710, in accordance with some embodiments. The wafer 710 may be a multiwell IC and in the example shown consists of 4×6=24 identical reticle areas (e.g. 18 mm×18 mm). The reticle area may be designed in a specific symmetry so that a simple redistribution layer (RDL) connections between the IO pads of neighbor reticle areas will allow I/O signals to pass through the entire wafer. The RDL may comprise conductors such as metal traces that serve as cross-reticle connections interconnect adjacent reticle areas, IO pads disposed around the periphery of wafer 710 may be then wire-bonded to the interposer as shown in FIG. 4.

[0041] FIG. 8 is a top view schematic diagram illustrating an example circuit design within a reticle area, in accordance with some embodiments. In FIG. 8, a reticle area contains 4 identical well circuits 830 positioned to allow standard well-plate alignment (e.g. 9 mm distance), although it should be appreciated that variations of the design as shown in FIG. 8 having any suitable number of well circuits may be used for other multiple-well arrays such as 24-well and 384-well plates. For the 24-well version reticle, only one well circuit should be centered at the reticle in this example. For example in a 384-well version reticle area, 16 well circuits may be positioned to allow standard 4.5 mm well distance.

[0042] In FIG. 8, reticle area 820 is designed to have left-right and top-bottom symmetric IO pads on the periphery so that signal can be routed cross the reticle area and pass into adjacent reticle areas through the cross-reticle signal buses 820. Each well circuit 830 inside the reticle area 820 may have dedicated signal buffers to buffer the global signal to local well circuit and vice versa. In one embodiment, different types of signals are routed along the X- and Y-directions, to increase routing efficiency when daisy-chaining a plurality of rows and columns of reticle areas. For example, the cross-reticle signal busses 822 may be a routing circuit that routes digital signal along the X-direction from the left side of the reticle area towards the right side, and routes analog signals along the Y-direction from the top side of the reticle area towards the bottom side.

[0043] FIG. 9 is a schematic block diagram illustrating an exemplary well circuit 930 inside a reticle area 920, in accordance with some embodiments. In a well circuit 930, a plurality of peripheral circuits 934 are designed to be able to connect to all or a subset of an array of electrodes 936 within a well of a multiple-well array attached atop the wafer that the reticle area 920 is disposed in. The array of electrodes may also be referred to as pixels, each pixel occupying a pixel area. In a non-limiting example, well circuit 930 has 256 peripheral circuits. By selective operation of a plurality of switches 932, all or a subset of the peripheral circuits are able to connect to all or a subset of 4096 pixels in a well to allow high density (HD), medium density (MD) or low density (LD) connections. Any set of arbitrary pixels can also act as reference electrode by connection the electrode to the reference electrode bias (V.sub.REF) In the non-limiting example described, in HD (MD) connections, a subset of 16×16 (32×32) pixels are recorded out of the total 64×64 available pixels. This routing design allows scanning of the recording area (16×16 for HD and 32×32 for MD) across the entire available active area (64×64). This example design allows customized experiment setups from well to well.

[0044] In some embodiments, switches 932 may also selectively couple the peripheral circuits 934 to one or more optoelectronic components instead of an electrode. Examples for the optoelectronic component include photodetectors or photoemitters such as light-emitting diodes, such that the functionality for each well above a reticle area can be individually and independently programmed to allow a range of different assessments to be performed within the multiple-well array. In some embodiments, the optoelectronic component may be a photodiode fabricated on the wafer such as wafer 710, and disposed in an optoelectronic sensing region within a pixel area. In a non-limiting example, a lateral spatial span of the optoelectronic sensing region covers the same area as the electrode array in the pixel area, although it should be appreciated that other suitable placement or dimension for the optoelectronic component may be used. In some embodiments, the optoelectronic interface has a 1:1 mapping with the electrical interface, and an optoelectronic component is provided for each electrode array or each pixel area, although the 1:1 mapping is not a requirement.

[0045] Referring back to FIG. 9, the peripheral circuit 934 may each include a stimulation circuit and a recording circuit. In some embodiments, the stimulation circuit may comprise one or more current injectors. Some aspects of the peripheral circuit design are related to current-based stimulators for electrogenic cells and related methods, as disclosed in International Application Publication. No. WO 2019/010343, Attorney Docket No. H0776.70105WO00, the disclosure of which is hereby incorporated by reference in its entirety. Some aspects may also be related to electronic circuits for analyzing electrogenic cells and related methods, as disclosed in International Application Publication. No. WO 2019/089495, Attorney Docket No. H0498.70647WO00, the disclosure of which is hereby incorporated by reference in its entirety.

[0046] Still referring to the design of well circuits in FIG. 9, global digital control and configuration signals may be routed from left to right in the center of the reticle, whereas global analog signals (output and control signals) are routed from top to bottom, also in the center of the reticle as shown in see FIG. 8. In some embodiments, each well circuit buffers in and out its local signals to the global buses.

Digital Interface

[0047] According to an aspect of the present disclosure, to allow for simple and fast programming of a multiwell IC such as the wafer 710 as shown in FIG. 7 cross all 24 reticles, three level of Serial-Peripheral-Interface (SPI) may be provided. The highest-level SPI select one or more specific well(s) from the multiwell IC to be programed in the lower level two SPIs. The input (D.sub.IN) of this SPI may come from an I/O pad on the left side of a reticle area, and the output (D.sub.OUT) of this SPI is routed to the symmetric I/O pad on the right side of the reticle area, which allows simple RDL connections to daisy-chain the reticles together. The lower two level SPIs may have shared control signals across the entire multiwell IC. In some embodiments, the Address Select SPI select the components (e.g. peripheral circuits and temperature control) within the well circuit to be programed by the Configuration SPI, which write the registers of the selected components in the selected wells.

Analog Output

[0048] Further according to an embodiment of the present disclosure, each reticle area may have, for example, 8 analog output buses routed from top I/O pads to bottom I/O pads. The analog output of the peripheral circuits in each well is multiplexed into one of the eight buses. Since each reticle has 4 wells but 8 analog buses, this design allows the top two rows (2×6) of reticle areas to be read out from the top side and the bottom two rows (also 2×6) to be read out from the bottom side of the reticle area, although aspects of the present disclosure are not so limited and other suitable readout schemes may be used. The inventors have recognized and appreciated that the routing of analog and digital signals as described herein may advantageously improve signal routing efficiency by simplifying the routing design. It should be understood, however, that other numbers of analog buses are also possible in other embodiments. Optionally or alternatively, signals can be routed all digitally, after analog signals are converted in analog-to-digital converters within the reticle, and converted back to analog form using digital-to-analog converters when needed to provide stimulation.

[0049] FIGS. 10A and 10B are top view and bottom view schematic diagrams, respectively, of an example design of an environment chamber lid with reference electrodes, in accordance with some embodiments. The lid may include Ag/AgCl reference electrode, which the inventors have recognized as an importance reference electrode material in electrochemical applications. In the example illustrated in FIG. 10A, 24/96/384 reference electrodes and their control circuits are integrated on a PCB Lid with the same form factor as the standard well-plate. The control circuits may be programed with SPI so that customized experiments can be perform from well to well. The reference electrodes can measure solution/media voltage/current and apply stimulation to the experiment well. The lid design can additionally be used to accommodate a photodiode or a photoemitter lid for optical applications (e.g. optogenetic/optical electrochemical sensing).

Applications

[0050] FIGS. 11A, 11B and 11C illustrate several exemplary applications of the apparatus as disclosed herein. In addition to electrophysiology studies, a CMOS-Multiwell platform as described herein can also leverage impedance and electrochemical measurement to extend the area of applications.

[0051] For example, a CMOS-Multiwell platform may be used for cell or tissue mapping, such as spatial characterization of one or more characteristics of cells or tissues disposed on a surface of a well. Such characteristics may be related to one or more phenomena such as cell confluency, cell migration, cell viability/toxicity, and cell adhesion. In one non-limiting example, an impedance map between electrodes in the electrode array may be created that is representative of spatial distribution of cells relative to the electrodes.

[0052] As another exemplary use scenario, the CMOS-Multiwell platform as described herein may be used for performing patterned redox electrochemistry in selected spatial areas by selectively activating a select pattern of electrodes within a well. The patterned electrochemistry may be used to interact with a pattern of cells electrochemically, or to perform electrochemical sensing such as sensing of pH, O.sub.2 level, etc. in selectively patterned spatial areas.

[0053] As a further example, the CMOS-Multiwell platform may be used for single-cell measurements, including but not limited to single-cell action potential or ion-channel measurements. The single-cell measurements may also include network measurements to characterize conduction velocity for cardiac cells, or synapse mapping of neurons in some non-limiting examples.

[0054] The following applications are each incorporated herein by references in their entireties: U.S. Provisional Patent Application Ser. No. 63/040,439, filed Jun. 17, 2020, by Park, et al.; U.S. Provisional Patent Application Ser. No. 63/040,424, filed Jun. 17, 2020, by Ham, et al.; and U.S. Provisional Patent Application Ser. No. 63/040,412, filed Jun. 17, 2020, by Ham, et al. In addition, the following are each incorporated herein by references in their entireties: a PCT patent application, filed on Jun. 16, 2021, entitled “Systems and Methods for Patterning and Spatial Electrochemical Mapping of Cells,” and a PCT patent application, filed on Jun. 16, 2021, entitled “Apparatuses for Cell Mapping Via Impedance Measurements and Methods to Operate the Same.”

[0055] Having thus described several aspects of at least one embodiment of this invention, it is to be appreciated that various alterations, modifications, and improvements will readily occur to those skilled in the art. Such alterations, modifications, and improvements are intended to be part of this disclosure, and are intended to be within the spirit and scope of the invention. Further, though advantages of the present invention are indicated, it should be appreciated that not every embodiment of the technology described herein will include every described advantage. Some embodiments may not implement any features described as advantageous herein and in some instances one or more of the described features may be implemented to achieve further embodiments. Accordingly, the foregoing description and drawings are by way of example only.

[0056] Various aspects of the present invention may be used alone, in combination, or in a variety of arrangements not specifically discussed in the embodiments described in the foregoing and is therefore not limited in its application to the details and arrangement of components set forth in the foregoing description or illustrated in the drawings. For example, aspects described in one embodiment may be combined in any manner with aspects described in other embodiments.

[0057] Also, the invention may be embodied as a method, of which an example has been provided. The acts performed as part of the method may be ordered in any suitable way. Accordingly, embodiments may be constructed in which acts are performed in an order different than illustrated, which may include performing some acts simultaneously, even though shown as sequential acts in illustrative embodiments.

[0058] Use of ordinal terms such as “first,” “second,” “third,” etc., in the claims to modify a claim element does not by itself connote any priority, precedence, or order of one claim element over another or the temporal order in which acts of a method are performed, but are used merely as labels to distinguish one claim element having a certain name from another element having a same name (but for use of the ordinal term) to distinguish the claim elements.

[0059] The terms “approximately” and “about” may be used to mean within ±20% of a target value in some embodiments, within ±10% of a target value in some embodiments, within ±5% of a target value in some embodiments, and yet within ±2% of a target value in some embodiments. The terms “approximately” and “about” may include the target value.