Ball-shaft connection

Abstract

The invention relates to a probing means for coordinate measuring machines, with a probe tip having a recess and a shaft penetrating with a shoulder into the recess. According to the invention, the recess tapers towards the interior of the probe tip and the shaft has a construction complementary thereto.

Claims

1. A probing means for coordinate measuring machines, the probing means having one end for contacting a workpiece to be measured, the probing means comprising a shaft, a probe tip provided at the end of the probing means for contacting the workpiece to be measured, the probe tip being fixedly attached to the shaft, the probe tip having a recess, the shaft having a projection, the projection penetrating into the recess, wherein the recess tapers towards an interior of the probe tip and the shaft has a shape which is complementary thereto, and wherein the recess is formed as a truncated pyramid with 4 to 8 facets.

2. The contact probe of claim 1, wherein the probe tip is made from a substance selected from the group consisting of: ruby (mono-crystalline aluminum oxide), sintered aluminum oxide, hard metal, sapphire, silicon nitride, zirconium oxide, and diamond.

3. The probing means of claim 1 wherein the recess does not include threading and the projection does not include threading.

4. A contact probe for coordinate measuring machines, comprising: a shaft having a projection, the projection forming one of a cone, a frustrated cone, a pyramid, and a truncated pyramid; a probe tip fixedly attached at one end of the shaft for contacting a workpiece to be measured and having a tapered recess, the tapered recess tapering towards an interior of the probe tip with an opening angle of the taper larger than 5°, the tapered recess being a complementary negative form of the projection; and a soldering or adhesive bonding provided between the projection and the tapered recess for fixedly attaching the projection in the tapered recess of the probe tip.

5. A contact probe for coordinate measuring machines according to claim 4, wherein the projection forms a truncated pyramid.

6. A contact probe for coordinate measuring machines according to claim 5, wherein the opening angle of the taper is larger than 15°.

7. A contact probe for coordinate measuring machines according to claim 6, wherein the tapered recess ends in a blunted manner in the interior of the probe tip.

8. A contact probe for coordinate measuring machines according to claim 6, wherein the recess does not include threading, the projection does not include threading and the tapered recess ends in a blunted manner in the interior of the probe tip.

9. The contact probe for coordinate measuring machines according to claim 5, wherein the recess is formed as a truncated pyramid with 4 to 8 facets.

10. A contact probe for coordinate measuring machines according to claim 9, wherein the opening angle of the taper is larger than 15°.

11. The contact probe of claim 5, wherein the tapered recess ends in a blunted manner in the interior of the probe tip and the probe tip is made from a substance selected from the group consisting of: ruby (mono-crystalline aluminum oxide), sintered aluminum oxide, hard metal, sapphire, silicon nitride, zirconium oxide, and diamond.

12. A contact probe for coordinate measuring machines according to claim 4, wherein the projection forms a frustrated cone.

13. A contact probe for coordinate measuring machines according to claim 12, wherein the tapered recess ends in a blunted manner in the interior of the probe tip.

14. The contact probe of claim 13, wherein the probe tip is made from a substance selected from the group consisting of: ruby (mono-crystalline aluminum oxide), sintered aluminum oxide, hard metal, sapphire, silicon nitride, zirconium oxide, and diamond.

15. The probing means of claim 14, wherein the recess does not include threading and the projection does not include threading.

16. The probing means according to claim 14, wherein the projection is adhesively bonded into the recess and the recess in the probe tip is larger than the size of the projection by an amount corresponding to the thickness of the adhesive.

17. The probing means according to claim 16, wherein the opening angle is larger than 15°.

18. A method for manufacturing a probing means for coordinate measuring machines according to claim 4, wherein the recess is made by laser ablation.

19. The method according to claim 18, wherein an opening angle of the taper is made which is larger than the opening angle of a focused laser beam used for ablation.

20. A probing means for coordinate measuring machines, the probing means having one end for contacting a workpiece to be measured, the probing means comprising a shaft, a probe tip provided at the end of the probing means for contacting the workpiece to be measured, the probe tip being fixedly attached to the shaft, the probe tip having a recess the shaft having a projection, the projection penetrating into the recess wherein the recess tapers towards an interior of the probe tip and the shaft has a shape which is complementary thereto, and wherein the shaft includes a proximal end, a distal end, and a longitudinal axis extending between the proximal end and the distal end, and the projection is formed at the distal end and has a longitudinal axis that aligns with the longitudinal axis of the shaft, and the projection has a shape of a truncated pyramid.

21. A contact probe for coordinate measuring machines, the contact probe having one end for contacting a workpiece to be measured, the contact probe comprising a shaft including a proximal end, a distal end, and a longitudinal axis extending between the proximal end and the distal end, a projection formed at the distal end with a shoulder surrounding the projection, a probe tip provided at the end of the probing means for contacting the workpiece to be measured, the probe tip being made from a substance selected from the group consisting of: ruby (mono-crystalline aluminum oxide), sintered aluminum oxide, hard metal, sapphire, silicon nitride, zirconium oxide, and diamond, the probe tip being fixedly attached to the shaft, the probe tip having a tapered recess, the projection forming one of a frustrated cone and a truncated pyramid; the tapered recess being a complementary negative form of the projection and the tapered recess ends in a blunted manner in the interior of the probe tip, the projection penetrating into the recess, the projection being formed at the distal end with a shoulder surrounding the projection, the tapered recess tapering towards an interior of the probe tip with an opening angle larger than 5° and a soldering or an adhesive bonding for fixedly attaching the probe tip to the shaft is provided between the projection and the recess.

22. The contact probe according to claim 21, wherein the probe is soldered to the projection.

23. The contact probe according to claim 22, wherein the tip has a ball shape.

24. The contact probe according to claim 23, wherein the angle of the taper is larger than 15°.

25. The contact probe according to claim 21, wherein the probe is adhesively bonded to the projection.

26. The contact probe according to claim 25, wherein the tip has a ball shape.

27. The contact probe according to claim 26, wherein the angle of the taper is larger than 15°.

Description

(1) In the following, the invention is described exemplarily on the basis of the drawings in which

(2) FIG. 1a shows a section through a probing means of the present invention with the projection on the shaft and the recess in the probe tip being manufactured in an accurately fitting manner;

(3) FIG. 1b shows a section through a probing means of the present invention with a slightly too short projection on the shaft;

(4) FIG. 2a shows, both as a sectional view and a perspective view, a probe tip body for the probing means according to FIG. 1 of the present invention for an embodiment of the invention with a recess having the shape of a truncated pyramid;

(5) FIG. 2b shows a shaft for the embodiment of the invention according to FIG. 2a;

(6) FIG. 3a shows, both as a sectional view and a perspective view, a probe tip body for a probing means according to the invention for an embodiment of the invention with a recess of truncated pyramid form;

(7) FIG. 3b shows a shaft for the embodiment of the invention according to FIG. 3a;

(8) FIG. 4 shows a section through a probing means of the prior art;

(9) FIG. 5 shows a section through a probing means of the prior art.

(10) In accordance with FIG. 1, in the probing means 1 for coordinate measuring machines (not shown), which is generally referred to as 1 and comprises a probe tip 3 having a recess 2 and a shaft 5 penetrating with a projection 4 into the recess 2, it is intended that the recess 2 tapers towards the interior of the probe tip 3a and the shaft 5 has a construction of the projection 4 which is complementary thereto.

(11) In the shown embodiment, the probing means 1 is realized as a probe with a straight shaft 5 and a ball-shaped tip 3. It can be used for both scanning and touching measurements. The transition arrangement from the probing means shank 5 to the coordinate measuring machine (not shown) is not shown and can readily be formed in a manner known per se.

(12) In the present case, the recess 2 is, as preferred, less deep than the radius of the probe tip body 3. Thus, the integrity of the probe tip body 3 is affected at the most little by the recess. In the present case, the opening angle of the recess 2, which is shown in FIG. 1b as the angle ALPHA for the sake of clarity, is so large that in case the bond is damaged, the probe tip body loosens from the shaft. For example, the angle is about 10°.

(13) In the present case, the probe tip 3 is made from ruby (i.e. a substantially mono-crystalline aluminum oxide) as hard material. However, other materials which are common for probe tip bodies can also be used. Without a limiting exclusion of further materials, in particular sintered aluminum oxide, hard metal, sapphire, silicon nitride, zirconium oxide and diamond are mentioned as preferred materials. The probe tip 3 is shown to be a highly-precise ball, but of course also other geometries of the probe tip body can be used without leaving the scope of the invention, i.a. ball disks, cones, cylinders.

(14) In the present example, the shaft 5 is made from hard metal. However, also other shaft materials, for example materials common in the prior art, can also be readily used. At least stainless steel, carbon fiber reinforced plastics as well as ceramics are explicitly mentioned.

(15) In the example of FIG. 1a, see the illustrations of FIGS. 2a and 2b, the recess 2 is formed as a recess having the shape of a truncated pyramid and having six facets and a face being formed by laser ablation. The shaft 5 has a complementary counter-shape which is made from a round piece of solid material from the shaft material also by means of laser ablation.

(16) FIG. 1 shows that, as preferred, the recess 2 in the probe tip body 3 and the projection 4 on the shaft 5 are complementary and fit together in such a manner that the probe tip body contacts the shaft 5 only with its projection 4 but not with the projection 6 surrounding the projection 4 on the shaft 5. Adhesive, which has possibly been introduced in excess, can thus be squeezed out of the recess 2 and moreover the visual control of the transitional area is improved. FIG. 1b shows, however, that also in case of a slightly shorter projection 4 on the shaft 5, a perfect connection can still be achieved.

(17) The arrangement is made and used as follows:

(18) First, a probe tip blank and a shaft blank are provided. A recess 2 is made in the probe tip blank by means of a focused laser beam and a projection is made on the shaft blank. The laser beam converges onto the focus with an angle smaller than 10°. Then the shaft is processed by laser ablation for forming a projection which is complementary to the recess 2.

(19) It is also mentioned that the recess 2 and the complementary projection can alternatively and/or additionally be made by using other methods, e.g., mechanical methods, electro-erosive methods, etching methods, electron or ion beam ablation.

(20) Then the shaft and the probe tip body are bonded to each other by using suitable adhesives.

(21) After assembling the arrangement to a coordinate measuring machine and calibration, touching or scanning measurements can be carried out. The truncated pyramid shape of projection and recess guarantees an increased stability of the bond and thus a high dimensional accuracy.

(22) If the bond is affected by impacts or the like, the probe tip body will loosen from the shaft without tilting or jamming, so that the defect becomes directly visible.

(23) While FIG. 2 shows a recess 2 in the probe tip body 3 and a complementary projection on the shaft 5, which has the shape of a truncated pyramid, FIG. 3 shows an alternative embodiment in which the recess is realized as a negative shape for a truncated cone (which is in the present case understood as a “recess having the shape of a truncated cone”, see above). Because of the circular cross-section of the truncated cone, in case of a section through the axis, this arrangement does not offer the advantage of an additional positive locking.