Semiconductor die and package jigsaw submount
09831144 · 2017-11-28
Assignee
Inventors
Cpc classification
H01L2224/48465
ELECTRICITY
H01L2224/0401
ELECTRICITY
Y02P70/50
GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
H01L2224/48472
ELECTRICITY
H01L2924/00012
ELECTRICITY
H01L2224/131
ELECTRICITY
H01L2224/81203
ELECTRICITY
H01L2224/49113
ELECTRICITY
H01L2224/04042
ELECTRICITY
H01L2224/32225
ELECTRICITY
H01L2224/131
ELECTRICITY
H05K2201/0939
ELECTRICITY
H01L2224/32225
ELECTRICITY
H05K3/3415
ELECTRICITY
H05K1/0204
ELECTRICITY
H01L2924/00
ELECTRICITY
H01L2924/00
ELECTRICITY
H01L2224/48472
ELECTRICITY
H05K3/3442
ELECTRICITY
H01L2924/00014
ELECTRICITY
H01L2224/48464
ELECTRICITY
H01L2924/00014
ELECTRICITY
H01L2924/00012
ELECTRICITY
H01L2224/48471
ELECTRICITY
H05K1/117
ELECTRICITY
H05K2201/041
ELECTRICITY
H01L2224/16225
ELECTRICITY
H01L2224/06135
ELECTRICITY
H05K2201/09063
ELECTRICITY
H01L24/73
ELECTRICITY
H05K1/141
ELECTRICITY
H05K2201/09472
ELECTRICITY
H01L2224/48465
ELECTRICITY
International classification
H05K1/18
ELECTRICITY
H05K1/11
ELECTRICITY
H01L25/065
ELECTRICITY
H01L23/498
ELECTRICITY
Abstract
A submount for connecting a semiconductor device to an external circuit, the submount comprising: a planar substrate formed from an insulating material and having relatively narrow edge surfaces and first and second relatively large face surfaces; at least one recess formed along an edge surface; a layer of a conducting material formed on a surface of each of the at least one recess; a first plurality of soldering pads on the first face surface configured to make electrical contact with a semiconductor device; and electrically conducting connections each of which electrically connects a soldering pad in the first plurality of soldering pads to the layer of conducting material of a recess of the at least one recess.
Claims
1. An apparatus comprising: a submount for connecting a semiconductor or passive device to an external circuit, the submount comprising: a planar substrate formed from an insulating material and having relatively narrow edge surfaces and first and second relatively large face surfaces; a plurality of recesses formed along an edge surface; a layer of a conducting material formed on a surface of each of the at least one recess, wherein at least two recesses of the plurality of recesses differ from each other with respect to one or more of: recess surface shape, recess surface area, and extent of coverage on the surface of the recess by the conducting material layer; a first plurality of soldering pads on the first face surface configured to make electrical contact with a semiconductor or passive device; a second plurality of soldering pads on the second face surface configured to make electrical contact with a second semiconductor or passive device; and electrically conducting connections each of which electrically connects a soldering pad in the first and/or second plurality of soldering pads to the layer of conducting material of a recess of the plurality of recesses; and a motherboard for mounting the submount, the motherboard comprising: a face surface configured to be apposed to the second face surface of the planar substrate of the submount when the submount is mounted to the motherboard; at least one conducting land on the face surface of the motherboard for making electrical contact with the layer of conducting material of a recess of the plurality of recesses formed along the edge surface of the submount when the submount is mounted to the motherboard; and a recess formed on the face surface of the motherboard and dimensioned to receive the second semiconductor or passive device mounted to the second face surface of the submount when the submount is mounted on the motherboard.
2. The apparatus according to claim 1 wherein the electrically conducting connections comprise a conducting trace on the first or second face surface.
3. The apparatus according to claim 1 wherein the electrically conducting connections comprise an internal conductor located inside the planar substrate.
4. The apparatus according to claim 1 wherein a recess of the plurality of recesses formed along the edge surface of the submount has a circular and/or polyline recess surface.
5. The apparatus according to claim 4 wherein, out of the plurality of recesses formed along the edge surface of the submount, at least one recess has a circular recess surface and at least one recess has a polyline recess surface.
6. The apparatus according to claim 1 further comprising a layer of a conducting material formed on at least one portion along the edge surface of the submount.
7. The apparatus according to claim 1 comprising a layer of conductive material formed on at least one portion along the edge surface of the submount between at least two adjacent recesses.
8. The apparatus according to claim 1 wherein the recess in the face surface is a blind recess having a bottom surface in the substrate of the motherboard.
9. The apparatus according to claim 8, wherein the motherboard comprises a layer of material configured to dissipate heat generated by operation of the semiconductor or passive device.
10. The apparatus according to claim 1, wherein the recess in the face surface of the motherboard passes through the motherboard substrate.
11. The apparatus according to claim 1 wherein an angle between at least a portion of the recess surface of the plurality of recesses formed along the edge surface of the submount is angled at an acute angle with respect to a face surface of the first and second face surfaces.
12. The apparatus according to claim 1 wherein a region of an edge surface of the submount is angled at an acute angle with respect to a face surface of the first and second face surfaces.
13. The apparatus according to claim 12 wherein the edge surface of the submount is a faceted surface comprising first and second facets.
14. The apparatus according to claim 13 wherein a region of the second facet is covered with a layer of conducting material.
15. The apparatus according to claim 14 wherein the substrate comprises an internal conductor that makes electrical contact with the layer of conducting material on the second facet.
16. The apparatus according to claim 14 wherein the substrate comprises an internal conductor that does not make electrical contact with the layer of conducting material on the second facet.
17. The apparatus according to claim 1, wherein, when the submount is mounted to the motherboard, there is no air gap between the first face surface of the insulating substrate of the motherboard and the second face surface of the planar substrate of the submount.
18. The apparatus according to claim 1 wherein, out of the plurality of recesses formed along the edge surface of the submount, at least one recess is fully covered with a conductive layer, and at least one recess is partially covered with a conductive layer.
Description
BRIEF DESCRIPTION OF FIGURES
(1) Non-limiting examples of embodiments of the invention are described below with reference to figures attached hereto that are listed following this paragraph. Identical structures, elements or parts that appear in more than one figure are generally labeled with a same numeral in all the figures in which they appear. A label labeling an icon representing a given feature of an embodiment of the invention in a figure may be used to reference the given feature. Dimensions of components and features shown in the figures are chosen for convenience and clarity of presentation and are not necessarily shown to scale.
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DETAILED DESCRIPTION
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(10) By way of example, substrate 30 is configured so that bare dies and/or die packages may be mounted to a first face surface 31, shown in
(11) A contact pad 51, or 53 may be electrically connected to a conductive layer 49 of a contact bay 40 by a conductive trace 61 on first face surface 31 of substrate 30 as schematically shown in
(12) A contact pad of a substrate may also be connected to another contact pad of the substrate by a conductive trace, bond wire, or internal conductor to electrically connect different components of a chip or components of two different chips mounted to the substrate. For example, first surface 31 of jigsaw submount 20 comprises two conductive traces 63 each of which connects a circular contact pad 51 to a rectangular contact pad 53. Each trace 63 and the circular and square contact pad 51 and 53 that it connects may be used to connect components in a same chip or different chips by soldering appropriate contact pads of the chip or chips to the contact pads connected by the conductive trace.
(13) As indicated by the variety of shapes of contact bays 40 formed in jigsaw submount 20 shown in
(14) By way of a numerical example, assume that a conductive layer of a contact bay of a jigsaw submount is to be used to provide a voltage, commonly referred to as a voltage V.sub.dd, equal to about 5 volts to a chip or chips mounted to the jigsaw submount and carry a peak current equal to about 1 A (amperes). Assume further that the contact bay is required to operate in a temperature range from a room temperature equal to about 20° to a maximum operating temperature equal to about 80° C. The contact layer of the bay may be formed from copper having electrical resistance equal to about 19.2 nΩm (nano-ohm meters) at 25° and temperature coefficient for change of conductivity per degree Kelvin equal to about 0.393% per K/degree. Then the contact bay surface may advantageously have a length equal to about 0.32 mm (millimeters) and a thickness equal to about 35 μm (micrometers).
(15) It is noted that generally it is easier and less expensive to form contact bays having circular bay surfaces. However, for a given length along an edge of a jigsaw submount a contact bay having a polyline bay surface can provide a bay surface having a larger or substantially larger area than a circular bay surface.
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(18) By way of a numerical example, assume that chips 80, 90, and 102 comprised in jigsaw MCM 20 have footprints respectively equal to 8 mm×8 mm, 10 mm×10 mm, and 16 mm×20 mm Assume that a 1 mm wide perimeter around each chip 80, 90, and 102 is required for routing conductive traces that eclectically connect the chip to other chips on the submount and/or contact bays 40 (
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(20) Lands 210 optionally comprise a row of relatively small square lands 211, relatively large rectangular and semicircular lands 212 and 213 respectively, a small square land 214 and a small circle land 215. Lands 211, 212, 213, 214, and 215 are shaped and located to match with, and provide for electrical contact to contact bays 41, 42, 43, 44, and 45 respectively (
(21) Whereas jigsaw motherboard 200 is shown receiving a single jigsaw submount, a jigsaw motherboard may be configured to be mounted with, and provide electrical connections to and between a plurality of jigsaw submounts, each comprising a chip or plurality of chips, to provide a desired circuit. Because jigsaw submounts comprise contact bays for providing electrical contact to chips mounted to the submounts, a plurality of submounts that may be required to produce the desired circuit may be positioned on a jigsaw mother board relatively close together so that the desired circuit is characterized by a relatively small footprint.
(22) By way of example,
(23) Optionally, jigsaw motherboard 300 has an edge connector 302 comprising contact fingers 304 and lands 211, 212, 214, 215, and a land 216 optionally having an area formed by an intersection of two non-concentric circles. Contact fingers 304 may be electrically connected to appropriate lands on the jigsaw motherboard by suitably configured conductive traces (not shown) or internal conductive layers. The lands are configured to provide electrical contact between jigsaw MCMs 321 and 322 and between the jigsaw MCMs and contact fingers 304 of edge connector 302. The jigsaw lands may of course be used to electrically connect components other than MCMs to motherboard 300, to each other, and/or to contact fingers 304.
(24) In an embodiment of the invention, a region of an edge surface of a jigsaw submount that is not a bay surface may be covered with a conducting layer so that when the jigsaw submount is butted up against another jigsaw submount having a matching conductive layer on a region of an edge surface, the two matching conductive layers touch and electrically connect the two jigsaw submounts. A conducting layer on an edge surface of a jigsaw substrate may be referred to as an edge surface conductor. In
(25) Because jigsaw submounts 321 and 322 in accordance with an embodiment of the invention provide electrical contact to chips mounted to the submounts via contact bays, the jigsaw MCMs may be positioned on jigsaw motherboard 300 closely adjacent and substantially “butted” together, as shown in
(26) It is noted that in jigsaw submounts 20, bay surfaces of bays 40 (
(27) By way example, jigsaw MCM 321 has an angled edge surface 340 that makes an acute angle with a bottom face surface 341 of the jigsaw MCM. Edge surface 340 has a normal 350 and face surface 341 has a normal 351. The acute angle between the surfaces is indicated as the angle a between normals 350 and 351. In an embodiment of the invention a is greater than about 60° and less than 90°.
(28) In some embodiments of the invention an edge surface such as an edge surface of jigsaw MSM 321 be faceted and an edge surface conductor be formed to cover one of the facets or a region of one of the facets. By way of example,
(29) It is noted that wherein in the above description edge surfaces of a jigsaw submount are described and shown having planar, tilted, or faceted surfaces a jigsaw submount in accordance with an embodiment of the invention is not limited to planar surfaces. By way of example, an edge surface of a jigsaw submount in accordance with an embodiment of the invention may comprise a curved or partially curved surface.
(30) In the description and claims of the present application, each of the verbs, “comprise” “include” and “have”, and conjugates thereof, are used to indicate that the object or objects of the verb are not necessarily a complete listing of components, elements or parts of the subject or subjects of the verb.
(31) Descriptions of embodiments of the invention in the present application are provided by way of example and are not intended to limit the scope of the invention. The described embodiments comprise different features, not all of which are required in all embodiments of the invention. Some embodiments utilize only some of the features or possible combinations of the features. Variations of embodiments of the invention that are described, and embodiments of the invention comprising different combinations of features noted in the described embodiments, will occur to persons of the art. The scope of the invention is limited only by the claims.