MEASUREMENT PROBE AND METHOD

Abstract

The present disclosure provides a measurement probe comprising a probe tip for contacting a device under test, a probe handle that accommodates the probe tip at least in part, an electrical interface for coupling the measurement probe to a measurement device, and a switch comprising a control input, a first load input that is electrically coupled to the probe tip and a second load input that is electrically coupled to the electrical interface, wherein in a closed state the switch electrically closes the connection between the probe tip and the electrical interface, and in an open state electrically interrupts the connection between the probe tip and the electrical interface. The present disclosure also provides a respective method.

Claims

1. A measurement probe comprising: a probe tip for contacting a device under test; a probe handle that accommodates the probe tip at least in part; an electrical interface for coupling the measurement probe to a measurement device; and a switch comprising a control input, a first load input that is electrically coupled to the probe tip and a second load input that is electrically coupled to the electrical interface, wherein in a closed state the switch electrically closes a connection between the probe tip and the electrical interface, and in an open state electrically interrupts the connection between the probe tip and the electrical interface.

2. The measurement probe according to claim 1, wherein the switch comprises a mechanically controlled switch.

3. The measurement probe according to claim 1, wherein the switch comprises an electrically controlled switch.

4. The measurement probe according to claim 3, wherein the switch comprises a semiconductor switching element.

5. The measurement probe according to claim 3, wherein the electrical interface comprises a switching input that is electrically coupled to the control input.

6. The measurement probe according to claim 3, further comprising a controller, wherein the controller is electrically coupled to the control input of the switch and outputs a control signal to the control input.

7. The measurement probe according to claim 6, wherein the controller comprises a switching logic that controls the switch.

8. The measurement probe according to claim 7, wherein the switching logic is electrically coupled to the probe tip and controls the switch based on a signal measured at the probe tip.

9. The measurement probe according to claim 6, wherein the controller is coupled with the electrical interface and receives control signals via the electrical interface.

10. A method for measuring with a measurement probe, the method comprising: providing a probe tip for contacting a device under test at least in part in a probe handle of the measurement probe; electrically coupling the measurement probe to a measurement device; and controlling a switch that is electrically coupled between the probe tip and an electrical interface of the measurement probe, wherein in a closed state the switch electrically closes a connection between the probe tip and the electrical interface, and in an open state electrically interrupts the connection between the probe tip and the electrical interface.

11. The method according to claim 10, wherein the switch is mechanically controlled.

12. The method according to claim 10, wherein the switch is electrically controlled.

13. The method according to claim 12, wherein the switch comprises a semiconductor switching element.

14. The method according to claim 12, wherein the electrical interface comprises a switching input that is electrically coupled to a control input of the switch and that receives control signals for the switch.

15. The method according to claim 12, further comprising: outputting a control signal to a control input of the switch from a controller.

16. The method according to claim 15, wherein the control signal is provided from a switching logic in the controller.

17. The method according to claim 16, wherein the switching logic is electrically coupled to the probe tip and controls the switch based on a signal measured at the probe tip.

18. The method according to claim 15, wherein the controller is coupled with the electrical interface and receives control signals via the electrical interface.

Description

BRIEF DESCRIPTION OF THE DRAWINGS

[0047] For a more complete understanding of the present disclosure and advantages thereof, reference is now made to the following description taken in conjunction with the accompanying drawings. The disclosure is explained in more detail below using exemplary embodiments which are specified in the schematic figures of the drawings, in which:

[0048] FIG. 1 shows a block diagram of an embodiment of a measurement probe according to the present disclosure;

[0049] FIG. 2 shows a block diagram of another embodiment of a measurement probe according to the present disclosure;

[0050] FIG. 3 shows a block diagram of a further embodiment of a measurement probe according to the present disclosure;

[0051] FIG. 4 shows a block diagram of another embodiment of a measurement probe according to the present disclosure; and

[0052] FIG. 5 shows a flow diagram of an embodiment of a method according to the present disclosure.

[0053] In the figures like reference signs denote like elements unless stated otherwise.

DETAILED DESCRIPTION

[0054] As required, detailed embodiments of the present invention are disclosed herein; however, it is to be understood that the disclosed embodiments are merely exemplary of the invention that may be embodied in various and alternative forms. The figures are not necessarily to scale; some features may be exaggerated or minimized to show details of particular components. Therefore, specific structural and functional details disclosed herein are not to be interpreted as limiting, but merely as a representative basis for teaching one skilled in the art to variously employ the present invention.

[0055] FIG. 1 shows a block diagram of a measurement probe 100. The measurement probe 100 comprises a probe tip 101 that is accommodated in a probe handle 102 such that at least the front tip of the probe tip 101 protrudes from the probe handle 102. The measurement probe 100 further comprises an electrical interface 103 and a switch 104. The probe tip 101 is coupled to a first load input 106 of the switch 104. The electrical interface 103 is coupled to a second load input 107 of the switch 104.

[0056] The electrical interface 103 serves for coupling the measurement probe 100 to a measurement device like e.g., an oscilloscope or any other measurement device.

[0057] The probe tip 101 serves for electrically contacting a device under test (not shown), DUT, and picking up signals that are to be measured in the DUT. The signals that are picked-up by the probe tip 101 are provided to the switch 104.

[0058] In a closed state of the switch 104, the signals are forwarded to the electrical interface 103 and from there to the measurement device. However, in an open state of the switch, the signal path is interrupted in the switch, and the signals are not forwarded.

[0059] In the open state of the switch 104, the signal path ends in the switch 104. Therefore, the signal path only provides little of the unwanted ohmic and capacitive load. The switch 104 may be positioned as near as possible to the probe tip 101 in the probe handle 102. This reduces the length of the signal path in the open state of the switch 104, and therefore, also reduces the unwanted ohmic and capacitive load in the DUT.

[0060] The electrical interface 103 may comprise a connector for coupling the measurement probe 100 electrically and mechanically to a measurement device via a cable. Such a connector may comprise contacts for transmitting the signal that is measured in the DUT. In addition, such a connector may comprise additional contacts for transmitting further signals from the measurement probe 100 to the measurement device or from the measurement device to the measurement probe 100.

[0061] Although not explicitly shown, it is understood, that the probe handle 102 may comprise any adequate exterior shape or form that allows holding the probe handle 102.

[0062] The switch 104 comprises a control input 105 that serves for controlling the switch with an external source. This external source may control the switch 104 independently of the state of the probe tip 101, and especially the contacting state between the probe tip 101 and the DUT.

[0063] FIG. 2 shows a block diagram of a measurement probe 200. The measurement probe 200 is based on measurement probe 100. Therefore, the measurement probe 200 comprises a probe tip 201 that is accommodated in a probe handle 202 such that at least the front tip of the probe tip 201 protrudes from the probe handle 202. The measurement probe 200 further comprises an electrical interface 203 and a switch 204. The probe tip 201 is coupled to a first load input of the switch 204. The electrical interface 203 is coupled to a second load input of the switch 204.

[0064] The switch 204 is provided as a mechanical switch, and the control input 205 of the switch 204 is a mechanical input. The measurement probe 200 further comprises a mechanical button or knob 210 on the probe handle 202 that is mechanically coupled to the switch 204.

[0065] When a user pushes the button or knob 210, the switch 204 is closed and a signal path between the probe tip 201 and the electrical interface 203 is established e.g., for performing a measurement. The button or knob 210 may be of a type that holds its state like for example a slide switch. As alternative, the button or knob 210 may be of a type that returns to the original state when the user releases the button or knob 210.

[0066] FIG. 3 shows a block diagram of a measurement probe 300. The measurement probe 300 is based on the measurement probe 200. Therefore, the measurement probe 300 comprises a probe tip 301 that is accommodated in a probe handle 302 such that at least the front tip of the probe tip 301 protrudes from the probe handle 302. The measurement probe 300 further comprises an electrical interface 303 and a switch 304. The probe tip 301 is coupled to a first load input of the switch 304. The electrical interface 303 is coupled to a second load input of the switch 304. The measurement probe 300 also comprises a button or knob 310.

[0067] The button or knob 310 of the measurement probe 300 is coupled to a controller 315 that is provided in the measurement probe 300. The controller 315 is further coupled to the control input 305 of the switch 304.

[0068] In the measurement probe 300 the switch 304 is provided as an electronic switching element that may be electronically controlled like e.g., a relay or a semiconductor switch.

[0069] The controller 315 may be a simple circuit that generates the required type of control signal 316 from the signal provided by the switch 304. Such a circuit may comprise passive components like resistors. The controller may also comprise an active logic device, like a configurable logic device or programmable logic device. Such devices may comprise but are not limited to CPLDs, FPGAs, microcontrollers, microprocessors, and processors.

[0070] An active logic device may for example provide additional functionality like error monitoring, signaling, and communication with the measurement device.

[0071] The controller 315 may for example perform a debouncing of the button or knob 310, if the button or knob 310 is a pushbutton-type input.

[0072] The error monitoring may comprise verifying the correct functionality of the button or knob 310. If the button or knob 310 is of the type that returns to an open state after being released, the controller 315 may verify if the button or knob 310 ever returns to the open state or not. If the button or knob 310 does not return to the open state, the button or knob 310 may be blocked or defective. The controller 315 may signal this for example with an optical signal like a red flashing LED or may provide a respective signal to the measurement device via the electrical interface 303.

[0073] The controller 315 may also verify the correct functionality of the switch 304 and verify that the switch 304 opens or closes as indicated by the control signal 316. To this end, the control signal 316 may comprise a further connection to the signal path between the probe tip 301, the switch 304, and the electrical interface 303.

[0074] FIG. 4 shows a block diagram of a measurement probe 400. The measurement probe 400 is based on the measurement probe 300. Therefore, the measurement probe 400 comprises a probe tip 401 that is accommodated in a probe handle 402 such that at least the front tip of the probe tip 401 protrudes from the probe handle 402. The measurement probe 400 further comprises an electrical interface 403 and a switch 404. The probe tip 401 is coupled to a first load input of the switch 404. The electrical interface 403 is coupled to a second load input of the switch 404. The measurement probe 400 also comprises a button or knob 410.

[0075] The button or knob 410 of the measurement probe 400 is coupled to a controller 415 that is provided in the measurement probe 400. The controller 415 is further coupled to the control input of the switch 404. The above-presented explanations regarding the controller 315 apply to the controller 415 mutatis mutandis.

[0076] The controller 415 comprises a switching logic 420 that generates the control signal 416. The switching logic 420 is coupled to the button or knob 410, to the probe tip 401, and to the electrical interface 403. It is understood, that the switching logic 420 may in other embodiments be coupled only to one or two of the button or knob 410, the probe tip 401, and the electrical interface 403.

[0077] The switching logic 420 may receive a signal from the button or knob 410 and generate a control signal 416 accordingly.

[0078] The switching logic 420 may also receive a signal from the measurement device via the switching input 421 and the electrical interface 403, and generate a respective control signal 416. Such a switching input 421 may comprise a discrete digital signal or may be based on any adequate protocol e.g., the SCPI protocol.

[0079] The switching logic 420 may also perform a measurement of signals at the probe tip 401, and generate a control signal 416 to close the switch 404 if signals are present at the probe tip 401.

[0080] Of course, the switching logic 420 may perform logical operations on the single input signals and for example only output a control signal 416 to close the switching logic 420 if multiple of the input signals comprise the respective values.

[0081] The switching logic 420 may for example only generate a control signal 416 to close the switch 404 if a general clearance is received from the measurement device, or if the button or knob 410 is actuated by a user and at the same time a signal is present at the probe tip 401, or if the button or knob 410 is actuated and the measurement device requests a measurement.

[0082] For sake of clarity in the following description of the method-based FIG. 5 the reference signs used above in the description of apparatus-based FIGS. 1-4 will be maintained.

[0083] FIG. 5 shows a flow diagram of a method for measuring with a measurement probe 100, 200, 300, 400.

[0084] The method comprises providing a probe tip 101, 201, 301, 401 for contacting a device under test at least in part in a probe handle 102, 202, 302, 402, electrically coupling the measurement probe 100, 200, 300, 400 to a measurement device, and controlling a switch 104, 204, 304, 404 that is electrically coupled between the probe tip 101, 201, 301, 401 and an electrical interface 103, 203, 303, 403 of the measurement probe 100, 200, 300, 400. In a closed state the switch 104, 204, 304, 404 electrically closes the connection between the probe tip 101, 201, 301, 401 and the electrical interface 103, 203, 303, 403, and in an open state electrically interrupts the connection between the probe tip 101, 201, 301, 401 and the electrical interface 103, 203, 303, 403.

[0085] The switch 104, 204, 304, 404 may for example be mechanically controlled.

[0086] As alternative, the switch 104, 204, 304, 404 may be electrically controlled. Such a switch 104, 204, 304, 404 may comprise a semiconductor switching element. The electrical interface 103, 203, 303, 403 may comprise a switching input that is electrically coupled to the control input 105, 205, 305 of the switch 104, 204, 304, 404 and may receive control signals 416 for the switch 104, 204, 304, 404.

[0087] The method may further comprise outputting a control signal 416 to the control input 105, 205, 305 of the switch 104, 204, 304, 404 from a controller. The control signal 416 may be provided from a switching logic in the controller.

[0088] The switching logic may be electrically coupled to the probe tip 101, 201, 301, 401 and may control the switch 104, 204, 304, 404 based on a signal measured at the probe tip 101, 201, 301, 401.

[0089] The controller may be coupled with the electrical interface 103, 203, 303, 403 and may receive control signals 416 via the electrical interface 103, 203, 303, 403. The switching logic may control the switch 104, 204, 304, 404 based on the control signal 416.

[0090] Although specific embodiments have been illustrated and described herein, it will be appreciated by those of ordinary skill in the art that a variety of alternate and/or equivalent implementations exist. It should be appreciated that the exemplary embodiment or exemplary embodiments are only examples, and are not intended to limit the scope, applicability, or configuration in any way. Rather, the foregoing summary and detailed description will provide those skilled in the art with a convenient road map for implementing at least one exemplary embodiment, it being understood that various changes may be made in the function and arrangement of elements described in an exemplary embodiment without departing from the scope as set forth in the appended claims and their legal equivalents. Generally, this application is intended to cover any adaptations or variations of the specific embodiments discussed herein.

TABLE-US-00001 LIST OF REFERNCE SIGNS 100, 200, 300, 400 measurement probe 101, 201, 301, 401 probe tip 102, 202, 302, 402 probe handle 103, 203, 303, 403 electrical interface 104,204,304,404 switch 105, 205, 305 control input 106 first load input 107 second load input 108, 208, 308, 408 measured signal 210,310,410 knob 315,415 controller 316, 416 control signal 420 switching logic 421 switching input

[0091] While exemplary embodiments are described above, it is not intended that these embodiments describe all possible forms of the invention. Rather, the words used in the specification are words of description rather than limitation, and it is understood that various changes may be made without departing from the spirit and scope of the invention. Additionally, the features of various implementing embodiments may be combined to form further embodiments of the invention.