Dynamic resolution correction of quadrupole mass analyser
09805920 ยท 2017-10-31
Assignee
Inventors
Cpc classification
H01J49/0031
ELECTRICITY
International classification
Abstract
A method of mass spectrometry is disclosed comprising automatically correcting the mass or mass to charge ratio resolution of a quadrupole mass filter or mass analyser one or more times during an experimental run or acquisition based upon a measurement, determination or estimation of the mass or mass to charge ratio resolution of one or more reference ions observed in a mass spectrum or mass spectral data acquired either during the same experimental run or acquisition or during a previous experimental run or acquisition.
Claims
1. A method of correcting mass or mass to charge ratio resolution drift of a quadrupole mass filter or mass analyser, said method comprising: automatically measuring a parameter during an experimental acquisition; and automatically correcting the mass or mass to charge ratio resolution of said quadrupole mass filter or mass analyser one or more times during said experimental acquisition in response to said measured parameter; wherein said parameter comprises an environmental parameter, temperature, humidity, ion current and/or space charge.
2. A method as claimed in claim 1, wherein said parameter comprises temperature and/or humidity.
3. A method as claimed in claim 1, wherein said parameter comprises a signal output from an electronic control unit.
4. A method as claimed in claim 1, wherein said step of automatically correcting the mass or mass to charge ratio resolution of said quadrupole mass filter or mass analyser comprises automatically altering a resolving DC offset voltage and/or a gain of said quadrupole mass filter or mass analyser.
5. A method as claimed in claim 1, wherein said step of automatically correcting the mass or mass to charge ratio resolution of said quadrupole mass filter or mass analyser comprises automatically altering the energy of ions passing to said quadrupole mass filter or mass analyser.
6. A method as claimed in claim 1, wherein said step of automatically correcting the mass or mass to charge ratio resolution of said quadrupole mass filter or mass analyser comprises automatically altering one or more voltages applied to a pre-filter arranged upstream of said quadrupole mass filter or mass analyser.
7. A method as claimed in claim 1, wherein said step of automatically correcting the mass or mass to charge ratio resolution of said quadrupole mass filter or mass analyser comprises automatically altering one or more voltages applied to a post-filter arranged downstream of said quadrupole mass filter or mass analyser.
8. A method as claimed in claim 1, further comprising acquiring mass spectral data during said experimental acquisition and correcting the mass position, mass accuracy or recalibrating or realigning the mass or mass to charge ratio of said mass spectral data.
9. A method as claimed in claim 8, wherein said step of correcting the mass position, mass accuracy or recalibrating or realigning the mass or mass to charge ratio of said mass spectral data is performed dynamically during said experimental acquisition and comprises automatically varying one or more voltages applied to said quadrupole mass filter or mass analyser.
10. A method as claimed in claim 8, wherein said step of correcting the mass position, mass accuracy or recalibrating or realigning the mass or mass to charge ratio of mass spectral data is performed as an automatic post-processing step.
11. A method as claimed in claim 8, further comprising acquiring further mass spectral data to confirm that the step of correcting the mass position, mass accuracy or recalibrating or realigning the mass or mass to charge ratio of mass spectral data was successful.
12. A method as claimed in claim 1, further comprising acquiring mass spectral data to confirm that the step of automatically correcting the mass or mass to charge ratio resolution of said quadrupole mass filter or mass analyser was successful.
13. A mass spectrometer comprising: a quadrupole mass filter or mass analyser; and a control system arranged and adapted: (i) to measure a parameter during an experimental acquisition; and (ii) to correct the mass or mass to charge ratio resolution of said quadrupole mass filter or mass analyser one or more times during said experimental acquisition in response to said measured parameter; wherein said parameter comprises an environmental parameter, temperature, humidity, ion current and/or space charge.
14. A mass spectrometer as claimed in claim 13, wherein said parameter comprises temperature and/or humidity.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
(1) Various embodiments of the present invention will now be described, by way of example only, and with reference to the accompanying drawings in which:
(2)
(3)
(4)
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS
(5)
(6)
(7) The three overlapping stability diagrams for the three different mass peaks which are shown in
(8) It will be apparent that scan line (a) intersects the three regions representing stable trajectory so that there is only a small region above the scan line (a). Scan line (a) illustrates a mode of operation wherein the quadrupole mass filter/analyser is being operated in a narrow bandpass mode of operation. As a result, the resulting mass resolution as illustrated by the sharp peak shapes in
(9) Scan line (b) has a lower gradient that scan line (a) and intersects the three regions so that there is a larger region above the scan line (b) compared with the situation with scan line (a). Scan line (b) illustrates a mode of operation wherein the quadrupole mass filter/analyser is being operated in a wider bandpass mode of operation compared with scan line (a). The resulting mass resolution as illustrated by the wider peak shapes in
(10) Scan line (c) has a lower gradient that scan line (b) and intersects the three regions so that there is a larger region above the scan line (c) compared with the situation with scan line (b). Scan line (c) illustrates a mode of operation wherein the quadrupole mass filter/analyser is being operated in a wider bandpass mode of operation compared with scan line (b). The resulting mass resolution as illustrated by the wider peak shapes in
(11) It will be understood that the scan lines (a), (b) and (c) shown in
(12) According to a preferred embodiment of the present invention lock mass, reference or calibration ions are periodically sampled and mass analysed by a quadrupole rod set mass analyser. A control system is arranged to analyse (e.g. by peak shape matching or profiling) the resolution of the mass or ion peaks observed in a mass spectrum or more generally in mass spectral data. The control system then determines the effective (instantaneous) resolution of the quadrupole mass filter or mass analyser. The control system then preferably alters one or more parameters of the quadrupole mass filter or mass analyser in order to maximise the resolution of the quadrupole mass filter or mass analyser. According to an embodiment the quadrupole mass filter or mass analyser is arranged to alter the ratio of the DC voltage to the RF voltage applied to the quadrupole mass filter/analyser. Varying the ratio of the DC voltage to the RF voltage applied to the quadrupole mass filter/analyser can have the effect of either altering the intercept of the scan lines shown in
(13) The preferred embodiment is therefore particularly advantageous in that the control system of a mass spectrometer preferably repeatedly monitors the resolution of a quadrupole mass filter/analyser during an experimental acquisition and preferably automatically and dynamically ensures that the resolution of the quadrupole mass filter/analyser is maintained as high as possible and is effectively prevented from drifting during an acquisition or between acquisitions.
(14) An embodiment of the present invention will now be described with reference to the flow chart shown in
(15) A further embodiment of the present invention will now be described with reference to
(16) Although the present invention has been described with reference to the preferred embodiments, it will be understood by those skilled in the art that various changes in form and detail may be made without departing from the scope of the invention as set forth in the accompanying claims.