Gap waveguide structures for THz applications
09806393 · 2017-10-31
Assignee
Inventors
Cpc classification
Y10T29/49016
GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
H01P1/2005
ELECTRICITY
International classification
Abstract
A microwave/millimeter device having a narrow gap between two parallel surfaces of conducting material by using a texture or multilayer structure on one of the surfaces is disclosed. The fields are mainly present inside the gap, and not in the texture or layer structure itself, so the losses are small. The microwave/millimeter wave device further includes one or more conducting elements, such as a metallized ridge or a groove in one of the two surfaces, or a metal strip located in a multilayer structure between the two surfaces. The waves propagate along the conducting elements. At least one of the surfaces is provided with means to prohibit the waves from propagating in other directions between them than along the ridge, groove or strip. At very high frequency, the gap waveguides and gap lines may be realized inside an IC package or inside the chip itself.
Claims
1. A scalable production method for fabrication of a microwave/millimeter wave device, said microwave/millimeter wave device operating at frequencies in the entire range of or one or more subranges of the frequency range between 1 GHz and 100 THz, and comprising the step of providing a metamaterial on a surface of said microwave/millimeter wave device, wherein the step of providing said metamaterial on said surface of the microwave/millimeter wave device involves the use of at least one polymer to fabricate a high-resolution structure, and subsequent metallization of the high-resolution structure.
2. The method of claim 1, wherein the microwave/millimeter wave device comprises two opposing surfaces of conducting material arranged to form a narrow gap there between, wherein at least one of the surfaces is provided with at least one conducting element, and wherein at least one of the surfaces is provided with said metamaterial, thereby stopping wave propagation in other directions inside the gap than along said conducting element.
3. A microwave/millimeter wave device, said microwave/millimeter wave device operating at frequencies in the entire range of or one or more subranges of the frequency range between 1 GHz and 100 THz, wherein the microwave/millimeter wave device comprises a metamaterial arranged on at least one surface thereof, said metamaterial being based on mushroom-shaped or inverted-pyramid-shaped pillars, wherein the metamaterial acts as a perfect magnetic conductor in the operating frequency range.
4. The method of claim 1, wherein the at least one polymer comprises a patterned photosensitive high-aspect ratio polymer.
5. The method of claim 1, wherein at least one of said at least one polymers is formed by at least one of: a micromolding process or hot embossing.
6. The method of claim 1, wherein the metallization is applied by at least one of sputtering, evaporation and chemical vapor deposition.
7. The method of claim 6, wherein the metallization is subsequently improved by at least one of electroplating and electroless plating.
8. The method of claim 1, wherein one fabricated part of the microwave/millimeter wave device is a lid.
9. The method of claim 1, wherein the metamaterial is formed on a flange on said microwave/millimeter wave device.
10. The method of claim 1, wherein the microwave/millimeter wave device is at least one of: a waveguide, a transmission line, a waveguide circuit, a transmission line circuit, a resonator/filter, a flange, a splitter, a shielding and a packaging.
11. The method of claim 2, wherein the at least one conducting element is selected from the group consisting of: a conducting ridge provided on the surface, a groove with conducting walls provided on the surface, and a conducting strip arranged within a multilayer structure of the surface.
12. A scalable production method for fabrication of a microwave/millimeter wave device, said microwave/millimeter wave device operating at frequencies in the entire range of or one or more subranges of the frequency range between 1 GHz and 100 THz, and comprising the step of providing a metamaterial on a surface of said microwave/millimeter wave device, wherein the step of providing said metamaterial on said surface of the microwave/millimeter wave device involves a Lithographie, Galvanoformung, Abformung (Lithography, Electroplating and Molding, LIGA) process.
13. A scalable production method for fabrication of a microwave/millimeter wave device, said microwave/millimeter wave device operating at frequencies in the entire range of or one or more subranges of the frequency range between 1 GHz and 100 THz, and comprising the step of providing a metamaterial on a surface of said microwave/millimeter wave device, wherein at least one part of said microwave/millimeter wave device is fabricated using freeforming or 3D forming in metals or other conducting material or metalized non-metals.
14. The method of claim 13, wherein the fabrication using freeforming or 3D forming in metals or other conducting material or metalized non-metals is applied by at least one of sputtering, evaporation and chemical vapor deposition.
15. The method of claim 14, wherein the fabrication using freeforming or 3D forming in metals or other conducting material or metalized non-metals is improved by electroplating or electroless plating.
16. The device of claim 3, wherein the at least one conducting element is selected from the group consisting of: a conducting ridge provided on the surface, a groove with conducting walls provided on the surface, and a conducting strip arranged within a multilayer structure of the surface.
17. The device of claim 3, wherein the microwave/millimeter wave device comprises two opposing surfaces of conducting material arranged to form a narrow gap there between, wherein at least one of the surfaces is provided with at least one conducting element, and wherein at least one of the surfaces is provided with said metamaterial, thereby stopping wave propagation in other directions inside the gap than along said conducting element.
18. The device of claim 3, wherein the metamaterial is provided on a flange of said microwave/millimeter wave device.
19. The device of claim 3, wherein the microwave/millimeter wave device is at least one of: a waveguide, a transmission line, a waveguide circuit, a transmission line circuit, a resonator/filter, a flange, a splitter, a shielding and a packaging.
20. The device of claim 3, wherein said device is produced in accordance with a scalable production method for fabrication of a microwave/millimeter wave device, comprising the step of providing the metamaterial on a surface of said microwave/millimeter wave device.
21. The method of claim 1, wherein said microwave/millimeter wave device operates in a the frequency range above 100 GHz.
Description
DRAWINGS
(1) The invention will now be discussed in more detail by means of embodiments, and with reference to the enclosed drawings, on which:
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DETAILED DESCRIPTION OF THE FIGURES
(10) In the following, the present invention will be discussed in relation to these types of embodiments, and it is to be appreciated by someone skilled in the art that specific advantageous features and advantages discussed in relation to any of these embodiments are also applicable to the other embodiments.
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(15) As experimental confirmation, an exemplary micromachined ridge gap waveguide and resonator for 220-325 GHz will now be discussed in more detail. As discussed in the foregoing, a ridge gap waveguide is a fundamentally new high-frequency waveguide, which does not need any electrical contact between the split blocks, and which gives it an advantage compared to the rectangular waveguide, which is the standard today. Rectangular waveguides are often fabricated by milling. However, there are issues when constructing waveguides above 100 GHz. As has already been discussed, it has now been discovered that MEMS technology can offer high-precision fabrication and thus enables the path for new types of high-frequency components.
(16) MEMS here related to “Microelectromechanical systems” (also written as micro-electro-mechanical, MicroElectroMechanical or microelectronic and microelectromechanical systems) is the technology of very small devices; it merges at the nano-scale into nanoelectromechanical systems (NEMS) and nanotechnology. MEMS are also referred to as micromachines, or micro systems technology—MST. MEMS are typically made up of components between 1 to 100 micrometers in size (i.e. 0.001 to 0.1 mm), and MEMS devices generally range in size from 20 micrometers (20 millionths of a meter) to several millimeters (i.e. 0.02 to 10 mm).
(17) In the example to be discussed in the following, a ridge gap waveguide and a ridge gap resonator have been fabricated for the frequencies 220-325 GHz using MEMS technology. Support packages have been designed to enable device measurements.
(18) Two devices were fabricated forming a bent-line waveguide and a resonator, as shown in
(19) The wave is prohibited from propagating away from the ridge by the pin surface. Packages were milled to support the silicon chip during measurements. The packages act as an interface and transition from the ridge gap waveguides to standard rectangular waveguides.
(20) Simulations show that the reflection coefficient for the ridge gap waveguide is below −15 dB between 240 and 340 GHz. Two resonance peaks were measured, as is seen in
(21) In another example, a contactless pin-flange adapter based on gap waveguide technology is considered for high-frequency measurements, as shown in
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(23) The invention is not limited to the embodiments shown here. In particular, the microwave/millimeter wave device is useable for many types of high-frequency devices, in addition to the ones discussed above. Further, different realizations of the metamaterial, such as posts, pillars, patches, nails, etc, and having different geometry, shapes etc, are feasible. Further, the metamaterial may be arranged on either one of the two surfaces, or even on both surfaces. Further, the two surfaces may be connected in various ways, and the cavity need not be closed, but may be open at one or several sides. Further, the conducting surfaces need not be mechanically fastened to each other, and also, many alternative options for mechanical interconnection, apart from the examples discussed above, are feasible. Still further, other types of MEMS and micromachining are useable to obtain similar results to the ones discussed above. Such and other related modifications should be considered to be within the scope of the patent, as it is defined in the appended claims.