System and method for forming a thin-film phosphor layer for phosphor-converted light emitting devices
09797041 · 2017-10-24
Assignee
Inventors
Cpc classification
C23C16/52
CHEMISTRY; METALLURGY
Y10T428/3154
GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
H10K71/125
ELECTRICITY
Y10T428/31544
GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
H01J1/64
ELECTRICITY
C09K11/025
CHEMISTRY; METALLURGY
Y10T428/31855
GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
International classification
C23C16/52
CHEMISTRY; METALLURGY
C23C16/455
CHEMISTRY; METALLURGY
C09K11/02
CHEMISTRY; METALLURGY
C23C16/458
CHEMISTRY; METALLURGY
H05B33/14
ELECTRICITY
H01J1/64
ELECTRICITY
Abstract
A thin-film phosphor layer can be formed by an improved deposition method involving: (1) forming a phosphor powder layer that is substantially uniformly-deposited on a substrate surface; and (2) forming a polymer binder layer to fill gaps among loosely packed phosphor particles, thereby forming a substantially continuous layer of thin film.
Claims
1. A system to form a thin-film phosphor layer on a substrate, the system comprising: a deposition subsystem defining an enclosure to accommodate the substrate; a phosphor powder delivery subsystem configured to deliver, using a carrier gas, a phosphor powder from a source of the phosphor powder to the deposition subsystem; a polymer precursor delivery subsystem configured to deliver polymer precursors in a vapor phase to the deposition subsystem; and a control subsystem connected to the deposition subsystem, the phosphor powder delivery subsystem, and the polymer precursor delivery subsystem, wherein the control subsystem is configured to control the phosphor powder delivery subsystem to deliver the phosphor powder to the deposition subsystem for a first time interval to form a phosphor powder layer adjacent to the substrate, and the control subsystem is configured to control the polymer precursor delivery subsystem to deliver the polymer precursors to the deposition subsystem for a second time interval to form a polymer layer adjacent to the phosphor powder layer.
2. The system of claim 1, wherein the deposition subsystem includes a chamber defining the enclosure, a substrate holder configured to support the substrate within the chamber, and a showerhead mechanism configured to deposit the phosphor powder over the substrate.
3. The system of claim 2, wherein the substrate holder is configured to rotate the substrate.
4. The system of claim 2, wherein the deposition subsystem further includes an ionizer.
5. The system of claim 1, wherein the phosphor powder delivery subsystem includes an ionizer.
6. The system of claim 1, wherein the polymer precursor delivery subsystem includes a gas reactor configured to generate reactive intermediates in a vapor phase from the polymer precursors.
7. The system of claim 6, wherein the gas reactor is configured to generate free radicals from the polymer precursors, and the polymer precursors have the formula: (CZZ′Y).sub.m—Ar—(CZ″Z′″Y′).sub.n, wherein Ar is selected from (1) an un-substituted phenylene group, (2) a chlorine-substituted phenylene group of the formula: C.sub.6H.sub.4-xCl.sub.x, with x being an integer in the range of 1 to 4, and (3) a fluorine-substituted phenylene group of the formula: C.sub.6H.sub.4-x′F.sub.x′, with x′ being an integer in the range of 1 to 4, Z, Z′, Z″, and Z′″ are independently selected from H, F, alkyl groups, and aryl groups, Y and Y′ being removable to generate the free radicals, m and n are each equal to zero or a positive integer, and a sum of m and n is less than or equal to a total number of sp.sup.2-hybridized carbons on Ar available for substitution.
8. The system of claim 6, wherein the gas reactor is configured to generate free radicals from the polymer precursors, and the polymer precursors include dimers having the formula: {(CZZ′)—Ar—(CZ″Z′″)}.sub.2, wherein Ar is selected from (1) an un-substituted phenylene group, (2) a chlorine-substituted phenylene group of the formula: C.sub.6H.sub.4-xCl.sub.x, with x being an integer in the range of 1 to 4, and (3) a fluorine-substituted phenylene group of the formula: C.sub.6H.sub.4-x′F.sub.x′, with x′ being an integer in the range of 1 to 4, and Z, Z′, Z″, and Z′″ are independently selected from H, F, alkyl groups, and aryl groups.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
(1) For a better understanding of the nature and objects of some embodiments of the invention, reference should be made to the following detailed description taken in conjunction with the accompanying drawings.
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DETAILED DESCRIPTION
Definitions
(12) The following definitions apply to some of the aspects described with respect to some embodiments of the invention. These definitions may likewise be expanded upon herein.
(13) As used herein, the singular terms “a,” “an,” and “the” include plural referents unless the context clearly dictates otherwise. Thus, for example, reference to a layer can include multiple layers unless the context clearly dictates otherwise.
(14) As used herein, the term “set” refers to a collection of one or more components. Thus, for example, a set of layers can include a single layer or multiple layers. Components of a set also can be referred to as members of the set. Components of a set can be the same or different. In some instances, components of a set can share one or more common characteristics.
(15) As used herein, the term “adjacent” refers to being near or adjoining. Adjacent components can be spaced apart from one another or can be in actual or direct contact with one another. In some instances, adjacent components can be connected to one another or can be formed integrally with one another.
(16) As used herein, the terms “connect,” “connected,” and “connection” refer to an operational coupling or linking. Connected components can be directly coupled to one another or can be indirectly coupled to one another, such as via another set of components.
(17) As used herein, the terms “substantially” and “substantial” refer to a considerable degree or extent. When used in conjunction with an event or circumstance, the terms can refer to instances in which the event or circumstance occurs precisely as well as instances in which the event or circumstance occurs to a close approximation, such as accounting for typical tolerance levels of the manufacturing operations described herein.
(18) As used herein, the terms “electrically conductive” and “electrical conductivity” refer to an ability to transport an electric current, while the terms “electrically nonconductive” and “electrical nonconductivity” refer to a lack of ability to transport an electric current. Electrically conductive materials typically correspond to those materials that exhibit little or no opposition to flow of an electric current, while electrically nonconductive materials typically correspond to those materials within which an electric current has little or no tendency to flow. One measure of electrical conductivity (or electrical nonconductivity) is in terms of Siemens per meter (“S.Math.m.sup.−1”). Typically, an electrically conductive material is one having a conductivity greater than about 10.sup.4 S.Math.m.sup.−1, such as at least about 10.sup.5 S.Math.m.sup.−1 or at least about 10.sup.6 S.Math.m.sup.−1, while an electrically nonconductive material is one having a conductivity less than about 10.sup.4 such as less than or equal to about 10.sup.3 S.Math.m.sup.−1 or less than or equal to about 10.sup.2 S−m.sup.−1. Electrical conductivity (or electrical nonconductivity) of a material can sometimes vary with temperature. Unless otherwise specified, electrical conductivity (or electrical nonconductivity) of a material is defined at room temperature.
(19) As used herein with respect to photoluminescence, the term “quantum efficiency” refers to a ratio of the number of output photons to the number of input photons.
(20) As used herein, the term “size” refers to a characteristic dimension. In the case of a particle that is spherical, a size of the particle can refer to a diameter of the particle. In the case of a particle that is non-spherical, a size of the particle can refer to an average of various orthogonal dimensions of the particle. Thus, for example, a size of a particle that is a spheroidal can refer to an average of a major axis and a minor axis of the particle. When referring to a set of particles as having a particular size, it is contemplated that the particles can have a distribution of sizes around that size. Thus, as used herein, a size of a set of particles can refer to a typical size of a distribution of sizes, such as an average size, a median size, or a peak size.
(21) As used herein, the term “alkane” refers to a saturated hydrocarbon molecule. For certain applications, an alkane can include from 1 to 100 carbon atoms. The term “lower alkane” refers to an alkane that includes from 1 to 20 carbon atoms, such as, for example, from 1 to 10 carbon atoms, while the term “upper alkane” refers to an alkane that includes more than 20 carbon atoms, such as, for example, from 21 to 100 carbon atoms. The term “branched alkane” refers to an alkane that includes one or more branches, while the term “unbranched alkane” refers to an alkane that is straight-chained. The term “cycloalkane” refers to an alkane that includes one or more ring structures. The term “heteroalkane” refers to an alkane that has one or more of its carbon atoms replaced by one or more heteroatoms, such as, for example, N, Si, S, O, and P. The term “substituted alkane” refers to an alkane that has one or more of its hydrogen atoms replaced by one or more substituent groups, such as, for example, halo groups, hydroxy groups, alkoxy groups, carboxy groups, thio groups, alkylthio groups, cyano groups, nitro groups, amino groups, alkylamino groups, dialkylamino groups, silyl groups, and siloxy groups, while the term “un-substituted alkane” refers to an alkane that lacks such substituent groups. Combinations of the above terms can be used to refer to an alkane having a combination of characteristics. For example, the term “branched lower alkane” can be used to refer to an alkane that includes from 1 to 20 carbon atoms and one or more branches. Examples of alkanes include methane, ethane, propane, cyclopropane, butane, 2-methylpropane, cyclobutane, and charged, hetero, or substituted forms thereof.
(22) As used herein, the term “alkyl group” refers to a monovalent form of an alkane. For example, an alkyl group can be envisioned as an alkane with one of its hydrogen atoms removed to allow bonding to another group of a molecule. The term “lower alkyl group” refers to a monovalent form of a lower alkane, while the term “upper alkyl group” refers to a monovalent form of an upper alkane. The term “branched alkyl group” refers to a monovalent form of a branched alkane, while the term “unbranched alkyl group” refers to a monovalent form of an unbranched alkane. The term “cycloalkyl group” refers to a monovalent form of a cycloalkane, and the term “heteroalkyl group” refers to a monovalent form of a heteroalkane. The term “substituted alkyl group” refers to a monovalent form of a substituted alkane, while the term “un-substituted alkyl group” refers to a monovalent form of an unsubstituted alkane. Examples of alkyl groups include methyl, ethyl, n-propyl, isopropyl, cyclopropyl, butyl, isobutyl, t-butyl, cyclobutyl, and charged, hetero, or substituted forms thereof.
(23) As used herein, the term “arene” refers to an aromatic hydrocarbon molecule. For certain applications, an arene can include from 5 to 100 carbon atoms. The term “lower arene” refers to an arene that includes from 5 to 20 carbon atoms, such as, for example, from 5 to 14 carbon atoms, while the term “upper arene” refers to an arene that includes more than 20 carbon atoms, such as, for example, from 21 to 100 carbon atoms. The term “monocyclic arene” refers to an arene that includes a single aromatic ring structure, while the term “polycyclic arene” refers to an arene that includes more than one aromatic ring structure, such as, for example, two or more aromatic ring structures that are bonded via a carbon-carbon single bond or that are fused together. The term “heteroarene” refers to an arene that has one or more of its carbon atoms replaced by one or more heteroatoms, such as, for example, N, Si, S, O, and P. The term “substituted arene” refers to an arene that has one or more of its hydrogen atoms replaced by one or more substituent groups, such as, for example, alkyl groups, alkenyl groups, alkynyl groups, iminyl groups, halo groups, hydroxy groups, alkoxy groups, carboxy groups, thio groups, alkylthio groups, cyano groups, nitro groups, amino groups, alkylamino groups, dialkylamino groups, silyl groups, and siloxy groups, while the term “un-substituted arene” refers to an arene that lacks such substituent groups. Combinations of the above terms can be used to refer to an arene having a combination of characteristics. For example, the term “monocyclic lower alkene” can be used to refer to an arene that includes from 5 to 20 carbon atoms and a single aromatic ring structure. Examples of arenes include benzene, biphenyl, naphthalene, pyridine, pyridazine, pyrimidine, pyrazine, quinoline, isoquinoline, and charged, hetero, or substituted forms thereof.
(24) As used herein, the term “aryl group” refers to a monovalent form of an arene. For example, an aryl group can be envisioned as an arene with one of its hydrogen atoms removed to allow bonding to another roup of a molecule. The term “lower aryl group” refers to a monovalent form of a lower arene, while the term “upper aryl group” refers to a monovalent form of an upper arene. The term “monocyclic aryl group” refers to a monovalent form of a monocyclic arene, while the term “polycyclic aryl group” refers to a monovalent form of a polycyclic arene. The term “heteroaryl group” refers to a monovalent form of a heteroarene. The term “substituted aryl group” refers to a monovalent form of a substituted arene, while the term “un-substituted arene group” refers to a monovalent form of an unsubstituted arene. Examples of aryl groups include phenyl, biphenylyl, naphthyl, pyridinyl, pyridazinyl, pyrimidinyl, pyrazinyl, quinolyl, isoquinolyl, and charged, hetero, or substituted forms thereof.
(25) As used herein, the term “arylene group” refers to a bivalent form of an arene. For example, an arylene group can be envisioned as an arene with two of its hydrogen atoms removed to allow bonding to one or more additional groups of a molecule. The term “lower arylene group” refers to a bivalent form of a lower arene, while the term “upper arylene group” refers to a bivalent form of an upper arene. The term “monocyclic arylene group” refers to a bivalent form of a monocyclic arene, while the term “polycyclic arylene group” refers to a bivalent form of a polycyclic arene. The term “heteroarylene group” refers to a bivalent form of a heteroarene. The term “substituted arylene group” refers to a bivalent form of a substituted arene, while the term “un-substituted arylene group” refers to a bivalent form of an unsubstituted arene. Examples of arylene groups include phenylene, biphenylylene, naphthylene, pyridinylene, pyridazinylene, pyrimidinylene, pyrazinylene, quinolylene, isoquinolylene, and charged, hetero, or substituted forms thereof.
Conformal Thin-Film Phosphor Deposition Process
(26) Certain embodiments of the invention relate to a thin-film conformal phosphor deposition process for phosphor-converted white LEDs. This process facilitates achieving the goal of increasing light scattering efficiency for white LEDs by providing a thin-film and remote phosphor layer configuration. According to the improved process as depicted in
(27) In accordance with the process of
(28) Typically, a phosphor used in accordance with
(29) Referring to operation 42 of
(30) In the case that the operation 422 of
(31) In the case that the operation 423 is implemented for an electrically conductive substrate, the substrate surface can be grounded to maintain an electric field potential for the deposition of the electrostatically charged phosphor powder. Electrostatic charges also can be created on the phosphor powder or an electrically nonconductive substrate surface by Tribo frictional charging. In particular, when two different materials are brought into contact, there can be a transfer of charge from one to the other to offset an imbalance of charges. The magnitude and direction of the charge transfer can depend on a number of factors, including a chemical and electronic structure of both materials. Table 1 sets forth certain materials ranging from those with the most positive charging effect to those with the most negative charging effect when brought into contact.
(32) TABLE-US-00001 TABLE 1 Materials ordered by Triboelectric Charging Effects Most Positive (+) Air Human Hands, Skin Asbestos Rabbit Fur +++ Glass Human Hair Mica Nylon Wool Lead Cat Fur + Silk Aluminum Paper Cotton Steel Wood Lucite Sealing Wax Amber Rubber Balloon Hard Rubber − Mylar Nickel Copper Silver UV Resist Brass Synthetic Rubber Gold, Platinum Sulfur Acetate, Rayon Polyester Celluloid Polystyrene Orlon, Acrylic Cellophane Tape Polyvinylidene chloride (Saran) Polyurethane −−− Polyethylene Polypropylene Polyvinylchloride (Vinyl) Kel-F (PCTFE) Silicon Teflon Silicone Rubber Most Negative (−)
(33) An opposite electrostatic charge can be created on an electrically nonconductive substrate surface with the Tribo frictional charging method. For example, negative charges can be created on the nonconductive substrate surface by one, or a combination, of the following: Tribo frictional charging is carried out using a Teflon powder blown through a nonconductive epoxy or silicone resin surface. The Teflon powder can carry electrons away from the epoxy or silicone resin surface to render the surface negatively charged. An epoxy surface is rubbed with a Nylon brush or cloth.
(34) The phosphor deposition process provides a number of advantages, including: It can be applied to both a near phosphor configuration and a remote phosphor configuration for phosphor-converted white LEDs. It can be implemented as a layer-by-layer phosphor deposition process, and can be readily used to form a multi-color phosphor thin-film stack. The deposition process can be a dry and clean process, without any solvents. Controlled quantities of phosphors can be used during deposition, thereby significantly reducing color variations and binning issues of white LEDs. It can achieve a substantially uniform coating of phosphors by introducing electrostatic charges among phosphor particles. It can achieve a high phosphor utilization yield during deposition.
Polymer Layer Deposition Process
(35) In accordance with the thin-film phosphor deposition process of
(36)
(37) Various parylene-based polymer films and other types of polymer films can be formed via a CVD technique of transport polymerization. Transport polymerization typically involves generating a vapor phase reactive intermediate from a precursor molecule at a location remote from a substrate surface, and then transporting the vapor phase reactive intermediate to the substrate surface. The substrate surface can be kept below a melting temperature of reactive intermediates for polymerization. For example, Parylene F can be formed from the precursor BrCF.sub.2—C.sub.6H.sub.4—CF.sub.2Br by the removal of the bromine atoms to form the reactive intermediate *CF.sub.2—C.sub.6H.sub.4—CF.sub.2*, wherein * denotes a free radical. This reactive intermediate can be formed at a location remote from a deposition chamber, and can be transported into the deposition chamber and condensed over the substrate surface, where polymerization takes place.
(38) More generally, parylene-based polymer films can be formed from a variety of precursors, such as those having the formula (CZZ′Y).sub.m—Ar—(CZ″Z′″Y′).sub.n, wherein Ar is an arylene group (e.g., un-substituted, partially substituted, or fully substituted arylene group, such as phenylene), Z, Z′, Z″, and Z′″ can be the same or different, Y and Y′ can be the same or different and are removable to generate free radicals, m and n are each equal to zero or a positive integer, and a sum of m and n is less than or equal to a total number of sp.sup.2-hybridized carbons on Ar available for substitution. In specific embodiments, Ar is C.sub.6H.sub.4-xX.sub.x, wherein X is a halogen such as Cl or F, x=0, 1, 2, 3, or 4, and Z, Z′, Z″, and Z′″ are independently selected from H, F, alkyl groups, and aryl groups (e.g., C.sub.6H.sub.5-xF.sub.x with x=0, 1, 2, 3, 4, or 5). Other suitable precursors include dimers having the formula {(CZZ′)—Ar—(CZ″Z′″)}.sub.2, wherein Ar is an arylene group (e.g., un-substituted, partially substituted, or fully substituted arylene group, such as phenylene), and Z, Z′, Z″, and Z′″ can be the same or different. In specific embodiments, Ar is C.sub.6H.sub.4-xX.sub.x, wherein X is a halogen such as Cl or F, x=0, 1, 2, 3, or 4, and Z, Z′, Z″, and Z′″ are independently selected from H, F, alkyl groups, and aryl groups (e.g., C.sub.6H.sub.5-xF.sub.x with x=0, 1, 2, 3, 4, or 5).
(39) One aspect of a parylene-based polymer film, or another type of polymer film, prepared by the CVD method is that it is a conformal coating with superior crevice penetration capability, thereby substantially filling gaps and voids within a phosphor powder layer. In some instances, Parylene F can achieve the best result for gap-filling, while Parylene N can achieve the second best result for gap-filling among the family of parylene-based polymers. Another aspect of a parylene-based polymer is that it has superior optical transparency in the visible light spectrum, rendering it a suitable filler material among a photoluminescent phosphor powder. Another aspect of a parylene-based polymer is that its refractive index can be adjusted based on chemical composition. In one embodiment, a multi-layer of parylene-based polymer films can be formed as a composite thin-film phosphor stack. This multi-layer structure can be formed by depositing a Parylene N film, with a refractive index of about 1.66, as a binder material among a phosphor powder, and then depositing a Parylene F film, with a refractive index of about 1.4, thereby enhancing light extraction due to index matching of the Parylene F film to ambient environment (e.g., air). It will be appreciated that, in general, this multi-layer structure can be formed by depositing a first polymer film, with a first refractive index, as a binder material among a first phosphor powder layer to form a first phosphor layer adjacent to the substrate surface, depositing a second polymer film, with a second refractive index, as a binder material among a second phosphor powder layer to form a second phosphor layer adjacent to the first phosphor layer, and so on, where the first refractive index is greater than or equal to the second refractive index.
(40) Using the CVD method, a parylene-based polymer, or another type of polymer, can be formed as a substantially continuous film having a thickness in the range of a few tens of angstroms to about 100 μm, such as from about 1 nm to about 100 μm, from about 10 nm to about 100 μm, from about 100 nm to about 100 μm, from about 1 μm to about 100 μm, from about 1 μm to about 75 μm, from about 1 μm to about 30 μm, or from about 1 μm to about 10 μm. In some instances, the thickness of the film can exhibit a standard deviation of less than about 20 percent with respect to an average thickness, such as less than about 10 percent or less than about 5 percent. A thickness of the initially deposited phosphor powder layer can be in the range of about 1 nm to about 60 μm, such as from about 10 nm to about 60 μm, from about 100 nm to about 40 μm, or from about 100 nm to about 20 μm. In some instances, the thickness of the phosphor powder layer can exhibit a standard deviation of less than about 20 percent with respect to an average thickness, such as less than about 10 percent or less than about 5 percent. A distribution of the phosphor powder within the resulting film can be substantially uniform across an extent of the film, such that a weight density (e.g., mass or weight of phosphor particles per unit volume) or a number density (e.g., number of phosphor particles per unit volume) can exhibit a standard deviation of less than about 20 percent with respect to an average density, such as less than about 10 percent or less than about 5 percent.
(41) An embodiment of a thin-film phosphor layer prepared by the CVD method is depicted in
(42) In accordance with a layer-by-layer deposition of phosphor powders, the CVD method can be used to form a substantially uniformly distributed multi-color phosphor stack. In an embodiment depicted in
(43) It will be appreciated that the phosphor powder deposition in operation 42 and the polymer deposition in operation 44 need not take place sequentially. Alternatively, these operations can take place substantially simultaneously to form a conformal phosphor thin-film layer.
Thin-Film Phosphor Deposition System
(44)
(45) The deposition subsystem 81 includes: (1) a deposition chamber 81a, which defines an enclosure within which a substrate is disposed and, for example, is a vacuum chamber with an associated vacuum pump to maintain vacuum conditions, is filled with an inert gas, or is an atmospheric chamber; (2) a substrate holder 81b within the chamber 81a and, for example, is capable of rotating the substrate during the formation of the phosphor film; (3) a showerhead mechanism 81c; and (4) a phosphor powder ionizer 81d, which introduces electrostatic charges among phosphor particles during phosphor powder deposition.
(46) The phosphor powder delivery subsystem 82 includes: (1) a phosphor powder canister 82a or other phosphor powder source; (2) a phosphor flow controller 82b, which regulates a specified quantity of phosphors for each deposition of phosphors; (3) an ionizer 82c, which introduces electrostatic charges among phosphor particles during phosphor powder deposition; and (4) a set of valves 82d.
(47) The parylene-based polymer precursor delivery subsystem 83 includes: (1) a precursor canister 83a or other precursor source; (2) a precursor flow controller 83b, which regulates a specified quantity of precursors for each polymer deposition; (3) a gas reactor 83c, which induces the generation of vapor phase reactive intermediates from precursors; and (4) a set of valves 83d.
(48) In order to deposit parylene-based films, solid or liquid precursors are heated in the stainless canister 83a to a consistent temperature to generate vapor phase precursors. The vapor phase precursors are fed into the gas reactor 83e, which is regulated by the flow controller 83b, as depicted in
(49) The thin-film phosphor deposition system 80 also includes a control subsystem or unit, which includes a processor 84 and an associated memory 85 that are connected to other components of the system 80 and serve to direct operation of those components. The memory 85 can include a computer-readable storage medium having computer code stored thereon for performing various computer-implemented operations. The media and computer code can be those specially designed and constructed for the purposes of embodiments of the invention, or they may be of the kind well known and available to those having skill in the computer software arts. Examples of computer-readable media include, but are not limited to: magnetic storage media such as hard disks, floppy disks, and magnetic tape; optical storage media such as Compact Disc/Digital Video Discs (“CD/DVDs”), Compact Disc-Read Only Memories (“CD-ROMs”), and holographic devices; magneto-optical storage media such as floptical disks; and hardware devices that are specially configured to store and execute program code, such as Application-Specific Integrated Circuits (“ASICs”), Programmable Logic Devices (“PLDs”), and ROM and RAM devices. Examples of computer code include, but are not limited to, machine code, such as produced by a compiler, and files containing higher-level code that are executed by a computer using an interpreter. For example, an embodiment of the invention may be implemented using Java, C++, or other object-oriented programming language and development tools. Additional examples of computer code include, but are not limited to, encrypted code and compressed code. Other embodiments of the invention can be implemented using hardwired circuitry in place of, or in conjunction with, computer code.
Advantages of Thin-Film Phosphor Deposition Method
(50) Table 2 sets forth certain advantages of the conformal thin-film phosphor deposition method of some embodiments of the invention, relative to other phosphor coating methods.
(51) TABLE-US-00002 TABLE 2 Comparison of Phosphor Coating Methods Conformal Thin- Slurry Method EPD Ceramic Plate Film Phosphor Spatial proximate proximate proximate remote conformal Phosphor phosphor-in-cup conformal phosphor phosphor Distribution phosphor Scattering ~50% ~40% Slightly better ≧ about 90% Efficiency than EPD (e.g., ≧ about 92% or ≧ about 95% and up to about 99% or more) Homogeneity Poor Good Good Good Color Poor Good Good Good Consistency Color Possible for Single Possible for Possible for layer- Rendering multi-color phosphor multi-layer by-layer phosphor phosphor ceramic plate deposition Temperature Medium Poor Good Best Stability Cost Die-level Batch process Die-level Batch process process process
(52) In conjunction with the advantages set forth above, a light emitting device formed in accordance with the conformal thin-film phosphor deposition method can emit white light of greater uniformity. In particular, a CCT variation of a white light LED can be no greater than about 1,000 K over a 140° (±70° from a center light-emitting axis) range of light emission angles, such as no greater than about 800 K, no greater than about 500 K, or no greater than about 300 K, and down to about 200 K or less.
(53) While the invention has been described with reference to the specific embodiments thereof, it should be understood by those skilled in the art that various changes may be made and equivalents may be substituted without departing from the true spirit and scope of the invention as defined by the appended claims. In addition, many modifications may be made to adapt a particular situation, material, composition of matter, method, or process to the objective, spirit and scope of the invention. All such modifications are intended to be within the scope of the claims appended hereto. In particular, while the methods disclosed herein have been described with reference to particular operations performed in a particular order, it will be understood that these operations may be combined, sub-divided, or re-ordered to form an equivalent method without departing from the teachings of the invention. Accordingly, unless specifically indicated herein, the order and grouping of the operations are not limitations of the invention.