Method for measuring light field distribution and device therefor

Abstract

A method and a device for measuring light field distribution are provided; including steps of utilizing the optical trap to stably levitating particles, moving the optical trap to bring the particles close to the light field to be measured, and utilizing the photodetector to collect the scattered light signals of the particles at different positions in the three-dimensional space of the light field to be measured, and calculating the light field distribution of the light field to be measured according to the scattered light intensity which is proportional to the light intensity at that position. The device for measuring the optical field distribution includes a laser, an optical trapping path, particles, a photodetector, a control system and an upper computer; the laser emits a laser, passes through the optical trapping path, and emits highly focused captured light B to form an V optical trap to capture particles.

Claims

1. A method for measuring the light field distribution, comprising steps of: stably levitating particles by an optical trap; moving the optical trap to bring the particles levitated close to a light field to be measured, collecting scattering beam of the particles at different positions in a three-dimensional space of the light field to be measured by a photodetector; calculating the light field distribution of the light field to be measured according to the scattered beam intensity, which is proportional to the light intensity at the position; wherein the signal collected by the photodetector is the scattering beam of the light field to be measured by the particle, and does not include the scattered beam of trapping beam by the particle. wherein the photodetector converts the light intensity to be measured scattered light by particle into the physical quantity directly related to the light intensity, including light intensity, optical power and brightness. wherein the particles scan the light field to be measured point by point, and the measurement spatial resolution of the light field to be measured is equal to a length of the scanning interval.

2. A device for measuring light field distribution adopting the method of claim 1, comprising:a laser, an optical trapping path particles, a photodetector, a control system, and an upper computer; the laser emits laser light, passes through the optical trapping path, and emits highly focused trap light B, forming an optical trap to capture particles; the particles are at a certain position in the light field A to be measured, and the scattered light C is collected by the photodetector; the photodetector uploads the scattered light signal to the upper computer; the relative positional relationship between the particles and the photodetector is fixed, and the control system synchronously controls the position of the particles and the photodetector, so that the particles scan the light field A to be measured point by point; the upper computer calculates the light field distribution of the light field A to be measured according to the scattered light signals obtained at different positions.

3. The device as recited in claim 2, wherein the optical trap comprises single beam optical trap or double beam optical trap.

4. The device as recited in claim 2, wherein the photodetector adopts CCD, CMOS, light intensity meter, light power meter or brightness meter.

5. The device as recited in claim 2, wherein the scanning step length of the control system brings the spatial resolution of the light field measured by the device to reach the order of nanometers.

Description

BRIEF DESCRIPTION OF THE DRAWINGS

(1) The FIGURE is a schematic diagram of a structure of the device of the present invention;

(2) As shown in the FIGURE, 1—laser 1; 2—optical trapping path; 3—particles; 4—photodetector; 5—control system; 6—upper computer.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENT

(3) The present invention will be further described below in conjunction with the drawings and embodiments.

(4) A method for measuring the light field distribution, comprises steps of:

(5) stably levitating particles by an optical trap; moving the optical trap to bring the particles levitated close to a light field to be measured, collecting scattering beam of the particles at different positions in a three-dimensional space of the light field to be measured by a photodetector; wherein a scattered beam intensity is proportional to a light intensity at the position; the stronger the beam intensity, the stronger the scattering beam; the light intensity of the light field to be measured in different positions in the three-dimensional space can be obtained by moving the position of the particles point by point.

(6) The ratio of a wavelength of particles in the light field to be measured to a beam wavelength is:

(7) $\sigma =\frac{2\pi r}{\lambda }$

(8) wherein r is a radius of the particle and λ is the beam wavelength. According to the scattering theory, when σ<<1, Rayleigh scattering is performed on the light field scattered by the particles; when σ≈1, the Mie scattering is performed on the light field; when σ>>1, scattering is performed by regarding the particles as geometric lens. In either case, the intensity of scattered beam in a certain scattering angle direction is proportional to the intensity of the light field where the particles are located. Taking Rayleigh scattering as an example, the intensity of scattered beam can be expressed as:

(9) $I\propto I_0\frac{1+{\cos }^2\theta }{2d^2}{\left(\frac{2\pi }{\lambda }\right)}^4{\left(\frac{n^2-1}{n^2+2}\right)}^2{r}^6$

(10) wherein I.sub.0 is a light intensity at a position where the particles located, θ is a scattering angle, i.e., an angle between an observation direction of the photodetector and a beam propagation direction, d is a distance between the photodetector and the particles to be measured, and n is a relative refractive index between the particles and a environmental medium.

(11) As shown in FIG. 1, a device for measuring light field distribution comprises a laser 1, an optical trapping path 2, a plurality of particles 3, a photodetector 4, a control system 5, and an upper computer 6.

(12) The laser 1 emits laser light, passes through the optical trapping path 2, and emits highly focused trap light B to form an optical trap to capture the particles 3 (standard particles are used in the Figs.); the particles 3 are located at a certain position in the light field A to be measured, the scattered light C is collected by the photodetector 4; the photodetector 4 uploads the scattered light signal to the upper computer 6; the relative position of the particles 3 and the photodetector 4 is fixed, and the control system 5 synchronously controls positions of the particles 3 and the photodetector 4 so that the particles 3 scan the light field A to be measured point by point; the upper computer 6 calculates the light field distribution of the light field A to be measured according to the scattered light signals obtained at different positions.

(13) For those skilled in the art, the present invention can have various modifications. as follows.

(14) (1) Depending on the optical trapping path, the formed optical trap can be a single-beam optical trap or a double-beam optical trap.

(15) (2) Standard particles are optically uniform medium particles with known size, density and scattering characteristics, with sizes ranging from nanometers to micrometers; the size of the particles only affects the scattering model and the structure of the optical trap used in the detection process.

(16) (3) The light field can be located in the environment of liquid, air or vacuum.

(17) (4) The wavelength of the light field to be measured and the wavelength of the trapping beam can be the same or different; if the two are the same, a filter needs to be added in front of the detector to filter out the scattered light of the trapping beam by the particles.

(18) (5) The propagation direction of the light beam to be measured and the propagation direction of the optical trapping beam can be at any angle.

(19) (6) The photodetector can be a CCD or CMOS, or a light intensity meter, an optical power meter, or a luminance meter, as long as the detector can obtain a physical quantity directly related to the light intensity, which can be light intensity, optical power and brightness etc.

(20) (7) The scattering angle range of the scattered light collected by the photodetector can be at a range of 0-180° C. When the scattering angle is 0° C., it corresponds to the forward scattered light; when the scattering angle is 90° C., it corresponds to the right side scattered light; and when the scattering angle is 180° C., it corresponds to the backward (back) scattered light.

(21) (8) When measuring beams of different sizes, particles of different sizes can be selected, and the scanning step length of the control system can be adjusted at the same time. The scanning step length and particle size jointly determine the spatial resolution of the measured light field, which can generally reach the order of nm.

Application Embodiment

(22) The light field A to be measured is a focused light field of a 532 nm laser passing through a microscope objective lens with a numerical aperture NA=0.9, which is in Gaussian-like distribution.

(23) Its theoretical beam waist size and Rayleigh distance are both less than 1 μm, which is smaller than the size of ordinary small holes or CCD camera pixel elements. Therefore, it is impossible to measure the light field distribution by general methods. The method provided by the present invention can be used to measure the light field distribution, especially to calibrate the waist size.

(24) The laser 1 adopts a 1064 nm single-mode laser, and the optical trapping path 2 comprises a pair of collimating lenses, a pair of mirrors and a focusing objective lens; wherein the laser light emitted by the laser 1 is collimated and focused by the optical trapping path to form a single beam optical trap; a standard sample of silica microspheres with a nominal diameter of 50 nm is adopted; the photodetector 4 adopts a light-emitting diode light meter, add a filter above a probe of the photodetector 4 to filter out stray light with a wavelength of 1064 nm in the scattered light. Only the scattered beam of the light field to be measured is received. The detection signal is inputted to the upper computer for processing by the beam intensity meter; wherein the control system 5 is a stepping motor control system, which controls the position of the optical element in the optical trapping path 2 and drives the light intensity meter, so as to maintain the relative position of the silica particles and the beam intensity meter unchanged during the measurement process.

(25) The single-beam optical trap captures a single silica particle and is close to the light field to be measured; when the particle is located in the beam waist plane of the light field to be measured, the stepping motor system drives the particles and the light intensity meter in the direction perpendicular to the light field to be measured. The upper computer collects scattered light signals at different positions in the entire beam waist plane, so as to obtain the light field distribution in the beam waist plane; the scanning step of the stepper motor system is 5 nm, which is smaller than the beam waist of the light field to be measured, in such a manner that the beam waist information of the light field to be measured can be accurately obtained.

(26) The particles move a certain displacement along the optical axis, and repeat the above steps to obtain the light field distribution on different beam cross sections; based on the light field distribution of different beam cross sections, in such a manner that the light intensity of the light field to be measured in different positions of the three-dimensional space can be obtained.

(27) One skilled in the art will understand that the embodiment of the present invention as shown in the drawings and described above is exemplary only and not intended to be limiting.

(28) It will thus be seen that the objects of the present invention have been fully and effectively accomplished. Its embodiments have been shown and described for the purposes of illustrating the functional and structural principles of the present invention and is subject to change without departure from such principles. Therefore, this invention includes all modifications encompassed within the spirit and scope of the following claims.