SPUTTERING TARGET ASSEMBLY HAVING A GRADED INTERLAYER AND METHODS OF MAKING
20170287685 · 2017-10-05
Inventors
- Stephane Ferrasse (Spokane, WA, US)
- Susan D. Strothers (Mead, WA, US)
- Xinlin Shi (Spokane Valley, WA, US)
- Diana L. Morales (Spokane Valley, WA, US)
Cpc classification
B33Y10/00
PERFORMING OPERATIONS; TRANSPORTING
C23C14/3407
CHEMISTRY; METALLURGY
B33Y80/00
PERFORMING OPERATIONS; TRANSPORTING
C23C24/106
CHEMISTRY; METALLURGY
H01J37/3435
ELECTRICITY
C23C24/103
CHEMISTRY; METALLURGY
International classification
B33Y80/00
PERFORMING OPERATIONS; TRANSPORTING
Abstract
A sputtering target assembly includes a sputtering target having a rear surface, a backing plate having a front surface, and an interlayer disposed between the target and the backing plate. The interlayer includes a first interlayer portion disposed proximate the target material rear surface, and a second interlayer portion disposed proximate the backing plate front surface. The first interlayer portion is formed of a first mixture containing a first material and a second material and having a higher concentration of the first material than the second material, and the second interlayer portion is formed of a second mixture containing the first material and the second material and having a higher concentration of the second material than the first material. A method of making is also provided.
Claims
1. A sputtering target assembly comprising: a sputtering target having a rear surface; a backing plate having a front surface; and an interlayer disposed between the sputtering target and the backing plate, the interlayer comprising a first interlayer portion disposed proximate the sputtering target rear surface, and a second interlayer portion disposed proximate the backing plate front surface; wherein the first interlayer portion is formed of a first mixture containing a first material and a second material and having a higher concentration of the first material than the second material, and wherein the second interlayer portion is formed of a second mixture containing the first material and the second material and having a higher concentration of the second material than the first material.
2. The sputtering target assembly of claim 1, further comprising a third interlayer portion between the first interlayer portion and the second interlayer portion wherein the concentration of the first material either increases or decreases along an axis extending through the sputtering target and the backing plate, wherein the axis is perpendicular to the rear surface of the sputtering target.
3. The sputtering target assembly of claim 1, wherein the interlayer has a property gradient in any one of grain size, grain texture, material composition, or material component density along an axis extending through the sputtering target and the backing plate, the axis perpendicular to the rear surface of the sputtering target.
4. The sputtering target assembly of claim 1, wherein the first interlayer portion and the second interlayer portion are each from about 0.5 millimeters to 3 millimeters thick.
5. The sputtering target assembly of claim 1, wherein the sputtering target is formed from a sputtering target material and wherein a coefficient of thermal expansion of the first interlayer portion is within five hundred percent of a coefficient of thermal expansion of the sputtering target material.
6. The sputtering target assembly of claim 1, wherein the backing plate is formed from a backing plate material and wherein a coefficient of thermal expansion of the second interlayer portion is within five hundred percent of a coefficient of thermal expansion of the backing plate material.
7. The sputtering target assembly of claim 1, wherein the first material is aluminum (Al), cobalt (Co), chromium (Cr), copper (Cu), iron (Fe), molybdenum (Mo), niobium (Nb), tantalum (Ta), titanium (Ti), nickel (Ni), tungsten (W), yttrium (Y), or zirconium (Zr) or their alloys, or steels.
8. The sputtering target assembly of claim 1, wherein the interlayer further includes a third material.
9. The sputtering target assembly of claim 1, wherein the interlayer further comprises a third material and wherein the first interlayer portion has a higher concentration of the third material than the second interlayer portion.
10. The sputtering target assembly of claim 1, wherein the interlayer further comprises a third material and wherein the first interlayer portion has a lower concentration of the third material than the second interlayer portion.
11. A method of forming a sputtering target assembly, the method comprising: forming a first layer on a surface of a sputtering target or a surface of a backing target from a first mixture containing a first material and a second material; forming a second layer on the first layer from a second mixture containing the first material and the second material, wherein the first layer has a higher concentration of the first material than the second layer, and the second layer has a higher concentration of the second material than the first layer; arranging the backing plate or the sputtering target on the second layer to form the sputtering target assembly having the first layer and second layer between the sputtering target and backing plate; and joining the sputtering target, the first layer, the second layer, and the backing plate together in a target assembly bonding step.
12. The method of claim 11, wherein the first layer is formed on the backing plate, and the sputtering target is arranged on the second layer.
13. The method of claim 11, the method further comprising, adding a plurality of subsequent layers of material on the first layer wherein each subsequent layer of material has a lower concentration of the first material than the layer on which it is formed.
14. The method of claim 13, wherein from the first layer to the second layer there is a change in any one of grain size, grain texture, or material component density.
15. The method of claim 13 wherein each layer of the plurality of subsequent layers of material is from about 0.5 millimeter to about 3 millimeters thick.
16. The method of claim 11, wherein the sputtering target is formed from a sputtering target material and wherein a coefficient of thermal expansion of the first layer is within five hundred percent of a coefficient of thermal expansion of the sputtering target material.
17. The method of claim 11, wherein the backing plate is formed from a backing plate material and wherein a coefficient of thermal expansion of the second layer is within five hundred percent of a coefficient of thermal expansion of the backing plate material.
18. The method of claim 11, wherein a difference between a coefficient of thermal expansion of the first layer and a coefficient of thermal expansion of the sputtering target is less than a difference between the coefficient of thermal expansion of the first layer and a coefficient of thermal expansion of the backing plate.
19. The method of claim 11, wherein the first mixture and the second mixture further include a third material.
20. The method of claim 19, wherein a concentration of the third material in the first mixture is higher than a concentration of the third material in the second mixture.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
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DETAILED DESCRIPTION
[0043] Additive manufacturing (AM) can be used to create graded materials and therefore materials having graded properties, including physical properties such as electrical and thermal conductivity, and material properties, like CTE, ductility, brittleness and strength (yield or ultimate tensile strength). AM can be used to form components that make up a sputtering target assembly that have a property gradient.
[0044] In some embodiments, creating a material having a property gradient such as a gradient in ductility, strength, or CTE can be used to bond a target and backing plate with dissimilar CTEs. In some embodiments, creating a material having a property gradient such as a gradient in ductility, strength, or CTE in a small region near the bonded interface between the target material and backing plate material provides a solution to bonding of materials with dissimilar CTE (i.e. a large CTE mismatch).
[0045] As shown in
[0046] In some embodiments, the interlayer 34 having a tailored property gradient can be created by depositing material directly by AM on top of either the backing plate 30 or sputtering target 32 or on both the sputtering target 32 and backing plate 30. After depositing the interlayer 34, the backing plate 30 and the sputtering target 32 assembled such that the interlayer 34 is positioned between the backing plate 30 and the sputtering target 32 and the assembly is bonded together.
[0047] In one example, the interlayer 34 can be formed on the sputtering target 32 or the backing plate 30. For example, in some embodiments, a first layer formed of a first mixture of a first material and a second material is formed on the back surface of the sputtering target 32. A second layer formed of a second mixture of the first material and the second material may subsequently be formed on top of the first layer. The first layer has a higher concentration of the first material than the second layer, and the second layer has a higher concentration of the second material than the first layer. Backing plate 30 may then be arranged on top of the second layer such that the front surface of the backing plate 30 is adjacent to the second layer. Sputtering target 32, the first layer, the second layer, and backing plate 30 may then be joined together in a bonding step.
[0048] In some embodiments, an entire interlayer 34 with the tailored property gradient can be created first and later positioned and bonded between the sputtering target 32 and backing plate 30.
[0049] In some embodiments, the backing plate 30 and the sputtering target 32 have one or more different properties and the property gradient of the interlayer smooths or reduces the difference in the property from the backing plate 30 to the sputtering target 32. For example, the interlayer 34 may be comprised of multiple layers and each layer may be from about 0.5 millimeter (0.02 inches) to about 3 millimeters (0.1 inches) thick. In some embodiments, the interlayer 34 is comprised of multiple layers such that the interlayer 34 is from about 1 millimeter (0.04 inches) to about 10 millimeters (0.4 inches) thick. At least one property of adjacent layers may be varied such that the property of the layer adjacent to the sputtering target 32 is more similar to that of the sputtering target 32 and the property of the layer adjacent the backing plate 30 is more similar to that of the backing plate 30. In this way, the interlayer 34 can have a property gradient.
[0050] In one example, the backing plate 30 and the sputtering target 32 have different CTEs. For example, the backing plate 30 may be made from backing plate material such as aluminum (Al) and copper (Cu) alloys, which have high CTEs, and the sputtering target 32 may be made from material with low a CTE, for example tungsten (W). In this example system, an interlayer 34 may be made from a material or combination of materials having a high CTE on the side adjacent to the backing plate 30 and gradually change to a material or combination of materials having a lower CTE on the side facing the sputtering target. The material composition at each location in the interlayer 34 is chosen to create an interlayer 34 material having a gradually changing CTE in a direction perpendicular to the plane of the sputtering surface of the sputtering target 32, which may reduce or eliminate stress and fracture in the target assembly. In other embodiments, the interlayer 34 may be made from a material or combination of materials that gives it a low CTE at the side adjacent to the sputtering target 32 and a high CTE at the side adjacent to the backing plate 30. Such an interlayer, for example, may be used when the sputtering target 32 has a lower CTE than the backing plate 30.
[0051] As used here, a property gradient refers to change in a compositional or material property from a first location to a second location. Example properties include elemental composition, coefficient of thermal expansion, brittleness, ductility, grain size, grain texture, and material component density.
[0052] AM provides several ways to create a material having a property gradient such as a gradient in composition, a gradient in material component density, a gradient in grain size, a gradient in CTE, a gradient in ductility, and/or a gradient in grain texture. In some embodiments, AM techniques can be used to produce layers of material with varying compositions and densities which enhance the bonding of certain materials together, such as, for example, materials having differing coefficients of thermal expansion (CTE). Depending on the AM method used to create the property gradient, the material property may gradually change in either a substantially smooth or a stepwise manner. Using AM techniques described herein, the layers of material can be built on the backing plate, the target material, or both.
[0053] For example, in some embodiments, the sputtering target 32 is formed of a sputtering target material and a coefficient of thermal expansion of a first layer is within five hundred percent of the coefficient of thermal expansion of the sputtering target material. The backing plate 30 is formed of a backing plate material and a coefficient of thermal expansion of a second layer is within five hundred percent of the coefficient of thermal expansion of the backing plate material. In one embodiment, the coefficient of thermal expansion of either the first layer and the second layer may be less than three hundred percent of the coefficient of thermal expansion of the sputtering target material and the backing plate material, respectively.
[0054] There are various AM techniques that can be used to carry out the methods of the instant disclosure. Because the material is deposited or laid down in a predetermined pattern and composition, the portion of the instant disclosure that uses AM can be referred to as a printing step. The AM or printing step may employ any one of a variety of AM techniques such as directed energy deposition (DED), sheet lamination, powder bed fusion, ink jetting, cold spray, thermal spray, or plasma spray. For example, an AM technique may be used to create an interlayer from any one of or any combination of aluminum (Al), cobalt (Co), chromium (Cr), copper (Cu), iron (Fe), molybdenum (Mo), niobium (Nb), tantalum (Ta), titanium (Ti), nickel (Ni), tungsten (W), yttrium (Y), zirconium (Zr) or their alloys, or steels.
[0055] Directed Energy Deposition (DED)
[0056] Directed energy deposition (DED) covers a range of terminology including direct metal deposition (DMD), laser engineered net shaping, directed light fabrication, blown powder AM, and 3D laser cladding. In these types of processes, focused thermal energy is used to fuse materials by melting the material as it is being deposited. In some embodiments, a laser is the source of energy and the material is a metal powder or wire.
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[0058] In this technique, a laser can be the source of energy 50 and the material 46 can be a metal powder. In some cases, metal powder is injected or deposited on a pool of molten metal created by the laser. Other names for this technique include blown powder AM and laser cladding. Some unique capabilities include simultaneous deposition of several materials, making functionally graded parts possible. Most directed energy deposition machines also have a 4- or 5-axis motion system or a robotic arm to position the deposition head, so the build sequence is not limited to successive horizontal layers on parallel planes. Hybrid systems can also combine powder-fed directed energy deposition with CNC milling (e.g. 4- or 5-axis milling).
[0059] Illustrated in
[0060] An exemplary schematic of a DMD system 60 is shown in
[0061] In some embodiments, a first layer 76 having a first composition such as a first concentration of two or more materials is laid down. Next, the composition of the materials coming out of the first feeder 68 is changed and a second layer 78 having a different ratio of the same materials is laid down. After this process has been repeated a number of times, an interlayer 80 having a gradient is formed. It is also envisioned that individual layers may be formed, with each layer having different materials than the previous layer. For example, the composition of the first layer 76 may be chosen to create a layer having a particular CTE. First layer 76 may include a first material and a second material. Additionally, first layer 76 may include a third material or any number of additional materials to achieve the particular CTE. A subsequent layer may be formed having a different ratio of the same materials as present in the first layer 76, or possibly materials that are different from the first layer 76, so long as the CTE of the subsequent layer is higher than the first layer 76. In other words, each layer may have the same materials as the adjoining layer in a different ratio, or may have different materials, so long as the CTE of each layer forms a gradient in a direction from one side of the interlayer to the opposite side. In this manner, an entire interlayer may be formed, with each layer having a different material composition than the previous layer, so long as the CTE of each individual layer is higher or lower than the previously formed layer.
[0062] As shown in
[0063] As shown in
[0064] As shown in
[0065] In some embodiments, the feedstock may comprise wire instead of powders. In this example, the thermal source melts and atomizes the wires into fine powders before they get trapped and mixed into the molten pool.
[0066] In some embodiments, the DMD system has hermetically sealed chambers purged with argon or with a high vacuum in order to keep oxygen and moisture levels can be below 10 ppm. Such an environment helps prevent oxidation and contamination and keeps parts clean in order to ensure the best quality material. Powder feeding systems and ejected powders are also surrounded by a gas shield, such as argon, to provide additional protection as well as pressure.
[0067] Sheet Lamination
[0068] Sheet lamination is another 3D printing technique that can produce parallel stacks of thin layers of different materials. Sheet lamination is an AM process where sheets of material are bonded to form a 3D object. Sheet lamination can be used to produce stacks of thin foils with different CTEs on top of either the backing plate or target material.
[0069] As shown in
[0070] In some embodiments, one type of sheet lamination technique that is particularly well suited for metals and alloys is ultrasonic additive manufacturing (UAM). As shown in
[0071] UAM usually combines a rolling ultrasonic welding system with CNC milling capabilities to ensure good tolerance or shape and ensure that the 3D shape and geometry follows the input CAD design. For example holes or changes in the surfaces can be milled if needed. UAM can be a very efficient technique to build multiple stacks of readily available foils of material, such as foils having titanium (Ti), aluminum (Al), or copper (Cu) in various ratios, on top of backing plate material. The low temperatures involved reduce the thermal stresses during manufacture. Also, because UAM utilizes solid foils instead of powders, it eliminates sources of porosities within each layer.
[0072] Other AM techniques that can be used to build 3D structures made of metals and alloys include binder jetting, powder bed fusion, cold spray, thermal spray, and plasma spray.
[0073] Binder Jetting
[0074] Binder jetting, as shown in
[0075] Metals parts produced by binder jetting usually must be sintered and infiltrated with a second metal after the AM build process. An example is the use of bronze infiltrant for stainless steel, bronze, or iron parts. Other infiltrants can be aluminum (Al), glass or carbon fibers. During a post-build furnace cycle, the binder is burned out and bronze is infiltrated into the parts to produce metal alloys. This technique can be used to produce a graded composition. However, besides the use of powder bed, this technique has other potential disadvantages for producing graded compositions: i) additional cost of sintering and infiltration steps, ii) more risk for unwanted porosities during infiltration step and iii) limitation in the number of infiltrant materials and therefore achievable compositions.
[0076] Powder Bed Fusion
[0077] Powder bed fusion is an AM method in which thermal energy, such as a laser, selectively fuses regions of a powder bed, such as that shown in
[0078] The thermal energy melts a selected portion of a layer of powder material, which then changes to a solid phase as it cools. For metal parts, anchors may attach the parts to a base plate and support down facing structures. This is necessary due to the high melting point of metal powders that can create a high thermal gradient resulting in thermal stresses and warping if anchors are not used. Other common names for powder bed fusion include laser melting (LM), selective laser melting/sintering (SLM/SLS), direct metal laser sintering (DMLS) and electron beam melting. In some embodiments, the target material or backing plate may be inserted in the powder bed and used as a substrate above which various layers are deposited and then selectively annealed by laser to create a gradient in grain size as described in above paragraph.
[0079] Cold Spray
[0080] Cold spray involves propelling build material against a substrate with enough kinetic energy to produce a dense coating or freeform. Cold spraying does not result in melting the build material and thus can be performed at relatively low temperatures The process can be carried out by spraying solid particles at high velocities (such as between about 500 m/s and 1500 m/s) to form deposits by plastic deformation. Cold spray techniques can be used to avoid metal oxidation and form high density hard metal deposits.
[0081] As shown in
[0082] Thermal Spray
[0083] Thermal spray methods, such as plasma spray, high velocity oxygen fuel (HVOF) spray, arc spray, and flame spray generally involve melting a build material into droplets with a heat source and spraying the melted build material onto the substrate or build surface at high velocity. Build material can be melted with various energy sources such as chemical combustion, plasma, or electric arc. A metallic build material can be provided as a feedstock as a powder or wire or metal matrix composites.
[0084] As shown in
[0085] AM Method of Forming Interlayer
[0086]
[0087] In some embodiments, exemplary forms of AM that may be used to produce an interlayer having a gradient in grain size and texture between a backing plate and a sputtering target include DMD and DED (
[0088] Once the entire interlayer is formed, it may be surface treated in step 204 using CNCL milling per CAD design for preparing the surface of the interlayer before the next step. In step 206, the sputtering target is added to the interlayer. This can be carried out using any bonding step that is suitable and that may help heal any defects in the interlayer. In some embodiments, a diffusion bonding method such as hot isostatic pressing “HIPping” may be used. Finally in step 208, the target assembly having the backing plate, interlayer, and sputtering target joined may undergo a final machining step to smooth the surfaces for example.
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[0090] As shown in
[0091] As shown in
[0092] Next in step 232 of
[0093] Additional control of grain size is possible within the deposited layers during the AM process. In steps 234 of
[0094] In steps 236 of
[0095] One additional advantage of AM is that the bonding surfaces can be more precisely prepared and controlled to create an improved or superior bond strength. For example, features such as dents, steps, grooves, or keys can be printed at the surface of the interlayer in order to improve the bond strength between the interlayer and the sputtering target or backing plate. Those features can be made more refined and complex by AM techniques. Near net shape fabrication reduces fabrication time and material costs. In addition, AM techniques including DED, DMD, and UAM may be combined with CNC milling capabilities. In some embodiments CNC milling can be used in combination with AM to provide a superior or improved surface finish and dimensional tolerance, for example, CNC milling can be used to machine grooves on the top surface of the graded interlayer to facilitate the bonding step. For example, CNC milling may be used to create a surface consisting of triangular dents across a face of the interlayer.
[0096] Solid state bonding of the target to the gradient interlayer and the backing plate assembly is performed next. In some embodiments, HIPping is preferred because it exerts an isotropic pressure from all directions on a part at a relatively high temperature. This method helps promote diffusion and reduced porosity while at the same time provides a solid state diffusion bond. Heat treatment performed before, during, and especially after HIPping also helps reduce residual stresses. Additionally, heat treatment during bonding steps can sometimes help promote further inter-diffusion between the AM formed layers and in effect produces a more continuous gradient in composition that further helps reduce thermal stresses.
[0097] Finally, in steps 238 of
[0098] As described above, AM techniques that use a thermal source such as a laser or electron beam can form layers of material with a gradient material composition and a controllable grain size on one surface of either the target or the backing plate. For example, for a tungsten (W) target with a copper (Cu) alloy backing plate, it can be advantageous for example to form a near net shape W/Ti/Cu or W/Mo/Cu layer stack. A general three layer stack will be of the form W/X/Cu where X is a metal or alloy having a CTE coefficient between the target material (tungsten (W) in this example) and the backing plate material (copper (Cu) alloy in this example).
[0099] The method can be extended further to the case of a four layer stack of the form W/X/Y/Cu where X and Y are metals or alloys having a CTE coefficient between the target material (tungsten (W) in this example) and the backing plate material (copper (Cu) alloy in this example). In another example, the CTE of Y is closer to the backing plate material (copper (Cu) alloy in this case) compared to that of the X because Y is deposited directly on the copper (Cu) alloy backing plate. In sum: the CTE of W <CTE of X<CTE of Y<CTE of Cu.
[0100] This procedure can be generalized to multiple stacks of multiple materials forming a gradient in CTE by controlling the composition and/or density of each layer. One method for creating material having a gradient composition would be a method that is controllable and involves a single continuous step for best efficiency and cost reduction. In some embodiments, a user can also tailor a gradient composition at an atomic or micro-scale and provide an almost continuous variation in composition and properties through the material thickness. Having a method that can control a gradient in grain size and texture will also lead to better control over local stresses and reduce cracking that occurs near the bond line, especially for brittle target materials.
[0101] In some embodiments, an interlayer 320 may be tailored to have a specific CTE at specific locations of the interlayer 320. As shown in
[0102] Referring again to
EXAMPLES
[0103] The following non-limiting Examples illustrate various features and characteristics of the present invention, which is not to be construed as limited thereto and wherein all percentages are weight percentages unless otherwise indicated.
Example 1
[0104] Use of AM to form a gradient interlayer of copper (Cu) and titanium (Ti) for binding a tungsten (W) target to copper-chromium (CuCr) backing plate:
[0105]
[0106] The compositions for the interlayer layers were mechanically mixed prior to DMD and put in separate powder feeders of the DMD system. The method used here is similar to that described above for
TABLE-US-00001 TABLE 1 Ti wt % Cu wt % Temperature Layer 402 5 95 590 C. Layer 404 25 75 460 C. Layer 406 50 50 350 C. Layer 408 75 25 250 C. Layer 410 85 15 250 C.
[0107] To facilitate adhesion and reduce porosities, each deposited layer was preheated before each laser application. This treatment allows also for some limited diffusion and homogenization of composition. Preheat step temperature was decreased slowly for each successive layer to minimize stresses and take into account compositional changes. Note that the total DMD cycle was relatively short for a total of 185 minutes and is therefore amenable to production applications.
[0108] Observation of a cross section of the interlayer by SEM/EDX is shown in
TABLE-US-00002 TABLE 2 Gradient Interlayer Concentrations Location Ti wt % Cu wt % 1 88.49 11.51 2 87.85 12.15 3 47.43 52.57 4 30.60 69.40 5 16.92 83.08 6 12.79 87.21 7 4.15 95.85
[0109] With reference to Table 2 above and the corresponding location numbers in
[0110] As also seen another view shown in
[0111] Disclosed herein is a sputtering target assembly comprising a sputtering target having a rear surface; a backing plate having a front surface; and an interlayer disposed between the target and the backing plate. The interlayer comprises at least a first material and a second material, a first interlayer portion disposed proximate the target material rear surface, and a second interlayer portion disposed proximate the backing plate front surface. The first interlayer portion has a higher concentration of the first material than the second material, and the second interlayer portion has a higher concentration of the second material than the first material.
[0112] Also disclosed herein is a method of forming a sputtering target assembly, the method comprising forming an interlayer having at least a first material and a second material. The interlayer having a first interlayer portion and a second interlayer portion, wherein the first interlayer portion has a higher concentration of the first material than the second interlayer portion, and the second interlayer portion has a higher concentration of the second material than the first interlayer portion. The method includes arranging a target having a rear surface with the target rear surface adjacent to the first interlayer portion; arranging a backing plate having a front surface with the backing plate front surface adjacent to the second interlayer portion; and joining the target, the interlayer, and the backing plate together in a target assembly bonding step. Forming the interlayer includes forming the first interlayer portion having a first concentration of the first material; adding subsequent layers of material to the first interlayer portion wherein each layer of material has a lower concentration of the first material than the previously added layer; forming the second interlayer portion having a second concentration of the first material; and subjecting the interlayer to an interlayer bonding step.
[0113] Also disclosed herein is a method of forming a sputtering target assembly, comprising forming an interlayer having a first interlayer portion and a second interlayer portion wherein forming the interlayer includes forming the first interlayer portion, and adding build material layer by layer. The method also includes forming the second interlayer portion, and subjecting the interlayer to a bonding step. Along a direction from the first interlayer portion to the second interlayer portion, each layer of build material has a lower concentration of a first material and a higher concentration of a second material than the previous layer. The method also includes placing the interlayer between a sputtering target and a backing plate; and heating the sputtering target, the interlayer, and the backing plate to a temperature high enough to form a diffusion bond between the interlayer and the sputtering target, and between the interlayer and the backing plate.
[0114] Also disclosed herein is a method of forming a sputtering target assembly, comprising forming an interlayer having a first interlayer portion and a second interlayer portion. Forming the interlayer includes forming the first interlayer portion having a first material property value, adding subsequent layers of material to the first interlayer portion, forming the second interlayer portion having a second material property value. Along a direction from the first interlayer portion to the second interlayer portion, the interlayer has a material property value gradient from the first material property value to the second material property value. The method also includes subjecting the interlayer to an interlayer bonding step; arranging a sputtering target having a rear surface with the target rear surface adjacent to the first interlayer portion; arranging a backing plate having a front surface with the backing plate front surface adjacent to the second interlayer portion; and joining the sputtering target, the interlayer, and the backing plate together in a target assembly bonding step.
[0115] Various modifications and additions can be made to the exemplary embodiments discussed without departing from the scope of the present invention. For example, while the embodiments described above refer to particular features, the scope of this invention also includes embodiments having different combinations of features and embodiments that do not include all of the above described features.