Circuit assembly, method for producing a test voltage, and testing device for determining a loss factor, which testing device contains said circuit assembly

Abstract

A circuit assembly is provided for producing a test voltage for testing a test object, comprising two high voltage sources for producing a positive and negative high voltage of variable amplitude at respective outputs thereof and a high voltage switch assembly, which is arranged between the outputs of the two high voltage sources and the test object and which can be switched suitably in order to successively charge and discharge the test object, wherein furthermore a closed-loop controller is provided, which measures the present test voltage on the test object and acts on the high-voltage switch assembly in order to charge and discharge the test object in a defined manner in dependence on the measured test voltage.

Claims

1. A circuit arrangement (1) for generating a test voltage (Up) for testing a test object (2) comprising: two high-voltage sources (3, 4) for generating a positive and a negative high voltage (U.sub.1, U.sub.2) of variable amplitude at their respective outputs (5, 6), a high-voltage switch arrangement (7), which is disposed between the outputs (5, 6) of the two high-voltage sources (3, 4) and the test object (2) and which can be switched appropriately for successive charging and discharging of the test object (2), wherein a closed-loop controller (8) is further provided that measures the instantaneous test voltage (U.sub.P) at the test object (2) and, as a function of the measured test voltage (U.sub.P), acts on the high-voltage switch arrangement (7) for well-defined charging and discharging of the test object (2), wherein the closed-loop controller (8) does not act on the two high-voltage sources (3, 4) and a separate open-loop controller (14) is provided for the two high-voltage sources (3, 4), wherein the open-loop controller (14) generates a clock signal (T) independent of the voltage (U.sub.P) at the test object (2), so that a synchronized, predefined high voltage (U.sub.1, U.sub.2) uninfluenced by the closed-loop controller (8) is supplied by the high-voltage sources (3, 4), and wherein the high-voltage switch arrangements (7) comprises two solid-state switch cascades (10, 11) which functions as voltage-controlled current sources.

2. The circuit arrangement of claim 1, wherein the two high-voltage sources (3, 4) are formed by two amplifier branches (18; 19), which are each provided with a switched-mode power supply (21; 22), a high-voltage transformer (23; 24) and a rectifier circuit (25; 26), wherein each amplifier branch (18; 19) is connected on the input side to a rectifier circuit (20) that generates a d.c. voltage from a line voltage.

3. The circuit arrangement of claim 2, wherein the switched-mode power supplies (21, 22) are designed to generate a sinusoidal a.c. voltage, wherein the phase angle of the sinusoidal a.c. voltage is predetermined by the clock signal (T).

4. The circuit arrangement of claim 3, wherein the test voltage (U.sub.P) and a test current (I.sub.p) derived therefrom, with which the well-defined charging and discharging of the test object (2) take place, are sinusoidal.

5. The circuit arrangement of claim 4, wherein the test voltage (U.sub.P), with a total harmonic distortion (THD) of smaller than or equal to 0.1%, is almost harmonics-free.

6. The circuit arrangement of claim 4, wherein the test current (I.sub.P), with a total harmonic distortion (THD) of smaller than or equal to 5%, is almost harmonics-free.

7. A test instrument (32) that comprises the circuit arrangement (1) of claim 1, a port (38) for the line voltage and a port (39) for the test object (2), wherein the test instrument (32) is provided with integrated measuring and evaluation electronics (33) for determining the loss factor of the test object (2).

8. The test instrument of claim 7, wherein the test instrument (32) for determination of loss factor has a measurement accuracy of +/−1 * 10.sup.−4, and specifically for a capacitance of the test instrument of only 2 nF and over a test-voltage range of 3 kV to 20 kV.

9. The test instrument of claim 7, wherein a test current (I.sub.P) measured in the measuring and evaluation electronics (32) is routed via a protective ground connection or via a guard connection.

10. A method for generating a test voltage (U.sub.P) for testing a test object (2), comprising: (A) Generating a first high voltage (U.sub.1) with positive sign and variable amplitude at the output of a first high-voltage source (3) and a second high voltage (U.sub.2) with negative sign and variable amplitude at the output of a second high-voltage source (4), and (B) Successively charging and discharging the test object (2) by appropriate switching of a high-voltage switch arrangement (7) disposed between the outputs (5, 6) of the high-voltage sources (3, 4) and the test object (2), wherein a closed-loop controller (8) is provided that measures the voltage (U.sub.P) at the test object (2) and, as a function of the measured voltage (U.sub.P), acts on the high-voltage switch arrangement (7) for well-defined charging and discharging of the test object (2), wherein the closed-loop controller (8) does not act on the two high-voltage sources (3, 4) and that a separate open-loop controller (14) acts on the two high-voltage sources (3, 4), wherein the open-loop controller (14) generates a clock signal (T) independent of the voltage (U.sub.P) at the test object (2), so that a synchronized, predefined high voltage (U.sub.1, U.sub.2) uninfluenced by the closed-loop controller (8) is supplied by the two high-voltage sources (3, 4), and wherein the high-voltage switch arrangement (7) comprises two solid-state switch cascades (10, 11) which function as voltage-controlled current sources.

Description

BRIEF DESCRIPTION OF THE DRAWINGS

(1) Various exemplary embodiments of the present invention will be explained in more detail hereinafter on the basis of the drawing, wherein:

(2) FIG. 1 shows a sketched circuit diagram of a first exemplary embodiment of an inventive circuit arrangement,

(3) FIG. 2 shows a sketched circuit diagram of a second exemplary embodiment of an inventive circuit arrangement,

(4) FIGS. 3a and 3b show a schematic diagram of the generation of test voltage and test current according to the prior art and the present invention,

(5) FIGS. 4a and 4b show measured results of the variation of the test voltage and test current using a circuit arrangement known from the prior art,

(6) FIGS. 5a and 5b show measured results of the variation of the test voltage and test current using an inventive circuit arrangement, and

(7) FIG. 6 shows a schematic view of an exemplary embodiment of an inventive test instrument.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

(8) The sketched circuit diagram illustrated in FIG. 1 shows a first exemplary embodiment of an inventive circuit arrangement 1 for generating a test voltage for testing a test object 2, in this case a schematically illustrated high-voltage or medium-voltage cable, to be connected to circuit arrangement 1. Circuit arrangement 1 comprises two high-voltage sources 3, 4, which are designed to supply a positive (+) or negative (−) high voltage of variable amplitude at their respective outputs 5, 6. A high-voltage switch arrangement 7, on which a closed-loop controller 8 acts for well-defined charging and discharging of test object 2, representing a certain capacitive load, is provided between outputs 5, 6 of the two high-voltage sources 3, 4 and test object 2 to be connected to circuit arrangement 1. Closed-loop controller 8 is connected via line 9 to the voltage potential present at test object 2 and is designed to measure the test voltage present there, in order to take it into consideration in the context of closed-loop control of the voltage variation—preferably sinusoidal—that is desired and is to be imposed by closed-loop controller 8. Obviously the test voltage can lie only within the voltage ranges predetermined by the two high-voltage sources 3, 4, wherein the high voltage of advantageously sinusoidal shape predetermined by the two high-voltage sources 3, 4 is preferably always somewhat higher than the test voltage tapped therefrom via high-voltage switch arrangement 7, in order to leave some margin for compensation for load fluctuations—caused, for example, by closed-loop control actions.

(9) In the present case, high-voltage switch arrangement 7 comprises two solid-state switch cascades 10, 11, for example, which as indicated by the selected circuit symbols function as voltage-controlled current sources and are in feedback relationship via respective amplifiers 12, 13, on which closed-loop controller 8 acts, as also explained in more detail in the publication already cited hereinabove (S. J. Kearly, R. R. MacKinlay: “Discharge measurements in cables using a solid state 30 kV bipolar low frequency generator”, Fifth International Conference on Dielectric Materials, Measurements and Applications, 1988, pp. 171-174). Such solid-state switch arrangements (e.g. on a transistor or FET basis) functioning as (voltage-)controlled current sources are sufficiently known from the prior art (see, for example, U. Tietze, Ch. Schenk, Solid-State Circuit Engineering, 12th Edition, Chapter 12.3, Springer-Verlag).

(10) The two high-voltage sources 3, 4 are activated not by closed-loop controller 8 but by a separate open-loop controller 14, wherein open-loop controller 14 comprises a clock-signal generator 15 which, via lines 16, 17 supplies to the two high-voltage sources 3, 4 subjected to open-loop control a clock signal T, which is taken into consideration in the generation of high voltage in such a way that the two high-voltage sources 3, 4 can respectively supply a high voltage that is synchronized on the basis of clock signal T, can have a predefined curve shape and amplitude, is advantageously edge-free and in particular is sinusoidal, and is not influenced by closed-loop controller 8.

(11) Clock generator 15 needed for this purpose can be constructed, for example, digitally on a quartz-crystal basis or mechanically in the manner of stepping motor, and should be designed to generate a sufficiently precise clock signal T, e.g. with repetition rates in the μs range.

(12) FIG. 2 shows a second exemplary embodiment of an inventive circuit arrangement for generating a test voltage for testing a test object 2 with capacitive properties to be connected to circuit arrangement 1, wherein, for the purpose of simplified explanation, components of the circuit arrangement of FIG. 2 functionally or structurally equivalent to those of the circuit arrangement of FIG. 1 are denoted by like reference symbols, and so the foregoing explanations are incorporated by reference for the description thereof.

(13) The special nature of the circuit arrangement of FIG. 2 lies in the fact that the two high-voltage sources 3, 4 here are each formed by an amplifier branch 18, 19, wherein each amplifier branch 18, 19 is connected on the input side to a rectifier circuit 20, which generates a d.c. voltage (of variable amplitude) from a line voltage. Each amplifier branch 18, 19 comprises a switched-mode power supply 21, 22 (disposed on the input side) for generating a predetermined, especially sinusoidal a.c. voltage, a high-voltage transformer 23, 24 for amplifying the a.c. voltage generated by the respective switched-mode power supply 21, 22 and a rectifier circuit 23, 24 (disposed on the output side), by means of which it is ensured that a high voltage of positive sign is always supplied to output 5 of first amplifier branch 18 and a high voltage of negative sign is always supplied to output 6 of second amplifier branch 19.

(14) The sketched circuit diagram of the second exemplary embodiment of an inventive circuit arrangement 1 according to FIG. 2 shows further that high-voltage switch arrangement 7 disposed between outputs 5, 6 of the two amplifier branches 18, 19 functioning as high-voltage sources 3, 4 and test object 2 can be configured as two solid-state switch cascades 10, 11, on which closed-loop controller 8 acts appropriately. Furthermore, in the exemplary embodiment of FIG. 2, the test voltage present at test object 2 and measured by closed-loop controller 8 by means of a suitable measuring device is tapped via a voltage divider 27.

(15) And, finally, it is indicated by dotted arrow 28 in the exemplary embodiment according to FIG. 2 that information can also be communicated if necessary by open-loop controller 14 (e.g. via clock signal T generated by open-loop controller 14 or clock-signal generator 15) to closed-loop controller 8 (but not vice versa), so that it can be taken into consideration if necessary for the action on high-voltage switch arrangement 7.

(16) Since the high voltage generated in the two high-voltage sources 3, 4 or by means of switched-mode power supplies 21, 22 with subsequent high-voltage amplification is subjected in the present case to open-loop control of its variation in time by open-loop controller 14 and clock signal T generated thereby, and since the generation of high voltage takes place without other closed-loop control actions, a particularly “smooth”, i.e. edge free (and advantageously sinusoidal) variation of the respective voltage profile can be generated in particular with high-voltage sources 3, 4 of inventive circuit arrangement 1.

(17) The schematic voltage and current curves of FIGS. 3a and 3b illustrate the effect that can be achieved with the present invention.

(18) The schematic diagram of FIG. 3a illustrates the voltage and current variations generated with a circuit arrangement known from the prior art, with closed-loop control actions on the high-voltage sources, wherein the high voltages U.sub.1′, U.sub.2′ supplied at the output of two amplifier branches are characterized by a voltage variation having edges with closed-loop control actions. From these two high voltages U.sub.1′, U.sub.2′, which as it were form an envelope curve for test voltage U.sub.P′, a largely sinusoidal variation of test voltage U.sub.P′ can be generated by means of suitable closed-loop control of the solid-state switch arrangement on the high-voltage side. However, the edges present in the voltage envelope curve and the associated load fluctuation in the circuit arrangement cause, as illustrated schematically in FIG. 3a, interferences 29, 30, 31 in the manner of harmonics or noise in the ideally sinusoidal test current I.sub.P′, just as do other closed-loop control actions on the high-voltage sources, ultimately having a detrimental influence on the accuracy of a determination of the exact phase position of test current I.sub.P′ that may be necessary in a later measuring process, especially at very low current amplitudes.

(19) In contrast, it is possible within the scope of the present invention, by using an inventive circuit arrangement, as is schematically illustrated in FIG. 3b, to generate sinusoidal and edge-free high voltages U.sub.1, U.sub.2 particularly exactly by means of the two high-voltage sources synchronized by a clock signal of the open-loop controller and not affected by closed-loop control actions, and from these to generate, by means of the high-voltage switch arrangement, a test voltage U.sub.P that is also particularly exactly sinusoidal and almost harmonics-free and—derived therefrom—an almost harmonics-free test current I.sub.P, thus significantly increasing the measurement accuracy of a measuring instrument provided with such a circuit arrangement and integrated loss-factor measurement, as has already been explained hereinabove.

(20) Finally, FIGS. 4a, 4b and 5a, 5b show real measured results for comparison measurements of the test voltage and test current in an experimental arrangement, in which—with instruments of otherwise absolutely identical design—a circuit arrangement known from the prior art, with feedback control of the switched-mode power supplies of the two amplifier branches was used at first (see FIGS. 4a and 4b) and then an inventive circuit arrangement according to FIG. 2 was used (see FIGS. 5a and 5b).

(21) The plot of test voltage U.sub.P″, illustrated in FIG. 4a, which was obtained with a circuit arrangement known from the prior art, shows a sinusoidal variation with hardly perceptible harmonics, wherein the THD value (total harmonic distortion), representing the harmonics component, is 0.0081. In contrast, in the variation of test current I.sub.P″ generated therefrom and illustrated in FIG. 4b, a large number of interferences 29, 30, 31 are apparent, caused by closed-loop control actions on the high-voltage sources and an edge-containing variation of the voltage amplitude at the output of the two high-voltage sources, and leading to a THD value of 0.0909 for test current I.sub.P″.

(22) In contrast, the plots of test voltage U.sub.P and test current I.sub.P achieved with an inventive circuit arrangement, in which the THD values are 0.000725 for test voltage U.sub.P (see FIGS. 5a) and 0.0527 for test current I.sub.P, respectively exhibit—compared with the prior art—an almost harmonics-free variation, thus significantly improving the measurement accuracy of a measuring instrument equipped with an inventive circuit arrangement.

(23) Finally, FIG. 6 shows an inventive test instrument 32 which, as schematically illustrated, is provided with an inventive circuit arrangement 1 (“VLF HV source”) for generating a suitable (VLF) test voltage and measuring and evaluation electronics 33 (tan delta evaluation circuit) coupled herewith and integrated into the test instrument for determination of the loss factor of test object 2 to be tested, which in the present case is a high-voltage or medium-voltage cable 2.

(24) In this case both circuit arrangement 1 and measuring/evaluation electronics 33 are disposed inside housing 34 of test instrument 32, on top side 35 of which at least one display/indicating element 36 is provided for display of the obtained test data, as is at least one operator-control element 37 for setting the measurement parameters, as is schematically indicated.

(25) The instrument is further provided with a port 38 for the line voltage and a port 39 for the test object 2 to be connected—in the present case via a high-voltage cable 40.