A fitting for an upper brush in a double brush scrubbing chamber of a wafer cleaning system is disclosed. The fitting includes a base plate, a flanged pipe, and a threaded connector. The base plate includes a threaded hole with a stop surface therein and a channel extending from the stop surface through a lower surface of the base plate. The flanged pipe is inserted into the base plate such that the flange at the top end of a hollow tube rests on the stop surface and the hollow tube passes through the channel of the base plate. The threaded connector has a passage therethrough, and engages the threaded hole of the base plate to fix the flanged pipe in place. This structure is able to provide fluid while minimizing particle generation.

A cleaning system for cleaning a circular panel or any other circular surface is provided. The system has a base mechanically fastened to the circular panel. An axis stub pivotally connected to the base and attached to a pivot member provides rotation for a blade set. The blade set includes a first blade and a second blade configured to rotate independently about the pivot member in either a clockwise or a counter clockwise direction, wherein the second blade is configured to sit above the first bade, each blade having at least one row of sprinkler holes positioned on each side of the blade running lengthwise. The at least one row of sprinkler holes are configured to eject a fluid to either clean, cool, or thaw the circular panel. The first blade includes a roller having cleaning implements configured to clean the circular panel as the first blade rotates about the pivot member.

A credit card cleaning apparatus for quickly and conveniently sanitizing a credit card includes a housing having a housing top side, a housing bottom side, a housing front side, a housing back side, a housing left side, and a housing right side. The housing front side is spaced apart from the housing back side in parallel opposition defining a housing interior. The housing top side has a card slot extending through to the housing interior. The housing receives a credit card through the card slot. A brush is coupled to the housing. The brush is coupled to the housing back side within the housing interior and is saturated with a sanitizing solution. The brush applies the sanitizing solution to the credit card when it is inserted through the card slot.

A produce wash system, method, and short-term wash treatment are provided. For example, the produce wash system includes a produce line including a short-term wash device followed by a wash device, a short-term wash treatment that is applied by the short-term wash device to a product, wherein the short-term wash treatment is applied using a spray device that creates micrometer sized droplets, and wherein the short-term wash treatment remains on the product for a pretreatment time that lasts until the product reaches the wash device, and a wash treatment that is applied by the wash device to the product, wherein the wash treatment rinses the short-term wash treatment from the product defining the end of the pretreatment time. The pretreatment time is set at or below a damage threshold time beyond which the short-term wash treatment damages the product beyond a damage threshold.

A debris collection and metrology system for collecting and analyzing debris from a tip used in nanomachining processes, the system including an irradiation source, an irradiation detector, an actuator, and a controller. The irradiation source is operable to direct incident irradiation onto the tip, and the irradiation detector is operable to receive a sample irradiation from the tip, the sample irradiation being generated as a result of the direct incident irradiation being applied onto the tip. The controller is operatively coupled to an actuator system and the irradiation detector, and the controller is operable to receive a first signal based on a first response of the irradiation detector to the sample irradiation, and the controller is operable to effect relative motion between the tip and at least one of the irradiation source and the irradiation detector based on the first signal.

A debris collection and metrology system for collecting and analyzing debris from a tip used in nanomachining processes, the system including an irradiation source, an irradiation detector, an actuator, and a controller. The irradiation source is operable to direct incident irradiation onto the tip, and the irradiation detector is operable to receive a sample irradiation from the tip, the sample irradiation being generated as a result of the direct incident irradiation being applied onto the tip. The controller is operatively coupled to an actuator system and the irradiation detector, and the controller is operable to receive a first signal based on a first response of the irradiation detector to the sample irradiation, and the controller is operable to effect relative motion between the tip and at least one of the irradiation source and the irradiation detector based on the first signal.

The robotic device conducts an action on a curved ferromagnetic surface. The robotic device includes a chassis platform and at least one magnetic side drive module. The chassis platform rolls on the curved ferromagnetic surface and is maintained thereon by virtue of the curved ferromagnetic surface being ferromagnetic. The at least one magnetic side drive module is pivotally attached to the chassis platform and is for conducting the action on the curved ferromagnetic surface as the chassis platform rolls on the curved ferromagnetic surface.

The present invention relates to an electrode rolling roll cleaning apparatus for removing pollutants on an electrode rolling roll, the apparatus comprising: a cleaning part for cleaning a rolling roll by bringing the rolling roll into contact with a cleaning member; an air spraying part for spraying air onto the rolling roll; a heating part for applying heat to the rolling roll so as to dry the rolling roll; and a scraper part for mechanically removing a cleaning liquid and foreign substances attached to the rolling roll.

A robotic system for providing a surface cleaning device to a solar panel device, the robotic system may include (a) a drive unit that is configured to move the robotic system in relation to the solar panel device; (b) a support unit that comprises guiding elements, the guiding elements are configured to support the surface cleaning device; wherein the guiding elements comprise a first guiding element and a second guiding element; (c) an alignment unit that is configured to align, during an alignment process, the first guiding element and the second guiding element with the solar panel device; (d) sensing units that comprises a first sensing unit and a second sensing unit; wherein the first sensing unit is configured to sense a first spatial relationship between the first guiding element and a first portion of the solar panel device; wherein the second sensing unit is configured to sense a spatial relationship.

Check valves are described herein. A check valve includes an inlet body, an outlet body, a valve body, a valve member, and a wiping extension. The inlet body defines an inlet portion. The outlet body defines an outlet portion. The valve body is coupled between the inlet bod and the outlet body. The valve body defines a valve cavity. The valve cavity is in fluid communication with the inlet portion and the outlet portion. The valve member is disposed within the valve cavity. The valve member is configured to permit flow from the inlet portion to the outlet portion and prevent flow from the outlet portion to the inlet portion. The wiping extension extends from the valve body toward the valve member. The wiping extension is movable relative to the valve member to dislodge particulate from the valve member.