Patent classifications
C08F224/00
Compound, resin, resist composition and method for producing resist pattern
A compound having a group represented by the formula (Ia): ##STR00001##
wherein R.sup.1 represents a C.sub.1 to C.sub.8 fluorinated alkyl group, R.sup.2 represents a group having an optionally substituted C.sub.5 to C.sub.18 alicyclic hydrocarbon group, and * represents a binding site.
Application of a fluorine-containing polymer in preparation of transparent frozen soil
Particles of a fluorine-containing polymer used as a transparent solid material in an artificial transparent frozen soil is provided. The fluorine-containing polymer is poly[4,5-difluoro-2,2bis(trifluoromethyl)-1,3-dioxole-co-tetrafluoroethylene], with a refractive index of 1.31 and a density of 2.1-2.3 g/cm.sup.3. The particles have a particle diameter of 0.25-2.0 mm or a particle diameter 0.074 mm, and have irregular shapes. When particles of the fluorine-containing polymer are used as a transparent solid material for preparing a transparent frozen soil, the prepared transparent frozen soil has high transparency, low price, no toxicity and no harm, good similarity with the properties of a natural frozen soil body, can substitute natural frozen soil, is used for simulating complicated geological conditions, and is effectively used in model tests in geotechnical engineering.
Application of a fluorine-containing polymer in preparation of transparent frozen soil
Particles of a fluorine-containing polymer used as a transparent solid material in an artificial transparent frozen soil is provided. The fluorine-containing polymer is poly[4,5-difluoro-2,2bis(trifluoromethyl)-1,3-dioxole-co-tetrafluoroethylene], with a refractive index of 1.31 and a density of 2.1-2.3 g/cm.sup.3. The particles have a particle diameter of 0.25-2.0 mm or a particle diameter 0.074 mm, and have irregular shapes. When particles of the fluorine-containing polymer are used as a transparent solid material for preparing a transparent frozen soil, the prepared transparent frozen soil has high transparency, low price, no toxicity and no harm, good similarity with the properties of a natural frozen soil body, can substitute natural frozen soil, is used for simulating complicated geological conditions, and is effectively used in model tests in geotechnical engineering.
RESIST COMPOSITION AND METHOD FOR FORMING RESIST PATTERN
A resist composition which includes a polymer compound including a structural unit which is derived from an acrylic ester in which the hydrogen atom bonded to an α-position carbon atom may be substituted with a substituent and which has a lactone-containing cyclic group containing other electron withdrawing groups such as a cyano group at a side chain terminal, and a compound whose a conjugate acid has an acid dissociation constant (pKa) of less than 3.
PHOTOACID-GENERATING MONOMER, POLYMER DERIVED THEREFROM, PHOTORESIST COMPOSITION INCLUDING THE POLYMER, AND METHOD OF FORMING A PHOTORESIST RELIEF IMAGE USING THE PHOTORESIST COMPOSITION
A monomer has the structure
##STR00001##
wherein R is an organic group comprising a polymerizable carbon-carbon double bond or carbon-carbon triple bond; X and Y are independently at each occurrence hydrogen or a non-hydrogen substituent; EWG1 and EWG2 are independently at each occurrence an electron-withdrawing group; p is 0, 1, 2, 3, or 4; n is 1, 2, 3, or 4; and M.sup.+ is an organic cation. A polymer prepared from monomer is useful as a component of a photoresist composition.
PHOTOACID-GENERATING MONOMER, POLYMER DERIVED THEREFROM, PHOTORESIST COMPOSITION INCLUDING THE POLYMER, AND METHOD OF FORMING A PHOTORESIST RELIEF IMAGE USING THE PHOTORESIST COMPOSITION
A monomer has the structure
##STR00001##
wherein R is an organic group comprising a polymerizable carbon-carbon double bond or carbon-carbon triple bond; X and Y are independently at each occurrence hydrogen or a non-hydrogen substituent; EWG1 and EWG2 are independently at each occurrence an electron-withdrawing group; p is 0, 1, 2, 3, or 4; n is 1, 2, 3, or 4; and M.sup.+ is an organic cation. A polymer prepared from monomer is useful as a component of a photoresist composition.
PHOTOACID-GENERATING MONOMER, POLYMER DERIVED THEREFROM, PHOTORESIST COMPOSITION INCLUDING THE POLYMER, AND METHOD OF FORMING A PHOTORESIST RELIEF IMAGE USING THE PHOTORESIST COMPOSITION
A monomer has the structure
##STR00001##
wherein R is an organic group comprising a polymerizable carbon-carbon double bond or carbon-carbon triple bond; X and Y are independently at each occurrence hydrogen or a non-hydrogen substituent; EWG1 and EWG2 are independently at each occurrence an electron-withdrawing group; p is 0, 1, 2, 3, or 4; n is 1, 2, 3, or 4; and M.sup.+ is an organic cation. A polymer prepared from monomer is useful as a component of a photoresist composition.
Hemiacetal compound, polymer, resist composition, and patterning process
A polymer for resist use is obtainable from a hemiacetal compound having formula (1a) wherein R.sup.1 is H, CH.sub.3 or CF.sub.3, R.sup.2 to R.sup.4 each are H or a monovalent hydrocarbon group, X.sup.1 is a divalent hydrocarbon group, ZZ designates a non-aromatic mono- or polycyclic ring of 4 to 20 carbon atoms having a hemiacetal structure, k.sup.1=0 or 1, and k.sup.2=0 to 3. A resist composition comprising the polymer displays controlled acid diffusion and low roughness during both positive and negative tone developments. ##STR00001##
Hemiacetal compound, polymer, resist composition, and patterning process
A polymer for resist use is obtainable from a hemiacetal compound having formula (1a) wherein R.sup.1 is H, CH.sub.3 or CF.sub.3, R.sup.2 to R.sup.4 each are H or a monovalent hydrocarbon group, X.sup.1 is a divalent hydrocarbon group, ZZ designates a non-aromatic mono- or polycyclic ring of 4 to 20 carbon atoms having a hemiacetal structure, k.sup.1=0 or 1, and k.sup.2=0 to 3. A resist composition comprising the polymer displays controlled acid diffusion and low roughness during both positive and negative tone developments. ##STR00001##
POLYMER, RESIST COMPOSITION, AND PATTERN FORMING PROCESS
A polymer comprising recurring units having an acid generator bound to the backbone, and recurring units having an optionally acid labile group-substituted carboxyl group and/or recurring units having an optionally acid labile group-substituted hydroxyl group is obtained by polymerizing corresponding monomers under such illumination that the quantity of light of wavelength up to 400 nm is up to 0.05 mW/cm.sup.2. The polymer avoids photo-decomposition of the acid generator during polymerization and concomitant deprotection reaction of the acid labile group when used in positive resist compositions. A pattern with high dissolution contrast and rectangularity is formed after development.