A multi-mode microwave waveguide blade sensing system includes a transceiver, a waveguide, and a probe sensor. The transceiver generates a microwave energy signal having a first waveguide mode and a different second waveguide mode. The waveguide includes a first end that receives the microwave energy signal. The probe sensor includes a proximate end that receives the microwave energy signal from the transceiver and a distal end including an aperture that outputs the microwave energy signal. The probe sensor directs the microwave energy signal at a first direction based on the first waveguide mode and a different second direction different based on the second waveguide mode. The probe sensor receives different levels of reflected microwave energy based at least in part on a location at which the at least one microwave energy signal is reflected from the machine.

A multi-mode microwave waveguide blade sensing system includes a transceiver, a waveguide, and a probe sensor. The transceiver generates a microwave energy signal having a first waveguide mode and a different second waveguide mode. The waveguide includes a first end that receives the microwave energy signal. The probe sensor includes a proximate end that receives the microwave energy signal from the transceiver and a distal end including an aperture that outputs the microwave energy signal. The probe sensor directs the microwave energy signal at a first direction based on the first waveguide mode and a different second direction different based on the second waveguide mode. The probe sensor receives different levels of reflected microwave energy based at least in part on a location at which the at least one microwave energy signal is reflected from the machine.

The present disclosure relates to a system for detecting and analyzing droplets of feedstock material being ejected from an additive manufacturing device. The system makes use of a split ring resonator (SRR) probe including a ring element having a gap, with the gap being positioned adjacent a path of travel of the droplets of feedstock material. An excitation signal source is used for supplying an excitation signal to the SRR probe. An analyzer analyzes signals generated by the SRR probe in response to perturbations in an electric field generated by the SRR probe as the droplets of feedstock material pass the ring element. The signals are indicative of dimensions of the droplets of feedstock material.

The present disclosure relates to a system for detecting and analyzing droplets of feedstock material being ejected from an additive manufacturing device. The system makes use of a split ring resonator (SRR) probe including a ring element having a gap, with the gap being positioned adjacent a path of travel of the droplets of feedstock material. An excitation signal source is used for supplying an excitation signal to the SRR probe. An analyzer analyzes signals generated by the SRR probe in response to perturbations in an electric field generated by the SRR probe as the droplets of feedstock material pass the ring element. The signals are indicative of dimensions of the droplets of feedstock material.

An insulated electrical component of an insulated electrical machine includes a conducting element, a first radiographically-visible conductor sensor node coupled to the conducting element, at least one second radiographically-visible conductor sensor node coupled to the conducting element a first distance in a predetermined direction from the first radiographically-visible conductor sensor node, and an insulating material bonded to the conducting element. In some embodiments, the insulated electrical component further includes a first radiographically-visible insulator sensor node coupled to the insulating material and not coupled to the conducting element and at least one second radiographically-visible insulator sensor node coupled to the insulating material and not coupled to the conducting element a second distance from the first radiographically-visible insulator sensor node. The radiographically-visible sensor nodes are distinguishable from the conducting element and the insulating material in a radiographic image. Methods of manufacturing and non-destructive testing of insulated electrical components are also disclosed.

An insulated electrical component of an insulated electrical machine includes a conducting element, a first radiographically-visible conductor sensor node coupled to the conducting element, at least one second radiographically-visible conductor sensor node coupled to the conducting element a first distance in a predetermined direction from the first radiographically-visible conductor sensor node, and an insulating material bonded to the conducting element. In some embodiments, the insulated electrical component further includes a first radiographically-visible insulator sensor node coupled to the insulating material and not coupled to the conducting element and at least one second radiographically-visible insulator sensor node coupled to the insulating material and not coupled to the conducting element a second distance from the first radiographically-visible insulator sensor node. The radiographically-visible sensor nodes are distinguishable from the conducting element and the insulating material in a radiographic image. Methods of manufacturing and non-destructive testing of insulated electrical components are also disclosed.

In order to allow detecting backscattered electrons (BSEs) generated from the bottom of a hole for determining whether a hole with a super high aspect ratio is opened or for inspecting and measuring the ratio of the top diameter to the bottom diameter of a hole, which are typified in 3D-NAND processes of opening a hole, a primary electron beam accelerated at a high accelerating voltage is applied to a sample. Backscattered electrons (BSEs) at a low angle (e.g. a zenith angle of five degrees or more) are detected. Thus, the bottom of a hole is observed using “penetrating BSEs” having been emitted from the bottom of the hole and penetrated the side wall. Using the characteristics in which a penetrating distance is relatively prolonged through a deep hole and the amount of penetrating BSEs is decreased to cause a dark image, a calibration curve expressing the relationship between a hole depth and the brightness is given to measure the hole depth.

In order to allow detecting backscattered electrons (BSEs) generated from the bottom of a hole for determining whether a hole with a super high aspect ratio is opened or for inspecting and measuring the ratio of the top diameter to the bottom diameter of a hole, which are typified in 3D-NAND processes of opening a hole, a primary electron beam accelerated at a high accelerating voltage is applied to a sample. Backscattered electrons (BSEs) at a low angle (e.g. a zenith angle of five degrees or more) are detected. Thus, the bottom of a hole is observed using “penetrating BSEs” having been emitted from the bottom of the hole and penetrated the side wall. Using the characteristics in which a penetrating distance is relatively prolonged through a deep hole and the amount of penetrating BSEs is decreased to cause a dark image, a calibration curve expressing the relationship between a hole depth and the brightness is given to measure the hole depth.

According to an embodiment, there is provided an apparatus which quantitatively evaluates a braze bonding length. A radiation emission unit emits radiation to each of a plurality of partial specimens which are obtained by cutting a specimen in a plane perpendicular to a braze bonding length direction. A light generator generates light of an amount corresponding to an intensity of transmissive radiation. An imaging unit photographs this light. A calculator calculates a braze bonding length of each of the partial specimens, from a light amount obtained with respect to each of the partial specimens, based on a correlation between a braze bonding length and a light amount. The calculator further calculates the braze bonding length of the specimen by totaling the braze bonding lengths of the respective partial specimens.

According to an embodiment, there is provided an apparatus which quantitatively evaluates a braze bonding length. A radiation emission unit emits radiation to each of a plurality of partial specimens which are obtained by cutting a specimen in a plane perpendicular to a braze bonding length direction. A light generator generates light of an amount corresponding to an intensity of transmissive radiation. An imaging unit photographs this light. A calculator calculates a braze bonding length of each of the partial specimens, from a light amount obtained with respect to each of the partial specimens, based on a correlation between a braze bonding length and a light amount. The calculator further calculates the braze bonding length of the specimen by totaling the braze bonding lengths of the respective partial specimens.