A system and method can determine one or more CT scanner calibration parameters from a plurality of calibration object projections in a plurality of radiographs.

A sensor device comprises a sensor connected to a first signal and responsive to an external field to produce a sensor signal, a test device connected to a second signal and electrically connected in series with the sensor by an electrical test connection providing a test signal, and a monitor circuit electrically connected to the first, second and test signals. The monitor circuit comprises a processing circuit and a determination circuit. The processing circuit is responsive to the test signal and a predetermined processing value to form a processing output signal. The determination circuit is responsive to the processing output signal to determine a diagnostic signal. A sensor circuit responsive to the sensor signal provides a sensor device signal responsive to the external field.

A sensor device comprises a sensor connected to a first signal and responsive to an external field to produce a sensor signal, a test device connected to a second signal and electrically connected in series with the sensor by an electrical test connection providing a test signal, and a monitor circuit electrically connected to the first, second and test signals. The monitor circuit comprises a processing circuit and a determination circuit. The processing circuit is responsive to the test signal and a predetermined processing value to form a processing output signal. The determination circuit is responsive to the processing output signal to determine a diagnostic signal. A sensor circuit responsive to the sensor signal provides a sensor device signal responsive to the external field.

A method for calibrating a device is described. The device accesses magnetometer data of a magnetometer sensor in the device, and accelerometer data of an accelerometer sensor in the device. The device determines a first position and a second position of the device based on the magnetometer data and the accelerometer data. The device determines a first magnetic vector based on the magnetometer data at the first position of the device, and a second magnetic vector based on the magnetometer data at the second position of the device. The device then assigns the first magnetic vector to the first position of the device, and the second magnetic vector to the second position of the device.

A method for calibrating a device is described. The device accesses magnetometer data of a magnetometer sensor in the device, and accelerometer data of an accelerometer sensor in the device. The device determines a first position and a second position of the device based on the magnetometer data and the accelerometer data. The device determines a first magnetic vector based on the magnetometer data at the first position of the device, and a second magnetic vector based on the magnetometer data at the second position of the device. The device then assigns the first magnetic vector to the first position of the device, and the second magnetic vector to the second position of the device.

In some implementations, a sensing device associated with less than a 360 degree measurement range may obtain a set of signal values. The sensing device may be configured to sense a magnetic field present at the sensing device and collect sensor data based on the magnetic field. The set of signal values may be included in the sensor data collected by the sensing device and may correspond to one or more components of the magnetic field present at the sensing device. The sensing device may determine, based on the set of signal values, a set of calibration points and a set of angular positions. The sensing device may calculate a set of calibration parameters based on the set of calibration points and the set of angular positions. The sensing device may utilize the set of calibration parameters to perform one or more safety checks.

A sensor device using verification includes a sensor component and a verification component. The sensor component is configured to generate first data and second data. The verification component is configured to analyze the first data and the second data and generate verification data based on the first data and the second data.

A sensor device using verification includes a sensor component and a verification component. The sensor component is configured to generate first data and second data. The verification component is configured to analyze the first data and the second data and generate verification data based on the first data and the second data.

A measuring circuit (100) is described, for the voltage of an electric machine comprising a first operational amplifier (20) having its non-inverting input (5) connected to a non-inverting input (10) of at least one second operational amplifier (30), and its output (7) feedback connected, through a resistance (R5), to the inverting input (6), the inverting input (6) of the first operational amplifier (20) being further connected through a resistance (R6) to a first phase (C) of the input current to an electric machine, the output (7) of the first operational amplifier (20) being connected, through a resistance (R8), to the inverting input (2) of a third operational amplifier (40) which has its non-inverting input (3) connected to a reference voltage (VREF), the output (7) of the first operational amplifier (20) being further connected to a first output (VC) of the circuit, which is at a voltage value equal to the voltage of a first phase of the electric machine to be measured, said third operational amplifier (40) having its output (1) feedback connected, through a capacitance (Cl), to the inverting input (2), the output (1) of the third operational amplifier (40) being further connected through a resistance (R10) to the non-inverting input (5) of the first operational amplifier (20) and to the non-inverting input (10} of the second operational amplifier (30); a system and a process for calibrating electric machines using such circuit (100) are further described.

A measuring circuit (100) is described, for the voltage of an electric machine comprising a first operational amplifier (20) having its non-inverting input (5) connected to a non-inverting input (10) of at least one second operational amplifier (30), and its output (7) feedback connected, through a resistance (R5), to the inverting input (6), the inverting input (6) of the first operational amplifier (20) being further connected through a resistance (R6) to a first phase (C) of the input current to an electric machine, the output (7) of the first operational amplifier (20) being connected, through a resistance (R8), to the inverting input (2) of a third operational amplifier (40) which has its non-inverting input (3) connected to a reference voltage (VREF), the output (7) of the first operational amplifier (20) being further connected to a first output (VC) of the circuit, which is at a voltage value equal to the voltage of a first phase of the electric machine to be measured, said third operational amplifier (40) having its output (1) feedback connected, through a capacitance (Cl), to the inverting input (2), the output (1) of the third operational amplifier (40) being further connected through a resistance (R10) to the non-inverting input (5) of the first operational amplifier (20) and to the non-inverting input (10} of the second operational amplifier (30); a system and a process for calibrating electric machines using such circuit (100) are further described.