Patent classifications
G01J4/00
Integrated polarimeter in an optical line system
A management system for an optical line system includes one or more processors and memory storing instructions that, when executed, cause the one or more processors to receive State of Polarization (SOP) measurements from one or more optical components in the optical line system, wherein the SOP measurements are taken while traffic-bearing channels are operating, and monitor health of one or more fibers based on the SOP measurements. The health can include detection and/or localization of SOP transients.
Smart sunglasses, smart window and smart mirror apparatus for augmenting human vision by means of adaptive polarization filter grids
Apparatus are described herein related to augmenting human vision by means of adaptive polarization filter grids. A preferred embodiment is described as smart sunglasses, realized as see through head mountable device (HMD) configured to reduce glare originating from polarized light. Each eyeglass of the HMD is associated with a grid comprising a plurality of dynamically configurable polarization filters placed in the path of the light. A polarization analyzer module analyzes the polarization characteristics of a field of view and performs an optimization calculation. The polarization analyzer controls the said grid via a controller module in such a way that the filter state of each grid element can be addressed separately. The grid of polarization filters causes the polarization characteristics of the incident light to be adapted in such a way as to reduce glare and/or to provide a user of the said head mountable device with an enhanced visual perception of the field of view. The user of the described head mountable device has the option of selection between a plurality of polarization enhancement modes, such as horizontal or vertical polarization filtering only or a hybrid mode combining both horizontal and vertical polarization filtering on an individual basis for each grid element. Additionally smart window and smart mirror embodiments of the described adaptive polarization filter grids are introduced.
Smart sunglasses, smart window and smart mirror apparatus for augmenting human vision by means of adaptive polarization filter grids
Apparatus are described herein related to augmenting human vision by means of adaptive polarization filter grids. A preferred embodiment is described as smart sunglasses, realized as see through head mountable device (HMD) configured to reduce glare originating from polarized light. Each eyeglass of the HMD is associated with a grid comprising a plurality of dynamically configurable polarization filters placed in the path of the light. A polarization analyzer module analyzes the polarization characteristics of a field of view and performs an optimization calculation. The polarization analyzer controls the said grid via a controller module in such a way that the filter state of each grid element can be addressed separately. The grid of polarization filters causes the polarization characteristics of the incident light to be adapted in such a way as to reduce glare and/or to provide a user of the said head mountable device with an enhanced visual perception of the field of view. The user of the described head mountable device has the option of selection between a plurality of polarization enhancement modes, such as horizontal or vertical polarization filtering only or a hybrid mode combining both horizontal and vertical polarization filtering on an individual basis for each grid element. Additionally smart window and smart mirror embodiments of the described adaptive polarization filter grids are introduced.
Inspection method and inspection system for pillar-shaped honeycomb structure
A method for inspecting a pillar-shaped honeycomb structure including the steps of: imaging a pattern of transmitted light from the second end face according to arrangement of the plugged portions of first cells and second cells, with a camera via a light diffusing film placed parallel to a second end face of the pillar-shaped honeycomb structure in a non-contact state with the second end face, which pattern is obtained by irradiating a first end face with light; and detecting a defective plugged portion(s) of the second cells based on an image of the pattern of transmitted light imaged with the camera.
Generation and detection of terahertz radiation with an arbitrary polarization direction
A photoconductive switch for generating or detecting terahertz radiation (TR) is provided. The photoconductive switch may comprise at least a first and a second pair of electrodes (E.sub.V, E.sub.H, E.sub.GR) on a surface (SS) of a photoconductive substrate, wherein the electrodes of the first pair are separated by a first gap comprising at least a plurality of first rectilinear sections (G.sub.V) extending along a first direction (x) and the electrodes of the second pairs are separated by a second gap comprising at least a plurality of second sections (G.sub.H) extending along a second direction (y), different from the first direction. The photoconductive switch may further comprise a patterned opaque layer (PML) selectively masking portions of the gaps between the electrodes. Methods and devices for generating and detecting terahertz radiation comprising such photoconductive switches are also provided.
Generation and detection of terahertz radiation with an arbitrary polarization direction
A photoconductive switch for generating or detecting terahertz radiation (TR) is provided. The photoconductive switch may comprise at least a first and a second pair of electrodes (E.sub.V, E.sub.H, E.sub.GR) on a surface (SS) of a photoconductive substrate, wherein the electrodes of the first pair are separated by a first gap comprising at least a plurality of first rectilinear sections (G.sub.V) extending along a first direction (x) and the electrodes of the second pairs are separated by a second gap comprising at least a plurality of second sections (G.sub.H) extending along a second direction (y), different from the first direction. The photoconductive switch may further comprise a patterned opaque layer (PML) selectively masking portions of the gaps between the electrodes. Methods and devices for generating and detecting terahertz radiation comprising such photoconductive switches are also provided.
Display device and optical inspection method for the same
A display device includes: a substrate; a display element layer disposed on the substrate, where the display element layer includes a light emitting element which emits light; a polarizing film disposed on the display element layer, where the polarizing film includes a first polarizer having a first absorption axis extending to a first direction and a first transmission axis extending to a second direction orthogonal to the first direction; and a first layer disposed on one surface of the polarizing film, where the first layer has a first phase difference. Light emitted from the display element layer has a polarizing axis, and an angle between the polarizing axis and one of the first absorption axis and the first transmission axis is in a range of about 25 degrees to about 65 degrees.
APPARATUSES AND SYSTEMS FOR OPTICAL ELEMENT MEASUREMENTS
The disclosed apparatus may include a holding affordance that is configured to hold an optical element, a beam emitter, and a beam sensor, where the holding affordance is positioned, along a first dimension, between the beam emitter and the beam sensor; a first linear stage that supports the beam emitter and that, when actuated, moves the beam emitter along a second dimension; a first rotational stage that supports the beam emitter and that, when actuated, rotates the beam emitter in a staging plane defined by the first dimension and the second dimension; a second linear stage that supports the beam sensor and that, when actuated, moves the beam sensor along the second dimension; and a second rotational stage that supports the beam sensor and that, when actuated, rotates the beam sensor in the staging plane. Various other systems and methods are also disclosed.
APPARATUSES AND SYSTEMS FOR OPTICAL ELEMENT MEASUREMENTS
The disclosed apparatus may include a holding affordance that is configured to hold an optical element, a beam emitter, and a beam sensor, where the holding affordance is positioned, along a first dimension, between the beam emitter and the beam sensor; a first linear stage that supports the beam emitter and that, when actuated, moves the beam emitter along a second dimension; a first rotational stage that supports the beam emitter and that, when actuated, rotates the beam emitter in a staging plane defined by the first dimension and the second dimension; a second linear stage that supports the beam sensor and that, when actuated, moves the beam sensor along the second dimension; and a second rotational stage that supports the beam sensor and that, when actuated, rotates the beam sensor in the staging plane. Various other systems and methods are also disclosed.
OPTICAL MEASUREMENT DEVICE WITH UNIVERSAL METASURFACE AND OPTICAL MEASURING METHOD USING THE SAME
An optical measurement device according to an aspect of the present disclosure includes a universal metasurface on which light is incident, a polarization sensor configured to measure a polarization state of light passing through the universal metasurface, and a controller configured to collect a quantitative differential interference contrast (QDIC) image for the x polarization of incident light that is collected by the polarization sensor, a QDIC image for y polarization, and a quantitative relative phase (QRP) image representing a relative phase difference between the x polarization and y polarization and configured to calculate intensity, a phase or polarization information of the incident light.