Provided is a Raman spectroscopy method for simultaneously measuring a temperature and a thermal stress of a two-dimensional film material in situ. The method includes: providing the two-dimensional film material including a suspended part and a supported part and measuring Raman signals of the suspended part and the supported part; establishing equations of a Raman shift with temperature and a Raman shift with thermal stress for each of the suspended part and the supported part, and solving simultaneous equations to obtain coefficients with temperature and thermal stress; and scanning a characteristic Raman spectrum field of the two-dimensional film material and obtaining a temperature distribution and a thermal stress distribution of the two-dimensional film material according to the characteristic Raman spectrum field in combination of the coefficients of the Raman shift with temperature and the Raman shift with thermal stress.

A temperature measurement system configured to measure a temperature of a target object having a first main surface and a second main surface includes a light source unit configured to emit output light penetrating the target object and including a first wavelength range and a second wavelength range; a measurement unit configured to measure a spectrum of reflected light; an optical path length ratio calculator configured to calculate an optical path length ratio between the output light of the first wavelength range and the output light of the second wavelength range; and a temperature calculator configured to calculate the temperature of the target object based on the optical path length ratio and a previously investigated relationship between the temperature of the target object and a refractive index ratio between the output light of the first wavelength range and the output light of the second wavelength range.

Systems and methods for sensing a tire parameter from a rotating wheel are disclosed. In some embodiments, a system includes: a rotatable component configured to rotate; a piezoelectric transducer disposed along a circumference of the rotatable component, where the piezoelectric transducer is configured to generate an offload voltage based on a mechanical deformation of the piezoelectric transducer; and at least one processor in communication with the piezoelectric transducer, the at least one processor configured to determine a temperature value based on the offload voltage.

Systems and methods for sensing a tire parameter from a rotating wheel are disclosed. In some embodiments, a system includes: a rotatable component configured to rotate; a piezoelectric transducer disposed along a circumference of the rotatable component, where the piezoelectric transducer is configured to generate an offload voltage based on a mechanical deformation of the piezoelectric transducer; and at least one processor in communication with the piezoelectric transducer, the at least one processor configured to determine a temperature value based on the offload voltage.

The invention relates to a watercraft having a hull (10), an introduction installation (20) for an object (70) to be anchored in the water, said introduction installation (20) being disposed on said hull (10), and at least one compressor (30) having at least one compressed-air line (40) which leads into the water and is coupled to at least one compressed-air distribution installation (45) which has a horizontal extent and for generating a bubble curtain (50) below the hull (10) has a multiplicity of mutually spaced apart outflow openings (46), characterized in that the hull (10) has at least two sub-hulls (11, 12) which are disposed so as to be mutually spaced apart and connected to one another, and a void (15) which is at least partially surrounded by the bubble curtain (50) is situated between the sub-hulls (11, 12).

Various examples are provided related to scanning tunneling thermometers and scanning tunneling microscopy (STM) techniques. In one example, a method includes simultaneously measuring conductance and thermopower of a nanostructure by toggling between: applying a time modulated voltage to a nanostructure disposed on an interconnect structure, the time modulated voltage applied at a probe tip positioned over the nanostructure, while measuring a resulting current at a contact of the interconnect structure; and applying a time modulated temperature signal to the nanostructure at the probe tip, while measuring current through a calibrated thermoresistor in series with the probe tip. In another example, a device includes an interconnect structure with connections to a first reservoir and a second reservoir; and a scanning tunneling probe in contact with a probe reservoir. Electrical measurements are simultaneously obtained for temperature and voltage applied to a nanostructure between the reservoirs.

Various examples are provided related to scanning tunneling thermometers and scanning tunneling microscopy (STM) techniques. In one example, a method includes simultaneously measuring conductance and thermopower of a nanostructure by toggling between: applying a time modulated voltage to a nanostructure disposed on an interconnect structure, the time modulated voltage applied at a probe tip positioned over the nanostructure, while measuring a resulting current at a contact of the interconnect structure; and applying a time modulated temperature signal to the nanostructure at the probe tip, while measuring current through a calibrated thermoresistor in series with the probe tip. In another example, a device includes an interconnect structure with connections to a first reservoir and a second reservoir; and a scanning tunneling probe in contact with a probe reservoir. Electrical measurements are simultaneously obtained for temperature and voltage applied to a nanostructure between the reservoirs.

Systems and methods for monitoring an environmental parameter are disclosed. A system includes a cable configured to produce a triboelectric signal along at least one conductor of the cable and an electrostatic voltmeter coupled to the cable and configured to provide an output signal responsive to the triboelectric signal. A conversion module is configured to convert the output signal to one or more parameter values indicative of the environmental parameter, and an interface provides a usable representation of the parameter value.

Systems and methods for monitoring an environmental parameter are disclosed. A system includes a cable configured to produce a triboelectric signal along at least one conductor of the cable and an electrostatic voltmeter coupled to the cable and configured to provide an output signal responsive to the triboelectric signal. A conversion module is configured to convert the output signal to one or more parameter values indicative of the environmental parameter, and an interface provides a usable representation of the parameter value.

A method for determining a characteristic of a direct-gap semiconductor comprises measuring at least one optical constant of a first sample of a direct-gap semiconductor with an optical spectrometer, calculating an estimated value of an optical parameter of the first sample of the direct-gap semiconductor based on fitting the model .sub.g(ln(1+e.sup.(h-E.sup.g.sup.)/(pE.sup.u.sup.))/ln(2)).sup.p to an optical absorption curve based on the at least one optical constant, obtaining at least one second value of the optical parameter, and calculating an estimated characteristic of the direct-gap semiconductor from the estimated value of the optical parameter and the obtained second value of the optical parameter. A method for determining a temperature of a direct-gap semiconductor and a system for determining a characteristic of a direct-gap semiconductor are also disclosed.