Disclosed therein are an inspection apparatus for a thermo-hygrometer based on phase change and methods for controlling and inspecting the same which can simultaneously inspect a thermometer and a hygrometer through a simple method using a phase change of reactants. The thermo-hygrometer based on phase change includes: reactants of at least two kinds; a plurality of cylinder type cells; a reactor body having a temperature sensor hole and a plurality of cell holes; a flow pipe in which a first gas circulates by a circulation pump; a relative humidity chamber which has a relative humidity sensor disposed therein; and a temperature control unit which is mounted below the reactor body, wherein when a phase change of a first reactant is induced, the relative humidity sensor is inspected based on the relative humidity of the first gas, and the temperature sensor is inspected based on the phase change temperature of the first reactant.

A temperature sensor is provided. The temperature sensor comprises: an inductor-capacitor (LC) oscillator configured; and a look-up table stored in a memory, wherein the look-up table contains a set of frequencies as a function of ambient temperature values, wherein when the LC oscillator is calibrated to a frequency from amongst the set of frequencies, the respective ambient temperature as stored in the look-up table is retrieved.

The invention relates to a method for real-time performance check of transport refrigeration units comprising the steps of: comparing via controller temperature sensors by pairs and determining from these comparisons by pairs if one or more temperature sensors are defective or in some extent deviates from expected temperature readings; at the same time measuring/monitoring the mass flow of cooling agent through a compressor and through an evaporator expansion valve V.sub.exp which the controller by comparison determines if mass flow through the compressor do not deviate more than 25% from the mass flow through that evaporator expansion valve V.sub.exp; if said deviation of mass flow through the compressor is more than 25% different from said mass flow through the expansion device V.sub.exp, an error signal is provided

A thermal sensor circuit that includes a temperature sensing circuit, an analog to digital converter, a processor and a divider circuit. The temperature sensing circuit generates a first temperature-dependent voltage and a second temperature-dependent voltage. The analog to digital converter converts a voltage difference between the first temperature-dependent voltage and the second temperature-dependent voltage to generate a first bit stream. The processor generates a second bit stream based on a thermal coefficient, wherein the thermal coefficient is used to calibrate the thermal sensor circuit. The processor further tunes the thermal coefficient until the output bit stream is equivalent to a bit stream of a reference model. The divider circuit divides the first bit stream by a denominator value to generate an output bit stream, wherein the denominator value is determined according to a bit value of the second bit stream.

A thermal sensor circuit that includes a temperature sensing circuit, an analog to digital converter, a processor and a divider circuit. The temperature sensing circuit generates a first temperature-dependent voltage and a second temperature-dependent voltage. The analog to digital converter converts a voltage difference between the first temperature-dependent voltage and the second temperature-dependent voltage to generate a first bit stream. The processor generates a second bit stream based on a thermal coefficient, wherein the thermal coefficient is used to calibrate the thermal sensor circuit. The processor further tunes the thermal coefficient until the output bit stream is equivalent to a bit stream of a reference model. The divider circuit divides the first bit stream by a denominator value to generate an output bit stream, wherein the denominator value is determined according to a bit value of the second bit stream.

A device is presented for use in controlling the quality of a perishable object, while progressing on its supply line, by monitoring the condition of a time-temperature indicator (TTI) associated with the object. The device comprises a sensing assembly for detecting a response of the TTI to a predetermined stimulus and generating measured data representative thereof, said measured data being indicative of the condition of the TTI, thereby enabling the determination of the remaining shelf life of the TTI and thereby any perishable good to which it is attached and calibrated.

An optical fiber temperature distribution measuring device includes: an optical fiber as a sensor; a calculation control unit for measuring a temperature distribution along the optical fiber by using backward Raman scattered light from the optical fiber; a far-end-position dispersion characteristic calculation unit for obtaining a dispersion characteristic of the optical fiber at a far-end position thereof; a per-unit-length dispersion characteristic calculation unit for obtaining a per-unit-length dispersion characteristic of the optical fiber based on the dispersion characteristic of the optical fiber at the far-end position thereof; and a correction parameter calculation unit for calculating a correction parameter for correcting a dispersion characteristic of the optical fiber based on a dispersion characteristic at each of different positions along the optical fiber.

Apparatuses are presented. The apparatus includes a sensor configured with an adjustable accuracy setting to measure a physical parameter and a controller configured to adjust the accuracy setting based on a threshold, and to adjust the threshold based on the physical parameter measured by the sensor. Another apparatus includes a sensor configured with a plurality of sensor accuracy settings to measure a physical parameter of a circuit in a plurality of operating regions. The plurality of operating regions is based on ranges of the physical parameter measured by the sensor. Each of the plurality of sensor accuracy settings corresponds to one of the plurality of operating regions. A controller is configured to adjust one of the ranges of the physical parameter for one of the plurality of operating regions, in response to a change of an operating condition of the circuit.

A semiconductor device includes first and second electrode pads for externally connecting two electrodes of a sensor capacitor that has a capacitance that changes according to an environmental change. The semiconductor device further includes a capacitor having a pair of electrodes, one of the pair of electrodes being connected to the first electrode pad, a capacitance circuit having a reference capacitance, and a determination circuit that includes first and second relay terminals. The determination circuit is configured to send a charging current from the first relay terminal to the other electrode of the capacitor and send a charging current from the second relay terminal to the capacitance circuit, and determine whether or not the size of a potential of the first relay terminal is greater than the size of a potential of the second relay terminal, thereby determining whether a capacitance of the sensor capacitor has changed or not.

A sensorless temperature sensing and control system and method uses electrical voltage and current feedback signals to monitor and control the temperature of heating elements used in a heat sealing process wherein sensors are not physically connected to a heat seal bar during the heat sealing process. After calibration of a heat seal bar using a sensor, voltage and current feedback signals are processed by a programmable logic controller (PLC) to calculate the real-time electrical resistance of each heating element. Data and electrical resistance is used to calculate real-time temperature of the heat seal bar during heating.