A method for the measurement of temperature in high temperature and high pressure processes includes the steps of providing at least a first material compound and at least a second material compound. The at least first and second compounds are mixed to form a material sample. The material sample is loaded into a device and the device and material sample are subjected to a high pressure of up to about 10 GPa and a high temperature of up to about 1700 C. to form the material sample into a solid crystalline solution. The material sample is recovered for analysis and the composition of the crystalline solid solution is measured to determine the temperature.

According to one embodiment, there is provided a semiconductor device including a temperature detection circuit and a test circuit. The temperature detection circuit is configured to detect a temperature by comparing potential of a reference block and reference potential. The test circuit is configured to test, in a test mode, an operation of the temperature detection circuit by serially switching a value of the reference potential to a value selected from a plurality of values, which is different from each other, while a temperature of the semiconductor device is kept at a first temperature.

A method for calibrating a measuring apparatus includes measuring a set of measured values for products including one or more measured variables. A first set of calibration parameters is determined having one or more weights for one or more of the products. The one or more products is grouped within a first product family. Some of the products in the first product family comprise an equal weight. At least a second set of calibration parameters is determined where one or more sets of additional weights are determined within the first product family. Products with equal weights are grouped into a sub product family within the first product family. Weights for the products outside of the first product family are determined and products with equal weights are grouped into another product family until all weights are determined.

A method for calibrating a measuring apparatus includes measuring a set of measured values for products including one or more measured variables. A first set of calibration parameters is determined having one or more weights for one or more of the products. The one or more products is grouped within a first product family. Some of the products in the first product family comprise an equal weight. At least a second set of calibration parameters is determined where one or more sets of additional weights are determined within the first product family. Products with equal weights are grouped into a sub product family within the first product family. Weights for the products outside of the first product family are determined and products with equal weights are grouped into another product family until all weights are determined.

Apparatus and methods are provided for providing flexible and repairable testing capabilities for systems that generate or absorb heat such as energy storage systems. One embodiment can include a temperature bath structure adapted to contain and maintain a fluid bath at a predetermined temperature, an outer containment structure adapted to insert into the temperature bath structure, heat sinks, thermal sensor assemblies, and an internal containment structure where the thermal sensor assemblies and heat sinks removably attach to different sections of the inner containment structure so as to measure heat flow into or out of the inner containment structure's different sections. Embodiments of the invention enable rapid insertion/removal of samples as well as replacement of sections of the system including embodiments or parts of thermal sensor assemblies as well as enabling separate thermal measurements associated with different sections of a sample under test within the inner containment structure.

Apparatus and methods are provided for providing flexible and repairable testing capabilities for systems that generate or absorb heat such as energy storage systems. One embodiment can include a temperature bath structure adapted to contain and maintain a fluid bath at a predetermined temperature, an outer containment structure adapted to insert into the temperature bath structure, heat sinks, thermal sensor assemblies, and an internal containment structure where the thermal sensor assemblies and heat sinks removably attach to different sections of the inner containment structure so as to measure heat flow into or out of the inner containment structure's different sections. Embodiments of the invention enable rapid insertion/removal of samples as well as replacement of sections of the system including embodiments or parts of thermal sensor assemblies as well as enabling separate thermal measurements associated with different sections of a sample under test within the inner containment structure.

A circuit includes a controller configured to determine a calibration state of a circuit, to determine an active mode state of the circuit, and to select a type of calibration operation based on the calibration state. The controller is configured to control timing of the selected type of calibration operation in response to determining the calibration state to correspond to a time when the circuit is not active.

A method for calibrating a measuring device in a mobile terminal includes: during a first calibration period, measuring first and second values at the first and second temperature sensors, respectively; during a second calibration period, measuring energy consumption values of the mobile terminal; generating first maximum, first minimum, and first temperature values from the first measured values; generating second maximum, second minimum, and second temperature values from the second measured values; generating a third maximum value from the measured energy consumption values; and storing the first and second temperature values for the calibration if the difference between the first maximum and minimum values and the difference between the second maximum and minimum values are smaller than a threshold value, and the third maximum value is smaller than a further threshold value.

A system and method for detecting an erratic state of a monitored sensor includes generating a variation value for a monitored signal generated by a monitored sensor and a variation value for an estimated signal estimated based on a predictive signal generated by predictive sensor, where the predictive signal is predictive of the monitored signal. The monitored signal can rapidly fluctuate based on system operating conditions. A dynamic threshold value is generated based on the estimated variation value, and the monitored signal is compared with the dynamic threshold value to determine if the monitored signal is in an erratic state. The detection method is sufficiently sensitive to distinguish between rapid fluctuation of the monitored sensor and an erratic state.

A system and method for detecting an erratic state of a monitored sensor includes generating a variation value for a monitored signal generated by a monitored sensor and a variation value for an estimated signal estimated based on a predictive signal generated by predictive sensor, where the predictive signal is predictive of the monitored signal. The monitored signal can rapidly fluctuate based on system operating conditions. A dynamic threshold value is generated based on the estimated variation value, and the monitored signal is compared with the dynamic threshold value to determine if the monitored signal is in an erratic state. The detection method is sufficiently sensitive to distinguish between rapid fluctuation of the monitored sensor and an erratic state.