Embodiments of a temperature sensing apparatus are disclosed. The apparatus may include a voltage generator and circuitry. The voltage generator may generate a first voltage level and a second voltage level dependent on an operating temperature. In response to a given change in the operating temperature, the first and second voltage levels may change, with the second voltage level changing by a different amount than the first voltage level. The voltage generator may generate a third voltage level. The circuitry may measure the first voltage level, the second voltage level, and the third voltage level, and may calculate the operating temperature dependent on a ratio of a difference between the first voltage level and the second voltage level and the third voltage level.

The internal temperate of a transistor is determined by detecting a voltage though a terminal of an integrated circuit that is also used by an overcurrent detection circuit of the integrated circuit for detecting an overcurrent condition of the system. The overcurrent detection circuit is coupled to a current electrode of the transistor through the terminal of the integrated circuit. A determination of internal temperature is based on a voltage measurement taken from the terminal during an on phase of the transistor. The voltage measurement is converted to a digital value and is used to determine an internal temperature of the transistor.

A temperature sensor includes a sensing element and a load. Multiple different currents pass through the sensing element in a sequential manner. Based on each current that passes through the sensing element, the sensing element outputs a complementary-to-absolute-temperature (CTAT) voltage and another current. Further, the currents that pass through the sensing element and the currents that the sensing element output separately pass through the load and result in the generation of multiple load voltages across the load. A current density ratio of the temperature sensor is determined based on the load voltages generated across the load. Further, a temperature value indicative of a temperature sensed by the temperature sensor is generated based on the current density ratio and the CTAT voltages outputted by the sensing element based on the different currents that pass therethrough.

The present invention provides a semiconductor device having a sensor capable of improving precision while suppressing increase in occupation area. A semiconductor device has: a first counter; and a second counter (time measuring circuit) measuring time until a count value, which is obtained by counting a first signal having a frequency corresponding to a first voltage, reaches a largest count value which can be counted by the first counter. The first counter obtains a piece of digital information corresponding to the first voltage on the basis of a count value obtained by counting a second signal having a frequency corresponding to a second voltage, which is different from the first voltage, on the basis of the time measured by the time measuring circuit.

A temperature-to-digital converter includes a temperature sensor circuit, an analog-to-digital converter (ADC), and a digital processing circuit. The temperature sensor circuit is configured to generate first and second complementary-to-absolute-temperature (CTAT) voltages based on a sensed absolute temperature. The ADC is configured to receive the first and second CTAT voltages. Further, during first and second conversion cycles of the ADC, the ADC is configured to receive the first and second CTAT voltages, and generate first and second digital voltages, respectively. The first and second digital voltages are generated based on the first and second CTAT voltages, respectively, and a difference between the first and second CTAT voltages. The digital processing circuit is configured to generate, based on the first and second digital voltages, a temperature output voltage that is independent of a gain of the ADC and a digital representation of the absolute temperature.

A temperature detecting apparatus includes a thermistor; a resistor connected in series to the thermistor: a temperature detector connected to a first node between the thermistor and the resistor; and a switch circuit including a first switch, a second switch, a third switch, and a fourth switch. The first switch and the third switch are connected in series, the second switch and the fourth switch are connected in series, the first switch and the second switch are connected to a power side, the third switch and the fourth switch are connected to a ground side, the thermistor is connected to a second node between the first switch and the third switch, and the resistor is connected to a third node between the second switch and the fourth switch.

An on-chip temperature sensor for generating a digital output signal representing a temperature value includes: a proportional to absolute temperature (PTAT) buffer for alternately generating a first voltage signal representing a first temperature of the PTAT buffer and a second voltage signal representing a second temperature of the PTAT buffer; an analog to digital (A/D) converter, coupled to the PTAT buffer, for converting the first voltage signal to a first digital voltage signal and for converting the second voltage signal to a second digital voltage signal; and a digital output generating block, for receiving the first digital voltage signal and the second digital voltage signal, and comparing a difference between the first digital voltage signal and the second digital voltage signal with a digital voltage reference signal to generate the digital output signal.

Methods and devices are provided for circuits. One device includes an adjustment circuit having an adjustable resistor for modifying a resistance value of a resistive device, the adjustment circuit connected to an adjustment terminal of the resistive device. The resistance value of the adjustable resistor changes, when a voltage or charge on the adjustment terminal of the adjustable resistor is changed. The adjustable resistor is a phase change element with an adjusting terminal to which different voltage values are applied for adjusting a conversion device threshold value.

A sensor for sensing a parameter includes a capacitor, a switch and a comparator. The capacitor is configured to be charged or discharged by at least one of a first current signal or a second current signal. The switch is configured to selectively connect or disconnect the first current signal and the capacitor in response to a feedback signal. The comparator is coupled with the capacitor and configured to output an output voltage based on a comparison of a capacitor voltage of the capacitor to a reference voltage. The first current signal is independent of the parameter, and the second current signal is dependent on the parameter. The output voltage defines the feedback signal and is indicative of a value of the parameter detected by the sensor.

An integrated circuit counter includes a segmented thermometer coding counter architecture that reaches the thermodynamic energy minimum for a forward/reverse counting operation, requiring only one write or one erase operation per count so that energy consumption can be minimized, and circuit endurance maximized.