A device, which includes an input, configured to read in an analog signal, an analog/digital converter, configured to convert the analog signal into a digital value, and a processor, configured to determine a digital measured value. The processor is further configured to derive a calibrated digital value from the digital value with the aid of a linear calibration function and to derive the digital measured value from the calibrated digital value with the aid of a nonlinear measurement function. The processor modifies the linear calibration function in response to a calibration signal, based on an algorithm, which is based on the nonlinear measurement function, and a number of predefined comparison measured values.

A temperature sensing circuit a switched capacitor circuit selectively samples ΔVbe and Vbe voltages and provides the sampled voltages to inputs of an integrator. A quantization circuit quantizes outputs of the integrator to produce a bitstream. When a most recent bit of the bitstream is a logic zero, operation includes sampling and integration of ΔVbe a first given number of times to produce a voltage proportional to absolute temperature. When the most recent bit of the bitstream is a logic one, operation includes cause sampling and integration of Vbe a second given number of times to produce a voltage complementary to absolute temperature. A low pass filter and decimator filters and decimates the bitstream produced by the quantization circuit to produce a signal indicative of a temperature of a chip into which the temperature sensing circuit is placed.

An abnormal temperature detection device includes a temperature acquirer configured to acquire temperature data; a preprocessor configured to perform preprocessing of calculating a feature amount of the temperature data; a synthesizer configured to perform synthesis processing of synthesizing the feature amount and past determination information indicating whether the temperature data acquired in the past is normal or abnormal; a learner configured to generate an identification model by performing machine learning on a result of synthesis by the synthesizer; and a determiner configured to determine whether temperature data for detection which is acquired by the temperature acquirer, and on which the preprocessing is performed by the preprocessor and the synthesis processing is performed by the synthesizer, is normal or abnormal by using the identification model.

An apparatus for digitizing an optical signal comprises: an optical detector to detect an optical signal and to generate an electric signal corresponding to the optical signal; an envelope curve detector to determine the amplitude of the electric signal or a modified electric signal resulting from the electric signal, and to supply an amplitude signal corresponding to the amplitude; an analog to digital converter to digitize the amplitude signal and to supply a corresponding digitized amplitude signal; and a variable voltage source to calibrate the envelope curve detector.

Disclosed are a CMOS temperature sensor for measuring a temperature and an operating method thereof. According to an embodiment, the CMOS temperature sensor for measuring the temperature may include a readout circuit that outputs a readout value by comparing a voltage value at a first end of a capacitor charging a charge based on a proportional current proportional to a temperature with an inverse proportional voltage inversely proportional to the temperature or comparing a voltage value at a second end of the capacitor formed at the other side of the first end with a ground voltage; and a control unit that determines a temperature based on an oscillation period of the readout value output from the readout circuit.

A temperature sensor includes a first selection circuit outputting one among temperature signals in response to a selection code. A reference voltage generator generates a reference voltage. A control circuit generates a control signal. A second selection circuit outputs the reference voltage and the temperature signal in response to the control signal indicating a voltage conversion condition is satisfied and outputs only the temperature signal in response to the control signal indicating the voltage conversion condition is not satisfied. A converter converts the reference voltage to a voltage digital code and the temperature signal to a temperature digital code in response to the control signal indicating the voltage conversion condition is satisfied and converts only the temperature signal to the temperature digital code in response to the control signal indicating the voltage conversion condition is not satisfied.

A circuit includes a first input terminal, a second input terminal, a third input terminal and an output terminal. A first summation node adds signals at the first and third input terminals. A second summation node subtracts signals at the second and third input terminals. A selector selects between the added signals and subtracted signals in response to a selection signal. The output of the selector is integrated to generate an integrated signal. The integrated signal is compared by a comparator to a threshold, the comparator generating an output signal at the output terminal having a first level and a second level. Feedback of the output signal produces the selection signal causing the selector to select the added signals in response to the first level of the output signal and causing the selector to select the subtracted signals in response to the second level of the output signal.

The present invention relates to integrated circuits. More specifically, embodiments of the present invention provide methods and systems for determining temperatures of an integrated circuit using an one-point calibration technique, where temperature is determined by a single temperature measurement and calculation using known electrical characteristics of the integrated circuit.

The internal temperate of a transistor is determined by detecting a voltage though a terminal of an integrated circuit that is also used by an overcurrent detection circuit of the integrated circuit for detecting an overcurrent condition of the system. The overcurrent detection circuit is coupled to a current electrode of the transistor through the terminal of the integrated circuit. A determination of internal temperature is based on a voltage measurement taken from the terminal during an on phase of the transistor. The voltage measurement is converted to a digital value and is used to determine an internal temperature of the transistor.

An on-chip temperature sensor for generating a digital output signal representing a temperature value includes: a proportional to absolute temperature (PTAT) buffer for alternately generating a first voltage signal representing a first temperature of the PTAT buffer and a second voltage signal representing a second temperature of the PTAT buffer; an analog to digital (A/D) converter, coupled to the PTAT buffer, for converting the first voltage signal to a first digital voltage signal and for converting the second voltage signal to a second digital voltage signal; and a digital output generating block, for receiving the first digital voltage signal and the second digital voltage signal, and comparing a difference between the first digital voltage signal and the second digital voltage signal with a digital voltage reference signal to generate the digital output signal.