Patent classifications
G01K2219/00
REMOTE TEMPERATURE SENSING WITH LOAD-LINE
A controller for a power converter includes an output terminal operative to output a modulation signal for controlling a phase current of the power converter. A modulator is operative to generate the modulation signal such that an output voltage of the power converter follows a first portion of a load-line when load current is above a first threshold, the first portion of the load-line having a first slope that determines a rate of change of the output voltage as a function of the load current. An interface is operative to receive a temperature signal. Circuitry is operative to change the first threshold in response to receipt of the temperature signal.
Temperature sensing device of integrated circuit
The invention provides a temperature sensing device of an integrated circuit. The integrated circuit includes a plurality of stacked metal wire layers, and the temperature sensing device includes a first metal sheet, a first via and a second via. The first metal sheet is disposed between the first metal wire layer and the second metal wire layer of the metal wire layers. The first via and the second via are used to connect the first metal sheet and the first metal wire layer, wherein a temperature sensing signal enters the first metal sheet through the first via and leaves the first metal sheet through the second via to measure the temperature of the integrated circuit.
Temperature sensing device and temperature sensing method
A temperature sensing device and a temperature sensing method are provided. The temperature sensing device includes a sensor and an analog-to-digital converter. The sensor generates a first sensing result corresponding to an ambient temperature based on a first condition and generates a second sensing result corresponding to the ambient temperature based on a second condition. The second sensing result is different from the first sensing result. The analog-to-digital divides the first sensing result and the second sensing result to obtain a quotient value and generates an output digital code value corresponding to the ambient temperature according to the quotient value.
TEMPERATURE SENSOR, LASER CIRCUIT, LIGHT DETECTION AND RANGING SYSTEM AND METHOD
In one embodiment a temperature sensor has a first sensing unit operable to provide a first pseudo-differential unipolar analog signal representing a first temperature value of a power unit, an interface circuit operable to provide a second pseudo-differential unipolar analog signal representing a second temperature value of a powered unit, a multiplexer circuit which is operable to provide a pseudo-differential unipolar multiplexed analog signal comprising the first analog signal or the second analog signal, and a first analog-to-digital converter, ADC, component operable to provide a first digital signal from the multiplexed analog signal, the first digital signal comprising a digital representation of the first analog signal or the second analog signal. Therein, the operation of the first ADC component is synchronized with a control signal designed for activating the power unit.
Measuring apparatus and physical characteristic measuring device
A measuring apparatus and a physical characteristic measuring device are provided. The measuring apparatus includes at least one first physical characteristic measuring device and a data processing device. The first physical characteristic measuring device includes a sensor, a signal processing circuit, and a transmission path. The sensor generates a measurement signal according to the physical characteristics of a location where the first physical characteristic measuring device is located. The signal processing circuit converts the measurement signal into a first processed signal. The transmission path is able to be electrically connected to a second physical characteristic measuring device. The transmission path passes a second processed signal of the second physical characteristic measuring device to the data processing device in response to the first physical characteristic measuring device and the second physical characteristic measuring device being electrically connected to each other.
Semiconductor device and resistance measurement system
A semiconductor device includes first and second terminals, a reference resister being coupled between the first and second terminals, third and fourth terminals, a sensor resister being coupled between the third and fourth terminals, a first buffer which supplies a first reference voltage to the first terminal, a second buffer which supplies a second reference voltage to the fourth terminal, a reference voltage generation circuit which supplies one of first and second voltages alternately in a time division manner as the first reference voltage and supplies the other as the second reference voltage, a first analog-to-digital conversion circuit which performs analog-to-digital conversion on a signal line coupled to the third terminal, an RC filter disposed on the signal line, a noise detector which detects noise of the signal line, wherein a time constant of the RC filter is changed based on a result of the noise detector.
TEMPERATURE-TO-DIGITAL CONVERTER
A temperature-to-digital converter includes a temperature sensor circuit, an analog-to-digital converter (ADC), and a digital processing circuit. The temperature sensor circuit is configured to generate first and second complementary-to-absolute-temperature (CTAT) voltages based on a sensed absolute temperature. The ADC is configured to receive the first and second CTAT voltages. Further, during first and second conversion cycles of the ADC, the ADC is configured to receive the first and second CTAT voltages, and generate first and second digital voltages, respectively. The first and second digital voltages are generated based on the first and second CTAT voltages, respectively, and a difference between the first and second CTAT voltages. The digital processing circuit is configured to generate, based on the first and second digital voltages, a temperature output voltage that is independent of a gain of the ADC and a digital representation of the absolute temperature.
Method and circuit for temperature sensing, temperature sensor and electrical appliance
In an embodiment a method includes providing an analog signal having a first value of a temperature of an object, performing an analog-to-digital conversion of the analog signal using a first analog-to-digital converter (ADC) thereby providing a first digital signal representing an initial digital temperature value, performing an analog-to-digital conversion of the analog signal using a second ADC thereby providing a second digital signal representing a digital reference temperature value, regularly providing the analog signal having a successive value of the temperature of the object, performing the analog-to-digital conversion of the analog signal using the second ADC thereby providing the second digital signal representing a successive digital temperature value, calculating a digital delta temperature value according to a difference between the successive digital temperature value and the digital reference temperature value and repeating portions of the method as long as the digital delta temperature value lies within a predefined range.
Temperature measuring device and method for measuring temperature
A temperature measuring device includes first and second semiconductor elements each of which has a p-n junction, a transistor group including a plurality of transistors of which respective sources are connected to a power source and of which respective gates are connected to each other, the plurality of transistors constituting a current source, the transistor group being configured to output a first current and a second current having a different magnitude from the first current to the first and second semiconductor elements, respectively, and a selector configured to select at least one first transistor and a plurality of second transistors different from the first transistor, from among the plurality of transistors.
IMAGING DEVICE AND CALIBRATION METHOD
An imaging device (1) according to the present disclosure includes a pixel array unit (10) that includes a pixel, an analog signal generation unit, an A/D conversion unit (23), and a switch. The analog signal generation unit generates an analog signal based on a temperature around the pixel array unit (10). The A/D conversion unit (23) converts the analog signal into a digital signal. The switch cuts off the analog signal to be supplied to the A/D conversion unit.