An abnormal temperature detection device includes a temperature acquirer configured to acquire temperature data, a preprocessor configured to perform preprocessing for calculating difference data indicating a difference sequence in the temperature data, generating substituted data in which either of a piece of difference data which is a positive number or a piece of difference data which is a negative number is substituted with zero, and calculating a similarity between the substituted data and reference data obtained from training data in which normality or abnormality has been identified, a learner configured to perform machine learning on the similarity calculated by the preprocessor and output an identification function, and a determiner configured to determine whether temperature data for detection acquired by the temperature acquirer and subjected to the preprocessing by the preprocessor is normal or abnormal by using the identification function.

The present disclosure relates to the field of biometric parameter measurement, and in particular, to a temperature measurement circuit, a temperature measurement method, a temperature and light intensity measurement circuit, a temperature and light intensity measurement method, a chip, a module, and an electronic device. A temperature signal is obtained based on an output voltage of a differential amplifier circuit when a non-inverting input terminal of the differential amplifier circuit is unload, an output voltage of the differential amplifier circuit when the non-inverting input terminal of the differential amplifier circuit is connected to a calibration resistor, and the output voltage of the differential amplifier circuit when the non-inverting input terminal of the differential amplifier circuit is connected to a thermistor, which improves the accuracy of the temperature measurement.

A temperature sensor having a two-state input current, an element whose temperature is sensed based on a change in voltage across the element induced by the two states of the input current, a charge-to-digital converter, and a capacitor continuously connected between the element and the charge-to-digital converter. The capacitor experiences a charge difference due to the change in voltage across the element induced by the two states of the input current, and the charge-to-digital converter converts the charge difference to a digital value indicative of the temperature of the element. A two-state DC-shifting current having opposite polarity of the two-state input current, a pull-down resistor whose voltage varies with the two-states of the DC-shifting current, and a second capacitor continuously connected between the pull-down resistor and the charge-to-digital converter operate to shift down a DC operating point of the charge-to-voltage converter to increase its dynamic range.

The invention provides a temperature sensing device of an integrated circuit. The integrated circuit includes a plurality of stacked metal wire layers, and the temperature sensing device includes a first metal sheet, a first via and a second via. The first metal sheet is disposed between the first metal wire layer and the second metal wire layer of the metal wire layers. The first via and the second via are used to connect the first metal sheet and the first metal wire layer, wherein a temperature sensing signal enters the first metal sheet through the first via and leaves the first metal sheet through the second via to measure the temperature of the integrated circuit.

The digital temperature sensing circuit includes a temperature voltage generator configured to generate a temperature voltage varying with a temperature in response to a first reference voltage, divide a supply voltage in response to a second reference voltage, and generate a high voltage and a low voltage, a code voltage generator configured to divide the second reference voltage based on the high voltage and the low voltage and output divided voltages having different voltage levels, and a mode selector supplied with the temperature voltage and the divided voltages, and configured to output a first code or a second code in response to a mode select signal, wherein the first code and the second code have different numbers of bits.

A semiconductor device includes first and second terminals, a reference resister being coupled between the first and second terminals, third and fourth terminals, a sensor resister being coupled between the third and fourth terminals, a first buffer which supplies a first reference voltage to the first terminal, a second buffer which supplies a second reference voltage to the fourth terminal, a reference voltage generation circuit which supplies one of first and second voltages alternately in a time division manner as the first reference voltage and supplies the other as the second reference voltage, a first analog-to-digital conversion circuit which performs analog-to-digital conversion on a signal line coupled to the third terminal, an RC filter disposed on the signal line, a noise detector which detects noise of the signal line, wherein a time constant of the RC filter is changed based on a result of the noise detector.

Devices, methods, systems, and computer-readable media for a dynamic temperature sensor are described herein. One or more embodiments include a device, comprising: a controller that includes a variable voltage output coupled to a sensor, wherein the controller provides a voltage segment to the sensor based on a signal of the sensor received at the controller.

An apparatus comprises: a first circuitry to charge first and second capacitors to a predetermined voltage level; a second circuitry to discharge the first capacitor through a diode at a first time; a third circuitry to discharge the second capacitor through the diode at a second time, wherein the second time is greater than the first time; a comparator to compare a first voltage of the first capacitor with a second voltage of the second capacitor; and logic to adjust a scaling factor applied to the second voltage according to an output of the comparator.

A resampling circuit converts first data updated synchronously with a first clock signal into second data updated synchronously with a second clock signal asynchronous with the first clock signal and outputs the second data. The resampling circuit measures a first time interval between a plurality of successive edges of the first clock signal, and a second time interval between one of the plurality of edges of the first clock signal and an edge of the second clock signal, with a third clock signal having a higher frequency than the first clock signal and the second clock signal. The resampling circuit calculates and outputs the second data updated at the edge of the second clock signal, based on the first time interval and the second time interval, and a plurality of the first data updated at the plurality of edges of the first clock signal.

The digital temperature sensing circuit includes a temperature voltage generator configured to generate a temperature voltage varying with a temperature in response to a first reference voltage, divide a supply voltage in response to a second reference voltage, and generate a high voltage and a low voltage, a code voltage generator configured to divide the second reference voltage based on the high voltage and the low voltage and output divided voltages having different voltage levels, and a mode selector supplied with the temperature voltage and the divided voltages, and configured to output a first code or a second code in response to a mode select signal, wherein the first code and the second code have different numbers of bits.