Methods for modifying multi-mode optical fiber manufacturing processes are disclosed. In one embodiment, a method for modifying a process for manufacturing multi-mode optical fiber includes measuring at least one characteristic of a multi-mode optical fiber. The at least one characteristic is a modal bandwidth or a differential mode delay at one or more wavelengths. The method further includes determining a measured peak wavelength of the multi-mode optical fiber based on the measured characteristic, determining a difference between the target peak wavelength and the measured peak wavelength, and modifying the process for manufacturing multi-mode optical fiber based on the difference between the target peak wavelength and the measured peak wavelength.

Electrical test of optical components via metal-insulator-semiconductor capacitor structures is provided via a plurality of optical devices including a first material embedded in a second material, wherein each optical device is associated with a different thickness range of a plurality of thickness ranges for the first material; a first capacitance measurement point including the first material embedded in the second material; and a second capacitance measurement point including a region from which the first material has been replaced with the second material.

There is provided herein a solution for measuring the optical power loss of duplex optical-fiber devices under test, and particularly those terminated with a duplex connector interface, which allows for a one-cord or one-cord equivalent testing method whichever the format of the duplex connector interface of the optical-fiber device under test, and this without disconnecting the optical fibers of the device under test from their duplex native connector interface. There is provided an optical-fiber expansion device to be used to interconnect and adapt a power meter instrument to a variety of duplex connectors. The proposed optical-fiber expansion device comprises a pair of optical fibers having a core diameter and a numerical aperture that are greater than those of the optical fiber in the DUT connector interface, so as to make it compatible with the one-cord testing method. Interchangeable optical-fiber expansion devices can be used to match the power meter interface on one side, to various duplex connector interfaces under test on the other side.

In some examples, optical fiber identification and distance measurement may include utilizing a reflectometer and optical fiber connection device that includes a Rayleigh wavelength pass filter to pass, in one direction, an optical reflectometer signal to an optical fiber. The reflectometer and optical fiber connection device may include a Raman wavelength pass filter to filter out, in another direction, Rayleigh backscattering from the optical reflectometer signal. Further, the Raman wavelength pass filter may pass, in the another direction, a Raman Anti-Stokes signal from the optical fiber.

A high-speed signal subsystem testing system includes a processing system having a transmitter and a receiver, a loop back subsystem coupled to the transmitter and receiver to provide a testing communication path between the transmitter and the receiver, and a communication path testing engine coupled to the transmitter and the receiver. The communication path testing engine generates test signal(s) and transmits the test signal(s) via the transmitter and through the testing communication path provided by the loop back subsystem and, in response, receives test signal result(s) via the receiver and through the testing communication path provided by the loop back subsystem, The communication path testing engine processes the test signal result(s) to generate a testing impedance profile for the testing communication path, and compares the testing impedance profile to an expected impedance profile to determine whether a testing communication path issue exists in the testing communication path.

An optoelectronic chip includes optical inputs having different passbands, a photonic circuit to be tested, and an optical coupling device configured to couple said inputs to the photonic circuit to be tested.

An optoelectronic chip includes optical inputs having different passbands, a photonic circuit to be tested, and an optical coupling device configured to couple said inputs to the photonic circuit to be tested.

The present disclosure is directed to enabling detection of microbending even in a case where a microbending loss varies.

The present disclosure relates to a device that measures a transmission loss in a measured optical fiber to be targeted, and detects microbending in the measured optical fiber based on periodicity of the transmission loss.

The purpose of the present invention is to provide an optical fiber evaluation equipment and an optical fiber evaluation method that evaluate the center of a cladding of an MCF and a deviation of the center of each core of the MCF from a design value with ease and high accuracy.

The optical fiber evaluation equipment according to the present invention approximates the outside diameter of a cladding by a circle, based on a cross-sectional image of an MCF, and determines the center of the circle as the center of the cladding. In addition, the optical fiber evaluation equipment according to the present invention obtains the center coordinates of cores with an origin at the center of the circle, rotates the cross-sectional image so as to minimize a difference between the center coordinates and design coordinates of each core, and derives the minimum value thereof as the amount of deviation of the center of each core.

An optical probe includes: an optical fiber; a reflecting portion; and a traveling direction changing portion changing a traveling direction of a laser beam of a first wavelength that has transmitted through the reflecting portion to a direction different from a traveling direction before transmitting through the reflecting portion. Further, the traveling direction changing portion is configured by a bending structure having a structure in which a portion on a distal end side of the optical fiber is bent, and the reflecting portion is provided closer to a proximal end side of the optical fiber than the bending structure.