G01N17/00

THINNING DETECTION SYSTEM AND THINNING DETECTION METHOD

A thinning detection system includes a current applying apparatus configured to apply an AC current to electrodes installed on metal equipment which is a monitoring object, a magnetic-field measuring apparatus including an array of magnetic sensors configured to measure a magnetic field distribution of a surface side of the metal equipment; and a measurement managing apparatus configured to estimate a thinning distribution of the metal equipment based on a magnetic field distribution difference which is a difference between a reference magnetic-field distribution which is obtained in a case where thinning has not occurred in the metal equipment and a measurement magnetic-field distribution which is an actual measurement result. The measurement managing apparatus calculates a virtual current distribution of the metal equipment from the magnetic field distribution difference, and estimates the thinning distribution of the metal equipment on the basis of a virtual eddy current represented by the virtual current distribution.

Apparatus for preventing deformation of communication card
09798365 · 2017-10-24 · ·

An apparatus for preventing deformation of a communication card includes a card holder configured to install a communication card; a temperature control component that is located on one side of the card holder and connected to a power supply configured to perform cooling or heating; a temperature sensor configured to collect temperature of the card holder; and the power supply configured to generate a supply current according to the temperature collected by the temperature sensor to supply power to the temperature control component, so that the temperature control component performs cooling or heating to maintain the temperature of the card holder within a preset temperature range, and the communication card is not deformed when the communication card is in the card holder and within the preset temperature range.

Semiconductor element and sensing device having a light emitting unit and a sensor unit

A semiconductor device disclosed in an embodiment comprises: a light emitting unit comprising a light emitting structure layer which has a first conductivity type semiconductor layer, a second conductivity type semiconductor layer, and an active layer between the first conductivity type semiconductor layer and the second conductivity type semiconductor layer; and a sensor unit disposed on the light emitting unit, wherein the sensor unit comprises: a sensing material changing in resistance with light emitted by the light emitting unit; a first sensor electrode comprising a first pad portion and a first extension part extending from the first pad portion and contacting the sensing material; and a second sensor electrode comprising a first pad portion and a second extension part extending toward the first extension part from the second pad portion and contacting the sensing material. The sensor unit senses an external gas in response to the light generated from the light emitting unit.

Environmental chamber control unit

A control unit is added to the environmental tester including a thermostat-humidistat container, an air conditioner, a first temperature and humidity sensor for measuring temperature and humidity in the thermostat-humidistat container, a controller for receiving a first signal from the first temperature and humidity sensor to control the air conditioner. The control unit includes a second temperature and humidity sensor configured to measure the temperature and humidity distribution in the thermostat-humidistat container, and an additional unit configured to receive the first signal and set values for the temperature and the humidity from the controller, and receive a second signal from the second temperature and humidity sensor, compute a correction value from the received first signal, second signal, and set values, and send the correction value to the controller.

Sensor arrangement with multiple sensors for weathering apparatus

The sensor device (100) has a sensor housing (110), to which at least two sensors from a group consisting of a black standard sensor (120), a UV radiation sensor (130), an air temperature sensor and a humidity sensor are connected.

Cooling water monitoring and control system

A method of controlling cooling water treatment may involve measuring operating data of one or more downstream heat exchangers that receive cooling water from the cooling tower. For example, the inlet and outlet temperatures of both the hot and cold streams of a downstream heat exchanger may be measured. Data from the streams passing through the heat exchanger may be used to determine a heat transfer efficiency for the heat exchanger. The heat transfer efficiency can be trended over a period of time and changes in the trend detected to identify cooling waterfouling issues. Multiple potential causes of the perceived fouling issues can be evaluated to determine a predicted cause. A chemical additive selected to reduce, eliminate, or otherwise control the cooling water fouling can be controlled based on the predicted cause of the fouling.

REMAINING LIFE ESTIMATION METHOD FOR ESTIMATING REMAINING LIFE OF HIGH-CHROMIUM STEEL PIPE
20170292906 · 2017-10-12 · ·

An aspect of the present disclosure is to precisely define a constant value used in the Monkman-Grant analysis, when estimating remaining life of a high-chromium steel pipe through which high-temperature and high-pressure fluid is allowed to flow. A remaining life estimation method according to the present disclosure is particularly characterized in that a step of obtaining a constant on an accelerated creep test is performed in which a constant indicative of the product of a strain rate and a rupture time in the Monkman-Grant analysis is obtained by multiplying a first coefficient to transform uniaxial rupture ductility into multiaxial rupture ductility, the uniaxial rupture ductility being obtained from a specimen of the high-chromium steel pipe, a second coefficient to amend consumed life of the specimen, and a third coefficient to amend a measured pressure into an assessment pressure.

APPARATUS FOR DETECTING CORROSION IN AN ARTICLE

A system and method of detecting, quantifying, and characterizing corrosion and degradation of an article, includes receiving signals indicative of a stack of images of a surface of the article; determining depth and nature of features in the stack of images; generating a surface model of the article in response to the determination of the depth and the nature of features; determining features of interest from the surface model; comparing the features of interest with predetermined information on the article; and characterizing the article as corroded or degraded in response to the comparisons of the features of interest.

Method for measuring spreading resistance and spreading resistance microscope

A method includes: removing at least a part of an oxide formed on a surface of the sample by relatively scanning the surface of the sample in X and Y directions parallel to the surface while bringing a probe into contact with the surface of the sample; detecting a signal by bringing the probe into contact with the surface of the sample from which at least a part of the oxide is removed at a predetermined detection position in the X direction or the Y direction while a bias voltage is applied to the sample; calculating a spreading resistance value based on the signal; and retracting the probe to keep the probe relatively away from the surface in a Z direction perpendicular to the surface while relatively moving the probe to a next detection position to start scanning the sample from the next detection position.

Method for measuring spreading resistance and spreading resistance microscope

A method includes: removing at least a part of an oxide formed on a surface of the sample by relatively scanning the surface of the sample in X and Y directions parallel to the surface while bringing a probe into contact with the surface of the sample; detecting a signal by bringing the probe into contact with the surface of the sample from which at least a part of the oxide is removed at a predetermined detection position in the X direction or the Y direction while a bias voltage is applied to the sample; calculating a spreading resistance value based on the signal; and retracting the probe to keep the probe relatively away from the surface in a Z direction perpendicular to the surface while relatively moving the probe to a next detection position to start scanning the sample from the next detection position.