A microfluidic sensor chip includes a body comprising a substrate and an upper cover, and the upper cover having at least one opening, at least one microfluidic channel formed on the substrate and has a supporting surface, wherein the at least one microfluidic channel communicates with the at least one opening, and a metamaterial layer coated on the supporting surface, wherein the metamaterial layer has a plurality of regions, and each region has a corresponding resonance pattern. The present disclosure further provides a measuring system for microfluidic sensor chip includes a carrying board, a plurality of the microfluidic sensor chips, a transmitter emitting a terahertz wave corresponding to the resonance pattern of one of the microfluidic sensor chips, a receiver receiving a reflected wave corresponding to the terahertz wave, and a processor receiving the reflected wave from the processor, and determining a testing sample characteristic according to the reflected wave.

Disclosed is a single-ended test method for the wave-absorbing characteristic of a material. The device comprises a sample cavity, a microwave transmission rod, spring needles, an SMA joint and a vector network analyzer, wherein one end of the sample cavity is provided with a test fixture; the microwave transmission rod is arranged in the sample cavity and is connected with the test fixture in a penetrating mode; the spring needles are arranged in the microwave transmission rod; the SMA joint is arranged at the other end of the sample cavity; the receiving end of the vector network analyzer is electrically connected with a coaxial cable, and the other end of the coaxial cable is electrically connected with the other end of the SMA joint.

Disclosed is a single-ended test method for the wave-absorbing characteristic of a material. The device comprises a sample cavity, a microwave transmission rod, spring needles, an SMA joint and a vector network analyzer, wherein one end of the sample cavity is provided with a test fixture; the microwave transmission rod is arranged in the sample cavity and is connected with the test fixture in a penetrating mode; the spring needles are arranged in the microwave transmission rod; the SMA joint is arranged at the other end of the sample cavity; the receiving end of the vector network analyzer is electrically connected with a coaxial cable, and the other end of the coaxial cable is electrically connected with the other end of the SMA joint.

The disclosure provides a microwave system developed to measure properties of fluidic materials incident upon a surface using a phase response of multiple microstrip transmission lines, generally over an ultra-wideband excitation. The system can include a series of parallel planar transmission lines as waveguides that are coupled to an insulator layer and a conductor as a formed-to-fit or flexible insulator layer, an ultra-wideband RF transceiver measuring phase angle, and a processing computer. The system can directly measure electrical permittivity in the microwave frequency band. This measurement can be processed to determine the presence of a homogeneous or heterogeneous fluidic material on a surface to which the transmission lines are coupled, the presence of a phase change in the fluidic material, and potentially the presence of other fluidic materials, depending on differences in permittivity between the fluid materials. In some embodiments, a thickness of the material can be also be provided.

The disclosure provides a microwave system developed to measure properties of fluidic materials incident upon a surface using a phase response of multiple microstrip transmission lines, generally over an ultra-wideband excitation. The system can include a series of parallel planar transmission lines as waveguides that are coupled to an insulator layer and a conductor as a formed-to-fit or flexible insulator layer, an ultra-wideband RF transceiver measuring phase angle, and a processing computer. The system can directly measure electrical permittivity in the microwave frequency band. This measurement can be processed to determine the presence of a homogeneous or heterogeneous fluidic material on a surface to which the transmission lines are coupled, the presence of a phase change in the fluidic material, and potentially the presence of other fluidic materials, depending on differences in permittivity between the fluid materials. In some embodiments, a thickness of the material can be also be provided.

This water vapor observation device comprises an antenna, an RF amplifier, and processing circuitry. The antenna receives radio waves radiated from an atmosphere including water vapor. The RF amplifier amplifies the received radio waves and generates an observation signal. The processing circuitry is programmed to at least: use the observation signal to select a plurality of observation frequencies excluding an accuracy degraded frequency; and calculate a water vapor index using the spectral intensities of the plurality of observation frequencies. This configuration makes it possible to accurately observe a water vapor amount.

This water vapor observation device comprises an antenna, an RF amplifier, and processing circuitry. The antenna receives radio waves radiated from an atmosphere including water vapor. The RF amplifier amplifies the received radio waves and generates an observation signal. The processing circuitry is programmed to at least: use the observation signal to select a plurality of observation frequencies excluding an accuracy degraded frequency; and calculate a water vapor index using the spectral intensities of the plurality of observation frequencies. This configuration makes it possible to accurately observe a water vapor amount.

The present disclosure relates to a computed tomography apparatus, comprising: a first semiconductor device with a first radar transceiver IC, a second semiconductor device with a second radar transceiver IC, and at least one third semiconductor device with a third radar transceiver IC, which are arranged at different positions around a tomographical measurement region; a synchronization circuit, which is designed to provide a synchronization signal in order to operate the first, second and third radar transceiver IC as synchronized transmitters and receivers using the synchronization signal; and an evaluation circuit, which is designed to ascertain at least one characteristic of a medium located in the measurement region based on time-of-flight measurements of radar signals received from at least two receivers.

The present disclosure relates to a computed tomography apparatus, comprising: a first semiconductor device with a first radar transceiver IC, a second semiconductor device with a second radar transceiver IC, and at least one third semiconductor device with a third radar transceiver IC, which are arranged at different positions around a tomographical measurement region; a synchronization circuit, which is designed to provide a synchronization signal in order to operate the first, second and third radar transceiver IC as synchronized transmitters and receivers using the synchronization signal; and an evaluation circuit, which is designed to ascertain at least one characteristic of a medium located in the measurement region based on time-of-flight measurements of radar signals received from at least two receivers.

Low-cost devices for measuring radar transmission and/or reflectance of coated articles are provided. An exemplary low-cost radar transmission and reflection measurement device includes a radar transmitter that emits a radar signal, a radar target to which the radar signal is directed, and a radar receiver that receives the radar signal. Further, the exemplary low-cost device includes a sample holder located between the radar transmitter and the radar target and between the radar target and the radar receiver. The sample holder receives a sample including a coating. The low-cost device also includes a controller connected to the radar transmitter and radar receiver. The controller measures a radar signal loss due to the coating.