According to one embodiment, a data detection system for an X-ray CT apparatus includes a data acquisition circuit and a connection structure. The data acquisition circuit includes at least one row of X-ray detection elements arrayed in a channel direction. The data acquisition circuit is configured to acquire data required for generating X-ray CT image data corresponding to the at least one row of the X-ray detection elements. The connection structure is configured to connect the data acquisition circuit with another data acquisition circuit directly or indirectly in a row direction.

Methods and apparatus for producing and assessing at least part of an object (2), the methods comprise: performing, using Additive Manufacturing apparatus (8), an Additive Manufacturing process to produce a test specimen (30, 34, 38) and at least part of an object (2); performing, using micro-tomography apparatus (40), on the test specimen (30, 34, 38), a micro-tomography process to create a digital model (50) of the internal structure of the test specimen (30, 34, 38); determining whether or not the model (50) satisfies one or more criteria; and, if the model (50) satisfies the criteria, determining that the at least part of the object (2) produced by performing the Additive Manufacturing process is acceptable, or, if the model (50) does not satisfy the criteria, determining that the at least part of the object (2) produced by performing the Additive Manufacturing process is not acceptable.

Methods and apparatus for producing and assessing at least part of an object (2), the methods comprise: performing, using Additive Manufacturing apparatus (8), an Additive Manufacturing process to produce a test specimen (30, 34, 38) and at least part of an object (2); performing, using micro-tomography apparatus (40), on the test specimen (30, 34, 38), a micro-tomography process to create a digital model (50) of the internal structure of the test specimen (30, 34, 38); determining whether or not the model (50) satisfies one or more criteria; and, if the model (50) satisfies the criteria, determining that the at least part of the object (2) produced by performing the Additive Manufacturing process is acceptable, or, if the model (50) does not satisfy the criteria, determining that the at least part of the object (2) produced by performing the Additive Manufacturing process is not acceptable.

A system, unit, device and method are shown for providing substantially simultaneous disinfection of bacteria or other pathogens in air passing through the system using C-band ultraviolet radiation from an ultraviolet light source and that is also capable of substantially simultaneous and efficient disinfecting air and surfaces outside the device using the same ultraviolet light source.

The present invention relates to modulating an irradiation condition of a charged particle beam at high speed and detecting a signal in synchronization with a modulation period for the purpose of extracting a signal arising from a certain charged particle beam when a sample is irradiated with a plurality of charged particle beams simultaneously or, for example, for the purpose of separating a secondary electron signal arising from ion beam irradiation and a secondary electron signal arising from electron beam irradiation in an FIB-SEM system. The present invention further relates to dispersing light emitted from two or more kinds of scintillators having different light emitting properties, detecting each signal strength, and processing a signal on the basis of a ratio of first signal strength when the sample is irradiated with a first charged particle beam alone to second signal strength when the sample is irradiated with a second charged particle beam alone, the ratio being set by a mechanism. The present invention enables extraction of only a signal arising from a desired charged particle beam even when the sample is irradiated with the plurality of charged particle beams simultaneously. The SEM observation can be performed in the middle of the FIB processing using the secondary electron in the FIB-SEM system, for example.

A measurement system is provided, including a measurement machine and a computer. The measurement machine is configured to measure a thickness T1 of a to-be-tested circuit board and a drilling depth D1 of the to-be-tested circuit board. The computer calculates a length S1 of a residual conductive portion in a back drilled hole of the to-be-tested circuit board according to a thickness T of a reference circuit board, a drilling depth D of the reference circuit board, a length S of a residual conductive portion in a back drilled hole of the reference circuit board, the thickness T1 of the to-be-tested circuit board and the drilling depth D1 of the to-be-tested circuit board.

Method and systems for managing clear-down are provided. The method can include generating a clear-down trigger associated with an ion mobility spectrometer and operating the ion mobility spectrometer in fast clear-down mode in response to the clear-down trigger. Methods and systems can further provide that where the ion mobility spectrometer operates in fast-switching mode, the ion mobility spectrometer alternating a plurality of times between operation according to a positive ion mode and operation according to a negative ion mode, and further operating according to the positive ion mode for less than about 1 second before switching to the operation according to the negative ion mode, and operating according to the negative ion mode for less than about 1 second before switching to the operation according to the positive ion mode.

Method and systems for managing clear-down are provided. The method can include generating a clear-down trigger associated with an ion mobility spectrometer and operating the ion mobility spectrometer in fast clear-down mode in response to the clear-down trigger. Methods and systems can further provide that where the ion mobility spectrometer operates in fast-switching mode, the ion mobility spectrometer alternating a plurality of times between operation according to a positive ion mode and operation according to a negative ion mode, and further operating according to the positive ion mode for less than about 1 second before switching to the operation according to the negative ion mode, and operating according to the negative ion mode for less than about 1 second before switching to the operation according to the positive ion mode.

An x-ray-based borehole fluid evaluation tool for evaluating the characteristics of a fluid located external to said tool in a borehole using x-ray backscatter imaging is disclosed, the tool including at least an x-ray source; a radiation shield to define the output faun of the produced x-rays into the borehole fluid outside of the tool housing; at least one collimated imaging detector to record x-ray backscatter images; sonde-dependent electronics; and a plurality of tool logic electronics and power supply units. A method of using an x-ray-based borehole fluid evaluation tool to evaluate the characteristics of a fluid through x-ray backscatter imaging is also disclosed, the method including at least producing x-rays in a shaped output; measuring the intensity of backscatter x-rays returning from the fluid to each pixel of one or more array imaging detectors; and converting intensity data from said pixels into characteristics of the wellbore fluids.