G01N2201/00

Closed-loop device calibration using a wideband signal

A closed-loop calibration scheme is configured to allow a device to remain in continuous operation. A signal generator device provides a pseudorandom sequence for a signal received by a magnetic field magnetic field sensor, such as a Hall-effect sensor. A signal decoder circuit receives the output signal and decouples the generated spread spectrum signal from the interference by measuring the gain in the overall signal. The decoder device distinguishes the known spread spectrum signal from any perturbation effects of particular bandwidths. A processing circuit then outputs a signal that has an operation parameter that has been adjusted to compensate for the perturbation effects. The processing circuit provides the receiver circuit with the compensation signal, hence forming a closed-loop calibration configuration.

Corrosion sensor

A corrosion sensor for detecting the action of corrosive media on a metallic component when the sensor is mounted in the vicinity of the metallic component in use is disclosed. The sensor includes an electrically conducting corrodible element mounted on a non conducting substrate, the corrodible element being covered with a protective coating such as paint adapted to protect the corrodible element from corrosive media. The protective coating defines a temporary feature such as a paint defect which extends across the corrodible element and is designed to permit attack on the corrodible element by corrosive media after a predetermined period of time. The corrodible element comprises a pair of spaced tracks extending generally in a longitudinal direction and a series of corrodible tracks, each corrodible track extending generally in a lateral direction and forming an electrical connection between the spaced tracks. The temporary feature extends longitudinally, in the space between the pair of tracks, across a number of the corrodible tracks whereby to permit a corrosive attack on a number of the corrodible tracks after the predetermined period of time.

Inspection method for semiconductor substrate, manufacturing method of semiconductor device and inspection device for semiconductor substrate

A manufacturing method of a semiconductor device is provided with an inspecting of a semiconductor substrate by an inspection method, the method including heating the semiconductor substrate, measuring first and second characteristics. The measuring of a first characteristic is performed by bringing a plurality of probes into contact with the heated semiconductor substrate and making a first electric current flow in the semiconductor substrate. The measuring of a second characteristic is performed, after the measuring of the first characteristic, by bringing a plurality of probes into contact with the heated semiconductor substrate and making a second electric current flow in the semiconductor substrate. A number of the plurality of probes used in the measuring of the second characteristic is larger than a number of the plurality of probes used in the measuring of the first characteristic. The second electric current is larger than the first electric current.

SYSTEM AND METHOD FOR TESTING SHELL AND TUBE HEAT EXCHANGERS FOR DEFECTS

A magnetostrictive transducer assembly for generating a longitudinal elastic guided wave of a selected frequency and mode and for guiding the wave into an open end of a heat exchanger tube for testing the tube. The transducer assembly comprises a current-carrying coil of wire, a magnetostrictive material wrapped around the coil of wire, a mechanism for pressing the magnetostrictive material against an inner surface of the tube, and one or more biasing magnets placed in the vicinity of the current-carrying coil of wire and the magnetostrictive material.

System comprising a probe and a measuring device

The invention relates to a system comprising a probe and a measuring device, wherein the probe is connected to an input of the measuring device, and wherein an analog-digital converter is connected downstream of the input of the measuring device. The probe provides an analog-digital converter for the generation of a value-discrete and/or time-discrete signal from an analog input signal, wherein the value-discrete and/or time-discrete signal is supplied to the analog-digital converter of the measuring device. The invention further relates to a method for the registration of an analog signal by means of a system comprising a probe and a measuring device.

Closed-Loop Device Calibration Using a Wideband Signal

A closed-loop calibration scheme is configured to allow a device to remain in continuous operation. A signal generator device provides a pseudorandom sequence for a signal received by a magnetic field magnetic field sensor, such as a Hall-effect sensor. A signal decoder circuit receives the output signal and decouples the generated spread spectrum signal from the interference by measuring the gain in the overall signal. The decoder device distinguishes the known spread spectrum signal from any perturbation effects of particular bandwidths. A processing circuit then outputs a signal that has an operation parameter that has been adjusted to compensate for the perturbation effects. The processing circuit provides the receiver circuit with the compensation signal, hence forming a closed-loop calibration configuration.

Electronic Device, System And Method For Insulation Resistance Measurements With Functions Of Self-Diagnosis And Diagnosis Of Insulation Loss With Respect To Ground Of An Energized Electrical Apparatus

A vehicle step apparatus including an extending and retracting device having a mounting bracket, a step bracket, and an arm assembly. A gear box has a cavity into which at least a portion of a motor shaft of a motor is inserted. A worm wheel is rotatably disposed in the cavity and has a worm wheel body meshing with the motor shaft. An output shaft is mounted to the worm wheel body. A sun gear is fitted over the output shaft. A planet carrier is rotatably disposed in the cavity and connected with the arm assembly. A planet gear is rotatably mounted to the planet carrier and meshes with the sun gear. An adjusting member is mounted in the gear box, and is movable in an axial direction of the motor shaft and abuts against a free end of the motor shaft.

Eddy current detection

Eddy current detection probes and related methods are disclosed. In some embodiments, the eddy current detection probes are hybrid probes, including a solid state sensor and a detection loop. In some embodiments, the eddy current detection probes include a drive coil and a detection loop, with the detection loop having a sensitive axis that is not parallel to principal axis of the drive coil. In some such embodiments, the sensitive axis of the detection loop is perpendicular to the principal axis of the drive coil.

System and method for testing shell and tube heat exchangers for defects

A magnetostrictive transducer assembly for generating a longitudinal elastic guided wave of a selected frequency and mode and for guiding the wave into an open end of a heat exchanger tube for testing the tube. The transducer assembly comprises a current-carrying coil of wire, a magnetostrictive material wrapped around the coil of wire, a mechanism for pressing the magnetostrictive material against an inner surface of the tube, and one or more biasing magnets placed in the vicinity of the current-carrying coil of wire and the magnetostrictive material.

Test handler that picks up electronic devices for testing and an orientation-changing apparatus for use in a test handler

A test handler comprises an orientation changing device having a device holder for holding electronic devices, the device holder having a vertical rotary axis. A conveying device is operative to convey electronic devices to the device holder, and a rotary motor connected to the device holder is operative to rotate the device holder about the vertical rotary axis to change an orientation of the electronic device held on it. A rotary turret of the test handler has a plurality of pick heads arranged on the rotary turret, and each pick head is configured to pick up electronic devices from the device holder.