Closed-Loop Device Calibration Using a Wideband Signal
20170192078 ยท 2017-07-06
Inventors
- Arup Polley (Richardson, TX, US)
- Russell Melvin Rosenquist (Plano, TX, US)
- Terry Lee Sculley (Lewisville, TX, US)
Cpc classification
G01R33/0035
PHYSICS
G01R35/005
PHYSICS
International classification
Abstract
A closed-loop calibration scheme is configured to allow a device to remain in continuous operation. A signal generator device provides a pseudorandom sequence for a signal received by a magnetic field magnetic field sensor, such as a Hall-effect sensor. A signal decoder circuit receives the output signal and decouples the generated spread spectrum signal from the interference by measuring the gain in the overall signal. The decoder device distinguishes the known spread spectrum signal from any perturbation effects of particular bandwidths. A processing circuit then outputs a signal that has an operation parameter that has been adjusted to compensate for the perturbation effects. The processing circuit provides the receiver circuit with the compensation signal, hence forming a closed-loop calibration configuration.
Claims
1. An apparatus comprising: a signal generator device configured to provide a pseudorandom wideband calibration signal; a device configured to receive the calibration signal and to provide an output dependent on at least the pseudorandom wideband calibration signal and perturbation effects; a processing circuit configured to receive the output and a desired device response signal and to provide a compensation signal configured to adjust an operation parameter to counter the perturbation effects for the device based on a comparison of an aspect of the output based on the pseudorandom wideband calibration signal and the desired device response signal.
2. The apparatus of claim 1 wherein the processing circuit is further configured to provide a detected output comprising aspects of the output not based on the pseudorandom wideband calibration signal.
3. The apparatus of claim 1 wherein the signal generator device is further configured to provide the pseudorandom wideband calibration signal comprising a spread spectrum signal.
4. The apparatus of claim 1 wherein: the device comprises a magnetic field detector; and the signal generator device is configured to provide the pseudorandom wideband calibration signal to cause a magnetic field applied to the magnetic field detector to change with the pseudorandom wideband calibration signal.
5. The apparatus of claim 4 wherein the magnetic field detector comprises a Hall Effect sensor; and the apparatus further comprises an integrated or nearby coil disposed with the Hall Effect sensor to provide the magnetic field that changes with the pseudorandom wideband calibrations signal to the Hall Effect sensor.
6. The apparatus of claim 5 wherein the processing circuit further comprises: a calibration signal cancellation circuit configured to receive the output and the pseudorandom wideband calibration signal and provide a clean output signal removing effects of application of the pseudorandom wideband calibration signal to the Hall Effect sensor; a decoder circuit configured to receive the output and the pseudorandom wideband calibration signal and provide the aspect of the output based on the pseudorandom wideband calibration signal for comparison to the desired device response signal.
7. The apparatus of claim 6 wherein: the decoder circuit further comprises: a switched capacitor integrator circuit configured to receive the output and a clock signal for the pseudorandom wideband calibration signal, to derive the aspect of the output based on the pseudorandom wideband calibration signal, and to integrate the aspect of the output based on the pseudorandom wideband calibration signal over a time period to provide an integrated output; a sample and hold circuit configured to receive and store the integrated output for the time period and provide the integrated output for comparison to the desired device response signal; the processing circuit further comprising: an error amplifier configured to: receive: the desired device response signal, and the integrated output from the sample and hold circuit; and output an error signal; a loop stabilizing switched capacitor integrator circuit configured to receive the error signal and to provide the compensation signal based on the error signal.
8. A method comprising: applying a pseudorandom wideband calibration signal to a device; providing an output from the device dependent on at least the pseudorandom wideband calibration signal and perturbation effects; receiving the output by a processing circuit; providing by the processing circuit a compensation signal; using the compensation signal to adjust an operation parameter to counter the perturbation effects for the device based on a comparison of an aspect of the output based on the pseudorandom wideband calibration signal and the desired device response signal.
9. The method of claim 8 further comprising providing by the processing circuit a detected output comprising aspects of the output not based on the pseudorandom wideband calibration signal.
10. The method of claim 8 further comprising providing by the signal generator device the pseudorandom wideband calibration signal comprising a spread spectrum signal.
11. The method of any of claim 8 further comprising detecting with the device a magnetic field; and applying an applied magnetic field to the device that changes with the pseudorandom wideband calibrations signal.
12. The method of claim 11 wherein detecting the magnetic field comprises detecting the magnetic field with a Hall Effect sensor; and the method further comprising providing the applied magnetic field that changes with the pseudorandom wideband calibration signal to the Hall Effect sensor by an integrated or nearby coil disposed with the Hall Effect sensor providing the magnetic field that changes with the pseudorandom wideband calibrations signal to the Hall Effect sensor.
13. The method of claim 12 wherein the providing by the processing circuit the compensation signal further comprises: receiving by a calibration signal cancellation circuit the output and the pseudorandom wideband calibration signal; providing by the calibration signal cancellation circuit a clean output signal removing effects of application of the pseudorandom wideband calibration signal to the Hall Effect sensor; receiving the output and the pseudorandom wideband calibration signal by a decoder circuit; and providing by the decoder circuit the aspect of the output based on the pseudorandom wideband calibration signal for comparison to the desired device response signal.
14. The method of claim 13 wherein the providing by the processing circuit the compensation signal further comprises: receiving by a switched capacitor integrator circuit the output and a clock signal for the pseudorandom wideband calibration signal; deriving the aspect of the output based on the pseudorandom wideband calibration signal; integrating the aspect of the output based on the pseudorandom wideband calibration signal over a time period to provide an integrated output; and providing the integrated output to a sample and hold circuit configured to receive and store for comparison to the desired device response signal.
15. The method of claim 14 wherein the providing by the processing circuit the compensation signal further comprises: receiving in an error amplifier the desired device response signal and the integrated output from the sample and hold circuit; outputting an error signal; receiving by a loop stabilizing switched capacitor integrator circuit the error signal; providing from the loop stabilizing switched capacitor integrator circuit the compensation signal based on the error signal.
16. An apparatus comprising: a Hall Effect sensor; a signal generator device configured to provide a pseudorandom wideband calibration signal to modulate a magnetic field applied to the Hall Effect sensor; wherein the Hall Effect sensor is configured to provide an output dependent on at least the pseudorandom wideband calibration signal and perturbation effects; a processing circuit configured to: receive the output and a desired device response signal, provide a compensation signal configured to adjust an operation parameter to counter the perturbation effects for the Hall Effect sensor based on a comparison of an aspect of the output based on the pseudorandom wideband calibration signal and the desired device response signal, provide a detected output comprising aspects of the output not based on the pseudorandom wideband calibration signal.
17. The apparatus of claim 16 wherein the processing circuit further comprises: a calibration signal cancellation circuit configured to receive the output and the pseudorandom wideband calibration signal and provide a clean output signal removing effects of application of the pseudorandom wideband calibration signal to the Hall Effect sensor; a decoder circuit configured to receive the output and the pseudorandom wideband calibration signal and provide the aspect of the output based on the pseudorandom wideband calibration signal for comparison to the desired device response signal.
18. The apparatus of claim 17 wherein the processing circuit further comprises: a switched capacitor integrator circuit configured to receive the output and a clock signal for the pseudorandom wideband calibration signal; a sample and hold circuit configured to receive output from the switched capacitor integrator circuit and the pseudorandom wideband calibration signal and provide the aspect of the output based on the pseudorandom wideband calibration signal for comparison to the desired device response signal.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
[0009]
[0010]
[0011]
[0012]
[0013] Skilled artisans will appreciate that elements in the figures are illustrated for simplicity and clarity and have not necessarily been drawn to scale. For example, the dimensions and/or relative positioning of some of the elements in the figures may be exaggerated relative to other elements to help to improve understanding of various embodiments of the present invention. Also, common but well-understood elements that are useful or necessary in a commercially feasible embodiment are often not depicted in order to facilitate a less obstructed view of these various embodiments. It will further be appreciated that certain actions and/or steps may be described or depicted in a particular order of occurrence while those skilled in the art will understand that such specificity with respect to sequence is not actually required. It will also be understood that the terms and expressions used herein have the ordinary technical meaning as is accorded to such terms and expressions by persons skilled in the technical field as set forth above except where different specific meanings have otherwise been set forth herein.
DETAILED DESCRIPTION
[0014] Referring now to the drawings, and in particular to
[0015] Generally speaking, the receiver circuit device 143 can be any device that receives outside signals and provides an output that is dependent on the received outside signals. Examples include magnetic field detectors such as a Hall-effect sensor, magneto-resistive sensor (XMR) like anisotropic magneto-resistive (AMR), giant magneto-resistive (GMR), tunneling magneto-resistive (TMR), colossal magneto-resistive (CMR), fluxgate sensor etc. The approaches described herein are further applicable to other types of sensors such as infrared sensors, photosensors, audio sensors, ultrasound sensors, and the like. In the example where the receiver circuit device 143 is a magnetic field detector, the de-embedding circuit 160 effectively separates out from the output signal 144 aspects due to the calibration signal 142 such that the de-embedding circuit 160 can then provide a detected output that accurately depicts the otherwise sensed magnetic field.
[0016] In another approach illustrated in
[0017] A receiver circuit 243 is configured to receive the pseudorandom wideband calibration signal 242, which now comprises a spread spectrum signal 251. A (spread spectrum) decoder circuit 250 then receives the output signal 244 from the receiver circuit 243 that is comprised of the pseudorandom wideband calibration signal 242 as well as any input signal 230 sensed by the receiver circuit 243. The response or transfer function of the receiver is also affected by any additional perturbation 245. The decoder circuit 250 detects the spread spectrum signal and, in turn, separates the known pseudorandom wideband calibration signal 242 from the input signal 230. This decoded signal 249 is sent to the processing circuit 246 that may then compare the decoded signal 249 to the desired response signal 247. A compensation signal 248 may now be sent from the processing circuit 246 back to the receiver circuit 243, thus forming a closed-loop configuration, and allowing for an highly accurate, iterative process. Separately, the de-embedding circuit 260 provides a detected output 270 that includes aspects of the output not based on the pseudorandom wideband calibration signal, but only based on the input signal 230 detected by the receiver circuit 243.
[0018]
[0019] Generally speaking, the decoder circuit 350 allows for discrete time signal processing of the output from the sensor. In this example, the decoder circuit 350 receives the output from the Hall-effect sensor frontend circuit 354 and the pseudorandom wideband calibration signal and provides the aspect of the output based on the pseudorandom wideband calibration signal for comparison to the desired device response signal. As illustrated in
[0020] More specifically, in this example of
[0021] The processing circuit 346 further includes an error circuit 358. The error circuit 358 includes an error amplifier 357 configured to receive the desired device response signal 347 and the integrated output from the sample and hold circuit 365. The error amplifier 357 outputs an error signal through comparison between the received signals. A loop stabilizing switched capacitor integrator circuit 359 is configured to receive the error signal and to provide the compensation signal based on the error signal. The compensation signal is routed as feedback to the Hall bias current generator 348 to help control the Hall effect sensor 353.
[0022] The processing circuit 346 also includes a calibration signal cancellation/de-embedding circuit 375 configured to receive the output from the Hall-effect sensor frontend circuit 354 and the pseudorandom wideband calibration signal. The calibration signal cancellation circuit 375 provides a clean output signal removing effects of application of the pseudorandom wideband calibration signal to the Hall Effect sensor 353.
[0023] An example method of operation in accord with these disclosures is illustrated in
[0024] The output signal is then decoded 403 by a decoder circuit that disentangles the known pseudorandom wideband calibration signal from the other sensed signals but while retaining the effect of the external perturbations. The decoded signal is received 404 by a processing circuit and compared to a desired device response signal to create 405 a compensation signal.
[0025] The creation and provision 405 of the compensation signal can be performed in any number of ways including those described above. By one approach, this step can be performed by receiving the output and the pseudorandom wideband calibration signal by a decoder circuit and providing by the decoder circuit the aspect of the output based on the pseudorandom wideband calibration signal for comparison to the desired device response signal.
[0026] In one particular implementation of the method, for instance as performed by the circuit of
[0027] So configured, the closed loop approach allows for fine-tuning of the sensor device without having to remove outside influences from the sensor. In the Hall-Effect example, there is no need to shield the Hall-Effect sensor from outside magnetic fields to adjust its parameters. Similarly, perturbation effects based on temperature or on-chip environmental factors can be addressed on the fly.
[0028] Those skilled in the art will recognize that a wide variety of modifications, alterations, and combinations can be made with respect to the above described embodiments without departing from the scope of the invention, and that such modifications, alterations, and combinations are to be viewed as being within the ambit of the inventive concept.