G01R1/00

Diode checker

Embodiments of the invention are directed to using a DC multimeter configured for checking device amperage. A DC voltmeter is electrically-connected in series with the DC multimeter. A linear circuit is electrically connected in series between the DC multimeter and the DC voltmeter. A device under test is electrically-connected between positive and negative terminals of the DC voltmeter.

Magnetic sensor and magnetic encoder

A magnetic sensor is provided with first and second magnetoresistive effect elements that can detect an external magnetic field. The first and second magnetoresistive effect elements include at least magnetization direction change layers where a direction of magnetization is changed according to an external magnetic field. The width W1 of a magnetization direction change layer in an initial magnetization direction of the magnetization direction change layer of the first magnetoresistive effect element, and the width W2 of a magnetization direction change layer in an initial magnetization direction of the magnetization direction change layer of the second magnetoresistive effect element have a relationship shown by formula (1) below. Sensitivity of the first magnetoresistive effect element to the external magnetic field is higher than that of the second magnetoresistive effect element.
W1>W2  (1)

PROBE CARD HAVING REPLACEABLE PROBE MODULE AND ASSEMBLING METHOD AND PROBE MODULE REPLACING METHOD OF THE SAME
20170315149 · 2017-11-02 ·

A probe card includes a substrate module having an installation hole and a first stair-shaped structure provided on two stairs thereof with a first connection surface and a first transmission surface having a first contact pad, a probe module having a probe and a second stair-shaped structure provided on two stairs thereof with a second connection surface and a second transmission surface having a second contact pad electrically connected with the probe, and a pressing member. The probe module is disposed in the installation hole so that the first and second connection surfaces are connected and the first and second transmission surfaces are opposite. The pressing member is detachably pressed on the probe module to press the second connection surface against the first connection surface and make the first and second contact pads electrically connected.

ERROR DETECTION DEVICE
20170299648 · 2017-10-19 ·

An abnormality detection device includes: a coupling-capacitor having a first-end and a second-end coupled with a high-voltage circuit; a signal output unit; a signal extraction unit; and a signal input unit. The signal output unit is coupled with the first-end of the coupling-capacitor via a detection-resistor, and outputs an alternating-current inspection-signal. The signal extraction unit extracts the inspection-signal, as an extraction-signal, output between the detection-resistor and the coupling-capacitor. The signal input unit detects abnormality of insulation resistance of the high-voltage circuit based on a level of the inputted extraction-signal. The signal extraction unit includes a signal removing filter and a subtraction circuit. The filter removes a signal equal in frequency to the inspection-signal and passes low-frequency noises lower in frequency than the inspection-signal. The subtraction circuit outputs a differential signal, as the extraction-signal, between a signal having passed through the filter and a signal not having passed through the filter.

High dynamic range RF power monitor

A device with at least one channel for measuring high dynamic range, radio frequency (RF) power levels over broad-ranging duty cycles includes a power sensor circuit comprising at least one logarithmic amplifier; at least one directional RF coupler electrically connected to the at least one power sensor; at least one RF attenuator electrically connected to the at least one RF coupler; and at least one sampling circuit electrically connected to the at least one RF attenuator and the at least one RF coupler. The at least one sampling circuit performs analog-to-digital conversion of electrical signals received to provide digitals signals for measuring the RF power level in the at least one channel.

Apparatus and method for diagnostics of a capacitive sensor

In at least one embodiment, an apparatus for diagnosing a state of a capacitive sensor is provided. The apparatus includes a control unit for being operably coupled to a decoupling device that exhibits a drift condition and to the capacitive sensor. The control unit being configured to determine an impedance of the capacitive sensor and to determine a characteristic of the capacitive sensor based on at least the impedance. The control unit being further configured to determine a characteristic of the decoupling device based on the characteristic of the capacitive sensor and to provide an estimated capacitance based on the characteristic of the decoupling device, the estimated capacitance being indicative of the state of the capacitive sensor.

APPARATUS FOR PROCESSING SIGNAL BY MEANS OF ELECTROMAGNETIC WAVES AND METHOD FOR CONTROLLING THE APPARATUS

An apparatus for processing a signal by means of electromagnetic waves according to one embodiment of the present invention can, when a radio frequency (RF) signal is radiated onto a medium through any one of a plurality of channels, simultaneously receive the radiated RF signals which have been reflected or scattered by the medium or have penetrated the medium through the plurality of channels other than the channel through which the RF signal has been radiated.

WAFER INSPECTION EQUIPMENT HAVING LASER CLEANING FUNCTION
20170285071 · 2017-10-05 · ·

A wafer test machine is disclosed. The wafer test machine comprises a main body having a chamber defined therein, wherein a probe card is disposed at an upper portion of the chamber; a chuck for fixing a wafer in the chamber; a moving unit for moving the chuck in the chamber, thus making a contact between the probe card and the wafer; and a laser cleaning apparatus for cleaning the probe card in the chamber using a laser beam, when the probe card does not contact the wafer.

3D PRINTED CONDUCTIVE COMPOSITIONS ANTICIPATING OR INDICATING STRUCTURAL COMPROMISE

An article includes a body and at least one 3D-printable conductive composite segment in mechanical communication with the body. The body includes a first material and the at least one conductive composite segment includes a matrix material, a plurality of carbon nanotubes, and conductive additives. The conductive additives include a plurality of metallic particulates, a plurality of graphitic particles or a combination thereof.

POWER STORAGE MANAGEMENT SYSTEM, POWER STORAGE APPARATUS AND POWER STORAGE MANAGEMENT METHOD

A power storage management system, a power storage apparatus, a power storage management method are provided. The power storage management system includes a receiver part, a sender identifying part, a memory part and a deterioration degree estimating part. The sender identifying part identifies an external apparatus that transmitted a control signal received by the receiver part. The memory part stores apparatus information related to the external apparatus identified by the sender identifying part and power storage status information related to the status change of the power storage apparatus caused by charging or discharging performed according to the control signal transmitted from the external apparatus. The deterioration degree estimating part estimates the deterioration degree of the power storage apparatus to which a charge/discharge control is performed according to the control signal transmitted from the sender apparatus based on the apparatus information and the power storage status information.