An example test fixture, which interfaces a tester and a unit under test (UUT), includes the following: first electrical contacts that face the tester; second electrical contacts that face the UUT; a substrate made of sections of printed first material, with the first material being electrically non-conductive, and with the substrate being between the first electrical contacts and the second electrical contacts; and structures through the substrate, with the structures including sections of second material, with the second material being electrically conductive, and with at least one of the structures electrically connecting a first electrical contact and a second electrical contact.

A coated probe is provided. The probe includes a probe body and a cladding layer. The probe body has a terminal. The cladding layer covers the surface of the terminal of the probe body, wherein the cladding layer includes a carbon nano-material layer, and the carbon nano-material layer includes a carbon nano-material.

A coated probe is provided. The probe includes a probe body and a cladding layer. The probe body has a terminal. The cladding layer covers the surface of the terminal of the probe body, wherein the cladding layer includes a carbon nano-material layer, and the carbon nano-material layer includes a carbon nano-material.

The invention relates to a composite material strip for producing an electric component, in particular a resistor, in particular a low-resistance current-measuring resistor, comprising a first material strip (4) made of a copper-containing material, in particular a copper-containing conductor material, for later forming a first connection part of the electric component and comprising a second material strip (3) for later forming a second connection part of the electric component. The first material strip (4) and the second material strip (3) are electrically and mechanically connected together along a longitudinal seam, wherein the second material strip (3) consists of an aluminum-containing material, in particular an aluminum-containing conductor material. The invention further relates to a corresponding production method and to a corresponding component.

The present disclosure relates to a method for producing a sensor comprising the steps of: adapting a sensor adapter of the sensor element to a first section of the process connection, introducing the sensor element with the sensor adapter first into the first section of the process connection, so that the sensor element projects beyond the process connection with a second section and the first section of the process connection and the first section of the sensor element form a gap, connecting the sensor element to the process connection by creating a weld connection between the first section of the process connection and the sensor adapter of the sensor element in the region of the gap.

The present disclosure relates to a method for producing a sensor comprising the steps of: adapting a sensor adapter of the sensor element to a first section of the process connection, introducing the sensor element with the sensor adapter first into the first section of the process connection, so that the sensor element projects beyond the process connection with a second section and the first section of the process connection and the first section of the sensor element form a gap, connecting the sensor element to the process connection by creating a weld connection between the first section of the process connection and the sensor adapter of the sensor element in the region of the gap.

Devices and methods for measuring an electrical characteristic, in particular, for measuring current are provided. The devices can use a pair of MEMS optical modulators as opposed to the more conventional coil and associated oil insulation arrangement.

Devices and methods for measuring an electrical characteristic, in particular, for measuring current are provided. The devices can use a pair of MEMS optical modulators as opposed to the more conventional coil and associated oil insulation arrangement.

A probe cleaning plate is configured to clean the probe plate of an ICT fixture. In particular, the probe cleaning plate is used to support a plurality of probes included as part of the probe plate and enable cleaning of the probe heads of each probe while maintaining support of the probes and minimizing, if not preventing, seepage of cleaning solution and contaminates from to the base of the probes.

A method for producing a contact spacing converter space transformer) which has electrical contacts that form electrical paths and in which a first contact spacing of the contacts is converted into a comparatively different, second contact spacing of the electrical contacts including producing at least one base part from each of at least some of the electrical contacts. At least a section of the base part is produced from plastic. The method subsequently includes metallization of at least the section of the base part that is produced from plastic.