The present invention provides a metal molded article, a manufacturing method therefor, and an inspection device having same. The metal molded article has an overall length dimension in a longitudinal direction, an overall thickness dimension in a thickness direction perpendicular to the longitudinal direction, and an overall width dimension in a width direction perpendicular to the longitudinal direction. The metal molded article is divided into a first body region and a second body region in the thickness direction. The lateral surfaces of the first body region are provided with multiple micro-trenches that are grooves formed to be elongated in the thickness direction and arranged side by side all over the entire lateral surfaces of the first body region. The lateral surfaces of the second body region are not provided with these micro-trenches.

The present invention provides a metal molded article, a manufacturing method therefor, and an inspection device having same. The metal molded article has an overall length dimension in a longitudinal direction, an overall thickness dimension in a thickness direction perpendicular to the longitudinal direction, and an overall width dimension in a width direction perpendicular to the longitudinal direction. The metal molded article is divided into a first body region and a second body region in the thickness direction. The lateral surfaces of the first body region are provided with multiple micro-trenches that are grooves formed to be elongated in the thickness direction and arranged side by side all over the entire lateral surfaces of the first body region. The lateral surfaces of the second body region are not provided with these micro-trenches.

The purpose of the present invention is to provide a method for repairing a probe card in which a defect has occurred in an alignment symbol or a peripheral region thereof by using a high reflection chip for alignment. The present invention is provided with a probe 16 for contacting an inspection object, a wiring substrate 14 to which the probe 16 is attached, and a high reflection chip 4 for alignment provided to a probe installation surface 17 of the wiring substrate 14. The high reflection chip 4 includes a metal plate having a fixing through-hole 41, and has an affixing surface to be attached to the probe installation surface 17 with an adhesive 6 and a mirror-finished high reflection surface on the other side from the affixing surface. The adhesive 6 formed on the affixing surface has a ridge 61 that extends into the fixing through-hole 41.

The purpose of the present invention is to provide a method for repairing a probe card in which a defect has occurred in an alignment symbol or a peripheral region thereof by using a high reflection chip for alignment. The present invention is provided with a probe 16 for contacting an inspection object, a wiring substrate 14 to which the probe 16 is attached, and a high reflection chip 4 for alignment provided to a probe installation surface 17 of the wiring substrate 14. The high reflection chip 4 includes a metal plate having a fixing through-hole 41, and has an affixing surface to be attached to the probe installation surface 17 with an adhesive 6 and a mirror-finished high reflection surface on the other side from the affixing surface. The adhesive 6 formed on the affixing surface has a ridge 61 that extends into the fixing through-hole 41.

A substrate structure includes a core substrate, a redistribution layer, a plurality of test pads, a first protective coating, at least one conductive pad and a passive device. The redistribution layer is disposed on and electrically connected to the core substrate. The test pads are disposed over the redistribution layer. The first protective coating is coated on the test pads. The conductive pad is d disposed on the redistribution layer aside the plurality of test pads. The passive device is disposed on and electrically connected to the at least one conductive pad.

A probe including a plunger, and a barrel provided with an opening through which at least a part of the plunger protrudes, and an inner surface of the opening is substantially parallel to an axial direction of the plunger.

An intelligent electric meter digital manufacturing platform based on intelligent manufacturing includes: an electric push rod fixedly disposed in a frame and a testing machine disposed on the electric push rod. The testing machine includes a box fixedly disposed on a telescopic shaft of the electric push rod and a testing component disposed in the box. A first pulley drives two ends of a pulling rope to move from a middle end of a side wall of the pulling rope through driving of a servo motor. This makes an end of the pulling rope pull a testing probe to move upwards, the other end of the pulling rope pull the other testing probe to move downwards, allowing it move to a bottom of the box. This design avoids affecting testing efficiency due to the need to replace or maintain the testing probes, facilitating subsequent testing of an intelligent electric meter.

An intelligent electric meter digital manufacturing platform based on intelligent manufacturing includes: an electric push rod fixedly disposed in a frame and a testing machine disposed on the electric push rod. The testing machine includes a box fixedly disposed on a telescopic shaft of the electric push rod and a testing component disposed in the box. A first pulley drives two ends of a pulling rope to move from a middle end of a side wall of the pulling rope through driving of a servo motor. This makes an end of the pulling rope pull a testing probe to move upwards, the other end of the pulling rope pull the other testing probe to move downwards, allowing it move to a bottom of the box. This design avoids affecting testing efficiency due to the need to replace or maintain the testing probes, facilitating subsequent testing of an intelligent electric meter.

A jig and a method for grinding probe pins of a probe card. The jig includes a carrier and a connecting part. The carrier carries a support body with a grinding sheet, and the carrier includes an opening. The support body with the grinding sheet straddles above the opening. The opening may expose a plurality of probe pins of the probe card.

A jig and a method for grinding probe pins of a probe card. The jig includes a carrier and a connecting part. The carrier carries a support body with a grinding sheet, and the carrier includes an opening. The support body with the grinding sheet straddles above the opening. The opening may expose a plurality of probe pins of the probe card.