A multi-electrode conductive probe, a manufacturing method of insulating trenches and a measurement method using the multi-electrode conductive probe are disclosed. The conductive probe includes a base, a plurality of support elements, a plurality of tips and a conductive layer. The base has a surface and a plurality of protrusions. The protrusions are configured on the surface in a spacing manner, and an insulating trench is disposed between the two adjacent protrusions. The support elements are disposed at the base and protrude from the base. The tips are disposed on the end of the support elements away from the base. The conductive layer covers the surface of the base, the protrusions, the support elements and the tips. Portions of the conductive layer on the two adjacent support elements are electrically insulated from each other by at least an insulating trench.

A probe head comprises a plate-shaped support including respective pluralities of guide holes, a plurality of contact probes being slidingly housed in the respective pluralities of guide holes and including at least a first group of contact probes being apt to carry only one type of signal chosen between ground and power supply signals, a conductive portion realized on the support and including a plurality of the guide holes housing the contact probes of the first group, and at least one filtering capacitor having at least one capacitor plate being electrically connected to the conductive portion, the conductive portion electrically connecting the contact probes of the first group.

A probe head comprises a plate-shaped support including respective pluralities of guide holes, a plurality of contact probes being slidingly housed in the respective pluralities of guide holes and including at least a first group of contact probes being apt to carry only one type of signal chosen between ground and power supply signals, a conductive portion realized on the support and including a plurality of the guide holes housing the contact probes of the first group, and at least one filtering capacitor having at least one capacitor plate being electrically connected to the conductive portion, the conductive portion electrically connecting the contact probes of the first group.

An inspection terminal unit includes at least two inspection pins, which are arrayed side by side, each of which has a contact portion at a first end of the inspection pin and a connection portion at a second end of the inspection pin, the contact portion being in contact with an inspection object element and the connection portion being connected to a substrate, and a holding unit that integrally holds at least the two inspection pins.

An inspection terminal unit includes at least two inspection pins, which are arrayed side by side, each of which has a contact portion at a first end of the inspection pin and a connection portion at a second end of the inspection pin, the contact portion being in contact with an inspection object element and the connection portion being connected to a substrate, and a holding unit that integrally holds at least the two inspection pins.

An insulating block configured for attachment to an electrical structure without the use of a tool. The insulating block is formed from an electrical insulator. One of the electrical structure and the insulating block may have a clip that is configured to engage a catch surface on the other of the electrical structure and the insulating block without the use of a tool. An opening or recess of the electrical structure may be configured to receive a portion of the insulating block having the clip or catch surface, and the portion of the insulating block may move within the opening or recess from a disengaged position to an engaged position, in which the clip engages the catch surface to securely attach the insulating block to the electrical structure. The electrical structure may be a meter socket enclosure. The combination of the insulating block with the electrical structure.

An insulating block configured for attachment to an electrical structure without the use of a tool. The insulating block is formed from an electrical insulator. One of the electrical structure and the insulating block may have a clip that is configured to engage a catch surface on the other of the electrical structure and the insulating block without the use of a tool. An opening or recess of the electrical structure may be configured to receive a portion of the insulating block having the clip or catch surface, and the portion of the insulating block may move within the opening or recess from a disengaged position to an engaged position, in which the clip engages the catch surface to securely attach the insulating block to the electrical structure. The electrical structure may be a meter socket enclosure. The combination of the insulating block with the electrical structure.

A system and method for disassembling a multiple contact probe head including a plurality of contact probes positioned by a first die at a first end of the plurality of probes and a second die at a second end of the plurality of probes, are provided. The system may include a manifold configured to sealingly receive an opposing side of the first die from the second die; and a vacuum source operatively coupled to the manifold to apply a vacuum to an interior of the manifold applying a force to the plurality of contact probes in position in the first die across. Where the probes include a paramagnetic material, a magnetic source may be employed to hold the probes during disassembly.

A system and method for disassembling a multiple contact probe head including a plurality of contact probes positioned by a first die at a first end of the plurality of probes and a second die at a second end of the plurality of probes, are provided. The system may include a manifold configured to sealingly receive an opposing side of the first die from the second die; and a vacuum source operatively coupled to the manifold to apply a vacuum to an interior of the manifold applying a force to the plurality of contact probes in position in the first die across. Where the probes include a paramagnetic material, a magnetic source may be employed to hold the probes during disassembly.

A probe has a substantially bar shape, and includes a tip end, a base end, and a body portion that is located between the tip end and the base end and has a thickness in a thickness direction orthogonal to an axial direction of the substantially bar shape thinner than the tip end. The body portion includes a slope surface that is continuous with the tip end and is inclined with respect to the axial direction in a direction in which the thickness becomes gradually thinner with increasing distance from the tip end. A first region having a surface shape that bulges outward is provided in at least a part of the slope surface.