G01R17/00

Fingerprinting of fluid injection devices
10401398 · 2019-09-03 · ·

The subject matter of this specification can be embodied in, among other things, a method for characterizing a fluid injector that includes receiving a collection of waveform data, identifying a pull locus, determining a detection threshold level value, identifying a first subset of the collection of data representative of a selected first electrical waveform of the collection of electrical waveforms, identifying an opening value, identifying a representative closing value, identifying an anchor value, identifying a second subset of the collection of data based on the collection of data, the pull locus, the first subset, and the opening value, identifying a maximum electrical value, identifying an opening locus based the collection of data, the anchor value, and the maximum electrical value, identifying a hold value, and providing characteristics associated with the fluid injector comprising the pull locus, the opening locus, the hold value, the anchor value, and the representative closing value.

Fingerprinting of fluid injection devices
10401398 · 2019-09-03 · ·

The subject matter of this specification can be embodied in, among other things, a method for characterizing a fluid injector that includes receiving a collection of waveform data, identifying a pull locus, determining a detection threshold level value, identifying a first subset of the collection of data representative of a selected first electrical waveform of the collection of electrical waveforms, identifying an opening value, identifying a representative closing value, identifying an anchor value, identifying a second subset of the collection of data based on the collection of data, the pull locus, the first subset, and the opening value, identifying a maximum electrical value, identifying an opening locus based the collection of data, the anchor value, and the maximum electrical value, identifying a hold value, and providing characteristics associated with the fluid injector comprising the pull locus, the opening locus, the hold value, the anchor value, and the representative closing value.

POSITION SENSOR SYSTEM
20240151507 · 2024-05-09 ·

An example of a position sensor system includes a magnet arrangement with at least one north pole and one south pole each. A first sensor is spaced apart from the magnet arrangement, wherein the first sensor includes four magnetoresistive elements interconnected in a first full-bridge circuit and sensitive for a first field direction, wherein the two magnetoresistive elements of a first branch of the first full-bridge circuit are arranged at a distance of more than 0.5 mm apart and wherein the two magnetoresistive elements of a second branch of the second full-bridge circuit are arranged at the distance apart. The magnet arrangement and the sensor can be moved relative to each other in a measuring direction.

POSITION SENSOR SYSTEM
20240151507 · 2024-05-09 ·

An example of a position sensor system includes a magnet arrangement with at least one north pole and one south pole each. A first sensor is spaced apart from the magnet arrangement, wherein the first sensor includes four magnetoresistive elements interconnected in a first full-bridge circuit and sensitive for a first field direction, wherein the two magnetoresistive elements of a first branch of the first full-bridge circuit are arranged at a distance of more than 0.5 mm apart and wherein the two magnetoresistive elements of a second branch of the second full-bridge circuit are arranged at the distance apart. The magnet arrangement and the sensor can be moved relative to each other in a measuring direction.

Test devices and test systems

A test device includes a data driver and a controller. The controller is configured to generate a test code by dividing a test sequence in a unit of n-bits. The data driver is configured to receive the generated test code and output one of input voltages to a device under test as a test signal based on the generated test code. A storage device stores a test sequence.

Current Sensor Using Modulation of or Change of Sensitivity of Magnetoresistance Elements

A current sensor can indirectly measure a sensed current by directly measuring static perturbing AC magnetic fields with magnetoresistance elements, the perturbing magnetic fields generated by perturbing coils. The sensed current can be indirectly measured by modulating or changing sensitivities of the magnetoresistance elements in a way that is directly related to the sensed current.

Current Sensor Using Modulation of or Change of Sensitivity of Magnetoresistance Elements

A current sensor can indirectly measure a sensed current by directly measuring static perturbing AC magnetic fields with magnetoresistance elements, the perturbing magnetic fields generated by perturbing coils. The sensed current can be indirectly measured by modulating or changing sensitivities of the magnetoresistance elements in a way that is directly related to the sensed current.

BATTERY VOLTAGE DETECTOR

Voltage-dividing resistors are arranged in parallel with a first DC power supply. A first switch is electrically connected to a first resistor and a second resistor and includes a first terminal, a second terminal, and a control terminal. A second switch switches supply of a power voltage from a second DC power supply. A voltage comparator includes a first and a second input terminals. A reference power supply is connected to the first input terminal of the voltage comparator and outputs a reference voltage. The first terminal of the first switch is electrically connected to the second input terminal of the voltage comparator. The control terminal of the first switch is electrically connected to a positive voltage side of the second DC power supply. When the power voltage is supplied to the control terminal, and allows a voltage to be applied to the first and the second resistors.

Method of and Apparatus for Reducing the Influence of a Common Mode Signal on a Differential Signal and to Systems including such an Apparatus

Differential sampling circuits may be adversely affected by changes in common mode voltage. Changes in the common mode voltage may alter the on resistance of transistor switches which it turn may mean that small signal changes are not correctly observed against a bigger common mode signal. The present disclosure relates to a way of improving the ability to resolve small differential signal changes by varying the supply or drive voltage to a component to compensate for common mode voltage changes.

Charging mode control method and device

A charging control method of a computing system is provided. The method includes determining a charging mode for an external device connected to the computing system, charging the external device according to the charging mode, monitoring a current and a voltage in the computing system, and changing the charging mode based on the result of the monitoring.