A method is provided for in situ functionality testing of electrical switches using a Functional Reflectometry Test (FRT) of switches on the signal path of electrical circuits in a semiconductor interface. The method includes initiating the functionality testing of the electrical switches in situ, wherein the functionality of the electrical switches is tested while the electrical switches are connected to the Automatic Test Equipment (ATE) and are in-use testing semiconductors. The method also includes conducting full Functional Reflectometry Testing of the electrical switches in situ in an open switch state and a closed switch state to determine whether each of the electrical switches is one of fully functional, stuck closed, and stuck open, wherein testing for each state is performed as a single vector functional test to minimize test time overhead.

A Josephson voltage standard includes: electrical conductors that receive bias currents and radiofrequency biases; a first Josephson junction array that: includes a first Josephson junction and produces a first voltage reference from the first bias current and the third bias current; a second Josephson junction array in electrical communication with the first Josephson junction array and that: includes a second Josephson junction; receives the second bias current; receives the third bias current; receives the second radiofrequency bias; and produces a second voltage reference from the second bias current and the third bias current; a first voltage reference output tap in electrical communication with the first Josephson junction array and that receives the first voltage reference from the first Josephson junction array such that the first voltage reference is electrically available at the first voltage reference output tap; and a second voltage reference output tap.

An apparatus comprises a signal generator; first and second electrodes, the second electrode being connected to a first terminal of the signal generator; a processor; and a first switch configured to connect the first electrode to the processor, the first switch having a first position and a second position. The processor is configured to determine one or more values of a first electrical parameter based on a signal received from the first electrode via the first switch in the first position, and to determine one or more values of a second electrical parameter based on a signal received from the first electrode via the first switch in the second position.

A method for the onsite calibration of a Rogowski sensor to be calibrated, includes the steps of: cause the sensor to be calibrated to be positioned on a reference phase, or cause a reference sensor to be positioned on the phase to be calibrated; acquiring a calibration current measurement produced by the sensor to be calibrated, a reference current measurement produced by the reference sensor, and a reference voltage measurement on the phase on which are positioned the reference sensor to be calibrated following the positioning step; and using the calibration current measurement, the reference current measurement and the reference voltage measurement to produce calibration parameters of the sensor to be calibrated.

A test circuit for testing a monitoring circuit includes: a ramp generator configured to generate a ramp signal in response to an activated first control signal; a counter configured to count pulses of a clock signal in response to the activated first control signal; at least one register configured to store an output value of the counter based on a change in at least one output signal generated by the monitoring circuit in response to the ramp signal in a test mode; and a controller configured to generate the first control signal and verify the monitoring circuit based on a ratio of a value stored in the at least one register to a duration during which the first control signal is activated.

A system and method for calibrating a capacitor voltage sensor that measures voltage on a power line coupled through a switch to a primary coil of a transformer. The method includes measuring a control voltage on a secondary coil of the transformer and measuring voltage on the capacitor sensor when the switch is known to be closed. The method identifies a calibration factor that when multiplied by the measured voltage on the capacitor sensor when the switch is closed makes the measured voltage on the capacitor sensor substantially equal to the control voltage. The method subsequently measures voltage on the capacitor sensor when the switch is open or closed during operation of the transformer, and multiplies the subsequently measured voltage on the capacitor sensor when the switch is open or closed by the calibration factor to obtain a measured voltage.

A measuring device facilitates equipment calibration. A measuring device for measuring noise contained in equipment having a prescribed resistance value is provided with a first voltage-dividing circuit connected to a direct-current power source, a second voltage-dividing circuit connected in parallel with the first voltage-dividing circuit , and a measuring unit which measures a first voltage-divided voltage output from the first voltage-dividing circuit, and a second voltage-divided voltage output from the second voltage-dividing circuit, a calculating unit which calculates the difference between the measured first voltage-divided voltage and second voltage-divided voltage, and an output unit which outputs the calculated result, wherein: the first voltage-dividing circuit outputs the first voltage-divided voltage from the equipment and a first resistor, connected in series.

A measurement system includes a gain chain configured to amplify an analog input signal; a range selector configured to select a gain between the analog input signal and a plurality of analog-to-digital converter (ADC) outputs from a plurality of ADCs, wherein each ADC output has a path, and a gain of each output path is made up of a plurality of gain stages in the gain chain; and a mixer configured to combine the plurality of ADC outputs into a single mixed output.

A device receives network information from an analyzer device associated with a host device, a target device, and a link of a network, and compares the network information and historical equalizer calibration information to identify a set of equalizer calibration information. The historical equalizer calibration information is associated with multiple host devices, multiple target devices, and multiple links. The device ranks the set of equalizer calibration information, based on quality information associated with the historical equalizer calibration information, to generate a ranked set of equalizer calibration information. The device provides the ranked set of equalizer calibration information to the analyzer device to permit the analyzer device to identify selected equalizer calibration information of the ranked set of equalizer calibration information, and utilize the selected equalizer calibration information.

A magnetic sensor system includes two magnetic sensors that detect components in two directions of an external magnetic field, an additional magnetic field generation section, and a signal processing circuit. The additional magnetic field generation section is capable of generating two additional magnetic fields for use in measuring the sensitivities of the two magnetic sensors. The signal processing circuit includes a sensitivity measurement processing section and a detection signal correction processing section. The sensitivity measurement processing section measures the sensitivities based on data concerning changes in the detection signals of the two magnetic sensors when the additional magnetic field generation section is controlled to generate two additional magnetic fields. The detection signal correction processing section performs processing for reducing change components attributable to the two additional magnetic fields on the detection signals of the two magnetic sensors.